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Si
atomic number 14 tetravalent metalloid chemical element.
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Testing for Si Solar Cells Using High Performance CCD
EL Imaging Tester
EL Testing for Si Solar Cells using High Performance CCD. The determination of luminescence (photo emissions) in solar cells is an important characterization tool. Typical solar cells often have defects which limit the efficiency or lifetime of a cell. Many of these defects are visualized with Luminescence Imaging. By using this technique, the manufacturing process can be optimized to produce better cells. Luminescence Imaging takes advantage of the radiative inter-band recombination of excited charge carriers in solar cells. The emitted photons can be captured with a sensitive CCD camera to obtain an image of the distribution of the radiative recombination in the cell. This distribution is determined by the local excitation level, allowing the detection of electrical losses, thus mapping the diffusion length of minority carriers as the emitted light is low intensity and in the near infra-red range, the CCD camera has a high sensitivity wavelength from 900 to 1100 nm with little thermal noise. This CCD camera provides excellent resolution of 1024 x 1024 pixels with a large 1μm pixel size, multi-megahertz readout speed, and robust USB 2.0 connectivity. The EL CCD Camera is the ultimate high-performance CCD camera for electroluminescence and photoluminescence imaging for Photovoltaic (PV) Cells and Modules. This camera combines low noise electronics and optimal sensitivity in NIR.
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Volume Calibration
Trescal provides full Volume Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Volume Calibration services can be delivered at your site or at our lab. Accreditations for our volume calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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Radiometry Calibration
Trescal provides full Radiometry Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Radiometry Calibration services can be delivered at your site or at our lab. Accreditations for our radiometry calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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IV Tester System
PET-CC
Application ■Mono crystalline silicon (Si) ■Multi crystalline silicon (mc-Si) ■Amorphous silicon (a-Si) ■Gallium arsenide (GaAs) ■Gallium indium arsenide (GaInAs)
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Force Calibration
Trescal provides full Force Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Force Calibration services can be delivered at your site or at our lab. Accreditations for our force calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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General Purpose Geiger Counter
Radalert® 100X
The Radalert® 100X is a general purpose geiger counter that measures alpha, beta, gamma, and X-radiation. Features of the Radalert® 100X, include a three-second update and a Utility Menu that allows you to change the default settings for several operating parameters. Its digital liquid crystal display (LCD) shows the current radiation level in your choice of SI units (microsieverts per hour) from .000 to 1,100 and counts per minute (CPM) from 0 to 350,000 or counts per second (CPS) from 0 to 3,500. For users of conventional units mR/hr (milliroentgens per hour) from .000 to 110 and CPM are optional in the Utility Menu. This instrument also offers an accumulated total and timer function, up to 9,999,000 counts and 40 hours.
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Process EDXRF Spectrometer
NEX LS
Applied Rigaku Technologies, Inc
Featuring advanced third generation EDXRF technology, the Rigaku NEX LS represents the next evolution of scanning multi-element process coatings analyzers for web or coil applications. To deliver superior analytical performance and reliability, the EDXRF measuring head assembly was derived from the established Rigaku NEX Series high-resolution benchtop instrumentation. With this proven technology, the Rigaku NEX LS delivers rapid, non-destructive, multi-element analyses — for coat weight, coating thickness and/or composition — for elements from aluminum (Al) through uranium (U). The measuring head is mounted on a rigid beam and is equipped with a linear traversing mechanism positioned over a roller so that the head-to-surface distance is constant. Common applications include silicone release coaters, converters, denesting Si for vacuum-formed plastics, RoHS compliance, conversion coatings, metalized plastic, top coatings on metal coil and fire retardants on fabric.
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KV CAPS
1000 V
Macom Technology Solutions Holdings Inc.
The MACOM KV CAPS™ Si high voltage capacitors feature very high working voltage ratings, very low loss and excellent stability by virtue of their novel internal construction and very high-quality dielectric layers. These capacitors are available in surface mount (SMT) plastic packages or in hermetic ceramic packages.
