JTAG Emulators
Exercise a processor's (DUT) on-chip debug services to perform JTAG emulation and debug.
See Also: JTAG, JTAG Controllers, JTAG Debuggers, iJTAG, P1687
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Product
Emulator
GCI E84
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The GCI E84 Emulator is the world's leading tester for development, implementation and qualification of products that must comply with the SEMI E84 Standard. It provides the industry-standard automated test plans that are utilized by virtually every 300mm FAB and equipment manufacturer worldwide. GCI testers are the only solutions that guarantee 300mm factory automation interoperability.
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Product
Scienlab Dual-Range Regenerative AC / Grid Emulator, 600 / 1200 VAC, 63 / 32.5 A, 90 KW / 135 KVA
SL1215A
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The SL1200A series was designed to handle all your 3-phase AC test needs up to 1200 VAC, from 30 kVA to 630 kVA without the need for a transformer. Two voltage ranges are available: 600 VAC and 1200 VAC. The 600 VAC models are ideal for low voltage inverter test as well as EV and EVSE charging test applications. The 1200 VAC models allow for (HVRT) testing at the IEC LV-AC limit without the need for a large, complex test setup.
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Product
Develop - Simulate - Validate JTAG / IJTAG based IP
NEBULA
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You, your vendors and your customers being able to use one common interface to control and observe on-chip IP, resources and instruments. The figure below shows an example IC. The new IEEE 1149.1-2013 standard supports an init-data register for configuring the analog paramaters of I/O as well as controlling on-chip PLLs. The standard further extends this by defining in BSDL user test data registers or 'scan chains'. These registers enable the ability of generic software to control and observe mission mode IP and instruments simply by describing the register interface in BSDL.
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Product
Regenerative AC Emulator, 1200 VAC, 32 A, 45 KVA, 3‑Phase
SL1212A
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The SL1200A series was designed to handle all your 3-phase AC test needs up to 1200 VAC, from 30 kVA to 630 kVA without the need for a transformer. Two voltage ranges are available: 600 VAC and 1200 VAC. The 600 VAC models are ideal for low voltage inverter test as well as EV and EVSE charging test applications. The 1200 VAC models allow for (HVRT) testing at the IEC LV-AC limit without the need for a large, complex test setup.
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Product
JTAG Isolation Protection
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Our line of JTAG isolators help protect your investment in computers, development boards, debug probes, and lab equipment. Each model connects easily between your target board and debug probe.
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Product
JTAG External Modules (JEM) DIMM/SODIMM Socket Cluster Test
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The primary function of the JTAG External Modules (JEM) for the DIMM/SODIMM Socket Cluster Test is to provide test access to off-board signals that otherwise could not be accessed by a JTAG test system and to strengthen the memory-independent JTAG testing for the assembly correctness of the almost full spectrum of the modern socket types, particularly (according to JEDEC_Std.21-C):
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Product
Low Cost Emulator
EB-XAS3
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* Emulates P51XAS3x Microcontrollers * Real-Time Operation up to 30MHz * 3.3V or 5V Voltage Operation * Source-Level Debugger for C and Assembler * MS-Windows Debugger Software * Reduced Set of C-Compiler and Assembler * Support for ROMless and ROMed Microcontrollers * 64K of Code Memory * Performance Analyzer * Real-Time and Conditional Breakpoints * 68-pin PLCC Emulation Header and Signal Testpoints * Serially Linked to IBM PC at 115 Kbaud
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Product
Sensor Signal Emulator
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This Sensor Signal Emulator is specially designed for Automotive Technicians to troubleshoot electrical control systems problems in the car. It simulates the signals generated from different sensors in the vehicle and the ECU which enables technicians to pinpoint the actual faults in the electrical control system in cases of doubt over their judgment of replacing the sensors or the entirety of the connecting wires to the ECU.
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Product
Emulates Dallas Semiconductors DS89C420
FE-C420
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* Emulates Dallas Semiconductors DS89C420 * 16K Code Memory * Real-Time Emulation * Frequency up to fmax at 3V and 5V * ISP Support * MS-Windows Debugger For C And Assembler * Emulation Headers and Signal Testpoints * Target Board and Programmer Included * Serially Linked to IBM PC at 115Kbaud
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Product
Mobile Comm DC Source w/ Battery Emulation
66321B
Battery Simulator
The Keysight Mobile Communications DC Source 663xx series offers several features ideal for testing wireless and battery powered devices. Excellent voltage transient response ensures maximum test-system throughput by minimizing device shutdowns due to significant voltage drops in the test wiring. Built-in advanced measurement system to accurately measure battery current drains when the device operates in different modes and a Keysight-developed feature that enables cellular telephone manufacturers to detect permanently and intermittently open-sense wire connections.The Keysight 66321B mobile communications dc source provides fast transient response, exceptional sourcing, output resistance programming, and precision measurement. This product is specially designed for testing next generation digital wireless communications products. The 66321B mobile communications dc source offers a new capability that simulates the internal resistance of a battery or battery pack. Additionally, these high performance models offer improved transient response and stable output operation with either short or long load leads.
