Scanning Probe Microscopes
Used to study the properties of surfaces at the atomic level. (www.eng.yale.edu)
See Also: SPM
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Scanning Probe Microscopes
attoMICROSCOPY
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The mission to create scientific impact has kept attocube at the frontier of cutting edge research instrumentation. Decades of combined experience in all relevant fields, an excellent team, and close cooperations with some of the world’s leading research institutes have evolved into a broad portfolio of high-end cryogenic scanning probe microscopes.
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Scanning Probe Microscopes
SpectraView 2500
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* Ultra-low noise SPM* Colocalized nanochemical analysis by IR, THz, Raman, AFM* Cantilever probes are completely transparent* Versatile configurations: Kelvin Probe chemical potential, electrical, thermal and photon force
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Advanced Stand-Alone AFM
SmartSPM
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The SmartSPM Scanning Probe Microscope is the first 100% automated system that offers its cutting-edge technology of ultra-fast, metrological and high-resolution measurements for the most advanced materials research at the nanoscale in all AFM and STM modes. With the SmartSPM zooming in from large up to 100 µm overview scans down to atomic resolution has become a reality. Its design has been specially developed to be capable of being seamlessly integrated with optical spectroscopies (SNOM, Raman, Photoluminescence and TERS/SERS techniques).
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Create Topographic Profiles from SPM Images
TopoStitch
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topoStitch™ offers the easiest and most accurate way to stitch topographic or greyscale images from Scanning Probe Microscopes (SPM’s), profilers, interferometers, confocal microscopes or any other instrument type. All images are placed automatically according to stage position coordinates when stored in the image files. Otherwise, the Grid Layout Wizard helps to lay out images in seconds. topoStitch™ even offers advanced snapping and semi transparent rendering, which makes it easy to place and adjust images manually.
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AFM-Raman for Physical and Chemical Imaging
XploRA Nano
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Fully integrated system based on SmartSPM state of the art scanning probe microscope and XploRA Raman micro-spectrometer.Compact, fully automated and easy-to-use, the XploRA Nano concentrates the power of AFM-Raman into an affordable yet full-featured package, making TERS imaging a reality for all. The TERS proven system.
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High-Resolution Scanning Probe Microscope
SPM-8100FM
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The new HR-SPM scanning probe microscope uses frequency detection. his instrument is not only capable of ultra-high resolution observations in air or liquids, but for the first time enables observations of hydration/solvation layers at solid-liquid interfaces.
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Scanning Probe Microscope
SPM-9700HT
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Making the Unknown Visible Scanning probe microscope (SPM) is a generic term for microscopes that scan sample surfaces with an extremely sharp probe to observe their three-dimensional image or local properties at high magnifications. The SPM-9700HT takes high-throughput observations to the next level.
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Real-time and Direct Correlative Nanoscopy
LabRAM Soleil Nano
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Fully integrated system based on our OmegaScope scanning probe microscope and LabRAM Soleil Raman microscope. LabRAM Soleil Nano offers unprecedented capabilities for direct co-localized AFM-Raman and photoluminescence measurements. AFM imaging modes (topographic, electrical, mechanical, etc.) and Raman acquisition can be performed either sequentially or simultaneously at the same location of the sample surface. Optical nano-resolution is also achievable with Tip-Enhanced Raman Spectroscopy and Photoluminescence (TERS/ TEPL). LabRAM Soleil Nano is compatible with the environmental chamber for AFM and Raman measurements in controlled atmosphere and at low temperatures.
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AFM-Raman for Physical and Chemical Imaging
LabRAM Nano
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Fully integrated system based on SmartSPM state of the art scanning probe microscope and LabRAM HR Evolution fully automated Raman micro-spectrometer. LabRAM HR Nano offers full automation and versatile compatibility with outstanding performance.
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High-Resolution Scanning Probe Microscope (SPM)
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High-Resolution Scanning Probe Microscope (SPM)
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x1149 Boundary Scan Analyzer
N1125A
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The x1149 is a tool for engineers to perform structural test such as opens and shorts tests on their PCBAs. It also performs In-System Programming for devices such as FPGAs and CPLDs.
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Elevated 1.68 (48.00) - 7.00 (198.00) High Performance Bias Ball Probe
POGO-1T-7-S
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Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Elevated 2.67 (76.00) - 7.00 (198.00) High Performance Lead Free Probe
LFRE-72U-7
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Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,700Overall Length (mm): 43.18
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Elevated 2.67 (76.00) - 7.00 (198.00) High Performance Lead Free Probe
LFRE-72H-7
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Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,700Overall Length (mm): 43.18
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High Force Type Probe For PCB, K100 Series 100mil Pitch, Type G, Ø1.50mm, 155gf
K100-G150155-SKAU
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K100 Series, Pitch 100mil, Tip Style G, Tip Diameter Ø1.50mm, Spring force 155gf, Steel with Gold Plating.
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Light 0.83 (24.00) - 2.00 (57.00) High Performance Lead Free Probe
LFRE-1Z-2
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Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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High 2.84 (81.00) - 8.00 (227.00) High Performance Lead Free Probe
LFRE-25I40-8
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Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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SIP-90-5 Test System Interface Probe
SIP-90-5
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Overall Length (mil): 1,000Overall Length (mm): 25.40Rec. Mounting Hole Size (mil): 55Rec. Mounting Hole Size (mm): 1.40Recommended Drill Size: #54 or 1.40 mm
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Alternate 2.14 (61.00) - 6.00 (170.00) High Performance Lead Free Probe
LFRE-72H-6
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Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,700Overall Length (mm): 43.18
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Alternate 2.58 (73.00) - 6.00 (170.00) High Performance Lead Free Probe
LFRE-25T79-6
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Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Elevated 2.65 (75.00) - 6.50 (184.00) High Performance Lead Free Probe
LFRE-25L-6.5
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Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Light 0.83 (24.00) - 2.00 (57.00) High Performance Lead Free Probe
LFRE-1H-2
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Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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Fiber-Optic Probes
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Designed with an unparalleled optical quality finish, Optomistic Products has developed a wide array of Fiber-optic Probes to accommodate your specific LED test requirement and mechanical constraints.
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Super 3.90 (111.00) - 16.00 (454.00) High Performance Lead Free Probe
LFRE-25A-16
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Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Standard 1.10 (31.18) - 4.80 (136.00) Switch Probe
TSP100-H180-1
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Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 20Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 197Full Travel (mm): 5.00Recommended Travel (mil): 157Recommended Travel (mm): 4.00Overall Length (mil): 1,990Overall Length (mm): 50.60Switch Point (mil): 59Switch Point (mm): 1.50
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Alternate 2.58 (73.00) - 6.00 (170.00) High Performance Lead Free Probe
LFRE-25B-6
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Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Passive Probe, 10:1, 350 MHz, 1.3 M
N2872A
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Compact 2.5-mm probe head diameter, low input capacitance, and various fine-pitch probe tip accessories make the Keysight N2870A Series passive probes ideal for probing densely populated IC components or surface-mount devices used in today’s high-speed digital applications.
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Premium 4.49 (127.00) - 12.00 (340.00) High Performance Lead Free Probe
LFRE-25UN-12
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Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Standard 0.62 (18.00) - 4.00 (114.00) High Performance Lead Free Probe
LFRE-1T-4
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Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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Elevated 2.65 (75.00) - 6.50 (184.00) High Performance Lead Free Probe
LFRE-25I35-6.5
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Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
