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Test Program
Generate native system input events for the purposes of test automation, self-running demos, etc. (developer.com)
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Field Test Set
MTS-207
The MTS-207 is a state-of-the-art portable PXI platform for field testing and data acquisition systems. Its proven architecture has been deployed worldwide on multiple programs including the MTS-206 Maverick Missile system flight line tester. The MTS-209 Common Armament Test Set, the AN/TSM-205B Hellfire System test Set, and many more. It combines the capabilities of the versatile and powerful PXI architecture in a compact, ultra-rugged, flight-line qualified enclosure. The MTS-207 is ideal for test and data acquisition applications requiring operation under harsh environmental conditions including flight-line, back-shop, or airborne applications.
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LED Test Production System
Lumere-LC
Evolusys Technologies Sdn. Bhd.
Lumere LC is a LED test and measurement system for various parameters of LED light. It is economical, its geometry conforms with CIE-Publication 127, and the test program is easy to configure and adjust. Main application is in the production of LEDs.
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PCIe-7821, Kintex 7 FPGA, Digital Reconfigurable I/O Device
785359-01
The PCIe‑7821 is a reconfigurable I/O (RIO) device that features a user-programmable FPGA for onboard processing and flexible I/O operation. With LabVIEW FPGA, you can individually configure the digital lines as inputs, outputs, counter/timers, PWM, encoder inputs, or specialized communication protocols. You can also program custom onboard decision making that executes with hardware-timed speed and reliability. Each line offers software-selectable logic levels. The PCIe‑7821 is well-suited for a wide variety of applications, such as high-speed waveform generation, sensor simulation, hardware‑in-‑the‑loop (HIL) test, bit error rate test, and other applications that require precise timing and control.
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6000 Series Digital I/O Modules
Series 6000 digital I/O modules record signals from frequency counters, flow meters, encoders, discrete transducers, IRIG time, etc. which are often part of the test environment. These digital signals are time aligned and recorded alongside the system’s analog measurements. High density digital inputs provide an opportunity to easily include facility controls like switches, valve positions, relays, lights, etc. along with the test data. Series 6000 digital I/O modules also provide outputs generated by user command or automatically by Sequence, Alarms or DSP. User generated outputs are accomplished in software while sequencers can be programmed prior to a test and initiated by program or hardware control. Alarm conditions preprogrammed on the analog side can automatically generate digital outputs which are typically connected to facility control systems or PLCs. A DSP adds powerful real-time processing and is appropriate for PID control loops, derived parameter calculations and a variety of other real-time operations.
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Function Test and In-Circuit Test
CT350
ICT test points: max 2736 CAD Data import Automatic program generator Powerful debugging tools Test coverage analysis Paperless repair station Logging- and statistic functions Full graphical functions Panel and multisite tests Fast adapter exchange High Pin Count-Interface On table optional usable shelf part.
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Multi-Function PXI Card
GX3788
The GX3788 is a user configurable, FPGA-based, 3U PXI multi-function card which supports digital and analog test capabilities. The card employs the Altera Stratix III FPGA which features over 45,000 logic elements and 1.836 Kb of memory. The GX3788 is based on the GX3700 FPGA card and includes an integral daughter board which provides (8) differential input, 16-bit, 250 MS/s A to D converters and (8), 16-bit, 1 MS/s, D to A converters. The module's FPGA is pre-programmed, providing access to all digital and analog functions. Alternatively, users can program or modify the FPGA , allowing user to adapt the module to their own specific test needs. The design of the FPGA is done by using Altera's free Quartus II Web Edition tool set. Once the user has compiled the FPGA design, the configuration file can be loaded into the FPGA directly or via an on-board EEPROM.
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Universal A/V Tester
This tester was built for our client with the specific requirement that specific UUTs can be added to the system by our client. We handled developing test software for the first 2 UUTs utilizing an open programming structure that allowed programming modules to be strung together to create test programs for any additional UUT that our client wants to add in the future.
