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Application Security Testing
assures web application vulnerabilities are identified.
See Also: Penetration Testing
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Seeker Interactive Application Security Testing
IAST
The industry's first IAST solution with active verification and sensitive-data tracking for web-based applications. See how Seeker helps development, QA, DevOps, and security teams automate the security testing of modern web applications and services.
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100GE Application & Security Test Load Module
CloudStorm
Keysight Network Applications and Security
Ixia's CloudStormTM is an industry-first 2.4 terabit application and security test solution that not only meets today’s need, but that of the future. CloudStorm delivers 3X-application and 4X-SSL-emulation scale over any other test system. It helps NEMs shortening their development cycles, and enterprises and data center operators find the right balance between mitigating security risks and delivering high end-user application performance. Emulate multi-terabit DDoS and botnet attacks to future-proof security solutions
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Enterprise-Scale Application and Security Testing
PerfectStorm ONE 10GE/40GE Appliance
Keysight Network Applications and Security
Building upon the terabit-scale PerfectStorm platform, PerfectStorm ONE™ appliances offers enterprises, service providers, and technology vendors a revolutionary solution for generating stateful applications and malicious traffic, simulating millions of real-world end-user environments to test and validate infrastructure, a single device, or an entire system.
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Mobile Application Security
ImmuniWeb®
ImmuniWeb® Mobile is a part of ImmuniWeb Application Security Testing Platform dedicated to comprehensive security testing of mobile applications. Based on proprietary machine-learning SAST and DAST mobile application testing technology, it also provides thorough testing of the mobile backend.
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Application Security Testing Solution
CxIAST
CxIAST provides dynamic vulnerability detection without impacting development cycle times. Unlike other application security testing solutions, CxIAST delivers results in zero time, making it a flawless fit for DevOps and CI/CD environments. CxIAST fills the critical application security gap by continuously monitoring application behavior and finding vulnerabilities that can only be detected on a running application.
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Enterprise-Scale Application and Security Testing
PerfectStorm ONE 1GE/10GE Appliance
Keysight Network Applications and Security
PerfectStorm ONE facilitates network and security proof-of-concepts (POCs) and assessments, all in a compact device. This POC-in-a-box enables enterprises and service providers to select optimal devices and right-size data centers, as well as providing device vendors with a platform to fully showcase their product’s performance, resiliency, and throughput under realworld traffic loads.
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Enterprise-Wide Application and Security Testing
PerfectStorm ONE
Keysight Network Applications and Security
Enterprises and government organizations are making major investments in consolidating and rebuilding data centers and enterprise -wide networks. The stakes have never been so high to get it right the first time.
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Security Testing Service
Web Application Penetration Testing. Mobile Application Penetration Testing. Security Code Review. Network Vulnerability Assessments.
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Standardize Production Test Software For PCBAs And Electronic Devices
The vast majority of test project man-hours are spent on software development, so the choices that teams make in software tools and architecture have significant impact on deployment schedules. Standardizing software across a team or organization increases both efficiency and proficiency, lowering the risk of missed deadlines and improving test quality and reliability. Test software must:
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Automated Aerospace and Defense Test
Obsolescence management, evolving RF requirements, and design for test (DFT) challenges every test organization in the aerospace and defense industry. Organizations are transitioning from rack-and-stack box instruments and closed-architecture automated test equipment (ATE) systems to smarter test systems built on a modular platform that scales to meet current and future needs.
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W-CDMA/HSPA+ Analysis Using NI PXI RF Test Instruments
RFmx W-CDMA/HSPA+
The NI-RFmx W-CDMA personality is a highly optimized API for performing physical layer measurements on W-CDMA cellular standard signals. NI-RFmx W-CDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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ADAS Test
Advanced driver assistance systems (ADAS) are introducing new technology into vehicles. They demand test systems that are adaptable and future-proof, so they can integrate all the technology used today and be ready for whatever tomorrow brings.
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Wireless Device Test
New wireless standards, in addition to rising wireless usage, are increasing wireless device complexity while lowering price expectations. To counter rising costs, manufacturers require test systems optimized for efficiency.
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6TL08 Benchtop Test Platform
H710008
The 6TL-08 base platform was designed to cover the most common testing and in-system programming (ISP) needs with a reduced initial budget. The system includes a robust manual linear push mechanism allowing a low-cost fixture strategy thanks to the exchangeable cassettesThe platform enclosure features an 8-Slot fixture receiver, compatible with VPC 90 Series Mass Interconnect Module, as well as 6TL intelligent YAVModules (YAV90MMU &YAV90059), with room for fast ISP devices, optional PXI chassis and various power supplies. A removable back panel allows easy placement of custom connectors or test auxiliary circuitry.
