Particle Impact Noise Detection
vibration, shock, and acoustics testing conducted to find particulate contamination.
See Also: Particle Impact Noise Detectors, PIND
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Product
Noise Suppression Products / EMI Suppression Filters / TVS Diodes (ESD Protection Devices)
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Murata noise suppression products include compact EMI suppression filters that efficiently eliminate noise, L Cancel Transformers (LCTs) that greatly suppress noise in high-frequency bands by reducing the ESL generated inside capacitors and in boards, and TVS Diodes that guard semiconductor devices against electrostatic discharge from external sources. Murata supplies products that support a variety of approaches to suppressing noise.
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Product
Process Particle Size Analyzers
Insitec Range
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Insitec systems deliver the online continuous particle size analysis needed for efficient, cost-effective monitoring and control of industrial processes. Suitable for the widest variety of process streams from dry powders to hot sticky slurries, sprays and emulsions, whether milligrams of material or hundreds of tonnes per hour. Insitec systems measure particles in the size range 0.1 micron to 2.5 mm.
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Product
High-Speed Impact Testing Machines
HITS-X Series
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With the increasing demand for safety and reliability, evaluation of the dynamic strength (impact properties) of materials and parts is becoming more and more important. This machine can obtain data, such as the maximum test force, energy, and displacement, up to a maximum velocity of 72 km/h (20 m/s). A tensile load type (HITS-TX) and a punching type (HITS-PX) are available.
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Product
Permanent Noise Monitoring System
831-NMS
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The Model 831-NMS permanent noise monitoring system is designed for long term monitoring around airports, industrial facilities, motorsport complexes, wind farms, mining operations, and within the general community. Many required accessories are integrated through the INT docking station. Two way remote communication is available for monitoring and control from a central station. Larson Davis provides the hardware, software and open interface to allow this system to be customized for any application or purpose.
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Product
2.3KG Steel Impact Test Ball
CX-325
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Shenzhen Chuangxin Instruments Co., Ltd.
UL858 2.3KG Steel Impact Test Ball
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Product
Accessories for Trace Impurity, Plasma Detection and Online Trace Impurity Detectors
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Our accessories are tailored to optimise and retain gas purity at every step of the gas sample stage in order to ensure the best performance for trace impurity measurements at the ppb level.
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Product
IEC60068-2-75 Spring Operated Impact Hammer
CX-T04
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Shenzhen Chuangxin Instruments Co., Ltd.
This Spring Impact hammer is strictly designed according to IEC60068-2-75, IEC884 and UL1244 GB/T2423.55-2006, GB4706.1, GB8898 and GB7000 standards. It is used to test the mechanical integrity of product enclosures. After applying the impact with the hammer, the product is examined with accessibility probes to determine access to shock, energy, and injury hazards. Built in exact accordance to IEC\EN, \UL\CSA and other international Standards.
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Product
Noise & Vibration Tester
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System PC Based particularly suitable for vibration and noise measurements for the characterization of mechanical, electromechanical and electroacoustic and for the control and monitoring of installations of production. Complete configurability for the use of platforms PC (Notebook, desktop, PXI) suitable to applications of both static labotatorio, both dynamic (eg road-test) and also in the production line (functional tests and monitoring).
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Product
Radiation Detection & Measurement Products
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Detect, localize, identify, and measure radioactivity in any scenario. From routine monitoring and surveillance to emergency response situations, our advanced, integrated radiation detection instruments mitigate the threat and keep you safe. Our product portfolio of radiation detection solutions provides comprehensive, real-time monitoring, early warning, and complete information in the palm of your hand, in the work place, and in your neighborhood.
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Product
SNS Series Noise Source 10 MHz to 18 GHz (ENR 6 dB)
N4000A
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The SNS series N4000A noise source is designed for accurately measuring devices with low noise figure, with a frequency range of 10 MHz to 18 GHz and nominal ENR 6 dB.
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Product
SNS Series Noise Source 10 MHz to 18 GHz (ENR 15 dB)
N4001A
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The SNS series N4001A noise source is ideal for general purpose use with a low reflection coefficent and a nominal ENR of 15 dB from 10 MHz to 18 GHz.