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FD-11637, 8-Channel Strain/Bridge Input Device for FieldDAQ
785641-01
8-Channel Strain/Bridge Input Device for FieldDAQ - The FD-11637 can measure eight channels and has built-in bridge completion and voltage excitation to support for quarter-, half-, and full-bridge sensors. It also features anti-alias filtering, offset nulling, and shunt calibration to reduce the effect of noise and improve measurement accuracy. The FD-11637 has an ingress protection rating up to IP67 (dust- and water-resistant), can operate in -40 °C to 85 °C environments, and can sustain 100 g shock and 10 grm vibration. The FD-11637 incorporates Time Sensitive Networking (TSN) and features an integrated network switch and built-in power circuitry for simple daisy chaining. You program the FD-11637 with NI-DAQmx, which automatically synchronizes multiple FieldDAQ™ devices. The FD-11637 is ideal for test cell and outdoor environments.
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Developer's Studio for ATLAS
PAWS
PAWS Developer's Studio gives you the power to compile, modify, debug, document, and simulate the operation of ATLAS test programs in a Windows environment.
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Linear DC Power Supply
MPS-5 Series
The five-channel programmable DC power supply is a new generation of high quality programmable linear DC power supply. The five channels can independently adjust the voltage and current. This series of products are equipped with RS232 communication interface, which has both desktop and system characteristics, and can be arbitrarily matched with other instruments, integrated as a test system with special functions to complete the measurement requirements in different occasions. The Upper computer program can be edited through the communication protocol, which brings great convenience to the user. It is a replacement product of the ordinary programmable power supple and has a high cost-effective advantage.
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Radio Frequency, Communications, & Navigation Test Systems
Reduce testing time and costs with the Astronics radio test sets for use in military, avionics, and civil security industries.Available in commercial and military grades, these integrated test systems make it easy to develop test program sets and leverage them securely and instantly across all deployed testers at the factory, depot, and operational levels.
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SD Express
SCHILLER AUTOMATION GmbH & Co. KG
The Standard SD Express Memory Card Test Adapters support PCIe® 16 GT/s (Gen4) and PCIe® 8 GT/s (Gen3) Interface Compliance Program testing for SD8.0 and SD7.1. Minimal crosstalk, short trace lengths. The Micro SD Express Memory Card Test Adapters supports PCIe® 8 GT/s (Gen3) Interface Compliance Program testing for SD7.1. Minimal crosstalk, short trace lengths. They all support SDHC, SDXC, and SDUC operation modes Data collection via Lab Standard SSMP Test Cables and hard gold mating surface allow for high cycle count insertions and reliable performance.
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FD-11605, 8-Channel, ±60 V Voltage Input Device for FieldDAQ
786469-01
The FD-11605 can measure up to eight channels with a voltage input range of ±60 V. It features 24-bit resolution with simultaneous sample rates up to 100 kS/s. The FD-11605 offers channel-to-channel isolation, which eliminates noise from ground loops and protects instrumentation circuitry from high-transient voltages of up to 1000 V. The FD-11605 has an ingress protection rating of IP65/IP67 (dust-tight and water-resistant),can operate in -40 °C to 85 °C environments, and can sustain 100 g shock and 10 g vibration. The FD-11605 incorporates Time Sensitive Networking (TSN) and features an integrated network switch and built-in power circuitry for simple daisy chaining. You program the FD-11605 with NI-DAQmx, which automatically synchronizes multiple FieldDAQ™ devices. The FD-11605 is ideal for test cell and outdoor environments.
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Semiconductor Test Software Solutions
The test engineering staff at Test Spectrum has developed hundreds of test software projects on all major ATE platforms for numerous product technologies.Whether you need to optimize a current test platform, convert to a lower cost test platform, or design a brand new program for a cutting edge product within incredible time constraints, the Test Spectrum team will exceed your program expectations with quality products and excellent results.