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ARINC 818 Tester
iWave 3U VPX High-Speed Video/Data Processing Card is a rugged standalone module in the 3U VPX form factor, aimed for the high-speed data, video processing, and display applications is ideal for military, defense, and aerospace applications requiring an optimal balance of performance and power efficiency. iWave 3U VPX High-Speed Video/Data Processing Card is implemented using Xilinx Kintex-7 device architecture and has I/O interfaces including High speed 16 channels of transceiver interfaces capable of operating up to 6 Gbps data rate, Gigabit Ethernet, RS232, RS422, PCIe interface, Built-in health monitoring circuits, HDMI input, and output interfaces
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Advanced SoC/Analog Test System
3650-EX
Chroma 3650-EX is specifically designed for high-throughput and high parallel test capabilities to provide the most cost effective solution for fabless, IDM and testing houses.
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6TL19 Off-Line Base Test Platform
H71001900
The 6TL19 is a bare half-rack with castors for creating Off-Line, modular, flexible and reliable Base test platforms. The overall rack capacity is 11U (580mm depth).
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128 DIOs JTAG Boundary Scan Resources Unit
YAV9JTAG
Boundary-scan is a widely practiced test methodology that is reducing costs, speeding development, and improving product quality for electronics manufacturers around the world. By relying on an industry standard, IEEE 1149.1, it is relatively quick, easy, and inexpensive to deploy a highly effective test procedure. In addition, today’s PCBs have little alternative because of limited access to board-level circuitry.
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Audio and Acoustic Functional Test Solution
With the growing popularity of Internet of Things devices worldwide, many electrical products are adopting voice commands as their user interface. This means that acoustic and audio test challenges are likely to impact more products than ever before. Test teams must meet extended test coverage requirements to ensure product quality while maintaining throughput and operational efficiency. For a solution to meet these sorts of demands, it must:
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EV Power Components End of Line Test Platform
Test and Validate all EV Power Electronics with One Flexible and Scalable Solution
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EV-DO Analysis Using NI PXI RF Test Instruments
NI-RFmx EV-DO
Highly optimized RF measurement experiencePerform physical layer analysis on EV-DO cellular signals including MODACC, ACPR, CHP, OBW, and SEMSimple access to advanced measurement parallelism
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VLSI Test System
3380
The 3380 VSLI test system equipped with a maximum of 1280 I/O channels, 256 VI sources, flexable architecture and comprehensive optional function boards (ADDA/Hi-voltage DPS) can meet the high parallel multi-test tendency.
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Functional Test Fixtures
Forwessun’s Functional Test Fixtures are tailored to validate the performance of your electronic assemblies, ensuring each product meets critical quality and functional standards. With customisable designs and precision engineering, these fixtures support a range of testing needs—from checking connectivity and function to confirming performance under real-world conditions. Built to handle rigorous demands, Forwessun's solutions are ideal for industries requiring reliable and repeatable results. Whether for high-volume production or specialised testing, our fixtures provide robust, adaptable support to maintain efficiency and accuracy throughout the testing process. We also create, and work with Ingun to create fixtures using the Ingun kit.
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80 DIOs, 8AIs, 8AOs JTAG Boundary Scan Resources Unit Expansion
YAV9JTAH
80 DIOs8 Ais8 AOsCompatible with all JTAG vendors
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PXI Digital Test Instrument
PXIe-6943
Conduct pattern-based digital tests incorporating the latest parallel, digital, serial, and bus protocols with the PXIe-6943 digital test instrument.This instrument is TPS-compatible with the legacy VXI digital test instrument from Astronics as well as other instrument vendors.
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NI Real-Time Test Cell Reference System
778820-35
DIAdem Advanced with DAC Bundle, Perpetual License, Include 1 Year SSP
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In-Line Test System
With an Averna in-line test system, clients boost production/yields, catch defects invisible to the human eye, reduce equipment downtime, and ensure repeatable results.
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Functional Test
cUTS
Get the essentials of measurement automation to power tests of simpler PCBAs and subassemblies. compactUTS (cUTS) is a cost-effective platform for automating manual tests of devices with fewer than fifty cable-accessible test points in manufacturing environments with moderate production volume. DUT-specific electrically keyed cables make changeover quick and easy.
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Advanced SoC/Analog Test System
3650
Chroma 3650 is an SoC tester with high throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses.
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Lens Module Test Platform
The Lens Module Test Platform is a flexible solution to deliver the quality that is expected from your brand for all types of lenses and cameras. The system can be configured to measure objective, eyepiece or camera lenses. As the platform can efficiently measure lenses as small as 2 mm3, it is perfect for the critically precise applications of life sciences, consumer electronics, automotive and other industries. With 25+ years of quality experience, the Lens Module Test Platform ensures that all products shipped to market work as intended.
