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Linear Testfixture (2 pcs. Cassette Included), UTT 105 x 170 mm (2pcs)

MG-05

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MG Products

MG-05 - MG Products

FEATURES• Linear click system with ball bearings, using gas springs• 10 mm ESD-proof top cover with aluminium reinforcement bars• Steel base cabinet with detachable aluminium back and bottom panels• Detachable interchangeable case system with an 8 mm spring loaded probe protection cover• Base cabinet fitted with a telescopic guide rail and catchTECHNICAL SPECIFICATIONS• Max. number of probes (1000N) 650 units for each cassette• Max. PCB height: 60 mm• Linear travel: 12 mm• Max UUT: 105 x 170 mm (wxd) each cassette• Outer dimensions: 550 x 400 x 50 x 140 mm (wxdxh1xh2)• Designed for 2 pieces changeable cassette

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Trace Probe

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Ashling Microsystems Ltd

Ashling Microsystems Ltd

Vitra-XS is Ashling’s Debug & Trace Probe for embedded development with support for multiple target architectures including RISC-V, Arm-Cortex, MIPS (P8700 & I8500) & Synopsys ARC-V & ARC powered systems. Vitra-XS works with Ashling’s RiscFree™ SDK for advanced embedded system debugging, tracing, profiling & analysis.

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Pneumatic Test Probes

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Equip-Test Kft.

Equip-Test Kft.

*Solution for difficult contacting *Cost Effective *Works With Air

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True RMS Clamp Meter w/ Pipe Clmap Adapter

DL489COMBO

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UEi Test & Measurement Instruments

DL489COMBO - UEi Test & Measurement Instruments

True RMS Clamp meter and 2 ATTPC3 pipe clamp adapter, 2 ATT29 K-Type temperature probes

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AC Current Probe 100 mV/A, 60A, 11 Hz LF Bandwidth, 5MHz HF Bandwidth, 1m cable

T3RC0060-LF

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Teledyne LeCroy

T3RC0060-LF - Teledyne LeCroy

AC Current Probe 100 mV/A, 60A, 11 Hz LF Bandwidth, 5MHz HF Bandwidth, 1m cable.

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High Voltage Passive Probes

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Teledyne LeCroy

Teledyne LeCroy

The PPE6KV-A and HVP120 can handle up to 6000 Vpeak transient overvoltages and are designed for probing up to 2000 Vrms and 1000 Vrms respectively. Fast rise times, excellent frequency response, and a variety of standard accessories make these probes safe and ideal for high voltage measurement applications

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150A, 12 MHz CURRENT PROBE, BNC, AC/DC, 150A rms, 300A Peak Pulse

T3CP150-12

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Teledyne LeCroy

T3CP150-12 - Teledyne LeCroy

150A, 12 MHz CURRENT PROBE, BNC, AC/DC, 150A rms, 300A Peak Pulse.

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Power Probes

RkT Thermopile Series

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LaserProbeinc.

RkT Thermopile Series - LaserProbeinc.

The RkT Series thermopile power probes are ideal for measuring Nd:YAG, CO2, and other mid-power lasers. The probes are designed to withstand average power densities up to 20kW/cm2 (15MW/cm2 peak pulse power density). The flat UV to far-IR spectral response allows the probes to measure broadband sources as well. Measure the power of cw sources or the average power of sources pulsed at 5Hz or greater.

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Microwave Testing

170

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Picoprobe

170 - Picoprobe

The PICOPROBE® MODEL 170, a high performance microwave probe which incorporates a WR-6 waveguide with our patented coaxial design techniques, has inherent low loss and low dispersion characteristics.