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DC Power Analyzer, Modular, 600 W, 4 Slots
N6705C
The N6705C DC Power Analyzer provides unrivaled productivity gains for sourcing and measuring DC voltage and current into the DUT by integrating up to 4 advanced power supplies with DMM, Scope, Arb, and Data Logger features. The N6705C eliminates the need to gather multiple pieces of equipment and create complex test setups including transducers (such as current probes and shunts) to measure current into your DUT. The DC Power Analyzer also eliminates the need to develop and debug programs to control a collection of instruments and take useful measurements because all functions and measurements are available at the front panel. For even greater control and analysis functions, the DC Power Analyzer can be used with the 14585A Control and Analysis Software. When automated bench setups are required, the N6705C is fully programmable over GPIB, USB, LAN and is LXI Compliant. 14585A Control and Analysis Software
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Analyzers
BA500 Series
The BA500 analyzers are high performance battery analyzers with charge and discharge capabilities. The analyzers connect to your computer via USB and the BA500WIN software program is used to control the analyzer and battery under test. This system has a fast data collection system allowing you to collect and view as much data as required. Once you collect this data you can graph, analyze & save it.
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Single-Phase Transformer Winding Resistance Meters
RMO-TT Series
RMO-TT series is perfect for measuring winding resistance of inductive objects such as power and distribution transformers or autotransformers. Additionally, every transformer resistance meter from RMO-TT series can analyze:tap changers,generators,electrical motors,high-current busbar joints,cable splices,and welding joints.Transformer demagnetization can also be performed with all RMO-TT instruments.The series is consisted of 3 models, with maximal test current from 40 A (RMO40TT) to 100 A (RMO100TT). RMO100TT is the only portable transformer resistance meter in the market with 100 A DC output current.The three independent channels enable testing of three windings in series. Consequently, a user can measure winding resistance in every tap position of an on-load tap changer without discharging between the tests.In addition to winding resistance measurement, a user can perform a detailed on-load tap changer analysis by analyzing recorded graphs (10 kHz sampling rate) and by measuring vibrations on an external tap changer tank.All RMO-TT instruments have a built-in tap changer control unit. Because of this, it is possible to remotely control on-load tap changer (OLTC) directly from the device. Also, a user can program DV-Win software to do everything automatically – running winding resistance tests and changing OLTC tap positions.The DV-Win software also enables control and observation of the test process, as well as saving and analyzing the results on a PC. It provides a test report, arranged in a selectable form as an Excel spreadsheet, PDF, Word, or ASCII format. Additionally, DV-Win measures and calculates the OLTC transition time, the ripple and the winding resistance for each tap changing operation. The software can also perform the calculations necessary for the “Heat Run” test.All results can be exported in the report format.
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Stand Alone Low Voltage Tester
Model 256/PC
Internal Memory: 8 program locations without test point labels or 2 program locations with test point labels. Removable Memory: 16 program locations without test point labels, or 4 program locations with test point labels.
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Tecap Automated Test Suite
Control of Automated Test Equipment (ATE) for functional test and in-circuit testOperation of test facilities with adapters and PLCssemi- and fully automatic testing of electronic components and assembliesFinal Test in ProductionTest of pre-series and sample seriesStandardized test program developmentAdaptable to your own system environment (customizing) – 100% usable after installation with standard elements
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Wire Harness Tester
NX Solo
The Dynalab NX Solo Wire HarnessTester is a low-cost, feature-packed, stand-alone tester with a maximum capacity of 256 test points. The flexibility of the NX System allows each program to perform multiple tests, display custom messages or sounds, and analyze the results of a test or an input to decide which operation to perform next. Testing for continuity, shorts, and a variety of components.
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Open Networking
We are committed to the ever changing world of Data Communication and Storage Networks. As the industry moves forward into Open Networking, we are keeping pace. Working closely with various Open Network organizations such as the Open Compute Project (OCP) and the Open Platform for NFV (OPNFV), we are leveraging years of experience of effecting positive change in the industry and creating robust test programs to enable markets.
