System Test
Testing conducted on a complete, integrated system to evaluate the system's compliance with its specified requirements .
See Also: Systems, Equipment, Test Systems, System Integrators
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PCI High Density Resistor Card 6-Channel, 24-Bit, 0 To 16M Ohm
50-295A-121-6/24
The 50-295A is a Programmable Resistor card with up to 18-channels of 8-bit resolution resistor chains in a single PCI slot. The flexible architecture allows the card to also be supplied as 12-bit, 16-bit or 24-bit resolution versions for applications requiring finer resolution, greater resistance range or higher channel count. The card is ideal for simulating the sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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System Instruments
bsw TestSystems & Consulting AG
Many tasks in the area of semiconductor characterization as well as in the testing of electronic assemblies are routine tasks. Test series of new building elements or samples from production are routinely measured in a large number of electrical parameters. For this, you do not need a measuring device with a complex graphical user interface. A simple interface for remote control with a PC is sufficient. The evaluation and visualization of the results is also carried out on the PC. With the Keysight E5270B and its "little brother" the E5260A two powerful modular SMU units are available for the purpose of the integration into automatic test systems.
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Power Module And Device Testing System
Dynamic and static test system Meet the power IPM module dynamic and static electrical parameters test
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OLED Lifetime Test System
58131
The 58131 Lifetime Test System is designed specifically for the OLED industry. Model 58131 provides twoquadrant constant current (CC) and constant voltage (CV) stimulus to each OLED panel and acquires electrical and optical characteristics automatically. Two independent and isolated precision source-and-measure units (PMU) are incorporated in one modular card, which is capable of testing two OLED panels. Additional instrument cards are added to expand test capacity. Hot plug and play is a key feature of 58131. When a UUT fails or an instrument card needs to be replaced, 58131 does not have to be shutdown and testing continues for other UUTs. Hot plug and play obviates life test cycle restarts due to isolated faults and significantly improves life test efficiency. We firmly believe that hot plug and play capability should be mandatory for all lifetime test systems.
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Systems Integration (SIL) Lab Data Acquisition
Bloomy’s SIL data system allows testing and simulation of every system component on the aircraft. The functionality of these complex integrated systems are fully tested, debugged, and verified safely in the lab prior to flight testing. This reduces cost and schedule for new aircraft. Bloomy has applied its expertise to multiple SILs.
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Flying Probe Testers
Flying probe test systems require no test fixturing, have few restrictions on board access, and can test boards with virtually unlimited number of nets. These systems also allow developers to complete test programs in a short time.
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Impulse-Calibration-System
KAL1000 Series
The impulse calibration system KAL1000 is a modular system to perform tests on complete impulse voltage measuring systems and on digital recorders for the measurement of high impulse voltages and impulse currents. The modular design allows an optimal KAL-configuration depending on the actual application.Additional, this modularity allows to up-grade or modify and existing KAL1000 system in case of changing or additional requirements
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Battery Test Software
Landt Battery Test Systems use different programs for data acquiring and data process. The acquiring software comes with a very user-friendly interface, which allows new users to operate with minimal training. Data process software shows different kinds of plots (Voltage vs. Capacity, Capacity vs. Cycle Number, Efficiency, etc.), which can be easily exported.
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Test Management Software
ActivATE™
Easily create and run robust test programs in semiconductor automated test systems with ActivATE™ test management software. Designed by test engineers for test engineers, ActivATE™ tames automated test complexities with elegant simplicity.
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PXI 2.5W Programmable Resistor Module, 8-Channel, 1Ω to 31.5Ω
40-251-010
The 40-251-010 is a programmable resistor module with 8 channels which can be set between 1Ω and 31.5Ω with 0.125Ω resolution The 40-251 range provides a simple solution for applications requiring up to 2.5W of power handling per channel. The 40-251 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. Each channel is able to simulate short or open circuit conditions that can be experienced in a system caused by faulty wiring or sensors.