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Product
Embedded JTAG Solutions
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The multifunctional JTAG platform enables testing and programming of microprocessors, microchips and other highly complex components (e.g., FPGA, µBGA or CSP) using integrated boundary scan architectures.
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Product
Mixed Signal JTAG Tester
JT 5705
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The JT 5705 series offer a unique combination of JTAG TAP controller (tester) interfaces plus digital and analog I/O in compact desktop package.Use the ‘mixed-signal’ features to measure power supplies, clock frequencies or test DACs and ADCs. Add your own capability through use of CoreCommander FPGA our generic bridge/translator system.
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Product
JTAG 3rd Party Controller Support
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Corelis offers support for a variety of devices and instruments from third-parties in an effort to provide existing test platforms comprehensive JTAG test execution with Corelis ScanExpress software products. Supported instruments include National Instruments PXI-655x HSDIO and Teradyne Di-Series modules. Corelis also provides support for JTAG testing with FTDI FT2232 ICs embedded on a unit under test (UUT).
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Product
ABex Terminal Module for JTAG Technologies JT 37x7 BSCAN Cards
ABex TM-JT37x7
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The ABex TM-JT37x7 is an ABex terminal module for the JTAG Technologies Boundary Scan Controller PXI/PXIe JT 37×7. In combination with the JT 2147/ABex from JTAG Technologies it integrates the POD functionality into the module.In combination with the PXI/PXIe JT 37×7 and the JT 2147/ABex it’s possible to connect up to four JTAG/Boundary Scan TAPs. All signal wires on the PCB are impedance controlled. In addition, all signals can be switched off via relays.
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Product
eNodeB Emulator
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The eNodeB Emulator includes UE simulation, and can be used to test the complete LTE Packet Core or individual Core Network elements, MME, SGW, PGW. It implements all the required protocols - S1AP/SCTP to communicate with MMEs over S1-MME interface and GTP-u to communicate with S-GW over S1-U interface.
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Product
Network Emulation 100GE, 50GE, 40GE, 25GE, 10GE
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Chimera by Xena is a network impairment emulator that makes it easy to introduce consistent, accurate, well-defined and repeatable impairments (e.g. packet manipulation, latency, jitter, bandwidth control and shaping) to traffic between DUTs in the lab. All rates from 10GE to 100GE are supported by a single 2-slot test module.
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Product
Single-TAP CFM JTAG Controller for Teradyne ICTs
USB-1149.1/CFM
Controller
The USB-1149.1/CFM High-Speed single-TAP boundary-scan controller makes adding JTAG test to Teradyne ICTs a snap. Designed specifically for integration into Teradyne TestStation and GR228x testers, the USB-1149.1/CFM offers a clean, convenient boundary-scan solution.
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Product
Air Interface Emulator
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Becker Nachrichtentechnik GmbH
With help of air interface emulators radio field propagations can be emulated reproduceable in laboratory environments. For different applications like cellular, wireless networks or broadcast several types of devices are available.
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Product
Emulates AT8xC5122 Derivatives with 6/12 Clocks/Cycle
FE-5122
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* Emulates AT8xC5122 Derivatives with 6/12 Clocks/Cycle * 32K Code Memory * Software Trace * Real-Time Emulation * Frequency up to 40MHz * MS-Windows Debugger for C and Assembler * Keil Vision2 Debugger Compatible * PLCC-68, PLCC-28, LQFP-32 and VQFP-64 Emulation Headers * Serially Linked to PC at 115Kbaud
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Product
Emulates Atmel AT89C51SND1
FE-SND1
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* Emulates Atmel AT89C51SND1 * 62K Code Memory * Real-Time Emulation * Frequency up to 20MHz/3V * ISP and X2 Mode Support * MS-Windows Debugger For C And Assembler * Emulation Headers and Signal Testpoints * Programmer Included * Serially Linked to IBM PC at 115Kbaud
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Product
JTAG Boundary-Scan I/O Modules
SCANIO Family
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The Corelis family of SCANIO™ modules turn any IEEE standard 1149.1 boundary-scan controller into a powerful digital boundary-scan tester. The SCANIO family of products use boundary-scan gate arrays to add control and visibility to connectors, traces, and logic that can not be tested using traditional boundary-scan techniques.The SCANIO products, when combined with a boundary-scan controller, operate as a traditional “bed-of-nails” tester except access to the stimulus and response I/O’s is achieved via boundary-scan.
