Infrared Microscopes
observe, measure and analyze, sample magnified, IR view.
See Also: Microscopes, Acoustic Microscopes, Atomic Force Microscopes
-
product
Electron Microscope Analyzer
QUANTAX FlatQUAD
QUANTAX FlatQUAD is the EDS microanalysis system based on the revolutionary XFlash® FlatQUAD. This annular four-channel silicon drift detector is inserted between SEM pole piece and sample, achieving maximum solid angle in EDS.
-
product
Infrared Camera for CO Detection and Electrical Inspections
FLIR GF346
The FLIR GF346 optical gas imaging camera detects carbon monoxide (CO) and 17 additional gases without the need to interrupt your plant's production process. CO emissions can be a significant threat to primary steel manufacturing operations; even the slightest leak in a vent stack or pipe can have a devastating effect. With the FLIR GF346, inspectors can scan large areas from a safe distance, pinpointing leaks in real-time, reducing repair down-time, and providing repair verification.
-
product
Semiconductor / FPD Inspection Microscope
MX61L
Motorized Microscope for 300mm dia. Wafer/17 inch Glass Substrate use Reflected/Transmitted Illumination.
-
product
FIBER OPTIC MICROSCOPES
SpecVision
SpecVision is a video probe that engages directly with Krell polishing machines. This permits the viewing of polished optical surfaces while connectors or bare fibers are still loaded in the polisher. This in-line video inspection technique minimizes material handling and potential damage/contamination that may occur when transferring components from the polisher to a traditional microscope. SpecVision can interface with Scepter, SpecPro and Rev Polishers.
-
product
Stereo Microscopes & Macroscopes
Leica Microsystems offers customized stereo microscopes for research, industry and education. Our macroscopes for industry, medicine and research offer exceptional optics and ultra convenient operation. Stereo microscopes and macroscopes from Leica enable you to view, analyze and document your specimens in two and three dimensions for any application.
-
product
Atomic Force Microscope
AFM
Atomic Force Microscopes are the most widely used SPM microscopes. They can be applied in fields that span from surface science, semiconductor technology, magnetic media, polymer science, optics to biology, chemistry and medicine.Absolute positioning with an accuracy of 2 nm.
-
product
Infrared Receiver For SumoBot
350-00014
Infrared receiver with 38 kHz carrier frequency, for use with the original BASIC Stamp SumoBot Robot kits, now discontinued. We recommend purchasing replacements in pairs, since models supplied in kits may vary.
-
product
High-Resolution Scanning Probe Microscope (SPM)
High-Resolution Scanning Probe Microscope (SPM)
-
product
Digital Infrared Thermometer
IR-710
Shenzhen Calibeur Industries Co., Ltd..
'- Non-Contact Infrared Thermometer With Laser Targeting '- Range: -38° C to +520° C/-36.4° F to +968° F'- Accuracy : < 0°C： ±3% or ± 3°C ≥0°C： ±2% or ±2°C'- Distance spot ratio (D:S) : 8:1'- ℃/℉ exchange,'- Size: 180x80x40mm'- Weight: 120g'- Power: AAA1.5V 2pcs (not included)
-
product
Infrared Camera Window with PIRma-Lock
FLIR IR Windows Series
FLIR's IR Windows add a barrier between you and energized equipment, protecting you from arc flash accidents. IR windows are easy to install, easy to use, and will help you work with greater confidence. You’ll perform inspections more efficiently and reduce the threat of arc flash injury, all while staying in compliance with NFPA 70E requirements. Choose the anodized aluminum frame, or opt for durable stainless steel to prevent mixed metal issues.