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Multi Channel Linear Vibration Motor Aging Tester
BK8018B
The BK8018B is our biggest Aging Tester for linear vibration motors. Connect up to 20 DUT's and the system will automatically test them all simultaneously. As well as evaluating current, it can also connect to accelerometers to test vibration characteristics. You can see information on the monitor in real time, and also store it to analyze later so you can keep track of the accuracy and stability of your manufacturing process. In addition, we will modify BaKo’s BS1123-BS8018 program to fit your needs so that the testing you do is a custom fit.
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Test Program Sets (TPS)
Data Review, Corrections, & Generation (Reverse Engineering). Technical Requirement Documentation (TRD). Test Strategy Reports (TSR). Test Program Development – Software. TPS Sell-Off & Acceptance. Life-Cycle Support. Technical Interface Test Adaptors (ITA) – Hardware. Training - TPS Development, ATE/TPS Operator, Fault Diagnostic, ATE Maintenance.
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Furniture Testing
We can test to ANSI/BIFMA or any government, military or industrial test standard. American Testing Laboratory can design a specific furniture testing program tailored to meet your particular needs.
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Test Strategy Consulting
Organizations and companies looking to drive change and increase engineering efficiency frequently need to step back and consider the big picture, without losing track of the details. Our consulting provides a comprehensive review of the challenges you face related to the cost and quality of test. We partner with you to develop a better understanding of test from a business perspective and create a strategic plan for aligning the test function with your corporate objectives. It's all geared to developing a test strategy that will help you launch a product or program in the most efficient way possible.
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PCI-7813, 3M Gate Virtex-II FPGA, Digital Reconfigurable I/O Device
779370-01
The PCI‑7813 is a reconfigurable I/O (RIO) device that features a user-programmable FPGA for onboard processing and flexible I/O operation. With LabVIEW FPGA, you can individually configure the digital lines as inputs, outputs, counter/timers, PWM, encoder inputs, or specialized communication protocols. You can also program custom onboard decision making that executes with hardware-timed speed and reliability. The PCI‑7813 is well-suited for a wide variety of applications, such as high-speed waveform generation, sensor simulation, hardware-in‑the‑loop (HIL) test, custom communications protocols, bit error rate test, and other applications that require precise timing and control.
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TMS Test Management Software
LX TMS
To diagnose and analyze electronic components and devices, various tests are required in development, production and service. Equipped with all the necessary standard functions, the test sequencer developed by LXinstuments meets all criteria for a successful and smooth test process. The test item ( DUT ) is examined under various operating conditions for its properties, function and usability. Typical areas of application can be found where the usual complexity of test sequences has to be processed. The test sequencer is therefore suitable for small and medium-sized systems where special functions of other sequencers are not required. The free, cross-platform, open source developer platform .NET serves as a starting point. The integrated WPF (Windows Presentation Foundation) framework ensures a user-friendly program interface.
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Meter Testing System
ASTel
Three-phase Meter Test Equipment of ASTeL 3.2x.x series system is a fully automatic system enabling simultaneous, multi-position calibration and legalization of electric energy meters. The automatics include power sources, reference standards, stand controllers, photoelectric scanning heads, separating transformers, and other elements of the system. All these elements are controlled through a Windows based executive program.
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Electronic Equipment Testing System
The task set forth the need to create a special universal software core, the main tasks of which are the provision of measurement and control processes, as well as the interaction of software components intended for collection, visualization, mathematical processing and documenting of data. For each stand, specific program modules were additionally developed according to test methods specific products. The overall modular architecture of the system makes it easy to supplement and correct test algorithms.
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Calibration - Certification - Repair Services
Acculab Measurement Standards, Inc.
Whatever your Test & Measurement Equipment service needs, ACCULAB has a cost-effective solution! From complete calibration, certification and repair capability at our 6200-sq.ft. state-of-the-art laboratory, to the convenience of on-site calibration at your facility, ACCULAB can tailor a program to meet your individual requirements.
