Scanning Probe Microscopes
Used to study the properties of surfaces at the atomic level. (www.eng.yale.edu)
See Also: SPM
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Product
Elevated 2.67 (76.00) - 7.00 (198.00) High Performance Lead Free Probe
LFRE-72H-7
ICT/FCT Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,700Overall Length (mm): 43.18
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Product
High-Frequency Probe, 300 kHz to 3 GHz
85024A
ICT/FCT Probe
85024A high-frequency probe makes it easy to perform in-circuit measurements. An input capacitance of only 0.7 pF shunted by 1 megohm of resistance permits high frequency probing without adversely loading the circuit under test. Excellent frequency response and unity gain guarantee high accuracy in swept measurements with this probe. High probe sensitivity and low distortion levels allow measurements to be made while taking advantage of the full dynamic range of RF analyzers.
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Product
Light Microscopes
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Compound light microscopes from Leica Microsystems meet the highest demands whatever the application – from routine laboratory work to the research of multi-dimensional dynamic processes in living cells.
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Product
FRP-25T Test System Interface Probe
FRP-25T
ICT/FCT Probe
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 160Full Travel (mm): 4.06Recommended Travel (mil): 120Recommended Travel (mm): 3.05Overall Length (mil): 1,210Overall Length (mm): 30.73
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Product
Power Rail Probe, 6 GHz
N7024A
Oscilloscope Probe
The N7024A power rail probe is for users making power integrity measurements that need mV sensitivity when measuring noise, ripple and transients on their DC power rails. The probe is designed for measuring periodic and random disturbances (PARD), static and dynamic load response, programmable power rail response, and similar power integrity measurements. Many of today’s products have tighter tolerances on their DC power rails than the previous generations of these products, and the N7024A power rail probe is designed to help users ensure their products meet these tighter tolerances.
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Product
Passive Probe, 10:1, 150 MHz, 1.2 M
N2841A
Oscilloscope Probe
The Keysight N2841A low-cost passive probe provides a 10:1 attenuation and features a high input resistance of 10 MΩ. The probe can be adjusted for low-frequency compensation and high-frequency compensation.
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Product
Elevated 1.68 (48.00) - 7.00 (198.00) High Performance Lead Free Probe
LFRE-1J-7
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Metallurgical Microscope
BXJ900 Series
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Nanjing Kozo Optical and Electronical Instrument Co., Ltd.
LCD Metallurgical microscope is one new microscope, it is suitable to observe the sample while with the sharp image.
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Product
Standard 1.50 (43.00) - 3.00 (85.00) General Purpose Probe
P2665G-1C1S
General Purpose Probe
Current Rating (Amps): 15Average DC Resistance lower than (mOhm): 10Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 230Full Travel (mm): 5.84Recommended Travel (mil): 167Recommended Travel (mm): 4.24Overall Length (mil): 1,290Overall Length (mm): 32.77Overall Length Remark: Tip 2W: 1270 mil (32.26 mm)
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Product
Focused Ion Beam Scanning Electron Microscopes
FIB-SEMs
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Combine imaging and analytical performance of a high resolution field emission scanning electron microscope (FE-SEM) with the processing ability of a next-generation focused ion beam (FIB).
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Product
Elevated 2.65 (75.00) - 6.50 (184.00) High Performance Lead Free Probe
LFRE-25V-6.5
ICT/FCT Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Atomic Force Microscope
LensAFM
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The Nanosurf LensAFM is an atomic force microscope that continues where optical microscopes and profilometers reach their resolution limits. It is mounted like a normal objective lens, thus extending the resolution and measuring capabilities of these instruments.
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Product
Wide-Aperture Fiber-Optic Probes
Fiber-optic Probe
Wide-aperture Fiber-optic Probes and Very Wide-aperture Fiber-optic Probes are used to test dim or misaligned LEDs.
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Product
Atomic Force Microscope
3DM Serirs
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Park Systems has introduced the revolutionary Park 3DM Series, the completely automated AFM system designed for overhang profiles, high-resolution sidewall imaging, and critical angle measurements. With the patented decoupled XY and Z scanning system with tilted Z-scanner, it overcomes the challenges of the normal and flare tip methods in accurate sidewall analysis. In utilizing our True Non-Contact Mode™, the Park 3DM Series enables non-destructive measurement of soft photoresist surfaces with high aspect ratio tips.
