Server Test
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Product
TeraBox FPGA Servers
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At the extreme of FPGA server density, the TeraBox 1401B/1402B give the highest level of compute and network capability in a 1U chassis. These servers provides twice the density of the typical 4U server. These innovative products support PCIe Gen4 and feature an AMD EPYC or Intel Xeon processor in a standard rack depth chassis.
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Product
Functional Test
cUTS
Functional Test
Get the essentials of measurement automation to power tests of simpler PCBAs and subassemblies. compactUTS (cUTS) is a cost-effective platform for automating manual tests of devices with fewer than fifty cable-accessible test points in manufacturing environments with moderate production volume. DUT-specific electrically keyed cables make changeover quick and easy.
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Product
80 DIOs, 8AIs, 8AOs JTAG Boundary Scan Resources Unit Expansion
YAV9JTAH
Test Fixture
80 DIOs8 Ais8 AOsCompatible with all JTAG vendors
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Product
Wireless Serial Device Server
SD-330AC
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The SD-330AC serial device server is an ideal choice for connecting your serial devices for industrial automation, building automation and medical devices to a wireless LAN. It supports both Infrastructure Mode or Ad-Hoc Mode, which allows SD-330AC to connect to Wi-Fi networks at offices and factories to allow users to move, or roam, between several access points.
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Product
EOL/Functional Testing
Functional Test
Whether you are testing RF LRU modules as a defense contractor, or implementing the next power supply tester for EV charge stations, ARC can create a custom, flexible automated end of line test solution for a variety of needs, with your budget in mind.Leverage our expertise with PXI mixed signal modular instruments, RF test capabilities and switching to complete your next solutions. Shorten your test development times, improve hardware and software standardization, and control your future test development costs by partnering with ARC on your next project.
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Product
High Throughput Device Server
DS-600
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The Silex DS-600 is designed to easily connect and share USB 3.0 and 2.0 devices over a network. Printers, Scanners, Disk Drives, Cameras, Card Readers, or virtually any other USB device can be now be enabled with network capability. It allows flexibility to place the USB device anywhere on the network instead of needing to be attached directly to the computer, and multiple users can access the USB device.
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Product
Avionics IO Servers
GSERV
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The GSERV avionics IO platform builds on The Goebel Company’s long history in computer architecture and realtime simulation. Weather your IO requirements are simply driving a cluster of displays, or driving a full complement of avionics IO, GSERV has the solution for you. GSERV provides the highest IO count in single chassis rack mount or desktop configurations.GSERV configurations are delivered with Windows XP Pro.
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Product
Radar Video Record and Playback Server
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Curtiss-Wright Defense Solutions
The Radar Video Record and Playback Server (RVRPS), designed for full compatibility with the Curtiss-Wright Radar Video Processor (RVP) and radar scan conversion hardware and software products, accepts multiple radar video network streams from RVP servers.
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Product
Windows Server Simulation Software For BACnet Systems
BACSim
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BACsim is the industry's first easy-to-use BACnet device simulator for Windows. BACsim runs under Windows 7/8/10 and Server 2012, and provides a robust set of basic simulator features tailored to the needs of BACnet designers and testers.
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Product
Single-Node Servers
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SKY single-node rack servers provide high-performance computing, flexible storage capacity and configurable network expansion for the enterprise.
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Product
NFC Conformance Test System
T3111S
Test System
The T3111S RIDER NFC Conformance Test System is the Keysight solution for RF Analog and Digital Protocol testing of NFC, EMV and ISO devices. The Test System is based on the Keysight T1141A NFC Test Set and it is complemented by the Keysight's or FIME's robots for accurate and repeatability RF testing. Selected 3rd party positioning robots can also be supported.
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Product
Laser Diode Burn-in Reliability Test System
58604
Test System
The Chroma 58604 is a high density, multi-function, and temperature controlled module for laser diode burn-in and lifetime tests. Each module has up to 256 SMU channels which can source current and measure voltage in various control modes as described below.
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Product
Trusted & Secure Servers
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A part of the EnterpriseSeries™ product line, Mercury’s RES Trust servers employ U.S. designed and manufactured motherboards with embedded Intel® processors and composable BuiltSECURE™ framework to deliver trusted performance for the most security-imperative mission critical applications. RES Trust servers can be configured with a variety of nation-state-level security features. System security features enable customer Foreign Military Sales (FMS) or Direct Commercial Sales (DCS) program success.
