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System Test
Testing conducted on a complete, integrated system to evaluate the system's compliance with its specified requirements .
See Also: Systems, Equipment, Test Systems, System Integrators
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Missile Warning System Test Set
Baringa™ IR/UV
Baringa™ is a handheld, ruggedized aircraft survivability test set used to stimulate the electro-optic sensor suites on various aircraft platforms. Available in ultraviolet (UV) as well as one-color or two-color infrared (IR), Baringa simulates dynamic multi-engagement profiles and is easily reprogrammable to meet user testing needs.
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Electro-Optical System Test Bench
IRCOL
Optical collimators and universal electro-optical test benches.
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eBIRST™ – Switching System Test Tools
The eBIRST toolset consists of four different tools that support 200-pin LFH, 104-pin, 78-pin and 50-pin D-type connectors and a set of adaptors that allow connection to other connector types. A supplied application program controls the eBIRST tools via a USB2 port that also provides the tool power and controls the switching system using a Test Definition File to define the test sequence.
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System Test
Testing a complete system is very different from unit and integration test. It starts with the V model that defines the system requirements, and this needs an effective system test capability that includes both the system and the environment around it. If the system has interfaces to the outside world, communications links or human control, these interfaces have to be tested.
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Switching System Test Tools
eBIRST
The eBIRST toolset consists of three different tools that support 200-pin LFH, 78-pin and 50-pin connectors and a set of adaptors that allow connection to other connector types. A supplied application program controls the eBIRST tools via a USB2 port that also provides the tool power and controls the switching system using a Test Definition File to define the test sequence. These tools work by measuring the path resistance at the switching system external connectors using four-wire measurements, quickly establishing whether the path is good, has increased resistance or has failed. Below are links to various eBIRST tool information:
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In-Line Test System
With an Averna in-line test system, clients boost production/yields, catch defects invisible to the human eye, reduce equipment downtime, and ensure repeatable results.
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Semiconductor Test System
TS-960e
The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
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Modular Test System
IMU-MGE
Modular test system with colour touch screen and intuitive software. An integrated help with graphics guide the user through fast and efficient setup and operation. The system is used for CE mark testing in the European Union. Each system can be individually configured and easily extended.
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High Impact Shock Test System
KRD16 series
High impact shock test system meets MIL-S-901D standard which covers shock testing requirements for ship board machinery, equipment, systems, and structures, excluding submarine pressure hull penetrations. The purpose of these requirements is to verify the ability of shipboard installations to withstand shock loadings which may be incurred during wartime service due to the effects of nuclear or conventional weapons.
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Rotary Table Test system
The requirement was to develop a test system that can take very different test and programming times into account so that the hardware used can be used in the best possible way.
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High & Low Temperature Impact System for ATF Cooling Motor
EVTP-30
Shanghai Dean Electrical Co., Ltd
This test system provides the most direct life evaluation of ATF cooling based EV motor by simulating the temperature impact from ultimate self- heating of the motor and severe cold condition from environment.
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Doppler Radar Target Simulators
Automotive radar sensors play a vital role in the current development of autonomous driving. Their ability to detect objects even under adverse conditions makes them indispensable for environment-sensing tasks in autonomous vehicles. As their functional operation must be validated in-place, a fully integrated test system is required. Radar Target Simulators (RTS) are capable of executing end-of-line, over-the-air validation tests by looping back a received and afterward modified radar signal and have been incorporated into existing Vehicle-in-the-Loop (ViL) test beds before. However, the currently available ViL test beds and the RTS systems that they consist of lack the ability to generate authentic radar echoes with respect to their complexity. The paper at hand reviews the current development stage of the research as well as commercial ViL and RTS systems. Furthermore, the concept and implementation of a new test setup for the rapid prototyping and validation of ADAS functions is presented. This represents the first-ever integrated radar validation test system to comprise multiple angle-resolved radar target channels, each capable of generating multiple radar echoes. A measurement campaign that supports this claim has been conducted.
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Charge Plate Monitors
Our easy-to-use charge plate monitors allow you to accurately evaluate air ionization systems used to neutralize static charge accumulation. Benefit from our economical solutions and products that offer onboard data storage to automate ionization system testing.
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Automated Test Interface
ATI-100
Matrix Test Equipment Incorporated
Now, with our ?New? Model ATI-100 you can turn your existing Matrix Signal Generator and Switchable Filter Bank into a full-blown DTS (Distortion Test System). Plug and play is the word, just plug in your Multiple Frequency Signal Generator, Switchable Filter Bank, Spectrum Analyzer, Oscilloscope, Power Meter, Frequency Counter, etc. to allow the following automatic testing with a single insertion of DUT (device under test
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PCI High Density Pecision Resistor Card, 3-Channel, 3.5Ω To 102kΩ
50-298-140
The 50-298-140 is a high density programmable resistor card with 3 channels which can be set between 3.5Ω and 102kΩ with 0.125Ω resolution The 50-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Mechanical Shock Machines
SD Series
The need for products to survive various shock levels in an operating environment requires in-house testing of products during design and evaluation stages. L.A.B. Equipment, Inc.''s SD-series of mechanical free-fall test systems produces accurate and repeatable half-sine, squarewave and sawtooth pulses in accordance with military and industry specifications.