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Product
Alternate 3.00 (85.00) - 5.70 (162.00) General Purpose Probe
P2664G-1C2S
General Purpose Probe
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 10Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 114Full Travel (mm): 2.90Recommended Travel (mil): 84Recommended Travel (mm): 2.13Overall Length (mil): 895Overall Length (mm): 22.73Overall Length Remark: Tip 1C: 845 mil (21.46 mm) Tip 2R: 935 mil (23.75 mm)
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Product
Passive Probe, 1:1, 35 MHz, 1.3 M
N2870A
Oscilloscope Probe
The N2870A passive probe offers DC to 35 MHz and 1:1 attenuation factor, making this probe ideal for low-level signal measurements.
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Product
Light 0.83 (24.00) - 2.00 (57.00) High Performance Bias Ball Probe
POGO-1T30-2
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Standard 0.62 (18.00) - 4.00 (114.00) High Performance Bias Ball Probe
POGO-1T-4-S
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Alternate 2.14 (61.00) - 6.00 (170.00) High Performance Lead Free Probe
LFRE-72T1-6
ICT/FCT Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,700Overall Length (mm): 43.18
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Product
Boundary Scan Test (BST)
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In the simplest case, the BST can be carried out via the connector of a module.Digital components require a JTAG port. In direct comparison to the ICT, the BST requires longer test times and the testing of analog components is not possible.
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Product
Rogowski AC Current Probe,30 MHz, 300 A
N7042A
High Current Probe
The Keysight N7042A Rogowski coil current probe measures AC currents up to 300 A, with bandwidth ranging from 9.2 Hz to 30 MHz. The probe has a thin, lightweight, flexible, and simple-to-use clip-around Rogowski coil that enables current measurement in the most difficult-to-reach parts and confined spaces of a circuit under test. It can also measure large AC current without an increase in transducer size.
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Product
OBDLink Bluetooth Scan Tool
4251BT
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OBDLink Bluetooth features a Class 1 Bluetooth transmitter for maximum range, and Plug and Play connectivity with popular Bluetooth devices including Android and Symbian based phones. The built-in USB port makes this the most versatile scan tool ever offered!
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Product
Standard 1.60 (45.00) - 4.50 (128.00) General Purpose Probe
EPA-3A
General Purpose Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 35Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Alternate 2.64 (75.00) - 6.50 (184.00) General Purpose Probe
EPA-2C40-1
General Purpose Probe
Current Rating (Amps): 5Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 160Full Travel (mm): 4.06Recommended Travel (mil): 107Recommended Travel (mm): 2.72Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 970Overall Length (mm): 24.64
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Product
High Force Type Probe For PCB, K100 Series 100mil Pitch, Type I, Ø1.26mm, 305gf
K100-I126305-SKAU
Spring Probe
K100 Series, Pitch 100mil, Tip Style I, Tip Diameter Ø1.26mm, Spring force 305gf, Steel with Gold Plating.
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Product
High 1.73 (49.00) - 8.00 (227.00) High Performance Bias Ball Probe
POGO-1T-8
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Standard 1.60 (45.00) - 4.50 (128.00) General Purpose Probe
EPA-3J
General Purpose Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 35Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Passive Probe, 10:1/1:1, 350 MHz, 1.3m
N2889A
Oscilloscope Probe
The Keysight N2889A low-cost passive probe provides up to 350 MHz bandwidth and features high-input resistance of 10 MΩ (@10:1 mode) to address a wide range of measurement needs with low probe loading. The N2889A comes with a convenient switch in the probe handle that lets you switch between a 1:1 and 10:1 attenuation ratio.
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Product
Stereo Microscope
Stemi 508
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Thanks to apochromatic optics you acquire high contrast images with color accuracy. With the 8:1 zoom you bring up smallest details. Stemi 508 offers an ergonomic viewing angle of 35° - stay relaxed even after hours of work.
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Product
Line Scan Camera
Piranha4 Polarization
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The Piranha4 Polarization™ camera is a breakthrough in the machine vision industry. This high-speed polarization camera features three native polarization states plus an unfiltered channel.The Piranha4 polarization camera extends detection capability in machine vision and is ideal for detecting stresses, surface roughness, film thickness, alloy composition, and 3D profiles.
