Relay Test Sets
See Also: Relay Test, Test Sets
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Product
PXI/PXIe High Density Electro-mechanical Relay Module, 75xSPST, Normally Open
42-145A-101
Relay
The 40-145A-101 (PXI) and 42-145A-101 (PXIe) 75xSPST relay module is part of a range of high density switching modules available in Normally Open (SPST & DPST), Changeover (SPDT) and Normally Closed (SPST) configurations. Connections are made via a front panel 200-pin female connector.
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Product
Test Fixture
N1295A
Test Fixture
The Keysight N1295A Device/Component Test Fixture provides a low-cost solution to quickly and easily test packaged devices and components. For more advanced packaged testing needs, the Keysight 16442B Test Fixture provides more capabilities.
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Product
Imperial Test Executive
ITE
test
The Imperial Test Executive (iTE) is a UI shell that sits on top of National Instruments TestStand. It provides a simple but elegant interface to execute your NI TestStand sequences. The iTE software was designed to allow general operators to execute ATE testing software without requiring any knowledge of NI TestStand. Training an operator to use this system typically takes less then 5-minutes.
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Product
PXI/PXIe Microwave Relay, Dual SPDT, 50GHz, 50Ω, SMA-2.4, External Termination
40-781A-722
Relay
The 40-781A-722 (PXI) and 42-781A-722 (PXIe) are dual SPDT 50GHz microwave relay modules with external terminations. The 40/42-781A range is available with one or two SPDT switches capable of switching frequencies up to 50GHz in 50Ω. They are available with either internal or external terminations and connections are via front panel mounted high quality SMA, SMA 2.9 or SMA 2.4 connectors.
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Product
Test System
BMS HIL
Test System
The BMS Hardware-in-the-Loop (HIL) Test System is a high performance platform providing all necessary input signals used for battery pack simulation. A real-time operating system executes complex cell and pack models commonly used for BMS algorithm development and firmware regression testing.
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Product
EBIRST 78-pin D-type To 68-pin Male SCSI Adapter
93-006-401
Test Adapter
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Product
PXI/PXIe Microwave Relay, Single SPDT, 40 GHz, 50 Ω, SMA-2.9, External Termination, Failsafe, Remote Mount
42-781A-521-E
Relay
The 40-781A-521-E (PXI) and 42-781A-521-E (PXIe) are single failsafe SPDT 40 GHz microwave relay modules with external terminations and remotely mounted relays. The 40/42-781A range is available with one or two SPDT switches capable of switching frequencies up to 50 GHz in 50 Ω. They are available with either internal or external terminations and connections are via front panel mounted high quality SMA, SMA 2.9 or SMA 2.4 connectors.
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Product
Test Fixture Kits
Test Fixture
More then ten years of experience in special, customized engineering and manufacturing brought us to the highest level of creating reliable, flexible and robust Test Fixtures. Currently our HQ is located in Vecsés, Hungary together with our R&D. Equip Group has Test Fixture Kit manufacturing plant in Serbia, focusing on supplying competitive, high – quality and high – volume products for the global market.With more then 180 employees, Equip – Test is able to offer our customers turnkey solutions in fixturing with test program generation. No matter if you have a simple or complex, high-density PCB (Printed Circuit Boards), or if you have DUT (Device Under Test) already assembled into metal or plastic housing, we can offer you a very stable technical solution.
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Product
PXI/PXIe Power Relay Module, 16xSPDT, 5 Amp, 50-Pin D-type Connector
40-158-103
Relay
The 40/42-158-103 is a PXI/PXIe high density power relay module with 16xSPDT switches rated at 5A. User connection is via a 50-pin D-type male connector. The 40/42-158 range is available in 8, 16, 24 or 32 SPST configurations with or without hardware interlock. Electro-mechanical power relays are used which are suitable for switching loads up to 5A at 250VAC.
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Product
PXI/PXIe Power Relay Module, 16xSPDT, 5 Amp, 50-Pin SGMC Connector
42-158-003
Relay
The 40/42-158-003 is a PXI/PXIe high density power relay module with 16xSPDT switches rated at 5A. User connection is via a 50-pin SGMC male connector. The 40/42-158 range is available in 8, 16, 24 or 32 SPST configurations with or without hardware interlock. Electro-mechanical power relays are used which are suitable for switching loads up to 5A at 250VAC.
