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Combinational ATE
ICT, Functional test, and boundary scan test all in one piece ATE.
See Also: ATE, Functional ATE
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ATE
QT 200 NXG
Qmax Test Technologies Pvt. Ltd.
QT 200 Nxg a Highly sophisticated ATE, is now available as a desktop unit with the cost, flexibility, and performance demanded by a large number of users in research, design, manufacturing, and repair & maintenance industry. It is a combinational-mixed signal board tester for PCBAs designed to cater the needs of PCB test and repair depots, keeping in mind the changing PCB technology and challenges in testing them offline with the combination of all such complex test methodologies in a single test hardware platform with simple to use graphical user interface software.
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ATE Support
Partech´s talented ATE (Automatic Test Equipment) Support team can provide reliable in country support of ATE, ATE related hardware and fixtures and software.
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Satellite ATE
MS 1123
Configurable Automatic Test Equipment (ATE) MKII is a customized tester, built to carry out card level testing for satellite systems (12 different types of boards). The purpose of ATE is to provide a user-friendly environment to test the boards for their functionality, perform specific tests of each card. The card level testing facilitates troubleshooting down to a faulty signal flow path. Both hardware and software designed such a way that each Input / Output is configurable and user can dynamically script the test procedure using standard ‘C’ Language.
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ATE Connecting Solutions
C.C.P. Contact Probes Co., LTD.
Customized pogo towers with high frequency capability.
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RF ATE Tester
ADIVIC MP5800/MP5806
MP5800 seamlessly upgrades your existing Chroma 3380, 3650 to RF ready ATE test solution, user friendly debug tools, IOT turnkey test solution.
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ATE System Integration
Cyth Systems is a Systems Integration Company specializing in Automated Test (ATE), Embedded Controls, and Machine Vision. Our skilled and experienced team uses their natural talent for problem-solving to create solutions in a wide range of industries. We build our solutions starting with the National Instruments (NI) platforms including LabVIEW and PXI, and by adding best-in class sensors and components.
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ATE Support
For the last 30 years, Terotest has offered a range of support services, from standard maintenance and calibration to ATE updates and legacy ATE replacement solutions.We provide, repair and exchange ATE modules, fixtures, adaptors and other hardware, as well as offering full maintenance contracts to our customers.
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ATE System Power Supplies
N8700 Series
The Keysight N8700 Series ATE system power supply delivers high current with low noise in a compact two unit package. Airflow moves front to back, so no additional space is required above or below the power supply in your automated test equipment (ATE) rack. This series of programmable power supplies sources up to 3300 or 5200 W. Get output voltages from 8 to 600 V and 5.5 to 400 A.
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ATE System Power Supplies
For more than 50 years, Keysight's automated test equipment (ATE) power supplies have changed the way engineers prove their designs, understand issues, and ensure product quality. Our programmable ATE system power supplies' compact design makes it easy to integrate them into any system. Keysight power supplies make it easy to update a test program with modern interfaces, LXI-core capability, and SCPI language. Accelerate test time with fast command processing and quick settling times.
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RWR ATE MKII
MS 1111
Automatic Test Equipment (ATE) MKII is a customized tester, built to carry out LRU and card level testing for TARANG systems of all platforms. The purpose of ATE is to provide a user-friendly environment to test the LRUs and sub-systems (individually) for their functionality, perform specific tests of each LRU / sub-system and Card Level Testing. The card level testing facilitates troubleshooting down to a faulty signal flow path. The UUT tests are carried out by injection of the stimuli generated by the computer or the programmable test equipments and the responses from UUT / test equipments are feedback to the computer for evaluation and generation of reports.
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ATE System
Digital Communication Technologies Ltd
We design and build automated test systems according to customer requirements. Hardware, writing drivers, test plans. We have multiple automated test systems installed in the Military, Aerospace, Power, Automotive and other industries throughout Israel. LanWindows, Labview, LabWindowsCvi, Teststand, ATEasy, C ++, C #, VB
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ATE / Bench Calibrators & Multimeters
Time Electronics offer a range of precision calibrators and digital multimeters that can be used in the lab or in automated testing applications. These programmable instruments are designed for precision, performance, and functionality, making them ideal for automatic testing and fault diagnosis. Each designated ATE calibrator is rack mountable for straightforward integration into user systems.
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Small Footprint Flex 20 ATE
Flex 20
The Flex 20 is floor mounted but maintains a small footprint on the shop floor. A VPC S6 interface is normally used on this system allowing multiple test fixtures to be used with the system.