Product

Exchangeable Test Fixture

MA 2112/D/H/S-7/GR2270/71

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INGUN Prüfmittelbau GmbH

MA 2112/D/H/S-7/GR2270/71 - INGUN Prüfmittelbau GmbH

Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 12,13 kg

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Semiconductor Metrology Systems

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MTI Instruments

MTI Instruments

MTI Instruments'' semiconductor wafer metrology tools consist of a complete line of wafer measurement systems for virtually any material including Silicon wafer (Si), Gallium Arsenide wafer (GaAs), Germanium wafer (Ge) and Indium Phosphide wafer (InP). From manual to semi-automated wafer inspection systems, the Proforma line of wafer metrology inspection tools is ideal for wafer thickness, wafer bow, wafer warp, resistivity, site and global flatness measurement. Our proprietary push/pull capacitance probes provide outstanding accuracy throughout their large measurement range, allowing measurement of highly warped wafers and stacked wafers. MTII''s solar metrology tools include off line manual systems for wafer thickness and Total Thickness Variation (TTV), as well as, in-process measurement systems capable of measuring wafer thickness, TTV and wafer bow at the speed of 5 wafers/second.

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Differential Probe

DP-8V

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PINTEK Electronics

DP-8V - PINTEK Electronics

*MAX. Input Voltage: ±4KV DC or 8KV p-p or AC 2.8KV rms*Bandwidth: DC-50MHz*Input Impedance 20MΩ// 2PF*x10, x100, x1000 Attenuator*To Ground MAX. Voltage: 4KV CAT III*Output Impedance 50Ω

Product

Flexible Implantable Microprobe

IT-18(10 FOOT)

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Physitemp Instruments

IT-18(10 FOOT) - Physitemp Instruments

IT-18(10 FOOT) Flexible Implantable Microprobe with 5 foot lead - Implantable in semi-solids and tissue with 18 gauge needle (supplied). Also for immersion in various solutions and rectal temperatures of small animals. Totally sheathed in chemical resistant Teflon™. Quited rugged. Maximum Temperature 150°C . Isolated. Probe diameter .050" (14 gauge represents the needle gauge that the probe can be inserted through). Time constant 0.3 seconds.

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Continuity Tester

TE6-0711

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Hangzhou Tonny Electric & Tools Co., Ltd.

TE6-0711 - Hangzhou Tonny Electric & Tools Co., Ltd.

*Designed to test circuits while power is off*2 AAA batteries included*Durable ABS housing*36" Test lead with insulated alligator clip*Sharp tip for probing circuits

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Probes

Pro-Series®

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ThermoWorks

Pro-Series® - ThermoWorks

Pro-Series High Temp Cooking Probe 6" Long probe with a right angle bend for easy pulling from meats or turkeys. Cable withstands 700°F to better withstand broiling and grilling temperatures. Probe tip and sensor read temperatures to 572°F for deep-frying. Good general-purpose probe, the length reaches the center of large roasts and turkeys.

Product

Temperature

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AOIP

AOIP

High accurate documenting field reference thermometer for thermocouples, resistive probes and thermistors with a high accuracy.

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Osprey Probe Card

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MPI Probe Card Technology

MPI Probe Card Technology

The Osprey probe card is MPI’s solution to demand for ever finer pitch. It is designed for smaller Al pad, and is ideal for tiny pitch application with peripheral and full array pattern. With precise alignment and better planarity control, Osprey can reach higher productivity by multi-DUT design.  The forming wire (FW) type needle produced with MPI’s own micro fabrication process not only delivers high-quality performance but also allows easy needle replacement and shortens maintaining cycle time.

Product

Probe Adapters

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Teledyne LeCroy

Teledyne LeCroy

Probe adapters provide simple and easy interface of third-party probes as well as change between the different Teledyne LeCroy Oscilloscope input and cable types (ProBus, ProLink, K/2.92 mm, BNC and SMA). Depending on the adapters, changing between the Teledyne LeCroy Oscilloscope's input type may have an effect on the overall performance of the channel.

Product

Clamp Meters, Clamp Multimeters

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HIOKI E.E. Corp

HIOKI E.E. Corp

Hioki provides a wide range of models for AC, DC, and leakage current measurement. The lineup also includes DC high-voltage probes for measuring the open-circuit voltage of high-voltage solar power (PV) systems. Models that can be easily inserted into narrow gaps between cables and transmit data to smartphones or tablets improve operational efficiency.