Visual Inspection
See Also: PCB Inspection
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Product
Macro Inspection
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High-throughput automated macro inspectionAny wafer size, in less than one second with ~75 micron resolutionSmall footprint table-top system
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Product
Scanning & Inspection
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API’s offers a range of portable measuring and laser scanning solutions together with robot or tripod mounted 3D structured light scanner.
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Product
Package Inspection Products
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Image quality. Speed. Uptime. They’re all crucial. Getting all three at the same time in a nondestructive testing (NDT) solution for package inspection is the challenge. It takes continuous innovation, advancing the state of the art to keep pace with the semiconductor industry’s own exponential progress.
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Product
Compact Inspection Camera
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Fits in your pocket or clips on your beltAffordable1 meter drop-proofLong, thin camera-tipped probe with excellent depth of field penetrates tight, hard-to-reach spacesProbe is waterproof, holds its configured shape, and coils inside clamshell case for storageFour camera-lighting LEDs produce bright, crisp video on large color LCDFour screen controlsFour useful probe tip accessories (pickup hook, magnetic pickup, 45 mirror, thread protector)
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Product
Baggage and Parcel Inspection
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Inspection of bags and parcels has to be effective, efficient, and meet the toughest regulatory requirements. Rapiscan® Systems products deliver on both levels.
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Product
Visual Designer For Arduino™
AVR And Raspberry Pi®
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Proteus Visual Designer combines world class Proteus VSM simulation with an easy to use flowchart editor and a gallery of virtual hardware to provide a truly integrated and intuitive development environment for Arduino and Raspberry Pi. The peripheral gallery makes hardware design easy. Simply add a shield or sensor from the gallery and Visual Designer will automatically place the correct circuitry on the Proteus schematic for you and add some simple methods to Visual Designer that allow you to control the hardware. The software is then designed as a flowchart so you can easily drag and drop these methods along with decisions, delays and assignments to drive the hardware. Compile and simulate at the press of the button, making use of our renowned simulation and debugging technology to watch your design come to life on screen.Finally, transfer to the physical hardware with a single mouse click and see it working first time in the real world.
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Product
Visual Fault Locator
FFL-310-U
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FFL-310-U Visual Fault Locator is equipped with a 650 nm high power visible laser diode,can be operated in -CW (continuous) or … MOD (1Hz modulation) mode. There is one LED indicator：with RED or GREEN light; the RED one shows the operating mode of the laser diode output signal, and the GREEN one indicates low battery level. FFL-310-U is designed in a card-size dimensions.
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Product
End Face Inspection Microscopes
D SCOPE EFI – D SCOPE EFI-C – D SCOPE EFI-C LWD
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The new D Scope EFI for MTP/MPO and multifibers field connectors is a cost effective microscope for inspecting fiber optic patchcords and cassettes.
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Product
Structural Adhesive Bead Inspection
Predator3D
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The Predator3D bead inspection technology measures bead height, width (volume) and position to assure structural integrity. It also alerts users to skips and partial skips, where material is deposited with insufficient volume.
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Product
Real-Time Visualization, Collaboration and Exploitation Tool
SeeGEO™
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Textron Systems' SeeGEO™ is a web-enabled platform with an architecture purpose built to solve problems across the spatial-temporal spectrum. Providing support for multi-modal data SeeGEO delivers a sophisticated toolset for exploitation packaged in a highly collaborative environment. With its user first design approach SeeGEO provides an experience that is unmatched in the industry that is coupled with best in class tools for visualizing and interacting with geospatial imagery and video.
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Product
In-line Inspection And Integrity Services
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The safety, integrity, and operating efficiency of your assets are at the core of what we do. Baker Hughes Process & Pipeline Services (PPS) unique portfolio of services helps you confidently manage the lifecycle of your pipeline—delivering timely and stress-free startup, supporting day-to-day reliability, and enabling controlled decommissioning.
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Product
X-Ray Inspection
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X-ray inspection systems are used wherever defects need to be detected by non-destructive means. The spectrum of use is broad and ranges from quality controls for complex assemblies, to the testing of materials for cracks and air inclusions, to foreign matter inclusions and shape deviations. The trend toward miniaturization, higher packing densities, and the relocation of components to the interior of the assembly require precise X-ray inspections that detect hidden defects quickly and reliably. X-ray systems from Viscom are used for the inspection of series assemblies as well as sampling and prototype controls. They take care of typical inspection tasks in concealed areas such as void controls, THT filling level measurements, and HIP inspections. At the same time, the systems reliably determine defect features such as coplanarity and polarity – at high inspection speeds and in a cost-effective way.
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Product
X-ray Inspection System
JewelBox-90T/100T/110T™
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All JewelBoxes deliver precision x-ray images of ultra-high resolution and grey scale accuracy without the aberrations of voltage blooming and image distortion prevalent in other systems.
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Product
Fiber End-Face Inspection Interferometer
CLEAVEMETER 3D
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The CLEAVEMETER 3D™ is a non-contact interferometer designed for inspecting the end-faces of cleaved or polished optical fibers with cladding diameters of 125 µm to 1200 µm. It gives immediate and precise information on important end-face properties such as flatness, perpendicularity, hackles and dust. Based on the NYFORS CLEAVEMETER 3D™ design, in addition to producing sharp fringe patterns it also generates three-dimensional images of the cleaved fiber end.