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Product
JTAG / BDM Instrumentation
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High-speed and static 3U and 6U PXI and PCI digital I/O instrumentation. Offering test rates to 200 MHz and programmable logic levels of -10 V to +15 V, our digital products feature the highest performance and most cost effective digital test solutions in the industry.
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Product
Network Emulator
KMAX
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The KMAX network emulator helps network engineers test and measure performance in order to identify and remove defects. Network emulators turn well behaved development and test networks into the kind of slow, congested, and less-than-reliable services encountered on the internet. In addition, unlike the real internet, network emulators allow the operator to control these conditions so that products and apps can be subjected to controlled and repeatable tests, by routing selected packets through a series of impairment nodes.
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Product
Regenerative AC Emulator, 600 VAC, 125 A, 90 KVA, 3‑Phase
SL1203A
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The SL1200A series was designed to handle all your 3-phase AC test needs up to 1200 VAC, from 30 kVA to 630 kVA without the need for a transformer. Two voltage ranges are available: 600 VAC and 1200 VAC. The 600 VAC models are ideal for low voltage inverter test as well as EV and EVSE charging test applications. The 1200 VAC models allow for (HVRT) testing at the IEC LV-AC limit without the need for a large, complex test setup.
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Product
High Level Language Debugger and Emulator Tool
Universal Debug Engine
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Programmierbare Logik & Systeme GmbH
With Universal Debug Engine (UDE®) PLS offers on top solutions for software development of systems-on-silicon including debug support for the 16 Bit and 32 Bit microcontrollers C16x, C166™, ST10F276, ST10F280, XC166, XC2000, XE166, XMC4500, C166S V2, SDA6000, TriCore™ from Infineon and STMicroelectronics, Power Architecture® MPC55xx, MPC560x, MPC563x, MPC57xx from NXP™, PowerPC PPC440SPe from AMCC, Power Architecture® SPC560, SPC563, SP574 from STMicroelectronics, ARM7™, ARM9™, ARM11™, Cortex™-M0, Cortex™-M0+, Cortex™-M3, Cortex™-M4, Cortex™-M7, Cortex™-R4, Cortex™-A8, Cortex™-A9, XScale™, SuperH™ SH-2A derivatives in a new multicore debug environment as well as technical support. The extensive feature list includes functions like: high speed and flexible target access via JTAG, cJTAG with OCDS L1, EmbeddedICE, OnCE, COP, DAP, DAP2, SWD support, OCDS L2 trace, MCDS trace, CoreSight™ trace, ETM trace, ETB trace, Nexus trace, ASC, SSC, 3Pin and CAN, in-system FLASH memory programming of FLASH / OTP with UDE MemTool, support of various RTOS, OSEK® and test automation tools.
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Product
Adjustable ISI Channel Emulation Package for M8000 Series BER Test Solutions
M8070ISIB
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Simplify receiver testing by offering unprecedented flexibility for handling test channels.
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Product
Emulators
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High fidelity DC power system and motor drive inverter testing is made achievable with the use of advanced power emulation.
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Product
Emulates AT89C5121 Derivatives with 6/12 Clocks/Cycle
FE-5121
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* Emulates AT89C5121 Derivatives with 6/12 Clocks/Cycle * 16K Code Memory * Software Trace * Real-Time Emulation * Frequency up to 16MHz/ 3V, 5V * X1 and X2 Mode Support * MS-Windows Debugger for C and Assembler * Keil mVision2 Debugger Compatible * PLCC-52 and SSOP-24 Emulation Headers * Serially Linked to PC at 115Kbaud
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Product
Live PD Emulation
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Flexibly Mimic Class 0 to 4 Powered Device Per PSA/PSL-3000 Test Port. Configure up to 192 Simultaneous IEEE 802.3 PD’s. User-Defined Class 0 - 4 Powered Device Modeling with or without Cable Loss. Emulate 802.3at PoE-LLDP Negotiations and Power Adjustments. Monitor Multi-Port Live Emulation Status. Available to PSA-3000 and PSL-3000 Platforms as optional license feature.
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Product
Scienlab Regenerative DC Emulator
SL1800A Series
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Keysight's SL1800A Scienlab Regenerative DC Emulator - High-Power Series enables users to emulate the large batteries in electric vehicles. The bidirectional power flow allows emulation of both power sourcing applications, such as traction inverter test, as well as power-absorbing (sinking) applications, such as EV charging. Being regenerative, the power absorbed is delivered back to the grid, saving on energy and cooling costs. The SL1800A Series is fully integrated with the SL1040A Scienlab Charging Discovery System. The SL1093A Scienlab Charging Discover Software fully automates DC charging applications to many different test standards. With bi-directionality, integrated DC voltage and current controllers, high dynamics, and its regenerative energy feedback capacity, the Scienlab Dynamic DC Emulator provides an all-in-one system for efficient and effective testing of the power electronic components in electric vehicles (EV) and electric vehicle supply equipment (EVSE).