-
product
X-ray Analytical Microscope Super Large Chamber Model
XGT-9000SL
- Large chamber capacity (W x D x H) : 1030 mm x 950 mm x 500 mm- X-ray shield complying with JAIMAS0101-2001/ IEC1010-1 to protect you from X-ray exposure- Mapping area size up to 350 x 350 mm2- <15 µm spot size with ultra-high intensity without compromising sensitivity and spatial resolution- Dual types of detectors for transmission and fluorescent X-rays- Detectable element range down to C with a light element detector and He purge module
-
product
AFM Atomic Force Microscope
FM-Nanoview 6800
Zhengzhou Nanbei Instrument Equipment Co. Ltd
All-in-one design, smart structure and shape.Scan head and sample stage are designed together, strong anti-vibration performance .Precision laser detection and probe alignment device make laser adjustment simple and easy.Adapt servomotor to drive the sample approaching tip manually or automatically, to realize precision scanning area positioning.
-
product
Infrared Thermometer
6575
Peaceful Thriving Enterprise Co Ltd
Infrared Thermometer is designed to measure surface temperature whereas traditional contact type thermometer is inappropriate. For example, measurement of moving object, items with live voltage, and items not reachable.
-
product
Measuring Microscopes, Image Processing + Semiconductor Technology, Micro Scriber
Line Width Measurement
Optik Elektronik Gerätetechnik GmbH
COMEF is an image processing software with special functions for the highly accurate measurement of line width and line distance. Using grey value algorithms, the width and distance of conductor lines or structures on silicon wafers can be measured with subpixel accuracy.
-
product
Atomic Force Microscope
XE7
Park XE7 has all the state-of-the-art technology you've come to expect from Park Systems, at a price your lab can afford. Designed with the same attention to detail as our more advanced models, the XE7 allows you to do your research on time and within budget.
-
product
infra-red turbidity bench meter (NTU) with calibration kit
CyberScan TB 1000
The CyberScan TB1000 series turbidity meters (employing the Nephelometric non-ratio or NTU principle) are designed to meet stringent requirements of today's scientists. TB1000 series meet the performance criteria specified by USEPA method 180.1 for NTU measurement and ISO 7027 (IR version). Ideal for beverage production, drinking water, waste water treatment, petrochemical and electroplating applications.
-
product
High Frequency Infrared Carbon and Sulfur Analyzer
CS-8820
Wuxi Jinyibo Instrument Technology Co., Ltd.
1. Infrared detector with low noise, high sensitivity and high stability. 2. The modular design of the whole machine improves the reliability of the instrument. 3. The electronic balance is automatically connected. 4, WINDOWS full Chinese operation interface, easy to operate, easy to master. 5. Dynamic display of various data and carbon in the analysis process. 6, measuring linear range is wide, and can be expanded. 7, high-frequency circuit design is reasonable, high-frequency furnace power is adjustable, suitable for different material sample analysis requirements. 8. The automatic cleaning device of the burner can reduce the influence of dust on the analysis results. 9. The burner heating device makes the conversion rate of sulfur tend to be consistent, which improves the stability of sulfur determination. 10, measuring linear range is wide, and can be expanded. 11. The software is fully functional, providing more than forty functions such as file help, system monitoring, channel selection, mathematical statistics, result correction, breakpoint correction, and system diagnosis.
-
product
Electron Microscope Analyzer
QUANTAX EDS for SEM
Bruker's latest generation of QUANTAX EDS features the XFlash® 7 detector series, which provides the largest solid angle for X-ray collection (also called collection angle) and the highest throughput.
-
product
Infrared Thermometer
EST-65
*High quality construction w/rubber insert in grip, nose & LCD areas. *High temperature range
-
product
Industrial Microscope for Materials Science & Industrial Applications
BX53M
Designed with modularity in mind, the BX3M series provide versatility for a wide variety of materials science and industrial applications. With improved integration with OLYMPUS Stream software, the BX3M provides a seamless workflow for standard microscopy and digital imaging users from observation to report creation.