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Product
Noise Source, 10 MHz to 18 GHz, nominal ENR 15 dB
346B
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The Keysight 346B noise source is the ideal companion to Keysight's noise figure solutions. Since it is broadband (10 MHz to 18 GHz), it eliminates the necessity for several sources at different frequency bands. The low SWR of the noise source reduces a major source of measurement uncertainty; reflections of test signals. The 346B's high ENR, low SWR, and variety of connectors make it a general-purpose noise source. Add special option H01 for high ENR (21 dB typical) to measure high noise figure devices, or option H42 for measuring Direct Broadcast Satellite (DBS) low noise block converters.
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Product
Noise Receiver Modules And Noise Switching Modules
MT7553 Series
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Noise Parameters are the non-50Ω extensions of Noise Figure, and are an important modeling and model validation tool to understand how a device-undertest’s performance changes as a function of source impedance. Noise Parameter measurements are typically performedusing a Vector Network Analyzer (VNA) to measure the S-Parameters of the DUT, and a Noise Analyzer (either Noise Figure Analyzer NFA or Spectrum Analyzer SA) to measure the noise power of the DUT. Noise parameters are calculated from a combination of knownsource impedances, S-parameters and noise powers.
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Product
Slip Line Detection System
YIS 200
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The YIS and SF Series metrology systems are designed for optical detection of wafer defects such as crystaldislocations, slip and other defects. The YIS-300HM (for 300 mm wafers) and YIS-200HM (for 200 mm wafers) utilizeMakyoh optics technology (Magic Mirror) and integrated robotic wafer handler provided by Hologenix.
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Product
Phase Noise Measurement Solution, 50 kHz to 110 GHz
E5505A
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The Keysight Technologies E5500 Series of phase noise measurement solutions offers the most flexible set of measurements on one-port VCOs, DROs, crystal oscillators and synthesizers. Two-port devices, including amplifiers and converters, plus CW, pulsed and spurious signals can also be measured. The E5500 measurements include absolute and residual phase noises, AM noise, and low-level spurious signals. The stand-alone instrument architecture easily configures for various measurement techniques, including the PLL/reference source technique, residual and FM discriminator methods.
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Product
Low Noise Amplifiers
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Chengdu KeyLink Microwave Technology Co., Ltd.
KeyLink's low noise amplifiers typically exhibit noise figures below 5.5dB and output 1dB compression points up 8dBm. These amplifiers are economical choices for general purpose applications. KeyLink's low noise amplifiers can be categorized as follows.
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Product
Phase Noise Tester 5MHz to 40GHz
Model 7340
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Berkeley Nucleonics Corporation
Broad Frequency Range in a single compact instrument from 5MHz to 40GHz. Measurement offsets from .01Hz to 100MHz. Absolute Phase Noise - High Drift mode (ability to measure modulations, high drifting or unstable DUTs, etc.). AM (Absolute Amplitude Noise) measurements. Pulsed Measurement Capabilities. Transient Mode: measure WB Frequency, NB Frequency, NB Phase, NB Power (WB/NB being Wide Band and Narrow Band). Dual channel low-noise integrated power supplies.
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Product
Pulse Function Arbitrary Noise Generator
81160A
Arbitrary Waveform Generator
Generation of 330-MHz pulses and 500-MHz function/arbitrary waveforms with a 2.5-GSa/s sample rate and 14-bit vertical resolution; Selectable crest factors for white Gaussian noise lets engineers determine how much distortion to apply to a device during stress testing to meet various serial bus standards; Glitch-free timing parameter changes allow engineers to change the frequency without drop-outs or glitches and enable continuous operation without rebooting or resetting the device under test; and Arbitrary bit patterns show capacitive load of the channels using simple pattern settings. Complex measurement setups are no longer necessary to test designs to their limits. Pulses 330 MHz, 500 MHz sine waves, 660 Mbit pattern
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Product
Detection of PtG and PtP Faults in Line Networks
LineTroll 110Tμr
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The indicator is powered by replaceable long-life lithium batteries which have a life expectancy of 10-15 years. It provides a 360 degree visibility for indication both for transient faults and permanent faults.