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Hardness Calibration
Trescal provides full Hardness Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Hardness Calibration services can be delivered at your site or at our lab. Accreditations for our hardness calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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Magnetic Calibration
Trescal provides full Magnetic Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Magnetic Calibration services can be delivered at your site or at our lab. Accreditations for our magnetic calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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Temperature Calibration
Trescal provides full Temperature Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Temperature Calibration services can be delivered at your site or at our lab. Accreditations for our temperature calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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Accelerometry Calibration
Trescal provides full Accelerometry Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Accelerometry Calibration services can be delivered at your site or at our lab. Accreditations for our accelerometry calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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Acoustic Calibration
Trescal provides full Acoustic Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Acoustic Calibration services can be delivered at your site or at our lab. Accreditations for our acoustic calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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Voltage and Current Measuring Technology
HIGHVOLT Prüftechnik Dresden GmbH
Designed for the measurement of alternating current (AC), direct current (DC), lightning (LI) and switching (SI) impulse high voltages (HV) as well as AC and impulse high current (HC) according to IEC 60060, IEC 61083 and IEC 60052, available as indoor and outdoor design.
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Medical Device Calibration
Trescal provides full Medical Device Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Medical Device Calibration services can be delivered at your site or at our lab. Accreditations for our medical device calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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PAM analysis upgrade for Signal Integrity Studio, WavePulser 40iX High-Speed Interconnect Analyzer
WAVEPULSER-SI-STUDIO-UPG-PAM
Signal Integrity (SI) Studio uses SDA Expert (SDAX) serial data analysis software options to simplify NRZ or PAM serial data jitter, eye diagram, noise and crosstalk measurement and analysis setup.
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DVB Analyzer
DVB Inspector
DVB Inspector is an open-source DVB analyzer, written in java. It can show the logical structure of the DVB SI and PSI data. It also shows bit rate usage data. DVB Inspector can be used to analyse contents; MPEG Video structure, teletext, DVB subtitles, DSM-CC Object carousels.
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Flow Calibration
Trescal provides full Flow Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Flow Calibration services can be delivered at your site or at our lab. Accreditations for our flow calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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AAA Solar simulator
SS50AAA-PLC
Application ■Mono crystalline silicon (Si) ■Multi crystalline silicon (mc-Si) ■Amorphous silicon (a-Si) ■Gallium arsenide (GaAs) ■Gallium indium arsenide (GaInAs) ■Gallium aluminum arsenide (GaAlAs) ■Gallium indium phosphite (GaInP)
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GaN Power Amplifiers > 5W
Macom Technology Solutions Holdings Inc.
MACOM GaN RF power amplifier solutions are designed with the latest GaN-on-SiC and GaN-on-Si technologies. Our MACOM PURE CARBIDE series of GaN-on-SiC power amplifiers offers high performance and reliability for the most demanding applications. Our expanding GaN portfolio is designed to address the challenging requirements of Aerospace & Defense, Industrial, Scientific and Medical applications and 5G wireless infrastructure. MACOM GaN products deliver output power levels ranging from 2 W to over 7 kW and exhibit best in class RF performance with respect to gain and efficiency. For sensitive Aerospace & Defense applications MACOM can offer a US only supply chain with AS9100D Certification.
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EMC Calibration
Trescal provides full EMC Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. EMC Calibration services can be delivered at your site or at our lab. Accreditations for our emc calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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Single Port Serial Interface
APCI-7300-3
*PCI interface to the 32-bit data bus. *Asynchronous communication adapter, 1-port serial interface*1 socket for SI modules*Modular structure through SI modules*Configurable as: RS232, RS422, RS485, with or without isolation, or 20 mA Current Loop (active, passive) with isolation*Addressing through software
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Vacuum Meters
An individually-numbered Traceable® Certificate provided with each unit, assures accuracy from our ISO/IEC 17025:2005 (1750.01) calibration laboratory accredited by A2LA. It indicates traceability of measurements to the SI units through NIST or other recognized national measurement institutes (NMI) that are signatories to the CIPM Mutual Recognition Agreement.
