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Reflectometers
Instruments used to measure the reflectance of a surface. (spaceflight.nasa.gov)
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Time Domain Reflectometer
IRG 2000
BAUR Prüf- und Messtechnik GmbH
Cable fault location with the BAUR IRG 2000. The IRG 2000 impulse reflection measurement unit or time domain reflectometer is a handy, easy to carry device for single-phase cable fault pre-location. It is used in combination with a surge voltage generator on low-, medium- and high-voltage cables 0 - 65 km in length. It can also be used on live cables carrying voltage up to 400 V.* Easy and quick cable fault location* Light, compact and manageable* Main unit for the tried-and-tested pre-location method* Ideal for integration in measurement systems
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Optical Time Domain Reflectometer OTDR
BD300
Shanghai Baudcom Communication Device Co.,Ltd.
BD300 Optical Time Domain Reflectometerhas excellent dead zone performance and wide dynamic range. Combined with the visualfault locator, the OTDR can easily find the breaks, bends, splices, faultyconnectors, and other causes of signal loss.
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Portable Optical Backscatter Reflectometers
OBR 6200 Series
The Luna OBR 6225 and OBR 6235 are portable and rugged ultra-high resolution reflectometers with backscatter-level sensitivity for testing fiber optic networks deployed in aerospace, naval, data center and industrial applications.
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OTDR
Shenzhen Sharingtek Communication Co., LTD
Is an optoelectronic instrument used to characterize an optical fiber. It is the optical equivalent of an electronic time domain reflectometer which measures the impedance of the cable or transmission line under test.
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OTDR
Wuhan Sunma Technology Co., Ltd.
OTDR, short for optical time-domain reflectometer, is an optoelectronic instrument used to characterize an optical fiber. It can offer you an overview of the whole system you test and can be used for estimating the fiber length and overall attenuation, including splice and mated-connector losses. It can also be used to locate faults, such as breaks, and to measure optical return loss.
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Portable Solar Reflectometer
CONDOR
Condor is a portable reflectometer designed for field measurement of reflectivity in the solar field in less than 10 seconds with a high accuracy and precision. It can be applied to both flat and curved reflecting surfaces of up to 4 mm thickness.
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OTDR Tester
M-OTDR-502
Fuzhou Metricu Technology Co Ltd
Optical Time Domain Reflectometer Wavelength 1310 / 1550nm, max test range 150KM, Dynamic range 28 / 26dB, SOR standard data saving, create PDF/EXCEL format report, stable laser source, support CW/270/330/1000/2000Hz, Test fiber's length, loss, attenuation parameters and event map, locate connection point/fusion point, Automatic analysis of various linkers/fusion points, easy analyze of various events,Support saving curves number ≥30000pcs, loss test, detect the optical or optical components loss value, etc. Test IP camera, optical power meter, visual fault locator, RJ45 cable TDR test, cable tester, cable tracer, etc.
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TX Ranger
4405200
The TX Ranger is a hand-held Time Domain Reflectometer (cable fault locator) with a first range of 2.5 meters combined with a 1.3 Nano second pulse width gives a blind zone of only 5 cm, it makes this the ideal product for fault location on short cable assemblies and harnesses. Small and intermittent faults can be easily identified by using the selectable gain control allowing trace amplification of up to 7 times and when set to scan lock mode the advanced noise reduction software may be selected allowing the user to select between 8,16 and 32-point trace averaging further enhancing the clarity of the trace by reducing electrical and environmental interference.
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Spectroscopic Ellipsometer
SE Series
Angstrom Sun Technologies, Inc.
Spectroscopic Ellipsometer SE series are advanced models built by Angstrom Sun Technologies Inc. Ellipsometry is a technique utilizing polarization state changes after light beam reacts with probing samples. A typical ellipsometer setup includes a light source, polarizing optics (like polarizer, analyzer, phase retarder or called as compensator), sample stage, detecting unit, incident angle change mechanism, computer and software for data acquisition and modeling. Not like reflectometer, ellipsometer parameters (Psi and Del) are always obtained at non normal incident angles. By varying incident angle. many more data sets can be obtained which will be helpful in refining model, reducing uncertainty and improving user's confidence on model's output. Therefore, variable angle ellipsometer is far more powerful than fixed angle ellipsometers. Furthermore, by utilizing broadband light source, spectroscopic data over a wavelength range with many wavelength points can be obtained and thus measurement precision and accuracy for optical properties can be greatly improved. The measurement speed for spectroscopic data has been overcome by implementing an advanced detector array so thousands of data can be acquired simultaneously. With such configuration and capable of collecting more data sets, the complicated layer stacks could be analyzed with powerful functions built within software.