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Product
Scienlab Battery Test System – Pack Level, 110 KW Compact Version
SL1710A
Test System
Compact solution for testing Battery Packs with output power up to 110 kW and voltage range up to 1500 V
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Product
In-line High-Density ICT System Series 7i
E9988GL
In-Circuit Test System
The E9988GL Keysight i3070 Series 7i Inline High-Density In-Circuit Test (ICT) system brings industry-leading ICT technologies into your automated manufacturing line, saving resources and optimizing your automated test strategy.
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Product
USB Device Server
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Advantech USB serial device server allows PC users to connect serial devices via a LAN to systems. They allow access from anywhere on your network.
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Product
LANTIME Stratum 1 Server for all networks
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Meinberg Funkuhren GmbH & Co. KG
Our Network Time Protocol (NTP) is the only way to get the most out of your network, to-use time server appliances.
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Product
VITA 62, 3U Test Fixture
TF-3U-7B041-1
Test Fixture
This Power Supply test fixture is being proposed as a tool for checking Injector / Ejector operation, proper alignment of the VITA 62 connector and proper alignment of both keys on a Single slot, 3U, VITA 62/SOSA power supply.
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Product
PXI Semiconductor/IC Test System
Test System
A high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO card consists of a Sequencer Pattern Generator (SQPG) and 32 channels of full ATE-like features. The 33010 IO card is expandable up to 256 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/ PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.
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Product
Semiconductor Test System
TS-960e
Test System
The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
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Product
Serial Device Servers
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Advantech''s serial device servers, Modbus gateways, and USB Device Server are easy to install and configure, support wired and wireless networking and provide various operation modes to satisfy rigorous industrial automation needs.
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Product
Serial Device Servers
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Connect and share RS-232 serial devices on wireless or wired Ethernet networks, with enterprise security support and multiple serial port modes for maximum flexibility in any environment.
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Product
HV Test System up to 20000 Volt
Test System
Insulated test booth with large space for test items. 2 banana sockets for AC connection and 4 banana sockets for the DC connection of the DUTs. IC’s are tested in a long-term test. These are checked in an oil bath so that there are no air gaps to reduce the insulation. Maximum voltage 20 kV. Therefore, insulation tests must be carried out. Ensuring the standard-compliant test. For the safety of the operating personnel, the test cell is electrically locked while the high voltage measurement is active.
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Product
Spring Clip Fixture
16092A
Test Fixture
Use this test fixture with parallel electrodes for impedance evaluation of both lead and SMD components.
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Product
Dielectric Test Fixture
16451B
Test Fixture
The 16451B is used to evaluate the dielectric constant of solid dielectric materials accurately, and complies with ASTM D150. The 16451B employs the parallel plate method, which sandwiches the material between two electrodes to form a capacitor. An LCR meter or an impedance analyzer is then used to measure the capacitance created from the fixture.
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Product
FPGA Servers
TeraBox™
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BittWare’s TeraBox™ range of certified server platforms feature the latest FPGA accelerators enabling customers to develop and deploy quicker with reduced risk and cost.
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Product
Test System Replication/Build-to-Print
Test System
Need to manufacture test stations? For more than 15 years we have sourced, assembled, tested and shipped fleets of robust, cost-effective solutions. We produce them at our high-volume facilities and deploy them around the world.
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Product
Cloud, Networking & Servers
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Refers to the hosting or using of network services via a public, private, or hybrid cloud.
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Product
Free Serial-TCP (More Than Just A Device Server)
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In the past two decades, legacy serial communication protocols such as Modbus have merged rapidly with modern TCP/IP communication, yielding benefits including widely available infrastructures and greater distance, reliability, and speed. The Serial-TCP program (more than just a Device Server) bridges your existing Serial COM port and TCP/IP without the need for changing existing protocol. It works seamlessly and transparently, just like passive RS232 / RS485 / RS422 converters, repeaters, and hubs, while the difference is that one requires installation of cables and converters with limited distance; and the other simply makes use of the existing computers and networks with an unlimited transmission distance





























