Scanning Probe Microscopes
Used to study the properties of surfaces at the atomic level. (www.eng.yale.edu)
See Also: SPM
-
Product
Laser Scanning Systems
-
QFP markets manually handled and optically tracked 3D laser scanners that set new standards in the metrology measurement industry. The products are characterized by exceptional performance, ease of use and cost-effectiveness and are the perfect solution for the metrology room as well as for the production line, stand-alone or automated.
-
Product
Ultra High 4.09 (116.00) - 10.00 (283.00) General Purpose Probe
EPA-2E-2
-
Current Rating (Amps): 5Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 160Full Travel (mm): 4.06Recommended Travel (mil): 107Recommended Travel (mm): 2.72Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 970Overall Length (mm): 24.64
-
Product
Scanning Acoustic Microscope
Pulse2
-
This industry-leading scanning acoustic microscope provides a universal inspection tool for packaged semiconductor development, production and failure analysis. With the ability to detect air defects as thin 0.05 micron and spatially resolve defects down to 10 microns, the ECHO is perfect for bump detection, stacked die (3D packaging) inspection, complex flip chip inspection and more traditional plastic packages.
-
Product
Boundary Scan
TurboBSD
-
TurboBSD is SynTest high-performance Boundary Scan Designer. It is 100% compliant to the IEEE 1149.1 Boundary Scan Standard. TurboBSD performs Boundary Scan logic synthesis, creates BSDL (Boundary Scan Description Language) file, and generates Boundary Scan test patterns
-
Product
Differential Scanning Calorimeter
DSC-60 Plus Series
-
DSC (Differential Scanning Calorimeter) is an indispensable thermal analyzer for materials characterization in R&D and quality control applications in such areas as polymers, pharmaceuticals, electronic parts , foods , etc . It offers the sensitivity and easy operation required for the development of high-performance, highly functional new materials.
-
Product
Horizontal Digital Microscope
BVM-20107
-
The microscope is configured with 1.3M HD industrial camera. VGA image output interface, can be connected to the computer and monitor directly. clear and vivid image, image freeze, auto exposure, dual cross lines , 8 mobile cross lines, color is variable, convenient observation and positioning. Camera is equipped with remote control panel, which makes the operation much easier
-
Product
Standard 6.13 (174.00) - 16.00 (456.00) General Purpose Probe
EPA-5E
-
Current Rating (Amps): 8Average Probe Resistance (mOhm): 35Test Center (mil): 187Test Center (mm): 4.75Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,420Overall Length (mm): 36.07
-
Product
High 2.84 (81.00) - 8.00 (227.00) High Performance Lead Free Probe
LFRE-25Z-8
-
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
-
Product
Ultra High 2.84 (81.00) - 10.00 (283.00) High Performance Bias Ball Probe
POGO-1A-10
-
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
-
Product
Industrial Microscope Systems
-
Below you can see two industrial microscope systems which can be created using our components. Many other automated microscopy systems are possible using our components.
-
Product
2D Scanning Unit
intelliSCAN FT
-
The intelliSCAN FT is a 2D scanning unit for planar remote laser applications. Fix integrated in the welding machine or attached to a Gantry system, the scan unit ensures fast and precise positioning of the laser spot.
-
Product
Alternate 3.20 (90.00) - 6.90 (196.00) General Purpose Probe
EPA-4D-1
-
Current Rating (Amps): 7Average Probe Resistance (mOhm): 35Test Center (mil): 187Test Center (mm): 4.75Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,320Overall Length (mm): 33.53
-
Product
Desktop Fluorescence Microscope
Nanoimager
-
The complete package for super-resolution microscopy
-
Product
Differential Scanning Calorimetry
Nano DSC
-
The Nano DSC differential scanning calorimeter is designed to characterize the molecular stability of dilute in-solution biomolecules. The Nano DSC obtains data using less sample than competitive designs. Solid-state thermoelectric elements are used to precisely control temperature and a built-in precision linear actuator maintains constant or controlled variable pressure in the cell. Automated, unattended continuous operation with increased sample throughput is achieved with the optional Nano DSC Autosampler.