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Mini OTDR
FiberPal OT-8800
OT-8800 series instruments are compact, cost-effective, portable and high dynamic range Mini Optical Time Domain Reflectometer (OTDR). By providing all the measurement functions and performance required for optical fiber construction and maintenance, it is designed for full-range fibre fault detection to solve FTTx, CATV and optical LANs problems
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OTDR Launch Cable Box
TM1000
Designed to aid in the testing of fiber optic cable when using an OTDR. The OTDR LaunchFiber box is used with Optical Time Domain Reflectometers (OTDR's) to help minimize the effects of the OTDR's launch pulse onmeasurement uncertainty.
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Time Domain Reflectometer
TDR-420
TDR-420 is a hand held Time Domain Reflectometer designed to identify and locate faults in power, telecommunications and teletechnical cables. TDR-420 reflectometer allows to measure the length of the cable and determine the distance to damage or impedance variation in the range of 4 m to 6000 m in conductors with metal wires. The shortest measuring range of 7 meters and a dead zone of 0.6 meters allows to locate damages at a very close distance from the place where the device is connected.
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Optical Time Domain Reflectometer
Alnair Laboratories Corporation
The FDM-OTDR encodes multiple probe pulses at different frequencies, in the same time frame that conventional C-OTDRs send out a single pulse. This frequency-division-multiplexing enables larger data acquisition in the same measurement time compared to C-OTDRs. As a result the FDM-OTDR can achieve higher dynamic range with the same measurement time, or a significantly reduced measurement time with the same dynamic range.
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Power Networks Test
TX8000
The TX8000 is a 6 Km range Time Domain Reflectometer housed in a rugged over moulded case being water proof to IP67 and drop resistant, designed for outdoor use, but sufficiently small and light weight for general use and may be operated using one hand. Using a 3.5-inch QVGA colour display information is clearly displayed; an illuminated keypad makes the TX8000 ideal for use in poorly lit areas.
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Spectrum & Vector Analyzer
SVA1000X Series
The SIGLENT SVA1000X series spectrum & vector network analyzers are powerful and flexible tools for broadcast and RF device testing. With a wide frequency range from 9 kHz to 1.5 GHz, the analyzer delivers reliable automatic measurements and plenty of features including a tracking generator and multiple modes of operation: the base model is a swept super-heterodyne spectrum analyzer and optional functions include a vector network analyzer, a Frequency Domain Reflectometer based distance-to-fault locator, and a modulation analyzer. Applications include broadcast monitoring/evaluation, site surveying, EMI pre-compliance, research and development, education, production and maintenance.
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VNA & SWR Site Analyzers
6050
SWR Site Analyzer with VSWR, Return Loss and FDR (Frequency Domain Reflectometer) measurements. VNA Site Analyzer with full Vector Network Analyzer measurement suite S11 and S21 ports, Spectrum Analyzer, Power Meter and FDR (Frequency Domain Reflectometer) measurements. Quickly shift between VNA and SWR/Return Loss only.
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Microspectrophotometer
MSP Series
Angstrom Sun Technologies, Inc.
Microspectrophotometer (MSP) is an advanced optical system. The key difference with typical low cost reflectometer is in its capability to characterize optical properties of thin films over a micron region area. With unique design by Angstrom's professionals, user can enjoy digital imaging capability in Microspectrophotometers (MSP series) by live video, powerful digital editing, measurement tools for reflection, transmission, absorption spectra. Data acquisition only takes milliseconds.
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OTDR Launch Cable Box, OTDR Dead Zone Eliminator 100-500M
Shanghai Fibretool Technology Co.,Ltd.
Designed to aid in the testing of fiber optic cable when using an OTDR. TheOTDR Launch Cable Box is used with Optical Time Domain Reflectometers (OTDRs) to help minimize the effects of the OTDRs launch pulse on measurement uncertainty. Available in many different configurations and fiber lengths.
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Integrated-In-Line-In-Situ-Meterology
Angstrom Sun Technologies, Inc.
Although table-top version is our major product platform, we do provide in-line and in situ solutions. Although all in-line tools involve some special configuration and customized designs, we have had such experience to demo our capability in semiconductor, photovoltaic, glass industries. Both spectroscopic ellipsometer and spectroscopic reflectometers could be integrated for in-line or in situ application purpose. But how to implement them, or which one is more suitable, an environmental situation should be considered. You are welcome to discuss with our experts and we'll be glad to offer a real solution to meet your needs.
