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Combinational ATE
ICT, Functional test, and boundary scan test all in one piece ATE.
See Also: ATE, Functional ATE
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ATE Integration
Want to improve the overall test coverage of your assembled boards? It’s easy. Simply combine or integrate your JTAG Technologies boundary-scan tools with your existing automatic test equipment (ATE). We work with any vendor of in-circuit testers (ICT), flying probes (FPT) or functional testers (FT).We offer solutions for most of the available automatic test equipment systems, in addition we can support you with customized integrations for your existing automatic test equipment (ATE).
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ATE Solutions
Our custom, application-specific ATE Test Solutions offer a full test suite with Test Systems hardware, software, and support services.
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Power Combiners
INSTOCK Wireless Components, Inc
INSTOCK Wireless High-Power Combiners offer unparalleled power handling performance for up to 100 watts in splitting and combining applications. IP67 outdoor weatherproof construction provides protection from the elements for uninterrupted outdoor use. Spanning 430-470 MHz and 698-2700 MHz, configurations available with Type N, SMA, and TNC connectors INSTOCK.
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Combination Antennas
By combining multiple technologies such as GNSS, cellular, and WiFi in a single housing, our combination antennas help you to increase efficiency and coverage for applications such as fleet management, vehicle tracking, and passenger connectivity on the go.
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Combination Gauges
Global Digital Instruments, LLC
GDI offers a variety of combination gauges including a Dual Gauge which can monitor battery status, fuel level, or voltage and an hour meter as well as a Dual Gauge to monitor battery life and hours with a battery shut down feature to extend the life of your equipment.
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Cost-Effective ATE System
PRO RACK ATE
Qmax Test Technologies Pvt. Ltd.
Pro-Rack is a cost effective ATE System, which comes with Modular Structure provision option to improvise and enhance much instrumentation based on the user’s requirements. Basically it is designed to cater to the needs of PCB test and repair depots, keeping in mind the changing PCB technology and the challenges in testing them off-line. It can provide complete PCB test and diagnostic functions for any kind of PCB including the latest very high density complex PCBs with high pin count PQFP, FPGA VLSI chips. AC /DC parametric tests enables testing of the DC parametric of device pins on the edge connector for input bias current, Fan out capacity ,Tri-state leakage currents, AC parametric measurements such as Input / Output Propagation delay Rise time / Fall time to further enhance fault coverage. Pro-Rack is designed with VPC Mass Interconnect adapter with 16 bit fixture ID interface to the UUT through simple clips and probes or through card edge or through a bed of nail test fixture.
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ATE & Test Systems
Data Patterns' core business for over 20 years has been the development of Automated Test Equipment for critical aerospace requirements. Data Patterns developed a Multi Programmer with associated test automation software in 1994. Christened the DP-800 this product was adopted for the implementation of test rigs for Navigation Platform Test Benches, Engine Test Bed Automation, Cable Harness Test Systems, etc. This product was effectively utilized in the development of test benches required by Indian Space Research Organisation (ISRO) for the Polar Satellite Launch Vechicle (PSLV) and Geo Stationary Launch Vehicle (GSLV). Based on this foundation, the next generation test benches were developed in the cPCI architecture. Presently, Data Patterns develops cPCI based test systems for Laboratory applications as well as VME based test systems for challenging environmental conditions. Examples of test solutions built by Data Patterns are indicated below.
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Docking / ATE
The iDock Series is a series of connectors ideal for use with automatic machine handlers in production testing. Floating bushings allow up to .04" of re-alignment. Use with a combination of various I/O modules and a max of 5,952 signal contacts simultaneously. The iDock series is rated up to 100,000 cycles.
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ATE Test & Engineering Services
We can provide a limited scope project or a full turn key solution where we analyze a data sheet and provide a full test plan. Our wide range of ATE test equipment and experienced team can support first silicon debug to release to high volume production for a wide range of products, from Digital to RF, including wafer sort and packaged part testing. Test platforms include Verigy, Teradyne, Advantest.
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Combined Transformer
Combined Transformer is a great solution for projects with dimension restrictions. Because we focus on quality and reliability of our products our combined transformers also require minimum maintenance once installed.
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Combination Wave Generator
Shanghai Guantu Technology Co., Ltd.
