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Test Handlers
Boston Semi Equipment test handlers are designed for optimum production performance on your test floor.
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High Parallel Test Handlers
High parallelism test in strip or singulated device batch handling on carriers, WLCSP post singulation test.
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Turret Test And Scan Handlers
Turret platforms for semiconductor test, inspection and packaging.
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CCD Device Handlers
Exatron has been in a unique position to supply handling systems for the new CCD device market. Manufacturers of CCD devices came to Exatron when these devices were new, looking for custom handling applications, and Exatron responded by modifying its Model 3000B, 3000BL, 5000, 5080, and 8000 systems to accommodate CCD devices.
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Slip Line Detection System
YIS 200
The YIS and SF Series metrology systems are designed for optical detection of wafer defects such as crystaldislocations, slip and other defects. The YIS-300HM (for 300 mm wafers) and YIS-200HM (for 200 mm wafers) utilizeMakyoh optics technology (Magic Mirror) and integrated robotic wafer handler provided by Hologenix.
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Docking / ATE
The iDock Series is a series of connectors ideal for use with automatic machine handlers in production testing. Floating bushings allow up to .04" of re-alignment. Use with a combination of various I/O modules and a max of 5,952 signal contacts simultaneously. The iDock series is rated up to 100,000 cycles.
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Configurable OSAT Friendly Pick-and-Place Handler
Delta Eclipse
Eclipse delivers scalable performance for testing a wide range of semiconductors, from analog ICs to high-performance CPUs and mobile processors. The Eclipse is a high-speed pick-and-place handler designed to test up to 16 Integrated Circuits (ICs) in parallel, at temperatures from -45°C to +155°C*, with throughput up to 13,000 UPH.
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Inline Test Handler W/Bypass
6TL36
The 6TL36 test handler is the first ATE handler on the market that easily integrates the radio frequency tests into mass production lines.The modular approach of the 6TL36 offers the possibility of adding handlers together for a work in parallel that reduces the cycle time and saves costs as well as space when compared to traditional parallel solutions. Therefore, the system can be ordered with only one conveyor, with two conveyors (bypass or dual-line), and with three conveyors (Retour conveyor).
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Test Contactor
cDragon
cDragon™ Test Contactor pin’s thermal design supports fast temperature control response and stabilization for repeatable at temperature testing of devices in a handler environment.The homogenous MEMS elastomer-free multi-beam pin delivers long life and high wear resistance. By design the cDragon’s pin decouples insertion motion from the test-interface-board side of the pin. This eliminates test-interface-board pad wear.
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Automatic System Function Tester
3240
Chroma 3240 is an innovative handler for high-volume multi-site IC testing at the system level.
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6TL36 Inline Handler
AM304
Test handler 6TL36 able to test DUTs inside Faraday ChamberDual line (bypass)
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Precision LCR Meter
TH2816A
Changzhou Tonghui Electronic Co., Ltd.
TH2816A is a new precision LCR meter combined with years of technical experience and newest measurement technology of instrument industry. With powerful measurement functions, high performance and low cost, TH2816A/TH2816B/TH2817A have been one of the world advanced instruments, and it provides users a super value measurement resolution and experience. The meter offers stable 6 digit resolution, wide frequency range (200kHz for TH2816A), programmable signal level (0.01V to 2.0V), up to 30 meas/sec measurement rate, 9 measurement ranges, 30Ω or 100Ω constant output impedance and friendly operation interface. TH2816Acan be used for incoming inspection of components, quality control of product line and high accuracy laboratory use. The HANDLER, GPIB, RS232C interfaces make it easy to build an automatic component test system,
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Gravity Feed - Benchtop
3000B
Exatron's Model 3000B Series of automatic component handlers integrates customer-specific ambient temperature programming and/or test sites and up to eight automatic device inputs and outputs.
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300KHz Precision LCR Meter
Model 4300R
Aplab Precision LCR Meter Model 4300R is a new generation of impedance test equipment with high accuracy, wide measurement range and six digits resolution. Being featured with test frequency up to 300kHz, test voltage of 5mV ~ 2V, built-in -5V ~ 5V DC bias and -10V~10V DC voltage source output, it can meet all requirements for measuring components and materials and provide guarantees for production line quality assurance, incoming inspection and laboratory precision measurements. The Handler, RS232C and GPIB interfaces as well as improved command system provided by the instrument make it easier to build the test system.
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Automatic System Function Tester
3260
Chroma 3620 is an innovative system handler for high-volume multi-site IC testing at the system level.
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Change Kit
This custom-designed, swappable tool (change kit), which is part of the handler, is for the customer whose devices come in an array of shapes and sizes. It allows a handler to be used flexibly with a variety of devices, instead of having to be dedicated to one specific device type.
