-
Product
Inspection Microscope
Z-NIR
-
The McBain Z-NIR Near Infrared Inspection System is best-in-class for wafer-to-wafer and die-to-die alignment measurement and verification. This unique tool has been sold into many industries with various applications including sub-surface wafer and die inspection for cracks and bond integrity, MEMS, wafer bonding, 3-D chip stacking, failure analysis, process development, tool verification, part characterization, environmental testing and more.
-
Product
Spectrometer
VIS-NIR
-
Wavelength range is 420 nm to 1100 nm with 4 nm resolutionHD Volume Phase Holographic GratingBack-thinned Si CCD with low noise electronicsExtreme low stray light and high transmissionShort acquisition time and high SNR spectraTEC cooling option availableBluetooth option availableFiber coupled or free spaceOEM Solution
-
Product
Turbidity Probe
AS56-N
-
AS56-N is a probe for direct installation into pipelines and vessels measuring NIR light absorption (Turbidity or Solids Concentration) in various liquid flow streams. Two optical path length choices allow the measurement range to meet the process control requirements.
-
Product
Ellipsometer
T-Solar™
-
The T-Solar ellipsometer combines the best photovoltaic measurement technology into a single system designed specifically for textured samples. Based on the establishedM-2000 rotating compensator spectroscopic ellipsometer, the T-Solar measures hundreds of wavelength across the UV-Visible-NIR.
-
Product
OEM CCD Camera
Syncerity BI-NIR Camera
-
The TE-cooled back illuminated 2048 x 70 CCD Camera combines affordability, performance and versatility for OEM applications. With peak QE of 84% @ 700nm and 20% at 1050nm, Syncerity BI-NIR offers a relatively broad response and addresses multiple applications. In the near-NIR, this detector is a much lower cost alternative to a deep depleted CCD, with no etaloning. Syncerity’s flexible design allows our OEM-dedicated team to quickly adapt the camera for industrial requirements, ranging from alternate CCD chips to electronics
-
Product
FT-NIR for Process Analytics
QuasIR™ 2000E
-
Galaxy Scientific’s QuasIR™ 2000E is designed for continuous measurement of the chemical composition of material transported on a conveyor belt, through a pipe, or in a chute. Our unique external projection optics use high powered tungsten lamps to illuminate the sample from as far as 24 inches away and collect the scattered reflection off the sample through a fiber optic cable. The analysis spot size can be set as small as 0.5″ or as large as 8″ in diameter and can be custom tailored to applications needs.
-
Product
FLIM Upgrades for Zeiss LSM
710 / 780 / 880
-
*Two Fully Parallel TCSPC FLIM Channels*Compact bh Simple-Tau or Power-Tau System*Two HPM-100-40 GaAsP Hybrid Detectors*Optional: HPM-100-06 Hybrid Detectors, IRF Width < 20 ps FWHM*Optional: HPM-100-50 Hybrid Detectors for NIR FLIM*Optional: Multi-Wavelength FLIM*Excellent Time Resolution: Electrical IRF Width 6.5 ps FWHM*Time Channel Width Down to 813 fs*Megapixel FLIM, Up to 2048 x 2048 Pixels at 256 Time Channels*Simultaneous FLIM/PLIM*Detection Wavelength Range from 360 nm to 900 nm*Excitation by Ti:Sa Laser, OPO, or by bh ps Diode Lasers*Identical Systems for Multiphoton FLIM and Confocal FLIM*Detectors can be Swapped Between NDD Port and Confocal Port*Systems are Modular: More FLIM Channels can be Added
-
Product
OEM Solutions
-
Headwall-manufactured gratings, spectrographs, and spectrometers maximize the quality of UV-VIS-NIR analysis. Each grating is an original piece, unmarred by replication processes. These master-quality gratings feature superior spectral and spatial resolution and extremely low scatter, meeting the demands of your high-performance instrument. We have more than 40 years of experience producing gratings and spectral engines for ourselves and for our OEM customers.
-
Product
Silicon Inspection System
NIR-01
-
The NIR-01 imaging system is made of CNC engineered Aluminium alloy. The suruface protection is powder painting and electrolitic oxidation on pure aluminium surfaces. The frame of the system is a high quality industrial design. All components are designed for long term heavy usage with minimal maintenance needs. Electrical components are also selected for stability and durability. The block like electronics gives the advantage of easy and quick repair.
-
Product
Detectors
-
Designed and manufactured by Becker & Hickl - bh offers a wide range of detector types as photomultiplier tubes (PMC), hybrid photo detectors (HPM), single-photon avalanche diodes (SPAD) as well as multi-channel- and multi-spectral detectors. The detection range covers the wavelengths from UV to the NIR and time resolutions spanning from tens of ps to hundreds of ps suitable for anti-bunching, FCS, FLIM, PLIM and other applications. bh guarantee that their TCSPC modules work with any photon counting detector and reach the fastest possible IRF width.Choose your detection now:
-
Product
Spectroscopy
NIRS XDS Process Analyzer
-
NIRS XDS Process Analyzer systems can measure a variety of sample types, such as granules, powders, liquids, slurries, or opalescent substances, among others. These analyzers provide fast, nondestructive analysis of pharmaceutical, chemical, and petrochemical products. If required, up to 9 inline measuring channels can be multiplexed with this system.
-
-
Product
Single Photon Detector System For Near-Infrared (1.6-2.3 Um Wavelength) Waves With Closed-Cyle Cooling
-
Single Photon Detector System for Near-Infrared (1.6-2.3 um wavelength) waves with Closed-Cylce (cryogen-free)cooling