GCW series combined wave generators can generate high energy surges for combined wave testing. It has the characteristics of fast rise and long pulse duration. According to different modulation components, different surge waveforms can be generated; the control system can automatically record and analyze the above surge waveforms. standard:IEC60060-4-5, IEC61643-11, UL1449-2006, GB18802.1, GB/T18802.21,
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ATE Design & Build
PXI has become the de-facto standard for housing the high performance modular instrumentation required to meet the demands of testing today's high performance products. Based on the PCI bus, PXI (PCI Extensions for Instrumentation), this platform is used in most of our new ATE designs.
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Combinated Multimeters
PeakTech Prüf- und Messtechnik GmbH
This combined digital handheld multimeter with the LCR meter function, due to its versatility, can be used universally in the service and maintenance area. In addition to multimeter functions such as voltage, current and frequency measurement, this device also has functions for inductance, capacitance and resistance measurements.
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ATE Development
Aero Engineering Support Group
ATE Development Aero Engineering Support specializes in designs and manufacturing of a wide variety of Automatic Test Equipment (ATE) of support for military avionics, commercial avionics, industrial sector, etc. AESG is committed to providing industry leading equipment that are designed to be scalable and expandable ATE capable of providing reliable functional test solutions for any electronic assembly or Circuit Card Assembly. New from Aero Engineering Support is the A2500 system, providing:
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Custom ATE Solutions
ATEC Matrix Corporation can be your one-stop provider of complete turn-key ATE Systems. With over 15 years in ATE Design, Development and implementation we have the expertise and experience to work with you efficiently to provide whatever level of solution your program requires.
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Combined Probe for IAQ
P37AB147
Temperature, relative humidity, atmospheric pressure, CO2 (Carbon Dioxide) and CO (Carbon Monoxide) combined probe, complete with SICRAM module.
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Combiners & Splitters
The range extends from Lumped Element Diplexers at 300 MHz through to 60 GHz devices based on BSC Filters’ Exact Filter Technology. Our design experience and in-house production facilities have allowed us to construct Diplexers with near contiguous passbands meeting the most demanding technical requirements.
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Automated Laser Test System (ATE)
Lix is a class of instruments for automated laser beam profiling, power measurement and analysis with integrated machine vision.
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Automated Discrete Semiconductor Tester (ATE)
5300HX
The Model 5300HX Automated Discrete Semiconductor Tester (ATE) is designed for fast, reliable testing of a wide range of discrete devices. Using an on-board Intel SBC, can provide stand alone testing capability or connected to a PC for intuitive test development and data capture.
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Amplifiers, Splitters & Combiners
DEV’s RF Splitters, Distribution Amplifiers, or Dividers are used to distribute and amplify RF signals, to compensate for signal loss, and to provide redundancy paths to ensure maximum uptime.
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Aerospace & Defense ATE Systems and Services
TE solution design, development, and integrationMeasurement / Test Process analysis and consultationEasy-to-use software interfaces for Engineers and UsersFactory automation for test processesAll major instrument brands available & supported
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Link simulation to ATE conversion
VCD2ATE
VCD2ATECost effective link simulation to ATE conversionDirect conversion from event driven design simulation dump (VCD/EVCD) to specific tester program files. VCD/eVCD to tester conversion Simple and cost effective conversion solution Simple cycle definition in excel High Performance Fast run time Handles very large files >6Gb
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Combined Temperature – RH probe
HP475AC1R
Relative humidity and Pt100 temperature combined probe, with SICRAM module.
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Combined System Controller Software
Designed and manufactured by Crystal Instruments, the Spider-101i controller is a key element of the Sentek Dynamics THV Series AGREE (Department of Defense Advisor Group on Reliability of Electronic Equipment) chambers.
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ATE Parts
Comware Technical Services, Inc.
We have thousands of parts in stock including hard to find legacy system components. For the best pricing, service and quality look to Comware for replacing your GenRad, Teradyne , Agilent and TRI system parts and modules.
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Production PCB Combinational Tester
The PT100Pro combines ARM Functional Test, Analog Test and Boundary Scan in one platform for testing up to 32 PCBs at a time. The PT100 Pro solves the test challenges and cost requirements of testing small, high-volume PCBs used in the home, mobile, entertainment, automotive and embedded markets. PCBs in these markets are cost sensitive yet require high volume, high fault coverage on leading edge technologies such as WiFi, DDR Memory, USB, Bluetooth, Nand Flash, MPEG decoders, Power Management Units, and MMC/Smart Cards interfaces.
