Focused Ion Beam
A scanning electron microscope with the electron source replaced by a gallium ion gun. Used for fault analysis and modification of modern microchips and semiconductor devices. (http://www.empa.ch)
See Also: Beam
-
Product
Beam Lead PIN Diodes
-
The SemiGen SBL 2000 series Beam Lead PIN Diodes feature fast switching speeds at both low capacitance and resistance. Beam Lead PIN Diodes have high levels of mechanical strength and stability during assembly. These diodes are suitable for microstrip or stripline circuits as well as circuits requiring high isolation from a series of mounted diodes such as multi-throw switches, phase shifters, attenuators and modulators.
-
Product
Beam Pattern Measurement System
BP100
-
The BP100 is purpose-made for luminous intensity measurement of lamps, using a diffusely transmitting screen to provide a flat image that can be measured by an imaging photometer. This is a low cost, versatile solution in comparison to the traditional method of measuring lamp properties as a function of angle of emission, using Goniometers that are often costly and dedicated for one specific measurement.
-
Product
Shear Beam LoadCells
-
Shear Beam LoadCells are designed for low profile scales and process applications. These loadcells should be mounted on a smooth flat surface using high strength hardend bolts. The mountaing holes are at the opposite end to where the cell is loaded. Some of the larger Shear Beam Loadcells use multiple mounting holes to allow extra bolts to hold them in place and keep them from stretching under the stress.
-
Product
Ion Sources
-
Veeco offers the most comprehensive array of ion beam sources for a broad range of applications, including the industry's only Linear gridded sources.
-
Product
Beam and Singlepoint Load Cells
-
We have trimmed all the non-essential fat off these load cells, however you can be sure that nothing has been trimmed from the actual load cells, they are precision tested and certified to meet all the exacting requirements on the downloadable technical specifications shown below.
-
-
Product
Nitrate Ion and Nitrate-Nitrogen Concentrations Pocket Water Meter
LAQUAtwin NO3-11C/NO3-11S/NO3-11
-
The only pocket meter that directly measures nitrate ion and nirate-nitrogen concentrations in 0.3ml sample (or 0.05ml sample with sampling sheet B). Unique sensor allows measurement of viscous liquids, solids, and even powder samples. No need for a beaker to calibrate your meter or measure a sample. Just place few drops of the standard or sample onto the flat sensor. This procedure saves you time and prevents wasting your precious sample.
-
Product
Ultra-compact Laser Collimated Beam Sensor
HL-T1
-
Panasonic Industrial Devices Sales Company of America
The HL-T1 Sensor is an ultra-small laser Thru-Beam Sensor with very high resolution.
-
Product
Digital Laser Beam Analyzer
-
ScienceGL offers economic laser beam profiling solutions for laser beam measurement, diagnostics and analysis. The Digital Laser Beam Profiler allows you to analyze laser output quickly and accurately at fraction of the market price. The profiler utilizes our advanced computer graphics engine for best visual perception of the beam in 3D realistic representation. Traditional 2D plot colored by the look up table (LUT) is also available.
-
Product
Ar Gas Cluster Ion Source
GCIS
-
The Kratos Ar Gas Cluster Ion Source (GCIS) is optimised for depth profiling organic materials in Arn+ cluster mode and inorganic materials in Ar+ monomer mode, dependent on the operating parameters defined by the user and the type of material to be profiled. In Arn+ ion cluster mode the ions can be accelerated up to a maximum of 20 keV. This enables the successful sputter depth profiling of the widest range of polymer materials to be undertaken. However, Arn+ cluster depth profiling has been shown to give very low sputter yields for inorganic materials. In order to retain the capability of generating depth profiles from this class of materials this ion source can also be operated in the more conventional Ar monomer (Ar+) mode.
-
Product
Ion Chambers
-
0.2 to 5000 mR/hr, 5 Ranges• Temperature Compensated• Retractable 1000 mg/cm² Beta Shield• High Background Zero Capability• Proportional Audio Output
-
Product
Gridded DC Ion Sources
-
Ion-assisted processes like sputtering, etching, and surface treatment depend on a beam that’s stable, uniform, and tightly controlled. Gridded DC ion sources make that happen, giving engineers the precision they need to fine-tune ion energy and current density for reliable results.
-
Product
Non-Contact Beam Profiler
BeamWatch
-
The patented BeamWatch non-contact profiling system accurately captures and analyzes industrial multi-kilowatt lasers wavelengths from 980nm - 1080nm by measuring Rayleigh Scattering. It features a complete passthrough beam measurement technique, no moving parts, and a lightweight compact design which makes it ideal for comprehensive analysis of industrial multi-kilowatt lasers
-
Product
Ion Chromatography
930 Compact IC Flex
-
The 930 Compact IC Flex is a versatile ion chromatograph developed with a focus on the requirements of routine users.
-
Product
Spectro UV-Vis Dual Beam
UVS-2700
-
Spectro UV-Vis Split Beam PC is a precise scanning Spectrophotometer with a new design of 8 microprocessor automatic 2 row cell holder that moves noiseless with a special membrane. This Split Beam Spectro has a dual detector and a very accurate system.
