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Product
Force & Strain Measurement
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Load cells, tank weighing devices, balances, scales, force gauges, torque sensors and strain gauges including diaphragm, dual parallel, linear, rosette, T-rosette, and torsion and shear types.
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Product
Advanced SoC Test System
3680
Test System
The Chroma 3680 is an advanced SoC test system with data rate up to 1Gbps. The Chroma 3680 is capable of conducting parallel tests on multiple chips to meet the digital and analog IC testing requirements, with applications including MCU, digital audio, digital TV, set-top box, DSP, network processor, field programmable gate array (FPGA) and consumer electronics.
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Product
Stand-Alone Test Fixture
MA 2012/D/H/VPC-G12x-18
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: NoInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 17,50 kg
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Product
Vision Measuring Projector
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Sinowon Innovation Metrology Manufacture Ltd.
◆ The lifting system adopts linear guide rail and precision screw drive, which makes the lift drive more comfortable and stable;◆ With precision toothless rod and fast movement locking device, ensure return error is within 2um;◆ High accuracy A optical scale and precision working stage, ensure machine accuracy is within 3+L/200 um;◆ HD zoom lens and HD color digital camera, ensure clear image without distortion;◆ With programmable surface 4-ring 8-division LED cold light and contour LED parallel illumination, it can control the brightness of the 4-ring 8-division independently;◆ With powerful iMeasuring2.1 software system , to enhance the control quality;◆ Optional imported contact probes and 3D measuring software, it can help upgrade the machine to be coordinate measuring machine;◆ Optional FexQMS measurement data analysis and real-time monitor software, enhance process control, reduce material consumption;
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Product
Digital Auto Multi-Meter
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This Digital Auto Multi-Meter (DAMM) was designed solely for Automotive Technicians for troubleshooting all electrical problems encountered in the vehicle. Be it a 6V, 12V or 24V system it can be used to check Amps draw directly on the fuse (Mini, ATC or Maxi Fuses) without having to remove it and measure parasitic drain current using the parallel method at the fuse box.
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Product
Pattern Generator
PI-2005
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As a test engineer or digital designer you must have state-of-the-art tools to test, characterize and verify your complex semiconductor devices and digital circuit boards. The PI-2005 Pattern Generator will generate a wide range of simple or complex digital patterns for any test application that requires a serial or parallel digital data stream. To meet the requirements of complex devices and digital circuits, the pattern generator can be configured from 16 to 64 output channels.
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Product
Back and Forth Scratching Tester
WGQ-60
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Shanghai Dean Electrical Co., Ltd
Executive standard: NEMA、JIS; Inspection standard: JB/T4279.15-2008Used to detect the scraping resistance of coating and cable insulation layer of flat wires of 0.800～5.600mm (narrow side) and the silk and enamel covered round wires with nominal conductor diameter of 0.100～5.000mm;Application of SCM control allows for fast operation and strong anti-interference capacity;Sample support table allows for parallel rise and fall, maintaining close contact between the entire plane with sample;Scratching needle is vertical to the paint scraping direction and parallel with sample supporting table;When film is scratched and the action current is ≥5mA, painting scraper would automatically stop scraping;LED would automatically display the number of scraping.
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Product
Wafer Chucks
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ARC, in addition to fabricating Wafer Chucks from aluminum, is also known for its ability to work in hard to machine materials such as hardened (50-62 Rockwell) metal alloys, fired ceramics, e.g. SiC and glasses. These materials are often ideal for semiconductor equipment applications due to their ability to hold critical dimensions and tolerances. ARC specializes in surface grinding and lapping these materials to precision flatness and parallelism specifications needed for semiconductor wafer chuck requirements.
