Scanning Electron Microscopes
surface imaging from 1 to 5 nm in size.
See Also: Scanning Electron Microscopy, SEM
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Hot Electron Bolometer (HEB) Mixers/ Receivers In Terahertz Range
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Insight Product Company offers Hot Electron Bolometer (HEB) mixers, receivers, and chips made from NbN or NbTiN thin film. The HEB mixers can operate at frequencies of up to several terahertz.
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Online OK Tester for Electronic Ballast and CFL
WT-1
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• Test 6 pieces at one time, suitable for mass testing in assembly line. • Measure parameter: Vrms, lrms, W, PF. • Freely set upper and lower limit for lrms, W, PF, alarm when value out of limits. • Freely set test duration in range: 0-99.9s, tested data automatically locked. • Test range: 1) Vrms: 10.0-300.0V 2) lrms: 5-999mA 3) W: 0.1-300.0W 4) PF: 0.0001-1.000 • Accuracy: 0.5% • Digital display on 6 windows is easy to read • Print port and communication port available (optional)
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Electronic Engineering
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By combining our core skills in electronic and electrical engineering we can design and support all aspects of test and measurement equipment.
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Handy Scan 3D
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The truly portable metrology-grade 3D scanners delivering highly accurate measurements.Truly portable and faster than everMetrology-grade accuracy and resolutionUser-friendly and easy to use
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Atomic Force Microscope (AFM)
CombiScope
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The CombiScope Atomic Force Microscope (AFM) is an advanced research instrument that provides the entry path for researchers in biology, spectroscopy and photonics. If you work with transparent samples either in air or in liquid towards nano-scale structures and (near-field) nano-optical properties investigation, the CombiScope is the right solution for you. It perfectly combines inverted optical and atomic force microscopies and unleash all the power of both techniques providing the instrument adjustment and measurement automation, high resolution and high speed. Plus it can be easily upgraded to our Raman spectrometers.
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Product
Line Scan Camera
8M Series
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The USB Line Camera 8M is an easy-to-use cost-effective board-level line scan camera. It consists of two circuit boards, the main circuit board and the sensor circuit board.
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VME System Electronics
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Keysight VME electronics give the highest performance available in a laser interferometer system. Choose from a variety of axis and compensation boards.
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Scanning Kelvin Probe
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Our large range of Scanning Kelvin Probes gives the user full access to 2D and 3D work function plots of samples ranging in size from 50 mm to 350 mm. With work function resolution of 1 - 3 meV, and the spatial resolution of the Probe tip diameter (0.05 mm with the SKP5050 model), the Scanning Kelvin Probe gives reliable, repeatable measurements for work function, contact potential difference and Volta potential.
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Electronics Cooling Simulation Software
FloTHERM
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Perform thermal analysis, create virtual models, and test design modifications of electronic equipment before physical prototyping. FloTHERM uses advanced CFD techniques to predict airflow, temperature, and heat transfer in components, boards, and complete systems, including racks and data centers. It''s also the industry''s best solution for integration with MCAD and EDA software.
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Product
kSA Scanning Pyro
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For use on Veeco K465i and EPIK700 MOCVD reactors, the kSA Scanning Pyro performs automated temperature mapping in order to measure temperature variations across wafer carriers and wafers. Use it to tune heater zones and optimize process and hardware to achieve higher yields, wafer uniformity and device performance.
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Digital Microscope Camera
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Providing you the best range of digi eye 510 microscope camera, digital microscope camera, digi eye 510c microscope camera, digi eye 210 digital microscope camera, digi eye 510c digital tablet and digi 4k microscope camera with effective & timely delivery.
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PXIe-4051 - PXIe, 1-Channel, 60 V, 40 A PXI Electronic Load Module
788179-01
Load Module
The PXIe-4051 provides programmable load capable of sinking DC power for characterization, design validation, and manufacturing test. This module helps you sink current and absorb power out of a power source up to 300 W with programmable constant voltage, current, resistance, and power levels. You can use the PXIe-4051 to streamline the task of designing automated test systems for a wide range of applications—from aerospace and defense to automotive and semiconductor component test—by eliminating the need to mix multiple instrumentation form factors in a given test system and simplifying synchronization.
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Custom Reed Relays from Pickering Electronics
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Pickering Electronics manufactures hundreds of model relays. Many of these custom reed relays are minor variations of a standard part, for example, a different test specification or pin configuration. Others are custom designed to meet our customer's particular requirements.
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Electronic Control Unit Functional Test
Functional Test
End-of-line tests are critical to ensure passenger safety in the era of smarter vehicles. A flexible test solution is needed to ensure extensive test coverage and high test throughput with a low total cost of ownership.
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Area Scan Camera
Genie Nano-CXP
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Introducing Genie Nano-CXP, a camera designed for full-throttle performance. Genie Nano-CXP builds on Nano's proven, industry leading reputation and leverages a CoaXPress 6Gbps interface to deliver the maximum throughput from leading edge high resolution CMOS image sensors.
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Boundary Scan Tester and Programmer
JTAGMaster
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The JTAGMaster Tester and Programmer is designed to work with ABI's bespoke software - a multiple purpose platform which enables users to freely configure test procedures and instruments. Integrated functions are also available to the user to automatically learn the device status, provide pin-to-pin comparison and information as well as use some reporting facilities.
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JTAG Boundary Scan Tools
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Blackhawk has teamed with Corelis, an EWA company, to offer customer Intuitive and High Performance JTAG Boundary Scan Tools that are compatible with our JTAG emulator product line. This allows developers not only to debug code on TI devices but also leverage boundary scan testing using the same emulator hardware.
