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Product
Haze Meter
DRKWGT-2S
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Shandong Drick Instruments Co., Ltd.
DRKWGT2S transmittance / haze analyzer is a computerized automatic measuring instrument which is designed based on the People's Republic of China national standard GB241080 "transparent plastic light transmittance and haze test methods" and the American Society for testing and materials standard ASTM D100361 (1997) Standard Test Method for Haze and Luminous Transmittance of Transparent Plastice." It could apply to all transparent, translucent parallel plane sampler (plastic plates, sheets, plastic film,sheet glass) of light transmittance, transmission haze and reflectivity test also applies to liquid samples (water, beverage, pharmaceutical, colored liquid, grease) turbidity measurements in defense research and production workers and peasants to have a wide range of applications.
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Product
Shore Durometer Test Stand
UI-FT31
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Shore Durometer Test Stand is used to support the durometer presser foot surface parallel to the sample support table to better complete the test.
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Product
Bench Power Supply, Adjustable, 2 Output, 0 V, 32 V, 0 A, 3 A
72-8690A
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The 72-8690A from Tenma is a dual channel general DC power supply suitable for laboratory use. The dual channel (CH1 and CH2) can work in CV or CC mode and these two modes convert automatically according to the load. The CH1 and CH2 have auto tracking function. In this condition, the output of CH2 tracks the output of CH1. This function is usually used when adjustable symmetrical and double polarity power is required. Both CH1 and CH2 display the output voltage or current with a 6 digit LED meter. The main outputs can be connected in parallel or in series. This product comes with 2 years warranty.
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Product
Test Database Software Module
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The relational test database is the pivotal point of the software structure. On one hand, this is where the test applications and test systems used for productive testing are stored; on the other hand, it provides the storage space for all DUT-related test data. Depending on customer requirements, the test database may either be hosted locally on the test system or centrally on a server, supporting several test systems. The database performance is sufficient for a high-volume production environment with many test systems which access the central database in parallel. LXinstruments prefers to implement the database as a license-free MySQL database; it is however also possible to realize a version based on Microsoft SQL.
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Product
Integrated Test Facility
ITF
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The ITF, located in El Segundo, California, has multiple test stations to enable parallel testing and significantly streamline program test schedules. More than 25,000 square feet are available for integration and test activities, including a 10,000-square-foot Class 10K clean room. Our facilities feature thermal vacuum chambers and test stations to support optical alignment, warm optical bench testing, and hardware integration.
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Product
1000W, 1500W HSM Watt Power Supply Models
Series HSM
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The Kepco HSM series comprises a group of ten models, seven 1000 watt power supplies with outputs from 3.3 volts to 125 volts and three 1500 watt power supplies with outputs from 24 to 125 volts. All models feature current sharing for parallel operation and redundancy applications. Kepco¹s 1000W HSM have a wide-range input (90-277V a-c). The 1500W models operate 180-277V a-c. Both incorporate power factor correction to meet EN 60555-2 and EN 61000-3-2. These modern power supplies operate at 100KHz using current mode control to provide rapid response to source and load changes and tight stabilization.
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Product
Time-of-Flight SIMS
PHI nanoTOF II
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PHI’s patented TRIFT mass spectrometer with Parallel Imaging MS/MS provides superior sensitivity, low spectral background, unique ability to image highly topographic surfaces, high mass accuracy and mass resolution, and unambiguous high mass peaks identification with parallel tandem MS imaging capability. The PHI nanoTOF II can be configured with a wide variety of options to optimize performance for organic materials, inorganic materials, or both, depending on customer requirements.
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Product
100 High Speed Programmer
Commander Accelerator
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The Commander High Speed Programmer (HSP) is low overhead system designed to test Flash Memories, PLA's and Micro-controllers. The parallel multi-module architecture provides the flexibility to program and test multiple devices. It's full-featured capabilities support chip erasing and programming, sector erasing and programming, sector protect and unprotect, and data verification functions.
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Product
Universal Pylon Tester
MS 1121
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Portable test equipment to check the electrical functionalities of pylons by simulating various store types in aircraft. This system is able to simulate the functionalities of different PIBs (IB/MB/CF, OB & Laser). The system provides facility to test two Pylons in parallel. The tester provides aircraft specific AC &DC voltages and facility to inject discrete inputs for checking output(s) viz firing voltages, fusing voltages. The system provides four channels of RS422 and Two channels of 1553B communication. Portable unit with caster wheels with all required hardware, power supplies, instruments, connectors and laptop housed in it.
