ECU Testing
test of Electronic Control Unit (Engine Control Unit) validating it and related dynamic systems.
See Also: ECU, ECU Simulation
-
Product
SAS Protocol Test System
M124A
-
The SAS Sierra M124A Protocol Test System is Teledyne LeCroy's 7th generation protocol analyzer system that provides 100% accurate protocol capture of both SAS (SAS 3.0) and SATA (SATA 3.0). The industry's most widely used test platform for SAS and SATA features unmatched analysis and debug capabilities to help pinpoint problems at every layer of the protocol.
-
Product
Custom Test System Solutions
-
No time to think about test? One-size-fits-all testers not ideal? Existing solution no longer fits your needs? Then count on integrated test solutions from Astronics. We’ll assist you with your test strategy and your test system, setting you on the path to market at a pace and ROI that ensures your program success.
-
Product
EFT Module for Teststand
-
The Electronics Functional Test (EFT) Module for TestStand provides out-of-the-box tools to speed up development of automated tests for electronic assemblies including PCBAs, subassemblies and final assemblies. Test engineers can develop, deploy and execute test sequences quickly and efficiently with minimal custom code development for a shorter time-to-solution.
-
Product
Test Fixture, Axial And Radial
16047A
-
The 16047A is designed for impedance evaluation of axial/radial lead type devices of up to 13MHz. The 16047A employs Kelvin contacts which realize a wide impedance measurement range. The contact tip can be changed according to the device shape.
-
Product
Flash Memory Test System
T5830
-
T5830 memory tester, the latest member of its T5800 product family, optimized for testing a wide range of flash memory devices used in mobile electronic devices. The highly flexible T5830 tester has all of the capabilities needed to perform wafer sorting and final testing of price-sensitive flash memories.
-
Product
Environmental Control System Test Platform
-
The Airframe Environmental Control System Test Platform provides a hardware-in-the-loop (HIL) closed-loop test environment for dynamic and maintenance testing of cockpit and cabin environmental control systems for airframes. The system simulates a military or commercial airframe cabin, including sensors and actuators from the control system and the passengers. The system delivers repeatable, cost-effective testing in a fraction of the time needed with typical in-house simulation systems.
-
Product
Test Handler
M4841
-
High-Throughput Device Handler for Volume Production Testing of MCUs and DSPs.
-
Product
Fixture Self-Test Controller and Calibration Check
AQ818
-
The module AQ818 includes all the electronic blocks required to perform an effective test platform self-test. Thanks to this module, a chain of tests can be performed, which will end up not only with a report of the defective instruments or switch modules, but also with the relay contacts live expectancy report.
-
Product
W-CDMA/HSPA+ Analysis Using NI PXI RF Test Instruments
RFmx W-CDMA/HSPA+
-
The NI-RFmx W-CDMA personality is a highly optimized API for performing physical layer measurements on W-CDMA cellular standard signals. NI-RFmx W-CDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
-
Product
Test Handler
M4872
-
Improve Efficiency in High-Volume Manufacturing and Device Characterization.
-
Product
Inline test system for FCT, ICT, ISP and Boundary Scan for Automated Operation
LEON InLine
-
High production volume often requires inline solutions with fully automated product Handling – the LEONlnline is a complete Inline Board Test Solutions for printed circuit boards. It integrates a flexible and scalable test system that features an excellent signal integrity and a high-quality fixture interface. This is achieved by combining a cableless connection from ABex modules to Virginia panel interface connectors.
-
Product
Compact & Flexible Test Systems for FCT,ICT, ISP and Boundary Scan Designed for Easy Integration
LEON Rack
-
The LEONRack test system is a flexible test system that could be installed in automation or handling solutions. It is highly flexible and available in three different chassis sizes from low pin count to high pin count test systems. As part of the LEON Family, LEONRack is based on the ABex platform which directly incorporates Konrad analog bus technology and PXI/PXIe in one chassis.
-
Product
HTOL Test Systems
-
Our IOL & Power-Cycling systems increase measurement quality & throughput while simultaneously reducing the Total Cost of Test (TCoT) of an open platform. We focus on complete monitoring and precise temperature control for each device under test.
-
Product
Functional Test Fixtures
-
Reliable connections to device under test (DUT) test points are essential for robust functional test. Bloomy provides rugged fixtures and cable sets (ITAs) built for thousands and thousands of cycles in manufacturing environments. With the industry’s best mass interconnects and internal electronic keying, our fixtures are easy to change out and are automatically recognized by the test system.
-
Product
Test System Optimized for High Throughput, Low Cost of Test for Single Site, Multi-site and Index Parallel Applications
ETS-88RF
-
Targeting the needs of power amplifier (PA) and front-end-module (FEM) semiconductor manufacturers, the ETS-88RF test system is aligned with the test challenges associated with these direct RF radio wave interface components. The precision with which the ETS-88RF can measure high-gain, wideband frequency performance, adjacent channel leakage and power supply efficiency makes this test system the most cost-effective alternative to bench set-ups. Teradyne routinely provides timely updates to a substantial library of RF Standards (such as 802.11xx and 3GPP) targeted for PA and FEM test.