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Product
Wi-Fi/Bluetooth/IoT Wireless Measurement Solution
MP5200
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*One-to-four parallel high-speed non-signaling test*Support Wi-Fi 802.11ax latest standard*Support Bluetooth V1.x/V2.x/V3.x EDR/BLE V4.x/V5.1 measurement*Support IoT protocol NB-IoT, Zigbee, single-channel GNSS...etc
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Product
PXI 8/16-Channel Isolated D/A Converter
M9185A
Digital / Analog Converter
The M9185A is a fully independent, isolated D/A converter that is capable of supplying high voltage levels in parallel of up to eight or sixteen channels. Each channel is able to output up to 16V as stimulus signals to Device Under Tests (DUTs).
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Product
4500~6000W DC Electronic Loads
JT634 Series
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Nanjing Jartul Electronic Co., Ltd
JT634 series electronic load is functioned with 500KHz high-speed synchronous sampling, DSP technology, powerful dynamic test and multi-aspect intelligence analysis. All these are fully integrated into auotmatic test function, which makes JT634 series load very suitable for testing power supply when produced in large quantity. Besides, JT634 series load also possesses the features of current rising slew rate programmable, high-speed dynamic loading and programmable list function, which makes JT634 series load satisfing most of R&D requirements. Moreover, JT634 series load’s special parallel operation method can satisfy the synchronous loading requirements of multi-channels output power supply and satisfy single-channel output power supply requirement for big power.
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Product
NTDS I/O Analyzer
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The NTDS I/O Analyzer provides insight and visibility, enabling users to quickly and efficiently analyze timing relationships, message protocols, throughput, and data integrity on all types of NTDS interfaces. It is capable of monitoring any combination of NTDS Parallel Type A, B, C, H and NTDS Serial Type D, E channels as defined in the MIL-STD-1397 revision B and C specifications regardless of NTDS mode. The channels are connected to existing NTDS cabling with NTDS tap boxes and extract ongoing communication. Each word of NTDS information received is time-stamped with a 125 nanosecond resolution clock ensuring highly accurate timing measurements. Data collected is stored locally for analysis and can be transmitted to external equipment enabling remote troubleshooting, event reconstruction, or time-critical feedback on system performance.
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Product
Scale / Weight Meter
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Equipped with a DC or load cell signal conditioner, this Laureate offers special firmware for scale / weighing applications: two tare functions; count by 1, 2, 5, 10, 20, 50 or 100; auto-zero function; setpoint offset, and dummy right-hand zero for display to 999,990. Built-in excitation for up to four 350-ohm load cells in parallel.
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Product
SAFETY TESTERS ( CURRENT LEAKAGE TESTERS )
ST-05
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Safety Tester Model ST-05 is a test set for testing small equipment powered by 120V 60 Hz, from an approved U-ground source. Test also can be run on double-insulated tools an on appliances with two-pin parallel plugs.
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Product
Confocal FLIM for Macroscopic Objects
DCS-120 Macro
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*FLIM of Macroscopic Objects*Scan Field Up to 15 mm Diameter*Two Fully Parallel TCSPC FLIM Channels*Compact bh Simple-Tau or Power-Tau System*Scanning by Fast Galvanometer Mirrors*Channel Seperation by Dichroic or Polarising Beamsplitters*Individually Selectable Pinholes and Filters*One or Two BDL-SMN or BDS-SM ps Diode Lasers*Tuneable Excitation by Super-Continuum Laser with AOTF*Two Fully Parallel Detection Channels*Two HPM-100-40 GaAsP Hybrid Detectors*Optional: Two HPM-100-06 Hybrid Detectors, IRF Width < 20 ps FWHM*Optional: HPM-100-50 Hybrid Detectors for NIR FLIM*Optional: Multi-Wavelength FLIM*Excellent Time Resolution: Electrical IRF Width 6.5 ps FWHM*Time Channel Width Down to 813 fs*Megapixel FLIM, Up to 2048 x 2048 Pixels at 256 Time Channels*Simultaneous FLIM/PLIM*Wideband Version, Compatible with Tuneable Lasers*Electronic Pinhole Alignment*Optional: Spatial Mosaic FLIM via Motorized Sample Stage
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Product
In-System Programmer for ARM
MPQ-ARM
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Supports Nuvoton M05x and NUC1xx device families Field Upgradeable - always supporting the latest devices Secure image management - protects your IP In-circuit gang programming of up to four devices at once Can be deployed in arrays to program up to 64 devices in parallel Stand-alone, PC-controlled or ATE-controlled operation Automatic device serialization
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Product
Dynamic Test System
3430-SW
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The Dynamic Test System 3430-SW measures dynamic characteristics of IGBT/MOSFET devices at high speed. Maximum of 4 parallel measurement is available by connecting the 3430-SW mainframe test stations for each test items ( normal 2stations). One PC controls the whole system.