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PXI 40Amp 14Volt 2xSPST Automotive Relay
40-180-001
Models 40-180/181 are High Power Relay Modules available with 2 SPST, 4 SPST or 2 SPDT contacts. They are capable of switching inductive/capacitive loads up to 40A at 14VDC or 20A at 28VDCThe 40-180/181 High Power Relay Modules are suitable for switching heavy loads or for slaving large external relays, contactors and solenoids. In particular these relay modules are designed for automotive test applications requiring the switching of D.C. voltage at high current. The 28V version is suitable for truck system test applications.
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Hydrostatic Testers
Hydraulic Technology Inc. has been manufacturing hydrostatic test equipment to the U.S. Military, aerospace and industrial sectors for over 30 years. These hydrostatic test systems are used for both high pressure proof testing and burst hydrostatic testing. By simply connecting one of our hydrostatic test systems to a shop air supply, safe high pressure testing can be accomplished with hydrostatic test output pressures available up to 15,000 psi. Among other specifications, our hydrostatic testers meet the requirements of MIL-T-25456, A-A-52687 AND PD02LEEE07. In addition to U.S. Military stock listed hydrostatic testers, we manufacture both standard and custom hose proof test stands, portable hydrostatic testers, hydrostatic test chambers and ancillary equipment to fit individual customers’ needs as required. We can typically ship standard units within 24-72 hours, sooner if required.
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HPx-310 Radar Signal Output Card
The HPx-310 Radar Signal Output card is a replacement for the HPx-300, form, fit, and function. It generates representative radar signals for system testing, simulation, training or radar video streaming. Under software control, the card generates radar video, trigger and azimuth signals similar to those generated by real radars.
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Bench top Dielectric Withstand tester
HYPOT III
RS-232 Interface available for automated controlPatented SmartGFI® functionPatented CAL-ALERT® functionComes complete with a test box for products terminated in a line cordPatented VERI-CHEK® functionStorage of up to 10 setups with 3 steps per setupBuilt-in security settingsDigitally controlled arc detection systemNo load setup of trip current and output voltageElectronic ramping (up & down)Built-in adjustable continuity testInterconnection to HYAMP® III to form complete test system
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PXI Very High Density Versatile 2 A Multiplexer
40-612B-002
The 40-612B (PXI) and 42-612B (PXIe) Very High Density Versatile Multiplexer module features a wide range of software selectable switching configurations. It is especially useful where a number of high density multiplexers are required with the option of easily altering the channel count as a test system evolves.
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SLT Socket
Mobile Phone, Tablet, TV Board, Set-top box etc.LEENO can provide a System Level Test solution on various types of packages.
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Services
Being a system developer as well as a system integrator we offer an entire service portfolio. Wherever you have a problem - we have the specialist in our team. We gladly make a feasibility study for a new product, write test specifications or later test applications.Our colleagues are happy to check or calibrate your test system, expand or optimize your test specification, manage the move to another site or train new personnel. In case you plan to build a new factory, our experience might be helpful tp plan of the new test field.
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Wafer Probe Test System
STI3000
The STI3000 is a wafer-level MEMS and mixed signal ASIC probe test system that combines several functional STI test equipment blocks for testing gyros, accelerometers, pressure sensors, microphones, resonators, and mixed signal ASICs.
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GPIB-ENET/1000, Ethernet GPIB Instrument Control Device
781630-07
Ethernet GPIB Instrument Control Device - The GPIB‑ENET/1000 is an IEEE 488 controller device for computers with an Ethernet port. You can use this device to share a single GPIB system among many networked users or to control several test systems from a single networked host. The GPIB‑ENET/1000 features a password-protected web interface for easy configuration. It can also control IEEE 488 devices from anywhere on an Ethernet‑based (LAN) TCP/IP network (Gigabit, 100BASE‑TX, 10BASE‑T). Each device interfaces to and shares up to 14 GPIB devices from several network hosts, and you can control up to 100 GPIB‑ENET/1000 interfaces with a single computer. The device includes a license for the NI‑488.2 driver software, providing maximum reliability for connecting to third-party instruments with GPIB.