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Product
Impact Series Power Discrete Semiconductor Tester
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The Impact Series Discrete Component Tester is designed to test small signal and power semiconductor components in both single and multi-device packages or hybrids.
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Product
Real-Time Online Monitoring to Detect and Analyze Potential Partial Discharge (PD) Signals and Insulation Faults using UHF, AE, and HFCT
PDMonitor
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Power Monitoring and Diagnostic Technology Ltd.
The PDMonitor, which utilizes Ultra High Frequency (UHF), Acoustic Emission (AE) and High Frequency Current Transformer (HFCT) sensors and is designed to conduct real time online monitoring to detect and analyze potential Partial Discharge (PD) signals and insulation faults before they lead to breakdown or catastrophic failure in power assets. The system provides the developing trend of the PD, when occurring, as alarms in real time, thus helping to predict the insulation degradation status of the asset, prevent sudden accidents, and provide an effective database for Condition-Based Maintenance (CBM) of power assets.
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Product
The Lorlin© Impact Series
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Discrete Component Tester is designed to test small signal and power semiconductor components in both single and multi-device packages or hybrids.. The automatic test system can be used in all test applications including incoming inspection, wafer probe, QC, engineering, production, final test, and high reliability. The system tests most all discrete semiconductors with reliable, accurate, and repeatable results.
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Product
Incline Impact Tester
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Evaluates the ability of the packaging system to withstand sudden horizontal impacts or crushing forces.
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Product
Subsea Pipe Detection & Tracking System
HydroPACT 440
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The HydroPACT 440 pipe detection system has been established for a number of years as the industry standard, providing accurate and reliable survey data, which provides the position of conductive assets on or beneath the seabed. The system is flexible in its range of uses and can be installed on a variety of vehicles for undertaking survey work.It provides a reliable and simple method for performing accurate submarine surveys on a conductive target such as a cable or pipe.
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Product
Near-Field Detection Module for Spectroscopy
nanoFTIR
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Reflective AFM-tip illuminationDetection optimized for high-performance near-field spectroscopyPatented background-free detection technologyBased on optimized Fourier-Transform spectrometerUp to 3 spectra per secondStandard spectral resolution: 6.4/cmUpgrade to 3 cm-1 spectral resolution availableSuited for visible & infrared detection (0.5 20 m)Exchangeable beam-splitter mount includedNEW: Suited for IR synchrotron sources
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Product
Contamination Detection and Analysis
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Contamination testing, detection, analysis, troubleshooting and resolution expertise to minimise downtime, maintain customer confidence, for quality & safety
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Product
HF Low Noise Amplifier
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The COMM-connect HF Low Noise Amplifier can be used to amplify signals in the HF frequency range. The amplifier comes with a selection of 4 different connectors, which makes it very easy to adapt to any type of installation. Mechanical mounting is made easy by mounting flaps protruding the casing.
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Product
IEC60950 Ball Drop Impact Test Apparatus
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Shenzhen Chuangxin Instruments Co., Ltd.
It is mainly used for mechanical strength testing equipment enclosure, test equipment enclosure should be able to ensure that the structure can be expected to withstand the operation does not produce within the provisions of the standard risk for damage to the outer surface of the enclosure will touch dangerous parts of the apparatus.
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Product
ECM Noise Under RF Test System
BK8020
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The BaKo Type BK8020 ECM Noise Under RF Test System tests microphones under RF noise, using a ‘Direct Injection Test’ in the frequency range of 5MHz~2.5GHz with an amplitude modulated (AM) disturbance signal of 1kHz. You run the system using the controlling PC, which allows automatic configuration and which runs the test sequence automatically. When you finish testing, you can print data as an MS Excel report or save it for comparison and analysis.
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Product
Noise Dosimeter
ASV5910-2
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Hangzhou Aihua Instruments Co., Ltd.
*Attractivedesign, mini—sized and weighs only 85g*Modulardesign, cable—free and dual channels*Complywith IEC61672, IEC61252 and ANSI S1.25*Rechargeable lithium polymer battery*Softwarepackage, downloads to PC*Varietymounting methods