-
Product
Alternate 2.82 (80.00) - 5.00 (141.00) General Purpose Probe
HPA-74T65-1
-
Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Test Center Remark: max. test center 187 mil / 4,74 mmFull Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 75Recommended Travel (mm): 1.91Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 598Overall Length (mm): 15.19Overall Length Remark: Tip “A-B”: 598 (mil), 15.19 (mil), Tip “C”: 586 (mil), 14.88 (mil), Tip “E, T135, T156, T65, T80”: 610 (mil), 15.49 (mil), Tip “T75”: 620 (mil), 15.75 (mil)
-
Product
Premium 4.49 (127.00) - 12.00 (340.00) High Performance Lead Free Probe
LFRE-25T-12
-
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
-
Product
Scanning Receivers
-
PCTEL® scanning receivers are precision network testing tools. Designed for drive testing, walk testing, troubleshooting, and monitoring of cellular, WiFi, IoT, and critical communications networks worldwide, they provide the insights you need to improve coverage and quality of service throughout the wireless network lifecycle.
-
Product
High 2.84 (81.00) - 8.00 (227.00) Bead Probe
BTP-25HF-8
-
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,300Overall Length (mm): 33.02
-
Product
Light Sheet Microscopes
-
Discover advanced light sheet microscopy solutions from Leica Microsystems. Our portfolio combines cutting-edge technology with exceptional imaging capabilities to enhance your research.
-
Product
Standard 0.62 (18.00) - 4.00 (114.00) High Performance Bias Ball Probe
POGO-1T30-4
-
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
-
Product
Alternate 3.50 (99.00) - 6.85 (194.00) General Purpose Probe
P2757G-3W2S
-
Current Rating (Amps): 20Average DC Resistance lower than (mOhm): 10Test Center (mil): 187Test Center (mm): 4.75Full Travel (mil): 230Full Travel (mm): 5.84Recommended Travel (mil): 167Recommended Travel (mm): 4.24Overall Length (mil): 1,210Overall Length (mm): 30.73Overall Length Remark: Tip 2C: 1140 mil (28.96 mm) Tip 1W: 1205 mil (30.61 mm) Tip 2W: 1205 mil (30.61 mm)
-
Product
POGO-62 High Performance Bias Ball Probe
POGO-62
-
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,300Overall Length (mm): 33.02
-
Product
Stereo & Pocket Microscope
-
A small microscope which is designed to be easily portable. In some cases, the microscope may literally fit in a pocket, while in other cases it may be more comfortably carried in a field bag or small carrying case.
-
Product
Standard 0.50 (14.00) - 2.00 (57.00) Non Replaceable General Purpose Probe
A-A-S-R
-
Current Rating (Amps): 2Average DC Resistance lower than (mOhm): 30Test Center (mil): 39Test Center (mm): 1.00Full Travel (mil): 30Full Travel (mm): 0.76Recommended Travel (mil): 20Recommended Travel (mm): 0.51Overall Length (mil): 310Overall Length (mm): 7.87Rec. Mounting Hole Size (mil): 31.5Rec. Mounting Hole Size (mm): 0.80Recommended Drill Size: #68 or 0.79 mm
-
Product
High Force Type Probe For PCB, K100 Series 100mil Pitch, Type A, Ø0.80mm, 155gf
K100-A080155-SKAU
-
K100 Series, Pitch 100mil, Tip Style A, Tip Diameter Ø0.80mm, Spring force 155gf, Steel with Gold Plating.
-
Product
Standard 1.17 (33.20) - 4.50 (128.00) Battery Probe
CP-2TB-8
-
Current Rating (Amps): 5Average Probe Resistance (mOhm): 50Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 88Full Travel (mm): 2.25Recommended Travel (mil): 78.7Recommended Travel (mm): 2.00Overall Length (mil): 315Overall Length (mm): 8.00Overall Length Remark: Overall length does not include tail.Recommended Drill Size: #53 or 1.51 mmRec. Mounting Hole Size (mil): 61Rec. Mounting Hole Size (mm): 1.55
-
Product
Alternate 2.39 (68.00) - 6.00 (170.00) High Performance Bias Ball Probe
POGO-1B-6-S
-
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
-
Product
Inspection Microscope
Z-NIR
-
The McBain Z-NIR Near Infrared Inspection System is best-in-class for wafer-to-wafer and die-to-die alignment measurement and verification. This unique tool has been sold into many industries with various applications including sub-surface wafer and die inspection for cracks and bond integrity, MEMS, wafer bonding, 3-D chip stacking, failure analysis, process development, tool verification, part characterization, environmental testing and more.
-
Product
Ultra High 2.84 (81.00) - 10.00 (283.00) High Performance Bias Ball Probe
POGO-1T1-10
-
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
-
Product
Inverted Light Microscopes
-
Inverted microscopes from Leica Microsystems are designed to meet the rigorous demands of life science as well as material science and industrial applications.