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Saluki S2110P Series PON OTDR (up to 45dB)
S2110P series optical time domain reflectometer can be used to test single-mode wavelengths of 1310nm, 1550nm, 1625nm and 1650nm as well as customized special wavelengths. It provides multiple optional modules, such as single wavelength, multi-wavelength and online test. S2110P series can test PON networks through even 1:128 high-port-count splitters.
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Time Domain Reflectometers
HL1100 Series
HYPERLABS HL1100 Series TDR instruments provide high-performance test and measurement capabilities for use in the field or in the lab. These instruments are used for applications such as fault detection in cables and interconnects, impedance characterization, time of flight analysis, water level measurement, and more.
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Multi-wavelength Measurement Optical Time Domain Reflectometer
MT-7300 Plus
Guangzhou Wanglu Communications Co., Ltd.
● 32/30dB high dynamic range● ≤2m extra-short event dead zone● 0.05m high distance resolution,128k sampling points● Fast auto measurement, one-button operating● Test up to four wavelengths with a single unit ● Communication light check automatically● Remote function via Ethernet● USB interfaces, supporting USB stick and printer and direct cable download to PC via ActiveSync● Supporting Bellcore GR196 file format in writing or reading● Built-in lithium battery with high capacity for over 8 hours of operating life● Integrated Visible fault locating (VFL)
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Compact Palm OTDR
AV6416-OTDR
Radiasun International Group Ltd.
AV6416 Palm-OTDR is new Optical Time Domain Reflectometer with integrated VFL(visual fault locator). AV6416 Palm-OTDR feature handheld, compact, lightweight, long battery life and easy-to-use. It supports auto test, manual averaging, manual real time test mode. Besides, the AV6416 Palm-OTDR can save and transfer the measurement data to PC. The AV6416 Palm-OTDR has become the indispensable and ideal tools for fiber
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OTDR
TMO350 Series
TMO350 series Optical Time Domain Reflectometer(OTDR) is the new generation of intelligent meter for the detection of fiber communications systems.
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Handheld Reflectometers And Emissometers
Are portable contact measurement devices designed to take precise, accurate measurements.
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Time Domain Reflectometer
ETDR 10A-C
Compact dual channel precision full function portable easy to useTDR for fault location on balanced loaded and unloaded cables.
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Spectroscopic Reflectometer
– Antireflective coating (ARC) on textured (poly-) crystalline silicon solar cellMeasurement– Thickness, Reflectivity, n&kWavelength– 420 – 950 nm (1.3-3.0 eV) : expandableAccuracy (thickness measurement on specular sample)– 104.5 nm for 104.8 nm SiO₂on c-Si* Accuracy can be dependent on the quality of filmThickness range– 10 nm ~ 20 mm (depend on sample)Data acquisition time– < 1 sBeam spot size– ~ 50 mmFocusing of beam– Manual (optional auto-focus)Sample stage– Manual X-Y stage (specify sample size and travel distance)(optional automatic X-Y stage for mapping)
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Time Domain Reflectometers and S-Parameter Analyzers
The Teledyne LeCroy WavePulser 40iX and the Teledyne Test Tools T3SP15D are a perfect combination of complimentary products to serve the requirements on testing, validating and troubleshooting cables, backplanes, connectors, transmission lines on boards and interconnect.
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Optical Time Domain Reflectometer
3000 Series
Shanghai Baudcom Communication Device Co.,Ltd.
BAUDCOM 3000 series Optical Time Domain Reflectometer (OTDR) is anintelligent meter of a new generation for the detection of fiber communicationssystems. With the popularization of optical network construction in cities andcountrysides, the measurement of optical network becomes short and disperse; The3000 series is specially designed for that kind of application. It’s economic,having outstanding performance.The ODTR is manufactured with patience and carefulness, following thenational standards to combine the rich experience and modern technology, subjectto stringent mechanical, electronic and optical testing and quality assurance;in the other way, the new design makes ODTR more smart and compact andmulti-purpose.
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Micro Spectrophotometer
USPM-RU III
The USPM-RU III is a reflectometer that provides highly accurate spectral reflectivity measurements of small, curved, and thin samples without interference from rear surface-reflected light. The curved surface of the lens can be measured from a minute spot as small as ø60 µm formed on the sample surface. This provides the ability to use a goniometer to examine even the curved side lenses or other optical component.