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Product
CompactPCI Serial Chassis
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CompactPCI Serial is an industrial standard for modular computer systems. It is based on the established PICMG 2.0 CompactPCI standard, which uses the parallel PCI bus for communication among a system’s card components. In contrast to this, CompactPCI Serial uses only serial point-to-point connections. CompactPCI Serial was officially adopted by the PCI Industrial Computer Manufacturers Group PICMG as PICMG CPCI-S.0 CompactPCI Serial in March 2011.
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Product
Bi-Axial or Axial Averaging Extensometers
Model 3560
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Jinan Testing Equipment IE Corporation
This extensometer is ideally suited for testing anisotropic materials such as advanced composites as well as for general purpose tests like determining Poisson’s ratio. The Model 3560BIA uses a design unique to Epsilon, where the knife edges remain parallel during the displacement. This approach greatly reduces crosstalk between axes and allows use on round or flat specimens with equal ease. These extensometers are very easy to mount. Integral springs hold the unit on the test sample. The parallel multiple flexure design makes these units very durable.The Model 3560AVG reads axial strain only as a single averaged output. It may also be supplied with two independent outputs, one measurement from each side of the specimen. This set-up is most commonly required when an indication of specimen bending is desired. The second version, the Model 3560BIA, includes both the averaged axial strain and the transverse strain. Again, this may also be configured as dual independent axial readings, which results in a three channel extensometer.The Model 3560 extensometers are strain gaged devices, making them compatible with any electronics designed for strain gaged transducers. Most often they are connected to a test machine controller. The signal conditioning electronics for the extensometer is typically included with the test machine controller or may often be added. In this case the extensometer is shipped with the proper connector and wiring to plug directly into the electronics. For systems lacking the required electronics, Epsilon can provide a variety of solutions, allowing the extensometer output to be connected to data acquisition boards, chart recorders or other equipment.
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Product
Room Temperature Sample Holders
12962A
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The 12962A sample holder is designed to allow accurate impedance tests of solid materials to be performed at room temperature. The sample holder consists of two parallel electrodes, one of which is fixed in position and the other which can be moved into contact with the sample by adjustment of a micrometer. The sample holder makes use of guard ring and reference techniques in order to improve accuracy by reducing “fringing” effects at the edge of the sample. The standard electrode provided is 20mm diameter.
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Product
Addon Cards
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Fit the IM6/Zennium electrochemical workstation to your application. Control external potentiostats, capture additional physical properties or enhance your system to a true parallel impedance analyzer.
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Product
Test Receiver
NTR GNSS
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Our primary objective is to provide a high performance and fully flexible test receiver for all types of GNSS systems. Thus, the NTR fully supports all existing navigation systems. The signal processing is fully flexible. The high performance correlation engine with up to 80 channels is implemented in a powerful set of FPGAs. Signal acquisition and tracking are realized on a high performance embedded ARM Cortex A8.Supporting up to 4 L-band frequencies in parallel, the NTR GNSS test receiver supports all current GNSS transmission frequencies. Due to its plug-in design, the RF front-end can easily be customized for special filtering and other frequencies.
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Product
Testing of Compressors and Compressors
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Automatic production test bench for semi-hermetic refrigeration compressors on 2 parallel assembly lines with 3 test stations each and central database.
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Product
Earth Ground Tester
1625-2
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The Fluke 1625-2 earth ground tester measures earth ground loop resistances using only clamps, only stakes, or one clamp and stakes. With the stakeless test method, the Fluke 1625-2 is able to measure earth ground loop resistances for multi-grounded systems using only current clamps. This technique eliminates the dangerous, and time consuming job of disconnecting parallel grounds, and finding suitable locations for auxiliary ground stakes.
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Product
Stand-Alone Test Fixture
MA 2013/D/H
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: NoInterface signals max.: 1700Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 22,00 kg
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Product
Digital Demultiplexers
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Advanced Science and Novel Technology, Co., Inc.
