Product

Scanning Probe Microscopes

SpectraView 2500

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DYNEOS AG

SpectraView 2500 - DYNEOS AG

* Ultra-low noise SPM* Colocalized nanochemical analysis by IR, THz, Raman, AFM* Cantilever probes are completely transparent* Versatile configurations: Kelvin Probe chemical potential, electrical, thermal and photon force

Product

Scanning Probe Microscopes

attoMICROSCOPY

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attocube systems AG

attoMICROSCOPY - attocube systems AG

The mission to create scientific impact has kept attocube at the frontier of cutting edge research instrumentation. Decades of combined experience in all relevant fields, an excellent team, and close cooperations with some of the world’s leading research institutes have evolved into a broad portfolio of high-end cryogenic scanning probe microscopes.

Product

High-Resolution Scanning Probe Microscope (SPM)

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Shimadzu Corp.

Shimadzu Corp.

High-Resolution Scanning Probe Microscope (SPM)

Product

AFM-Raman for Physical and Chemical Imaging

XploRA Nano

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HORIBA, Ltd.

XploRA Nano - HORIBA, Ltd.

Fully integrated system based on SmartSPM state of the art scanning probe microscope and XploRA Raman micro-spectrometer.Compact, fully automated and easy-to-use, the XploRA Nano concentrates the power of AFM-Raman into an affordable yet full-featured package, making TERS imaging a reality for all. The TERS proven system.

Product

Create Topographic Profiles from SPM Images

TopoStitch

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Image Metrology A/S

TopoStitch - Image Metrology A/S

topoStitch™ offers the easiest and most accurate way to stitch topographic or greyscale images from Scanning Probe Microscopes (SPM’s), profilers, interferometers, confocal microscopes or any other instrument type. All images are placed automatically according to stage position coordinates when stored in the image files. Otherwise, the Grid Layout Wizard helps to lay out images in seconds. topoStitch™ even offers advanced snapping and semi transparent rendering, which makes it easy to place and adjust images manually.

Product

High-Resolution Scanning Probe Microscope

SPM-8100FM

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Shimadzu Corp.

SPM-8100FM - Shimadzu Corp.

The new HR-SPM scanning probe microscope uses frequency detection. his instrument is not only capable of ultra-high resolution observations in air or liquids, but for the first time enables observations of hydration/solvation layers at solid-liquid interfaces.

Product

Real-time and Direct Correlative Nanoscopy

LabRAM Soleil Nano

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HORIBA, Ltd.

LabRAM Soleil Nano - HORIBA, Ltd.

Fully integrated system based on our OmegaScope scanning probe microscope and LabRAM Soleil Raman microscope. LabRAM Soleil Nano offers unprecedented capabilities for direct co-localized AFM-Raman and photoluminescence measurements. AFM imaging modes (topographic, electrical, mechanical, etc.) and Raman acquisition can be performed either sequentially or simultaneously at the same location of the sample surface. Optical nano-resolution is also achievable with Tip-Enhanced Raman Spectroscopy and Photoluminescence (TERS/ TEPL). LabRAM Soleil Nano is compatible with the environmental chamber for AFM and Raman measurements in controlled atmosphere and at low temperatures.

Product

Scanning Probe Microscope

SPM-9700HT

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Shimadzu Corp.

SPM-9700HT - Shimadzu Corp.

Making the Unknown Visible Scanning probe microscope (SPM) is a generic term for microscopes that scan sample surfaces with an extremely sharp probe to observe their three-dimensional image or local properties at high magnifications. The SPM-9700HT takes high-throughput observations to the next level.

Product

AFM-Raman for Physical and Chemical Imaging

LabRAM Nano

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HORIBA, Ltd.

LabRAM Nano - HORIBA, Ltd.

Fully integrated system based on SmartSPM state of the art scanning probe microscope and LabRAM HR Evolution fully automated Raman micro-spectrometer. LabRAM HR Nano offers full automation and versatile compatibility with outstanding performance.

Product

Advanced Stand-Alone AFM

SmartSPM

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HORIBA, Ltd.

SmartSPM - HORIBA, Ltd.

The SmartSPM Scanning Probe Microscope is the first 100% automated system that offers its cutting-edge technology of ultra-fast, metrological and high-resolution measurements for the most advanced materials research at the nanoscale in all AFM and STM modes. With the SmartSPM zooming in from large up to 100 µm overview scans down to atomic resolution has become a reality. Its design has been specially developed to be capable of being seamlessly integrated with optical spectroscopies (SNOM, Raman, Photoluminescence and TERS/SERS techniques).