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Product
PXI/PXIe Power Relay Module, 24xSPDT, 5 Amp, 50-Pin SGMC Connectors, With Interlock
42-158-002-HI
Relay
The 40/42-158-002-HI is a PXI/PXIe high density power relay module with 24xSPDT switches rated at 5A and includes the hardware interlock option. User connection is via 2x50-pin SGMC male connectors, hardware interlock is via a 4-pin 00 series socket (mating plug is supplied).
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Product
Bottom Electrode SMD Test Fixture
16197A
Test Fixture
The 16197A is designed for impedance evaluations of bottom electrode SMDs. It achieves stable frequency characteristics up to 3 GHz and provides highly repeatable measurements. The Keysight 16197A supports various SMD sizes, as small as 1005 (mm)/0402 (inch) and as large as 3225 (mm)/1210 (inch). Accommodation of the 0603 (mm)/0201 (inch) size is available with option 001.
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Product
SoC Test Systems
Test System
SoC (System on Chip) devices integrate multiple different functions into a single chip. Our SoC test systems can test all the integrated circuits in SoC devices, including logic, analog, RF, DC and imagers by flexible configuration of the cards/modules used in the test system.
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Product
Mixed Signal, Multi-Functional Test Module
PXIe-ScanIO-112
Test Module
The PXIe-ScanIO-112 delivers a powerful combination of digital, analog, and AC-coupled testing in a single PXIe module. With 104 boundary-scan controllable digital I/O channels and 8 analog I/O channels ranging from –15V to +15V, engineers gain the flexibility to test a wide variety of board-level designs. The module supports IEEE-1149.6 AC-coupled interconnect testing, configurable single-ended and differential pin operation, and integrates seamlessly with the Corelis ScanExpress™ suite.
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Product
PXI/PXIe Power Relay Module, 2xSP4T, 20 Amp
40-166-202
Relay
The 40/42-166-202 is a PXI/PXIe high density power relay module with 2xSP4T switches rated at 20A. The 40/42-166 range is available with SPST, SPDT or SP4T switching configurations. It uses power relays which are suitable for switching loads up to 20A at 240VAC (SPDT & SP4T versions) or 30A at 277VAC (SPST versions).
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Product
PXI 16 x SPDT Reed Relays
40-110-021
Relay
The 40-110/115 range of switching modules are available in both Changeover (SPDT) and Normally Open (SPST & DPST) configurations. Connections are made via a front panel 96 pin male micro-D connector. General purpose reed relays are used for the construction of small switching networks or for slaving up to larger switches.To simplify inter-relay wiring, interconnection points are built onto the circuit board thus easing the construction of complicated wiring.
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Product
PXI/PXIe Power Relay Module,5 Amp, 50-Pin SGMC Connectors
40-158-001-HI
Relay
The 40/42-158-001-HI is a PXI/PXIe high density power relay module with 32xSPDT switches rated at 5A and includes the hardware interlock option. User connection is via 2x50-pin SGMC male connectors, hardware interlock is via a 4-pin 00 series socket (mating plug is supplied). The 40/42-158 range is available in 8, 16, 24 or 32 SPST configurations with or without hardware interlock.
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Product
Semiconductor Test Software
Test System
Easily create and run robust test programs in semiconductor automated test systems with ActivATE™ test management software. Designed by test engineers for test engineers, ActivATE™ tames automated test complexities with elegant simplicity.
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Product
Memory Test System
T5833/T5833ES
Test System
T5833 system is a cost-efficient, high-volume test solution capable of performing both wafer sort and final test of DRAM and NAND flash memory devices. Amid surging sales of mobile electronics, DRAMs, NAND flash memories and multi-chip packages (MCPs) — the main device types used in smart phones and tablets — are quickly evolving toward higher speeds and greater device capacity. Internet and cloud servers also are driving demand for faster, higher-capacity ICs. Yet the cost of testing today's wide array of memory devices is an obstacle for chipmakers, which urgently require solutions that can deliver high functionality, high performance and low cost of test (COT). Advantest's new, multifunctional T5833 memory test system meets these needs, delivering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories and next-generation non-volatile memory ICs.
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Product
Fixture Self-Test Controller and Calibration Check
AQ818
Test Fixture
The module AQ818 includes all the electronic blocks required to perform an effective test platform self-test. Thanks to this module, a chain of tests can be performed, which will end up not only with a report of the defective instruments or switch modules, but also with the relay contacts live expectancy report.