24:48 digital demultiplexer (DMUX) with SSTL1.5 input and output interfaces.Supports data rates from 1.0Mbps to 2.0Gbps.User-controllable independent internal delays for data and clock signals.1.5V I2C control interface with a user-defined 3-bit chip address.Preset function for synchronization of multiple parallel devices.Full-rate output copy of external high-speed clock input signal.Two pairs of clock divided-by-2 and synchronous clock enable outputs for supporting the tree-type demultiplexation structure.Additional synchronous clock divided-by-4 output.Dual power supply of +3.0V and +1.5V.Industrial temperature range.Low power consumption of 2.1W at 2.0Gbps.Available in custom 256-pin BGA package (13mm x 13mm x 2.5mm).
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Product
Memory Burn-in Tester
B6700 Series
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B6700 can test as many as 48 burn-in boards in parallel at speeds up to 10 MHz, which helps memory suppliers get their newest products to market faster while also reducing testing costs. An original high performance chamber improves yield by assuring high temperature accuracy while generating high temperature. It also shortens the temperature rise and fall time which leads to shortening the test time.
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Product
Stand-Alone Test Fixture
MA 2011/D/H
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: NoInterface signals max.: 1000Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 12,00 kg
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Product
Safety Compliance Test System
EN 60601
Test System
Test system for electrical safety compliance testing of medical products in accordance with EN 60601-1, 3rd edition.The system is equipped with three test fixtures which are connected in parallel order to reduce the number of setup tasks for different variants in the course of day-to-day manufacturing processes. Its purpose is to test medical products, e. g. patient monitors, which are employed at hospitals to monitor heartbeat and oxygen saturation.Based on the integrated electrical safety tester by Associated Research, in combination with an AC power source and a switching matrix, it is possible to fully automate tests like for instance AC/DC high-voltage tests, insulation resistance measurements, earth connection tests and leakage current measurements.The required occupational safety is provided by a high-voltage safety hood in accordance with EN 501191. The entire safety technology, as well as the control PC, is mounted in an aluminum-profile cart.
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Product
Ball Pressure Test Apparatus
CX-Q03
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Shenzhen Chuangxin Instruments Co., Ltd.
The Ball Pressure Apparatus is used to check the integrity of dielectric materials by exerting 20N force. The BPA10 is called out in IEC 60335, 60950, 61010, UL, CSA and European Norms. It is used to check the integrity of dielectric materials by exerting 20N force. The Ball Pressure Apparatus is made of stainless steel for long life. Since accelerated life procedures are used for this oven test, more than one apparatus may be useful for parallel testing.
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Product
AMR Angle Sensors
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MultiDimension Technology Co.,Ltd.
Iis proportional to the sine or cosine functions of two times of the angle – sin(2α) and cos(2α) – of a magnetic field applied parallel to the surface of the sensor, which can be provided by a small magnet positioned above the device.
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Product
Triple Channel DC Linear Power Supply
MPS-X Series
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Triple channel programmable DC power supply is with high resolution, high precision and high stability, over-voltage and over-heat protection are available. Series and parallel operation are also provided. The resolution is 1 mV/1 mA
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Product
TMR Angle Sensors
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MultiDimension Technology Co.,Ltd.
Angle sensor are proportional to the sine and cosine of the angle of a magnetic field applied parallel to the surface of the sensor, which can be provided by a small magnet positioned above the device.
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Product
Battery Capacity Tester
BLU-C Series
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BLU-C is the latest solution from DV Power for conducting a comprehensive battery capacity test. This universal instrument is applicable to any battery string, such as lead-acid, Li-Ion, Ni-Cd, and others, with voltages up to 800 V DC.BLU-C tester simplifies battery testing in multiple ways. The instrument provides monitoring of discharge parameters (graphically and numerically) in real-time on a 7-inch touch screen display. The instrument also enables measurement and monitoring of cell parameters (voltage/intercell voltage/temperature), which makes it a complete stand-alone discharge test system.The capacity tester is compatible with DV-B Win software. Because of that, the user can view detailed numerical and graphical presentations of key parameters, and create reports in various formats.The capacity test is performed in a user-friendly way according to battery testing standards: IEEE 450-2010, IEEE 1188-2005, IEEE 1106-2015, IEC 60896-11/22 and other.The battery tester enables setting the discharge current up to 300 A, with 0,1 A resolution. If higher currents are required, BLU-C units can be connected in parallel, or BXL additional load units can be used.The user can select one of three discharge modes: Constant current, Constant power, Constant resistance. Additionally, different battery duty cycles can be simulated using user-selectable discharge profiles.Testing can be carried out without disconnecting the battery from the equipment it supplies.