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High Purity Germanium (HPGe) Radiation Detectors
Semiconductor based photon radiation detectors have been evolving for over half a century, with ORTEC pioneering commercial availability for a majority of that time. Initial offerings were based around lithium-drifted germanium Ge(Li) and lithium-drifted silicon Si(Li). Ge(Li) was later replaced with more advanced, high purity germanium (HPGe) detectors. ORTEC provides a comprehensive suite of HPGe detector solutions covering an extensive range of energies and for a variety of applications.
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Si Detectors & Spectrometers
Baltic Scientific Instruments, Ltd
X-ray spectrometers based on Si detectors with liquid nitrogen cooling, Peltier and electric machine cooling. The spectrometers are applied in the various systems for element analysis: X-ray fluorescent; electron probe; with alpha and beta excitation etc, as well as for the precision diffractometry in the devices of structural and phase analysis.
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Power Meters and Calibration Cells
The Solar Reference Cell consist of a 20 x 20 mm monocrystalline silicon Photovoltaic Cell encased in a 92 x 70 x 16 mm metal enclosure with a protective quartz window and a temperature sensor. The temperature sensor is a 100 ohm platinum Resistance Temperature Detector (RTD).The Solar Reference Cells come with a Certificate of Calibration and compatible set of connecting cables. The following parameters of the reference cell are certified: Isc, Imax, Voc, Vmax, Pmax, Area, Fill Factor and Efficiency. The certification is accredited by NIST to the ISO-17025 standard and is traceable both to the National Renewable Energy Laboratory (NREL), and to the International System of Units (SI). A compatible cable set is also supplied with each Solar Reference Cell.
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General Purpose Radiation Survey Meter/Geiger Counter
Rad 100™
The RAD 100™ is a general purpose radiation survey meter/geiger counter that detects and measures alpha, beta, gamma, and X-radiation. It is intended for personal safety and educational purposes. Like the popular Radalert® 100X, the RAD 100™ features a 3-second update on its digital liquid crystal display (LCD). The LCD shows the current radiation level in your choice of microSieverts per hour (SI units) or mR/hr for gamma radiation measurements. For mixed sources (alpha, beta, gamma) the CPM mode is recommended. This instrument also offers an accumulated total and timer function, up to 9,999,000 counts and 40 hours. A red LED blinks and a beeper chirps with each count (the chirp can be muted). This is a professional instrument that is also easy to learn to use and to operate, and carries the industry leading Medcom warranty (2 years overall limited to 1 year on the GM sensor). Many instruments designed by the Medcom team are still working perfectly after 30 years of use, so this instrument should provide a lifetime of useful information.
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Avalanche Photodiodes
Excelitas offers Avalanche Photodiodes (APDs) on both Silicon (Si) and InGaAs materials. Si APDs cover the spectral range of 400 nm to 1100 nm and the InGaAs APDs cover 950 nm to 1550 nm. An Avalanche Photodiode (APD) provides higher sensitivity than a standard photodiode and is for extreme low-level light (LLL) detection and photon counting.
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Automated I-V/AOI/EL and Sorting System
OAI’s High Performance In-line Automated-I-V Testing, AOI/EL Inspection and Sorting/Binning System for Various Si Solar Cells. The 10000A-I-V System is a unique and reliable I-V testing, AOI/EL Inspection and Sorting / Binning system for testing of Mono, Multi-Si, C-HJT and other full Size (156mm x 156mm) and/or Cut-cell (156mm x 39mm or 156mm x 31.2mm or other custom sizes) Si Solar Cells.
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Spectrometer
VIS-NIR
Wavelength range is 420 nm to 1100 nm with 4 nm resolutionHD Volume Phase Holographic GratingBack-thinned Si CCD with low noise electronicsExtreme low stray light and high transmissionShort acquisition time and high SNR spectraTEC cooling option availableBluetooth option availableFiber coupled or free spaceOEM Solution