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Multi Channel Optical Fibre Verification
The multi-channel optical fibre test system is used in the development and qualification of single mode optical fibres. The fibres are exposed to environmental influences in a climatic chamber in order to analyse the data on insertion loss and reflection. In addition, the current temperature in the climatic chamber is documented. Insertion loss measurement is performed with the help of an optical power meter, laser sources and optical switches. An Optical Time Domain Reflectometer (OTDR) from Exfo is used for the reflection measurements. The system was designed for the simultaneous characterization of 15 sample fibres and one reference fibre.
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Digital LCR Meter
Changzhou Applent Instruments Inc.
Can be used for quality control on production line, incoming inspection of components and automatic test system.
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PCI High Density Pecision Resistor Card, 18-Channel, 2Ω To 239Ω
50-298-013
The 50-298-013 is a high density programmable resistor card with 18 channels which can be set between 2Ω and 239Ω with 1Ω resolution The 50-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Cleanliness Test Systems
CM Series
The Contaminometer (CM Series) test systems were originally developed by Protonique, the business of industry guru Brian Ellis. They also featured in the early development programmes of "cleanliness measurement" carried out by the US Department of Defense at China Lake in the 1970s.
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Modular Hydrostatic Test System
Our modular hydrostatic test chambers are designed with open ends to accommodate the connection to similar units for the purpose of lengthening the enclosed test area. The modular test system starts with a base unit with complete pump system, gauges and controls mounted on the 60” x 24” x 18” test chamber. If longer test lengths are required, simply add another test chamber to double, triple or quadruple the test length area. Specify your particular requirements at our Customization Page.
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PCI Precision Resistor Card 3-Channel, 3Ω To 1.51MΩ
50-297-150
The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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NI-9222 , ±10 V, 500 kS/s/ch, 16-Bit, Simultaneous Input, 4-Channel C Series Voltage Input Module
781397-01
±10 V, 500 kS/s/ch, 16-Bit, Simultaneous Input, 4-Channel C Series Voltage Input Module - The NI‑9222 performs differential analog input. This module is well suited for applications such as ballistics, impact, and blast wave testing. The NI‑9222 can sample at the maximum sample rate per channel while the module next to it samples at a much slower rate, which is ideal for mixed-measurement test systems. There are two connector options for the NI‑9222: a 10‑position screw terminal or a 25‑pin D‑SUB connector.
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Test Program Execution for High-Volume Production Systems
ScanExpress Runner Gang
Electronic manufacturing test systems must be fast and efficient. Schedules today are shorter, products are more complex, and the market demands higher speed—the product needs to be built and shipped yesterday.ScanExpress Runner Gang Edition is a concurrent boundary-scan and in-system programming test executive designed specifically for high volume production. Unlike traditional test systems which execute sequentially on a single unit under test (UUT) at a time, ScanExpress Runner Gang Edition provides concurrent (gang) testing on up to 8 UUTs for improved test and programming times.
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PCIe® Gen5 NVMe SBExpress Test System
SBExpress-RM5
The SANBlaze SBExpress-RM5 is a complete turnkey PCIe® Gen5 NVMe SSD Drive validation test system. The SBExpress-RM5 feature set provides unique functions applicable to all aspects of a product lifecycle, from development and QA, to design validation and manufacturing test cycles. The ability to drive Gen5 NVMe SSDs with a wide range of configurable attributes provides engineers with a flexible, multi-controller supported validation test platform. Development, qualification, and certification test cycles can be highly automated, thus reducing overall test time, and rapidly surfacing errors and non-conformance.The SANBlaze SBExpress-RM5 hardware provides a rackmount chassis with sixteen dual or single port front-accessible drives.
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PXI Precision Resistor Module 9-Channel, 1.5 to 3.55k
40-297-023
This 9-channel PXI Precision Resistor Module provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-297 series is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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PXI-2533 , 256-Crosspoint, 1-Wire PXI Matrix Switch Module
778572-33
256-Crosspoint, 1-Wire PXI Matrix Switch Module—The PXI‑2533 is a high-density 4x64 PXI matrix switch module built to serve high‑channel‑count automated test systems. Featuring solid-state relays (SSRs), the PXI‑2533 offers unlimited mechanical lifetime and the ability to route 55 W simultaneously on all channels. It also features onboard relay counting for relay monitoring and deterministic operation with hardware triggers to improve test throughput.