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Product
Universal Programmer Superpro 6100N
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Until now,Support 401 IC manufacturer, 103004 pcs devices and keeps growing.Features:Supports 87454 types of devices from 305 IC manufacturers (by 3/15/2013) and keeps growing.Supports EPROM、Paged EPROM、Parallel and Serial EEPROM、FPGA、PROM、FLASH(NOR & NAND)、BPROM、NVRAM、SPLD、CPLD、EPLD、Firmware HUB、Microcontroller、MCU；Supports devices with Vcc as low as 1.2V. Socket Adaptors available for DIP、SDIP、PLCC、JLCC、PGA、LGA、SOIC、SOJ、SOT、QFP、TQFP、PQFP、VQFP、MQFP、LQFP、TSOP、SOP、TSOPII、PSOP、SSOP、TSSOP、SON、EBGA、FBGA、FTBGA、VFBGA、μBGA、CSP、SCSP、QFN、HVQFN etc.High programming speed.Built with 144 universal pin-drivers. Universal adaptors are available for varies packages up to 144 pins. Quick new device support. Popular NAND FLASH Platform supported including Samsung (XSR1.0/1.6), QualComm, HYNIX（HIFFS）, MTK(Solution V1.1), ICERA (v1.0/2.0), ST （7162、7141等）, AMLOGIC(IF2/0), REALTEK, PICOCHIP, DataLight ( Flash FX Pro), Marvell(310/303/920/935…), BroadCom, ZTE, Intel (CE4100)，UBI, LEADCORE(L1809OG), MSATR etc. Customer-specific NAND solution available.PC hosted mode and stand-alone dual modes. Under PC hosted mode the programmer is controlled by a PC via USB2.0 (high speed) to program a chip. Under stand-alone mode the programmer is controlled via a 6-KEY keypad and a 20 character by 4 line LCD display. A CF card is used to store the project files.User can operate multiple units to construct a concurrent multiprogramming system thank for the stand-alone mode. IC manufacturer approved programming algorithms are used for high reliability.Testing functions for logic devices.Advanced and powerful software functions.Production mode starts chip operation at the moment the chip is inserted in the socket properly.Project function simplifies processes such as device selection, file loading, device configuration setting, program option, and batch file setting into one touch step.Password can be set for project files and production volume controlBatch command combines device operations like program, verify, security into a single command at any sequence.Dynamic buffer makes it possible that each chip is programmed with different data file. Applications including serial number, MAC address etc.Log file is useful for quality tracking.Many safety mechanisms are built including self-diagnosis, wrong chip placement detection, poor-pin-contacting detection, ID checking, over-current and over-voltage protection etc.Windows XP/Vista/Win7/ Win8/Win10 compatibility.
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Product
DC Electronic Load
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DC electronic loads are designed for testing a wide range of power conversion products including AC/DC and server power supplies, DC/DC converters, EV batteries, automotive charging stations, and other power electronics components. These units can be synchronously paralleled up to 240kW and dynamically synchronized for generating complex multi-channel transient profiles. The 300% peak overpower capability provides extra headroom for fault condition simulations in automotive batteries, fuel cells, and more.
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Product
Full Wafer Contact Test System
Fox 1
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Unique cartridge technology uses full-wafer contactors combined with parallel test electronics to achieve single touch, full-wafer test
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Product
Electronic Ballast Automatic Test Equipment
ATE-1
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Test series connection, parallel connection and series/parallel connections of the electronic ballast (about 15 kinds of connections), available for various electronic ballast. • With a precise resistance box, tube is substituted for the resistance, can act as many as 6 tubes. Resistance value: 1-4095Ω adjustable. • Measure input parameters (vrms, irms, w, pf, harmonics, etc), output parameters (on-circuit voltage, lamp voltage, filament voltage, lamp current, lamp power, oscillatory frequency), can also test the ballast efficiency, abnormity protection, and power symmetry of partial rectifier effect and etc. • Program controlled AC power source to guarantee the smart choice of input voltage and the frequency. • Equipped with 17 inch LCD controlled machine, specially designed A/D combined with special CPU, has the two left and right testing interfaces to achieve stability of data and high- speed testing. • We can make the special-designed product for you and promise to upgrade the software for free.