-
product
IR / Infrared Thermometer, Digital, -32°C to +650°C, 2 %, -32 °C, 650 °C
72-823
Simply point the unit and squeeze the trigger to provide fast, accurate surface temperature measurement. Attached laser pointer provides immediate verification of aim. In addition to accuracy specifications this unit delivers an incredible 20:1 Distance to Spot Ratio
-
product
Thermal Microscope Stage For Large Petri Dish
TS-4LMP
Thermal Microscope Stage For Large Petri Dish
-
product
Inspection Microscope
Z-NIR
The McBain Z-NIR Near Infrared Inspection System is best-in-class for wafer-to-wafer and die-to-die alignment measurement and verification. This unique tool has been sold into many industries with various applications including sub-surface wafer and die inspection for cracks and bond integrity, MEMS, wafer bonding, 3-D chip stacking, failure analysis, process development, tool verification, part characterization, environmental testing and more.
-
-
product
Eyepiece-less Stereo Microscopes
Vision Engineering’s eyepiece-less stereo microscopes are better for users and for business. Their ergonomic design lets the operator sit back in a comfortable position, and the expanded pupil technology delivers an enhanced 3D view of the subject. The relaxed natural posture makes it easy and to work with tools and to manipulate the subject. Greater comfort and ease of use directly translate into greater productivity and quality.
-
product
Microscope Platforms
Applied Scientific Instrumentation
ASI Modular Microscope components consist of tube lenses along with adapters and accessories that either are primarily used in the collimated light space or adapters that are to be used on the image side. Collimated light adapters use the 38 mm diameter C60-RING system to connect components. Focus-side adapters attached to lens tubes with either a 30 mm diameter coupling to the I.D. of the C60-TUBE, or with a 50 mm coupling on the O.D. of the lens tube.
-
product
Broadly Tunable, Narrow-Linewidth & Automated Laser Source Covering the Visible, Neur Ultraviolet & Near Infrared
SolsTiS Rainbow
SolsTiS Rainbow brings together M Squared’s award-winning laser technologies into a single, easy-to-use platform providing hands-free automated access to light of any colour in the visible, near-ultraviolet and near-infrared wavebands. The advanced SolsTiS Rainbow features a fully-automated self-aligning, sealed, high-efficiency SolsTiS, a SolsTiS Doublet SHG cavity and a frequency mixing module, all capable of rapid and precise narrow-linewidth wavelength tuning in the range from 350 – 1100 nm. Furthermore, SolsTiS Rainbow is capable of user-defined high-speed, high-resolution stepped and continuous scanning over extended tuning ranges.
-
product
CT Series Infrared Thermometer
The pyrometers of the optris CT series are equipped with one of the world’s smallest infrared sensing head with a high optical resolution of up to 75:1. The separate control box offers a high variability due to selectable analog outputs as well as several digital interfaces. The CT sensors have unique advantages for the installation in applications with high surrounding temperatures, such as within the metal, ceramics or glass industry. The robust and ambitious design allows the sensing heads to be used for temperatures up to 250°C without additional cooling. This advantage helps to reduce the costs for mechanical installations. The variety of different available spectral ranges makes the CT the ideal sensor for manifold application fields.
-
product
Confocal Raman Microscope
LabRAM HR Evolution
The LabRAM HR Evolution Raman microscopes are ideally suited for both micro and macro measurements, and offer advanced confocal imaging capabilities in 2D and 3D. The true confocal Raman microscope enables the most detailed images and analyses to be obtained with speed and confidence. With guaranteed high performance and intuitive simplicity, the LabRAM HR Evolution is the ultimate instrument for Raman spectroscopy. They are widely used for standard Raman analysis, PhotoLuminescence (PL), Tip Enhanced Raman Spectroscopy (TERS) and other hybrid methods.
-
product
Atomic Force Microscope
3DM Serirs
Park Systems has introduced the revolutionary Park 3DM Series, the completely automated AFM system designed for overhang profiles, high-resolution sidewall imaging, and critical angle measurements. With the patented decoupled XY and Z scanning system with tilted Z-scanner, it overcomes the challenges of the normal and flare tip methods in accurate sidewall analysis. In utilizing our True Non-Contact Mode™, the Park 3DM Series enables non-destructive measurement of soft photoresist surfaces with high aspect ratio tips.
