Focused Ion Beam
A scanning electron microscope with the electron source replaced by a gallium ion gun. Used for fault analysis and modification of modern microchips and semiconductor devices. (http://www.empa.ch)
See Also: Beam
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Ion 700 Benchtop Meters
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Oakton benchtop 700-series meters are designed for use in crowded laboratory settings. Compact footprint of less that 6" x 7" (16 x 18 cm) conserves valuable space, while the large, dual-display LCD provides excellent visibility—even from a distance. Ion 700 meter measures pH, mV, relative mV, ion concentration and temperature. Automatic temperature compensation (ATC) maintains reading accuracy even with fluctuating temperatures. Models feature five-point pH calibration with automatic buffer recognition for both USA (pH 1.68, 4.01, 7.00, 10.01, 12.45) and NIST (pH 1.68, 4.01, 6.86, 9.18, 12.45) pH buffers. Meters additionally feature ion concentration calibration of up to 5 points. Meter features include Auto-Hold, selectable °F or °C measurement, and easy recall of electrode slope or offset. The convenient pull-out quick reference card keeps procedures handy at all times. Use 700-series meters with any pH, ORP, or ISE electrodes with a BNC connector.
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Product
50% Beam Splitter
10725A
Beam Splitter
The 10725A 50% beam splitter, designed for beam diameters of 9 mm or less, divides the beam into equal parts. It transmits one part straight through, and bends the other part at a 90-degree angle. This optic is without housing and requires a user-supplied mount.
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Shear Beam Force Sensors For Pull/push Direction
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INELTA Sensorsysteme GmbH & Co. KG
Inelta Force Sensors operate with foil strain gauges
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Intex Beam Gauge & Standard Contacts
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Developed to measure both internal and external diameters and lengths, the Intex gauge's aluminium extrusion beam gives it a rigid yet lightweight quality, making it ideal for shop-floor environments. The simple release of a locking thumbscrew enables the gauge's measuring direction to be changed quickly and easily.
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Multiple Light Beam Safety Devices
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Leuze electronic GmbH + Co. KG
The multiple light beam safety devices of the MLD 300 (type 2) and MLD 500 (type 4) series are used for access guarding at machines and systems. The devices are available as 2-, 3- and 4-beam transmitter-receiver systems for large operating ranges up to 70 m and as cost-efficient 2- and 3-beam transceiver systems for operating ranges up to 8 m.
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Camera Based Beam Propagation Analyzer: M2
BeamSquared
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The BeamSquared® system is a compact and fully automated tool for measuring the propagation characteristics of CW and pulsed laser systems from the UV to NIR to Telecom wavelengths. Users can also measure wavelengths above 1.8 microns, including CO2 and terahertz in manual mode (a bench set-up; without the automated optical train) with a Pyrocam IV or IIIHR. Our longer optical train and patented Ultracal™ Calibration makes BeamSquared the most accurate product on the market and is ISO 11146 compliant. Its operational robustness and reliability ensures continuous use applications in industry, science, research and development.
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Neutrals, Radicals and Ions Analysis
HPR-60 MBMS
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The Hiden HPR-60 molecular beam mass spectrometer is a compact skimmer inlet MS for the analysis of atmospheric plasma and reactive gas phase intermediates.
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Scanning Slit Beam Profilers
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DataRay manufactures two types of scanning slit beam profilers: the patented BeamMap series, which offers real-time M², divergence, focus and alignment management, and the Beam’R series which provides affordable, compact, and precise beam profiling. All of our scanning slit beam profilers are available with Si, Ge, and InGaAs detectors, covering wavelengths from 190 nm to 2500 nm.
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Nitrate Ion and Nitrate-Nitrogen Concentrations Pocket Water Meter
LAQUAtwin NO3-11C/NO3-11S/NO3-11
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The only pocket meter that directly measures nitrate ion and nirate-nitrogen concentrations in 0.3ml sample (or 0.05ml sample with sampling sheet B). Unique sensor allows measurement of viscous liquids, solids, and even powder samples. No need for a beaker to calibrate your meter or measure a sample. Just place few drops of the standard or sample onto the flat sensor. This procedure saves you time and prevents wasting your precious sample.
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Ion Chromatography
Metrohm IC Driver 2.1 for Empower®
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Software drivers for integrating Metrohm IC instruments in "Empower® 3" made by Waters. One license per computer authorizes the operation of IC systems under "Empower® 3".
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Beam Geometry & Alignment Testing
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Perform quality control testing of your Digital Radiography (DR), Computed Radiography (CR) and Fluoroscopy X-ray systems with ease. Comply with local, state, federal, and governing bodies for digital and traditional analog radiographic imaging technologies.
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Ar Gas Cluster Ion Source
GCIS
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The Kratos Ar Gas Cluster Ion Source (GCIS) is optimised for depth profiling organic materials in Arn+ cluster mode and inorganic materials in Ar+ monomer mode, dependent on the operating parameters defined by the user and the type of material to be profiled. In Arn+ ion cluster mode the ions can be accelerated up to a maximum of 20 keV. This enables the successful sputter depth profiling of the widest range of polymer materials to be undertaken. However, Arn+ cluster depth profiling has been shown to give very low sputter yields for inorganic materials. In order to retain the capability of generating depth profiles from this class of materials this ion source can also be operated in the more conventional Ar monomer (Ar+) mode.