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Wireless Device Test
New wireless standards, in addition to rising wireless usage, are increasing wireless device complexity while lowering price expectations. To counter rising costs, manufacturers require test systems optimized for efficiency.
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PCI Precision Resistor Card 9-Channel
50-297-030
The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Test Cell Controller
RAPID
The Rapid II Test Cell Controller is an integrated, multi-loop control and data acquisition system for test cell applications, designed to provide maximum performance at an affordable price. Rapid II combines the latest in digital control technology with off-the-shelf hardware to produce one of the industry's most powerful, flexible and advanced controllers at a cost-effective price. This high-speed, 4-channel PID controller includes ample I/O to act both as a system controller and a data acquisition system, reducing overall system cost and complexity. Designed for integrators, OEMs, and DIYers, these systems can be configured to fit your needs with little upfront costs and minimal risk while benefiting from a stable, powerful platform.
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In-Circuit Test System Repairs
Forwessun provides expert repair services for a wide range of Test Systems, helping you maintain optimal performance and extend the life of your equipment. Our team of skilled technicians quickly identifies and addresses issues, ensuring that your system is back in operation with minimal downtime. We handle both routine and complex repairs, offering comprehensive solutions to keep your systems running efficiently and reliably.
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TestStation Product Family
TestStation In-Circuit Test Systems provide full structural and functional coverage for a wide-range of manufacturing, component, process, and performance for high-performance analog, digital, and mixed-signal devices used on modern PCBs.
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Incircuit and Functional Test Systems
REINHARDT System- und Messelectronic GmbH
We offer test systems which vary in their expansion and can be used for different ranges of automatic testing.
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Build-to-Print for Test Systems
Built-to-print / test system replication addresses your internal capacity and capability constraints. Ball Systems has perfected quoting, procurement, planning, assembly, testing, quality, delivery and installation to ensure your testers are on-time and on-budget, and meet design and production standards while keeping open and transparent communication.
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HPx-310 Radar Signal Output Card
The HPx-310 Radar Signal Output card is a replacement for the HPx-300, form, fit, and function. It generates representative radar signals for system testing, simulation, training or radar video streaming. Under software control, the card generates radar video, trigger and azimuth signals similar to those generated by real radars.
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PCI Programmable Resistor Card 4-Channel 2 Ohm To 255 Ohm - SPST
50-294-113
The 50-294 series of PCI Programmable Resistor cards are available with two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single card. These cards are ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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Switching System Test Tools
EBIRST™
Switching systems are an important part of many test systems, however, the switching system is in a vulnerable place. When accidents happen that can cause a faulty device, you need a way to get the system up and running again with a minimum of effort and operator skills.
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Sequence Application Manager
AMFAX SAM
We have been building test systems for many years, as a result we find that many of the requirements our customers are looking for are very similar. This may be how a user logs in to the test system or the generation of test reports for example.
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Wide Range High Voltage Programmable DC Power Supply
N3600 Series
Next Generation Instrumental (Shanghai) T&C Tech. Co., Ltd.
N3600 series is developed based on NGI's years of experience in testing for battery fluctuation simulation test, battery charger, high voltage diode, electrolytic capacitor, electromechanical control, ATE test system, etc. It is a high-voltage wide-range programmable DC power supply. According to different test environments in the fields of lab test, system integration test, and mass production line, NGI has made a number of optimization designs based on the international advanced technology. N3600 series is a market leader in similar products in terms of reliability, maintainability and safety.
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Three-phase Fully Automatic Test System
TS33
Calmet Smart Calibration Devices
The Calmet TS33 portable test system consists of a three-phase reference meter of accuracy class 0.02%, 0.04% or 0.1% and an integrated three-phase current and voltage source up to 3x120A/600V. The TS33 is designed for analysis of complete metering installations and local mains conditions.
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Test Database Software Module
The relational test database is the pivotal point of the software structure. On one hand, this is where the test applications and test systems used for productive testing are stored; on the other hand, it provides the storage space for all DUT-related test data. Depending on customer requirements, the test database may either be hosted locally on the test system or centrally on a server, supporting several test systems. The database performance is sufficient for a high-volume production environment with many test systems which access the central database in parallel. LXinstruments prefers to implement the database as a license-free MySQL database; it is however also possible to realize a version based on Microsoft SQL.