-
-
Product
Laser Diode Collimators, 520nm - 785nm, Elliptical Beam
-
The Optoelectronics Company Ltd
Custom lasing wavelengths and power options are available. Both standard and custom configurations provide OEMs, end-users and systems integrators with complete, cost-effective laser solutions.
-
Product
Spectro UV-Vis Dual Beam PC Scanning Spectrophotometer
UVS-2800
-
Spectro UV-Vis Split Beam PC is a precise scanning Spectrophotometer with a new design of 8 microprocessor automatic 2 row cell holder that moves noiseless with a special membrane. This Split Beam Spectro has a dual detector and a very accurate system.
-
Product
Laser Beam Positioning
-
Under the trade name of SpotOn we offer a wide variety of computerized position measurement systems.This is a family of cost-effective and versatile solutions to numerous industrial and laboratory applications.Among the measurement applications, are:Measure laser power and centration or displacementAlign beams and QC of optical systemsMeasure target rotation and displacementMonitor vibration, deflection and motion
-
Product
Headlight Beam Testers
-
VLT offers a wide range of professional headlight beam testers. From simple manually operated models up to fullly automated robot type machines for use in integrated test lanes.
-
Product
Infrared Laser Diode Modules: 830nm-852nm, Elliptical Beam
-
The Optoelectronics Company Ltd
Custom lasing wavelengths, from 405 nm to 852 nm, output power options and laser engraving are available to your specifications. Both standard and custom configurations provide OEMs, end-users and systems integrators with complete cost-effective laser solutions.
-
Product
Sodium Ion Concentration Pocket Water Meter
LAQUAtwin Na-11
-
The only pocket meter that directly measures sodium ion concentration in 0.3ml sample (or 0.05ml sample with sampling sheet B). Unique sensor allows measurement of viscous liquids, solids, and even powder samples. No need for a beaker to calibrate your meter or measure a sample. Just place few drops of the standard or sample onto the flat sensor. This procedure saves you time and prevents wasting your precious sample.
-
Product
Intex Beam Gauge & Standard Contacts
-
Developed to measure both internal and external diameters and lengths, the Intex gauge's aluminium extrusion beam gives it a rigid yet lightweight quality, making it ideal for shop-floor environments. The simple release of a locking thumbscrew enables the gauge's measuring direction to be changed quickly and easily.
-
Product
4ch Beam Forming Sound Source Visualization System
BF-3200/MI-5420A/BF-0310
-
Beam Forming is one of the sound visualization techniques that obtains the sound pressure distribution using the phase differece information from the sound source to the microphone, and makes it visualized with the color map.This technique requires a lot of microphones to cover a wide area and generally tends to increase the size of the system. By this Beam Forming system, Ono sokki achieved real time sound source visualization with just 4 microphones.
-
Product
Beam Position Detectors
-
We offer a wide range of laser beam position detectors for optical alignment including Quadrant Cell Photoreceivers, PSDs, and Thermopile Position Sensors. Please see our Beam Position Sensor Guide for more information.
-
Product
Taper System, CCD Beam Imaging Camera
TaperCamD series
-
355 to 1150 nm, standard CCD detectorHyperCal Dynamic Noise and Baseline Correction software (Pat. Pending)CTE Comet Tail Elimination for > 900 nm (Pat. Pending)Port-powered USB 2.0; flexible 3 m cable, no power brick14-bit ADC, 4 MB image buffer & on-board microprocessorWindow-free sensors standard for no fringing25,000:1 electronic auto-shutter, 40 s to 1000 ms1,000:1 SNR (30/60 dB Optical/Electrical)
-
Product
Beam Directional Power Supply Battery 40 to 160 kV
CP160B
-
Next to the CP120B, the CP160B is the slightly more powerful version of our ultra-light, compact and battery operated constant potential portable X-Ray generators. Allowing penetration reaching up to 30 mm for steel, the CP160B is the perfect tool for specific NDT applications that require repetitive short exposures, as well as security applications.
-
Product
*Beam Propagation Analysis
M²
-
M², or Beam Propagation Ratio, is a value that indicates how close a laser is to being a single mode TEM00 beam, which in turn determines how small a beam waist can be focused. For the perfect Gaussian TEM00 condition the M² equals 1. M² cannot be determined from a single beam profile measurement. The ISO/DIS 11146 requires that M² be calculated from a series of measurements. M² is measured on real beams by focusing the beam with a fixed position lens of known focal length, and then measuring the characteristics of the artificially created beam waist and divergence. We have a number of solutions for the measurement of M² ranging from simple manual processes to fully automated dedicated instruments, depending on the frequency of the need to measure M² of lasers and laser systems.
-
Product
Shear Beam Load Cell
SB-1.0
-
The Shear Beam Load Cell SB-1.0 is a single point weighing device, suitable for use in multiple applications.
-
Product
Bending Beam Load Cell
-
Futek Advanced Sensor Technology, Inc.
Are the best fit for many measuring tasks. Here, the signal, on principle, depends on the bending moment.