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Product
PXI/PXIe Microwave Relay, Single SPDT, 12.4GHz, 50Ω, N-Type, Remote Mount
40-780B-511-E
Relay
The 40-780B-511-E (PXI) and 42-780B-511-E (PXIe) are single SPDT 12.4GHz unterminated microwave relay modules with remotely mounted relays. The 40/42-780B range is available with one, two, three or four SPDT front panel mounted relays capable of switching frequencies up to 67GHz in 50Ω or 2.5GHz in 75Ω. Connections are made via high quality RF coaxial connectors, SMA or N-Type for 50Ω and 1.6/5.6 in 75Ω versions. Remote versions can support up to three SPDT relays in a single slot.
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Product
PXI/PXIe Microwave Relay, Dual SPDT, 110 GHz, 50 Ω, SMA-1.0, External Termination, Latching
42-781A-922-LA
Relay
Externally terminated switches have the advantage that the terminations can be removed and replaced with higher power RF loads. This also allows alternative configurations such as terminated 4-port bypass (1 termination removed) and 5-port DP3T (both terminations removed). See the datasheet for diagrams of these configurations.
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Product
PXI/PXIe Microwave Relay, Triple SPDT, 2.5GHz, 75Ω, 1.6/5.6
40-780B-753
Relay
The 40-780B-753 (PXI) and 42-780B-753 (PXIe) are triple SPDT 2.5GHz 75Ω unterminated microwave relay modules. The 40/42-780B range is available with one, two, three or four SPDT switches capable of switching frequencies up to 67GHz in 50Ω or 2.5GHz in 75Ω. Connections are made via front panel mounted high quality RF coaxial connectors, SMA or N-Type for 50Ω and 1.6/5.6 in 75Ω versions.
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Product
PXI/PXIe High Density Electro-mechanical Relay Module, 32xSPDT
40-148A-001
Relay
The 40-148A-001 (PXI) and 42-148A-001 (PXIe) 32xSPDT relay module is part of a range of high density switching modules available in Normally Open (SPST & DPST), Changeover (SPDT) and Normally Closed (SPST) configurations. Connections are made via a front panel 200-pin female connector.
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Product
PXI/PXIe Microwave Relay, Single SPDT, 2.5GHz, 75Ω, 1.6/5.6, Remote Mount
40-780B-751-E
Relay
The 40-780B-751-E (PXI) and 42-780B-751-E (PXIe) are single SPDT 2.5GHz 75Ω unterminated microwave relay modules with remotely mounted relays. The 40/42-780B range is available with one, two, three or four SPDT panel mounted relays capable of switching frequencies up to 67GHz in 50Ω or 2.5GHz in 75Ω. Connections are made via high quality RF coaxial connectors, SMA or N-Type for 50Ω and 1.6/5.6 in 75Ω versions.
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Product
Scienlab Battery Test System - Cell Level
SL1007A
Test System
The SL1007A Scienlab Battery Test System – Cell Level enables you to accurately and productively test battery cells for automotive and industrial applications. The bidirectional power supply charges and discharges your cells under test with very high efficiency.
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Product
Memory Test System
T5851/T5851ES
Test System
The T5851 system is designed to provide a cost-effective test solution for evaluating high-speed protocol NAND flash memories including UFS3.0 universal flash storage and PCIe Gen 4 NVMe solid-state drives (SSD), both of which are expected to be in high demand for the LTE 5G communications market.
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Product
Display Driver Test System
T6391
Test System
High-resolution flat-panel displays (LCDs / OLEDs) are becoming increasingly integrated. It is common for today's display driver ICs (DDIs) to contain a multitude of logic/analog circuits to manage advanced operations including touch-sensor functions. At the same time, the rapidly growing applications of LCDs / OLEDs in mobile electronics are driving demand for DDI's with smaller sizes and greater capabilities. These factors present serious IC-testing challenges. ADVANTEST's T6391 system is designed to address these needs along with DDIs' increasing number of pins and faster interfaces.
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Product
EMS Test System
TS9982
Test System
The R&S®TS9982 is the base system for conducted and radiated EMS measurements. Due to its modular design, it covers a wide range of applications and can be very easily adapted to the measurement task at hand. Any configuration is possible – from conducted measurements and the small precompliance system with a compact test cell to the accredited test system for complete motor vehicles with 200 V/m.