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Product
Visual IR Thermometers
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With just one button, simultaneously save a digital image with an infrared heat map overlay, instantly giving you the ability to communicate the exact location of problems and prove repairs need to be made. Fluke Visual IR Thermometers often pay for themselves by finding a single hidden issue.
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Product
3/4D Image Visualization and Analysis Software
Imaris
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Our latest release, Imaris 8.4, introduces a new and innovative approach to tracing neuron structures in 3D images. Torch™, a patent-pending tool which intuitively highlights structures in close proximity to the cursor while darkening the rest of the image, enables users to efficiently and accurately trace individual neurons within dense and thick samples. Improved depth visibility makes tracing in thick samples easier than ever before, allowing for the selection of a dynamic region of interest for tracing. All of this possible with terabyte-sized datasets.
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Product
Conformal Coating Inspection (CI AOI)
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They cover the components, the area around the components and identify most coating issues including cracks, bubbles, insufficient / excess coating, loss of adhesion and other common contaminations. Full coverage inspection for conformal coating.
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Product
Real-time X-ray Medical Device Inspection System
The Bench-X
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Our latest real-time, compact system used for Medical Device X-ray Inspection. Very configurable and compact with high resolution at relatively low radiation levels.
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Product
Semiconductor Wafer Defect Inspection Management Software
ProcessGuard
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Microtronic ProcessGUARD Software is the desktop client for the EagleView auto macro wafer defect inspection system. ProcessGUARD is a high volume, high speed semiconductor wafer defect inspection management solution that provides an easy-to-use, customizable and extensible platform and interface to automate your fabs defect inspection process. ProcessGUARD is feature rich (see below) and its newest releases include complete wafer randomization software, a user-defined defect library, and an integrated trainer and knowledge base.
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Product
PCB Assembly Inspection
a3Di
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a3Di is a revolutionary new technology designed to provide accurate, repeatable and fast PCB inspection. The cost saving potential to your business is significant, reducing your overall product inspection costs, increasing your product throughput rates and reducing customer returns.
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Product
Fiber Visual Fault Locator
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Fiber visual fault locator is a pen type device which is able to locate the breakpoint, bending or cracking of the fiber glass,this small fiber optic equipment can locate the fault of OTDR dead zone and make fiber iIdentification from one end to the other end .
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Product
Vacuum Inspection
INDEC
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INDEC vacuum test systems monitor a wide range of containers during the production process, including bottles, jars and cans, by measuring the cap panel concavity of their closures which is dependent on the vacuum inside. This non-contact inspection reliably identifies defective containers for automatic rejection.
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Product
Terahertz Imager for Material Inspection
T-SENSE FMI
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This highly efficient technology is based on the most recent research results. Production can be monitored and controlled at various levels. T-SENSE FMI uses millimeter waves in the lower terahertz range with no health risks involved. This means that the equipment can be used anywhere and for several purposes without the need for radiation protection.
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Product
Wafer Inspection System
AutoWafer Pro™
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AutoWafer pro is our most advanced ultrasonic equipment for detecting defects in bonded wafers in a production environment, providing fast, high-resolution scanning of 200mm and 300mm bonded wafers.
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Product
Inspection Microscope
Z-NIR
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The McBain Z-NIR Near Infrared Inspection System is best-in-class for wafer-to-wafer and die-to-die alignment measurement and verification. This unique tool has been sold into many industries with various applications including sub-surface wafer and die inspection for cracks and bond integrity, MEMS, wafer bonding, 3-D chip stacking, failure analysis, process development, tool verification, part characterization, environmental testing and more.
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Product
Chip Inspection System
GEN3000T
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GEN3000T is an inspection system that performs automatic inspection of individual semiconductor chips.This revolutionary chip surface inspection system was achieved by combining the chip handling technology cultivated by Toray with the inspection algorithm used in the "INSPECTRA®" wafer defect inspection system.
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Product
Thickness and Flaw Inspection
NORTEC 600
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Olympus converges its latest advancements in high-performance digital circuitry and eddy current flaw detection into one compact and durable portable unit—the new NORTEC® 600. With its crisp and vivid 5.7 inch VGA display and true full-screen mode, the NORTEC 600 is capable of producing highly visible and contrasting eddy current signals in any lighting condition.
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Product
Non-Destructive Inspection Equipment
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Non-destructive inspection means that various materials such as metal are "without damaging the object, knowing the presence or absence of scratches on the surface or inside and the degree of scratches, and passing the object against standards such as standards.
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Product
Entry-level X-ray Inspection System
X-eye 5100 Series
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100kV ~ 130kV Micro-focus Closed tube and high-definition Flat Panel Detector are installed and high-resolution image can be gained.Customer convenience is primarily considered in operation and maintenance of the product.Customization is available because it is specially designed to be add up any necessary functions depends on customer needs with reasonable prices.
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Product
3D Automated Optical Inspection Systems
New 3Di Series
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To handle today’s rapidly changing market trends, the system can handle complex inspection challenges such as high component mounting density areas containing highly miniaturized parts placed near much larger and taller component. With our new 3D AOI system, you can strengthen quality assurance and increase production efficiency.