-
Product
Photonics Wafer Probing Test System
58635
-
The advancement of the photonics device technology continues to enable broader and more demanding applications in the industry.
-
Product
Seno-Con Test System
PANTHER 2K QST
-
Qmax Test Technologies Pvt. Ltd.
Panther 2K-QST is a versatile ultra fast Seno-Con test system designed to test high volume ,low to high pin count consumer semiconductor IC’s for its assembly line wire bonding faults. Its innovative test technology helps learn from known good device and test against target device drastically reduces time required to develop Test programs.The operating software is designed in such a way that it is fully user friendly with GUI programming.
-
Product
128 DIOs JTAG Boundary Scan Resources Unit
YAV9JTAG
-
Boundary-scan is a widely practiced test methodology that is reducing costs, speeding development, and improving product quality for electronics manufacturers around the world. By relying on an industry standard, IEEE 1149.1, it is relatively quick, easy, and inexpensive to deploy a highly effective test procedure. In addition, today’s PCBs have little alternative because of limited access to board-level circuitry.
-
Product
ESD Test System
58154 Series
-
ESD (Electrostatic Discharge) Test Systems are PXI/PCI controlled module to simulate electrostatic discharge pulse during electronic device testing. The 58154 series offer both ESD STM5.1-2001-Human Body Model and ESD STM5.2-1999-Machine Model. The user friendly software offers programmable and flexible features, such as sampling test on a wafer, ESD model, ESD pulse polarity, ESD pulse interval in a sequence, and automatic testing function.
-
Product
Advanced SoC/Analog Test System
3650
-
Chroma 3650 is an SoC tester with high throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses.
-
Product
PXI Integration Platform
ATS-3100
-
The new ATS-3100 enables you to rise above the module level and shift your focus to the sophisticated test solution you’re actually building. Simply add your instruments, software, and customization to create a complete solution. Or, if you're short on time or resources, ask Astronics Test Systems to do the finishing work for you.
-
Product
Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196A
-
The 16196A surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results - reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement - now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
-
Product
SMD Array Type LCR Test Fixture
16034H
-
The 16034H is designed for impedance evaluations of array-type SMD.The minimum SMD size that this fixture is adapted to evaluate is 1.6(L)x0.8(W)[mm]. Since the tip of the measurement electrodes are very thin and the device holder is extremely flat, the device can be shifted and the measurement electrodes can contact each of the elements of the array-type component.
-
Product
80 DIOs, 8AIs, 8AOs JTAG Boundary Scan Resources Unit Expansion
YAV9JTAH
-
80 DIOs8 Ais8 AOsCompatible with all JTAG vendors
-
Product
SoC Test Systems
-
SoC (System on Chip) devices integrate multiple different functions into a single chip. Our SoC test systems can test all the integrated circuits in SoC devices, including logic, analog, RF, DC and imagers by flexible configuration of the cards/modules used in the test system.
-
Product
PN009 – ECU – Diagnostic
-
*Allow to read and write EEPROM EDC15, EDC17 (BOOT MODE), SID201, SID801, SID801A, SID802, SID803, SID803A, SID804, SID806.*Read and modify of counter – EDC16, EDC17(BOOT MODE), SID201, SID801, SID801A, SID802, SID803, SID803A, SID804, SID806*Read and change PIN EDC15, SID201, SID801, SID801A, SID802, SID803, SID803A, SID804, SID806*Read and change EEPROM with EDC15 and make OFF
-
Product
Functional Test for Engineering Lab
Spectrum BT
-
Designed to meet the needs of product engineering labs, production lines, test development centers, and repair depots, the Spectrum BT is a configurable and scalable functional test system. This focused system solves typical functional test coverage challenges throughout the defense/aerospace product life cycle—and it’s upgradable as test requirements evolve.
-
Product
FADEC/EEC Test Platform
-
The FADEC/EEC Test Platform provides a hardware in-the-loop (HIL) closed-loop test environment for dynamic and maintenance testing of full-authority digital engine control (FADEC) and electronic engine control (EEC) units of both rotary- and fixed-wing airframes. The system simulates one or more turbofan engines, including its sensors and actuators for use with the most sophisticated FADECs and EECs on the market. The system delivers repeatable, cost-effective testing in a fraction of the time needed with typical in-house simulation test systems.
-
Product
Multibus Development and Test Tool for ECUs and Networks
CANoe
-
The versatile software tool for development, testing and analysis of ECUs and entire networks. Bus systems: CAN, CAN FD, LIN, MOST, FlexRay, Ethernet, WLAN, Car2x ITS G5, AFDX, J1708, ARINC429 > Protocols: TCP/IP, SOME/IP, CANopen, J1939, ISO 11783, J1587, MCnet, GMLAN, K-Line, CANaerospace and ARINC 825. Others upon request.
-
Product
Mini In-Circuit Test System
U9403A
-
The Keysight Mini ICT is a true in-circuit test unit in the rack that can be used standalone or integrated. It comes with a full set of Keysight ICT test features, from VTEP vectorless test, Cover-Extend Technology, to digital library tests and boundary scan. The unmuxed per-pin programmable digital engine makes test development really flexible and easy, especially in a situation when device conditioning is needed in functional test.