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Ultra-High Vacuum Scanning Kelvin Probe
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Our Ultra-high Vacuum Scanning Kelvin Probes (UHVSKP2020 and UHVSKP5050) give the user full access to work function (Φ) and contact potential difference (CPD) measurements under vacuum with the ability to scan a sample area of 20 x 20mm or 50 x 50mm respectively. Each system comes with the UHV head unit, tip amplifier (located at the mounting port), digital control unit and host PC with dedicated software. The tip can be retracted 100mm from the sample and approaches normal to the sample. The associated digital electronic unit powers the head unit and provides an interface between the head unit and the data acquisition system. The system comes with a complete user manual, which includes an introduction to work function measurements and a detailed description of the system software, including examples. The work function resolution of the Ultra-High Vacuum Scanning Kelvin Probes is 1-3 meV.
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High Quality Digital Benchtop Microscope
D SCOPE
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This unique microscope combines high quality optics with a modern and ergonomic design ideally suited to fiber optic applications. Until the D Scope, most microscopes were suffering from poor illumination quality yielding variable and non-reproducible image quality even amongst scopes of the same kind.
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High Soeed CMOS System on Chip (SoC) Line Scan Image Sensor
LS4k
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The LS4k is a high speed CMOS System on Chip (SoC) line scan image sensor optimized for applications requiring short exposure times and high accuracy line rates. It incorporates on chip two pixel arrays consisting of 2 rows with 4,096 7µm pitch pixels and 4 rows with 2,048 14µm pitch pixels respectively, a high accuracy (12-bit) high speed (84MHz) analog-to-digital conversion (ADC), and sophisticated on chip optical calibration for PRNU, DSNU, and lens shading correction.
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Atomic Force Microscope
FlexAFM
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For success in research, scientists depend on professional tools that can readily provide the information needed, regardless of the tasks at hand.
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X-ray Analytical Microscope Super Large Chamber Model
XGT-9000SL
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Large chamber capacity (W x D x H) : 1030 mm x 950 mm x 500 mm. X-ray shield complying with JAIMAS0101-2001/ IEC1010-1 to protect you from X-ray exposure. Mapping area size up to 350 x 350 mm2 <15 µm spot size with ultra-high intensity without compromising sensitivity and spatial resolution. Dual types of detectors for transmission and fluorescent X-rays. Detectable element range down to C with a light element detector and He purge module.
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Scan Systems
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Allows its user to achieve previously unreachable levels of dynamic performance and precision.
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Electronic Fuel Quantity Indicator
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Proportional to the amount of fuel in the tank, thereby visibly indicating remaining fuel quantity to the pilot.
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Hi-Res Radar Scan Converter PMC
Eagle-2
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Curtiss-Wright Defense Solutions
Eagle-2 is a high-performance radar scan converter from Curtiss-Wright Defense Solutions. Eagle-2 provides improved performance and support for high-resolution screen displays up to 2560 x 1600, including 2048 x 2048, making it the perfect choice for high-end radar display applications such as air traffic control (ATC) displays, VTS display command and control consoles, and radar head monitors.
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RAPID SCANNING AUTOCORRELATOR/CROSSCORRELATOR
FR-103HP
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The FR-103HP is a compact NL crystal autocorrelator, suitable for moderate and high power lasers (Pav>5mW). It is available with a scan range >60ps (suitable for pulsewidths within 10fs-15ps) and covers a wide range of wavelengths with easily interchangeable plug-in detector modules. The standard FR-103HP provides ‘real-time’ pulsewidth monitoring capability for rep rates down to 1kHz.
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Electronic DC Load, 80V, 80A, 400W With/without Remote Interfaces
LD400 Series
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Versatile solution for testing dc power sourcesConstant current, resistance, conductance, voltage and power modesWide voltage and current range, 0 to 80V and 0 to 80A400 watts continuous dissipation at 28°C (360W at 40°C)600 watts short-term dissipation (up to 60 seconds)Low minimum operating voltage of <1V at 40AHigh resolution and accuracy for level settingBuilt-in transient generator with variable slewCurrent monitor output for waveform viewingVariable drop-out voltage for battery testingHigh resolution backlit graphic LCD with soft key controlAnalogue remote control of levels and TTL control of on/off and transient switchingFront and rear input terminals (front terminals 30A max.)Full bus control via USB, RS232 and LXI compliant LAN interfaces (LD400P)GPIB option (LD400P only)
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3-CMOS & 3-CCD prism-based RGB Area Scan Cameras
Apex Series
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JAI’s prism-based R-G-B cameras separate the incoming light into red, green and blue wavelengths, which are directed to three separate image sensors. The cameras deliver exceptionally accurate R-G-B raw image data ideal for demanding color machine vision applications across a range of industries including pharmaceutical, electronics, printing/packaging and imaging in microscopy and medical diagnostics equipment.
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Electronic Ballast Tester
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LCD for displaying waveforms and parameters directly, and it includes all the functions and technical parameters of WT3000. Reports can be printed if printer is connected. It also meets the latest requirements for electronic ballasts in international standards
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AC Electronic Load
IT8600 Series
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IT8600 is ITECH latest series of AC/DC electronic loads with power range 0~14.4 kVA and adjustable frequency 45 Hz ~ 450 Hz. The unique oscilloscope waveform display function of IT8600's can display input voltage & current as waveform. It is equipped with measurement modes for different parameters such as inrush current, peak value, effective value, PF (power factor).