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Waterproof pH/mV/Ion Meter
CyberScan pH 620
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Measures pH and Ion with up to 0.001 Resolution.Cal-Due Alarm Prevents Out-dated Calibrations, while Set-Point Alarms warns when readings are outside set-point limits.
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Field-installation Type Simplified Fluoride Ion Concentration Meter(Four-Wire Transmission)
HC-200F
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HC-200F is connected to a fluoride ion electrode (1009) to detect free fluoride ions in the sample water.(Total fluorine is not detected.) It is suitable for fluoride ion monitoring in effluent from factories, e.g., those of semiconductor FPD and glass manufacturers.
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Force Sensors, Load Cells, Shear Beam
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INELTA Sensorsysteme GmbH & Co. KG
Exact force measurement and weight measurement
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Deep Reactive Ion Etch (DRIE
Syndion Product Family
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Deep silicon etch refers to plasma-based processes that remove silicon, creating features that can be many orders of magnitude larger than those in advanced transistors and memory cells.
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UV-Vis Double Beam Research Spectrophotometer
UVD-3500
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The high- performance blazed holographic grating and the optimized CT-type Monochromator reduce stray light, and widen the photometric range. Wavelength range: 190 nm – 900 nm. Spectral bandwidth: 0.1, 0.2, 0.5nm, 1.0nm, 2.0nm, and 5.0 nm.(UVD-3500).
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Product
Benchtop Ion Meters
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Benchtop Ion Meters for Cl (chloride), F (fluoride), Na (sodium), Ca (calcium), Br, (bromide), NH4 (ammonium), NH3 (ammonia), Cn (cyanide), Ag (silver), K (potassium), S (sulphide), Pb (lead), I (iodide), Cu (copper), Cd (cadmium)
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Product
Economical Bending Beam Load Cells
EBB SERIES
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The EBB Series is a economical low capacity bending beam load cell suitable for use in a variety of industrial and OEM force measurement and weighing applications. It is made of an aluminum alloy and comes in 1, 2, 5 and 10 kilogram ranges.
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Product
Beam Directional Power Supply Mains 60 To 180 kV
SiteX D1802
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Our SITEX and SITEXS are capable of the direct and accurate measurement of high voltage. This essential information enables the control system to guarantee the stability and reproducibility of the radiological parameters based on true high voltage, ensuring extremely precise measurements-based utilization.
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Waterproof pH/mV/Ion/ Conductivity/TDS/ Resistivity/SalinityHandheld Meter
CyberScan PC 650
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Combining two of the most popular electrochemistry parameters, the Eutech’s CyberScan PC650 allows you to measure pH, conductivity and temperature with one handheld, at the same time.
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Economical Single Point Bending Beam Load Cells
ESP SERIES
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The ESP Series is a economical, high accurate single point bending beam load cell. It is ideal for OEM applications such as electronic scales and weighing machines. The single point bending beam design is highly resistant to eccentric loading allowing direct mounting to the scale base and weighing platform. The ESP Series features a moisture proof sealant.
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Electron Beam Lithography System
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Spot type Electron Beam Lithography System JBX-8100FS achieved high throughput, small footprint and electric power saving.
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Digital Laser Beam Analyzer
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ScienceGL offers economic laser beam profiling solutions for laser beam measurement, diagnostics and analysis. The Digital Laser Beam Profiler allows you to analyze laser output quickly and accurately at fraction of the market price. The profiler utilizes our advanced computer graphics engine for best visual perception of the beam in 3D realistic representation. Traditional 2D plot colored by the look up table (LUT) is also available.
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Shear Beam Load Cell
SB-1.0
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The Shear Beam Load Cell SB-1.0 is a single point weighing device, suitable for use in multiple applications.
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Product
Spectro UV-Vis Double Beam PC Scanning Spectrophotometer
UVD-2950
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Spectro UV-Vis Double PC is a high performance UV-Vis double beam automatic scanning spectrophotometer. Spectro UV-Vis Double has a brand new optical system design, microcomputer controlled. It is capable of processing data, from analytical and spectrum testing. Precise with high accuracy of measurement and stability are also provided by the powerful built in software and large LCD screen, which can display the screen menu and other functions. It can also be linked to a computer and a printer to show Photometric and Spectral data in the PC monitor.
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Beam Profiling System
BeamCheck
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BeamCheck is an integrated laser measurement system designed to measure critical laser beam parameters for laser-based additive manufacturing systems BeamCheck includes a CCD camera for spatial measurements and a NIST-traceable power sensor that will provide a complete analysis of the laser power density profile.
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Beam Panoramic Power Supply Battery Crawler 40 to 160 kV
CP160CR
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Designed to fit into 6” pipelines and higher, the CP160CR constant potential X-Ray generator for crawlers is – in its category – the most powerful panoramic X-Ray tube head in the world for crawlers. The generator is making the cutting edge constant potential technology of the CPSERIES even more compact into a 9.9 kg – 120 mm diameter X-Ray tube head. The crawler unit is capable of penetrating up to 28 mm of steel in 10 minutes, which corresponds to just a 25 second exposure time for 6” standard pipeline welds.