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Automated Discrete Semiconductor Tester (ATE)
5000E
Same Proven Technology as all 5000 Series Testers. High Speed Single Test Measure. Capable of Testing Multiple and Mixed Devices. 1KV Standard, 2KV Optional. 1NA to 50A Standard, 100A Optional. 0.1NA Resolution. Complete Self Test. Auto-Calibration. RDSON to 0.1MOHM Resolution. Windows Application Software. Optional Scanner. Optional Wafer Mapping. Optional Curve Trace. MOSFET, IGBT, J-FETTriac, SCR, Sidac, Diac, Quadrac, STS, SBS Transistor, Diode, Opto, Zener Regulator, MOV, Relay. UNDER $23,000.00
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ATE
Below is a list of high speed scopes and BERTs that form an integrated extension to Advantest’s V93000 ATE tester. In addition to these instruments, Multilane offers turnkey solutions for ATE testing.
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6TL24 Combinational Base Test Platform
H71002400
The 6TL24 is the Base platform ideal for Combinational test (ICT+FCT) in low to mid volume, high-mix electronics productions. A dual-stage pushing mechanism will allow performing both, the FCT and the ICT test, without the need of changing the test platform and with a low cost fixturing technology. To do so, the exchangeable cassette fixture must be designed with two-level probes. IN the 6TL24, the second level is reached thanks to a pneumatic actuator.
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Cable Free ATE
CABLEFREEATE
Digalog Systems customizes resources to provide requirements or more cost-effective requirements that are not currently on the market.The CableFreeATE™ technology also affords lower cost and easier integration of some common offerings:- VPC 64 SPST Reed Relay- 0.1" Discrete Header 64 SPST Reed Relay- DL1-156R 72 SPST Reed Relay
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Automatic Test Equipment (ATE) Module Products
Automatic Test Equipment (ATE) Module Products by ADSYS
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ATE Design & Build
PXI has become the de-facto standard for housing the high performance modular instrumentation required to meet the demands of testing today's high performance products. Based on the PCI bus, PXI (PCI Extensions for Instrumentation), this platform is used in most of our new ATE designs.
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ATE Computer
MS 1201
This system used for multi-purpose applications such as data acquisition and Automatic Test Equipment. ATE Computer has ISA Bus based eleven slots with inbuilt power supply. Micro Processor board or USB Controller is used to drive the back plane.
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High Performance VXI Chassis for Military ATE Systems
1261B Series
The 1261B high-performance VXI chassis serves as the standard for most military ATE systems. All 1261B chassis include full-power protection features such as overvoltage and overcurrent protection, and also incorporate a quick-check diagnostic connector to verify performance of power supply voltages, currents and specific VXI signals.
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ATE Socket
Design ATE socket according to customer's requirementsUse on auto-test eqiupments and handler.Pitch range from 0.30 to 1.0mm.Pin amount: 2 and above.Key material: Peek,Torlon.etcContact with top pogo pin
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ATE Test Probes
For contacting loaded PCBs in automatic test equipment (ATE) with vacuum, pneumatic or mechanically operated fixtures. Available in 2.54mm, 1.91mm & 1.27mm test centre spacings.
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ATE Integration
Want to improve the overall test coverage of your assembled boards? It’s easy. Simply combine or integrate your JTAG Technologies boundary-scan tools with your existing automatic test equipment (ATE). We work with any vendor of in-circuit testers (ICT), flying probes (FPT) or functional testers (FT).We offer solutions for most of the available automatic test equipment systems, in addition we can support you with customized integrations for your existing automatic test equipment (ATE).
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ATE For ADC Module
MS 1527
The Semi-ATE is used for testing the analog ADC. It shall carry out the functional test on ADC analog module. The ATE shall have all necessary IO signals on the connector end. The semi-ATE can carry out the functional tests on ADC analog module with host PC or laptop. It provides +15V, -15V, +5V & -5V to module and +2.5V high precision reference voltage. It can able to control keysight N6700B Power supply mainframe using RS422 interface.
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Redundant Strap down INS ATE Test Station
Redundant Strap down Inertial Navigation System (RESINS) checkout test station comprises of cPCI chassis with various functional I/O modules like ADC, DAC, DIO, VFC, Relay matrix, MIL 1553, GPIB, Serial communication interfaces and Custom Built System interface adaptor.
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Automated Laser Test System (ATE)
Lix is a class of instruments for automated laser beam profiling, power measurement and analysis with integrated machine vision.
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ATE Test & Engineering Services
We can provide a limited scope project or a full turn key solution where we analyze a data sheet and provide a full test plan. Our wide range of ATE test equipment and experienced team can support first silicon debug to release to high volume production for a wide range of products, from Digital to RF, including wafer sort and packaged part testing. Test platforms include Verigy, Teradyne, Advantest.
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Production PCB Combinational Tester
The PT100Pro combines ARM Functional Test, Analog Test and Boundary Scan in one platform for testing up to 32 PCBs at a time. The PT100 Pro solves the test challenges and cost requirements of testing small, high-volume PCBs used in the home, mobile, entertainment, automotive and embedded markets. PCBs in these markets are cost sensitive yet require high volume, high fault coverage on leading edge technologies such as WiFi, DDR Memory, USB, Bluetooth, Nand Flash, MPEG decoders, Power Management Units, and MMC/Smart Cards interfaces.