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Super Fast Industrial Gang Programmer
448Pro2AP
The Dataman 448Pro2AP is a super fast industrial gang programmer with four independent modules, ISP capabilities and USB 2.0 connectivity• Optimised for use in automated handlers and ATE machines • Over 71,000 devices supported with new devices added monthly • Mechanically stable case design with multiple fixing points • Independent modules supporting concurrent programming • ISP capable using the JTAG interface • Easy to use software compatible with the latest operating systems including Windows 10 • Comprehensive 3 years parts and labor warranty • Free life-time software updates
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Test Handlers
Cohu has 50+ years of semiconductor test expertise designing and manufacturing pick-and-place, gravity feed, test-in-strip handlers, MEMS test cells, and turret-based test handling and back-end finishing equipment for ICs, LEDs and discrete components.Our test handlers support a variety of package sizes and device types, including automotive, mobile, power, micro-electromechanical systems (MEMS) and microcontrollers, among others.
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MEMS Inertial Test
Cohu´s inertial solutions enable high precise Gyroscope and Accelerometer test with best-in-class cost of test due to high parallelism and package flexibility. All Cohu stimulus modules guarantee high precision and velocity stability as well as high temperature accuracy. With use of our high efficient handler portfolio we can offer the ideal solution with optimized cost of test.
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Miniature IC Handler
3270
Chroma 3620 is an innovative system handler for high-volume multi-site IC testing, especially for CIS Testing, at the system level.
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Full Range Active Thermal Control Handler
3110-FT
Chroma 3110-FT is an innovative pick & place system ideal for characteristics evaluation, development, and IC final test.
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Tri-Temp Test Handler
JANUS 2800T Tri-Temp Handler
SESSCO Janus 2800T Tri-temp Handler is designed to accommodate small to medium size standard and custom IC packages. Supports high parallelism of up to octal sites and is equipped with dual high-speed input tube loaders and dual auto output tube unloaders for higher throughput up to 28K UPH. With over 500+ I/O and 16 temperature zones available, it has plenty enough resources for the most demanding applications. It can be customized for MEMS applications and high-voltage testing. Powered by a cutting-edge 10 ns/step all-integrated controller and modular programming design.
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ULTRA® Contactors
ULTRA CONTACT Series offers high yield, durability and consistent performance under the most demanding testing environment. Our design offers easy integration to most test handler platforms and on automotive devices.
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Inline Handler W/By-Pass Line Master Push Down
6TL33
A perfect basis for a heavy-duty, reliable, high precision, and automatic integrated Test system for medium to high demanding environments. Important technical and economic advantages due to their modular structure and expansion capability are evident. The production testing environment will be flexible and efficient, helping towards the always valued Return of Investment.
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In-Line Functional Test Fixtures
Add an advantage to in-line production with fast change over interchangeable fixturing. Circuit Check’s in-line board handlers and in-line board handler fixturing exceed the high performance requirements associated with high-volume production. Circuit Check supports in-line fixturing for all the leading handlers.
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Bipolar/FET/Diode Dual Head Production Test System
36XX
Two test stations on the 3600E and 3601E systems. Performs DC, AC, and pulsed tests. Excels at evaluating difficult to measure parameters on zeners, current limiters, varactor tuning diodes and darlingtons. 24 bin opto-isolated handler/prober interface. Parallel first-in first out computer to tester interface for maximum throughput. Parallel testing with a 3602E or 3603E allows shared test execution for extremely high throughput applications when interfaced to high speed handlers with multiple test sites.
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Capacitor Leakage Current/IR Meter
Chroma 11200
Chroma Systems Solutions, Inc.
The 11200 Capacitor Leakage Current / IR Meter is mainly used for electrolytic capacitor leakage current testing and aluminum-foil withstand voltage testing (EIAJ RC-2364A). The 11200 can also be used for active voltage checking or leakage current testing of absorber, Zener diode, and Neon lamp etc. With the standard RS232 interface, optional GPIB & Handler interfaces, high speed and stable measurement capabilities, the Chroma 11200 can be used for both component evaluation on the production line and for fundamental leakage current or IR testing for bench top applications.
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Line Automation Equipment
5000 Series In-line Handler
The Circuit Check 5000 Series In-line Handler is an integrated inline solution that combines automation, fixturing and measurement hardware in addition to other in-line PCBA probe based test stations, while adding a standardized quick change fixture interface. The 5000 series in-line is a unified solution that is software and hardware agnostic, enabling adaptability to a variety of off-the-shelf lower cost ICT, flash and functional test software and hardware.