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Product
Variable Resistor Load Bank
REOLOAD 100
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A variable resistor load-bank with fixed stages connected in parallel and switched in, as required, with an adjustable stage for fine trimming. Designed for testing equipment under load. 1000V (AC or DC). 250A and 2500
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Product
96 Sink/Source
YAV90096
Digital I/O
Selectable voltage and current, comparation and measurement Drive sink or source up to 32 mA per channel Maximum voltage in output selectable from 9 to 24 VDC Possibility to use I7Os in parallel Pin voltage comparator with logic readout at fix +4VDC 10-bit resolution pin voltage measurement with CAN bus value readout Build-in editable test steps sequence (test script) Size: form G
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Product
Area Scanners
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Leuze electronic GmbH + Co. KG
These devices scan their environment using a quickly-rotating laser measurement beam. This allows them to detect objects even at long distances. With an opening angle of 190° and a measurement distance of up to 65 m, the laser scanner can monitor an area of one hectare. Object detection occurs in parallel in up to 4 detection fields. Convenient configuration software RODsoft permits the parameterization of 8 detection field pairs and 4 detection fields. The status output takes place via a serial interface and an optional warning output. Should service be necessary, the device can be swapped out and put back into operation extremely quickly thanks to the ConfigPlug configuration memory.
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Product
5.0 MP Custom Lens Camera Module (Monochrome)
e-CAM50_CU9P031_MOD
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e-CAM50_CU9P031_MOD is a 5 MP custom lens monochrome camera module based on Aptina's MT9P031 CMOS image sensor with S-mount lens holder attached to it. The MT9P031 is a 1/2.5" Optical Form factor, Electronic Rolling Shutter CMOS sensor. The e-CAM50_CU9P031_MOD is designed to connect with any Application Processor that has parallel digital video interface. The standard S-Mount lens holder can accommodate a wide range of lenses based on the customer choice. e-CAM50_CU9P031_MOD’s S-Mount holder can also house a fisheye lens or a zoom lens to meet their application requirements.
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Product
LCR Meter
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*Rs, Rp, Cs, Cp, Ls, Lp, phase angle, Dissipation factor, Quality factor *Auto select series or parallel test mode *Auto select 100Hz/1kHz/10kHz test frequency, 0.5V rms approx. *Calibration
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Product
USB Modular Source Measure Unit
U2723A
Source Measure Unit
The 3-channel 20V/120mA module can operate in a 4-quadrant operation. The channels could be connected in series or in parallel to achieve up to 60 V/360 mA. It uses the common non-proprietary standard high-speed USB 2.0 interface that provides ease of connectivity allowing users to set up and configure their tests swiftly with its plug and play feature.
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Product
High Performance Strip Handler
Rasco Jaguar
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Jaguar is designed for high-volume production testing of ICs on a strip format or in device carrier. It is fully automotive qualified for tri-temperature test and the ideal solution for high parallel testing of small packages at short test times, but also for Power and Sensor devices. Due to the integrated vision alignment and high precision linear motors, Jaguar provides high yield and excellent OEE.
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Product
Analysis
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External appearance due to non-destructive semiconductor · X-ray fluoroscopic observation, SAT observation, electrical operation confirmation, ESD fracture analysis, plastic opening observation of Chip, search for abnormal portions by EMS / OBIRCH, package (PKG) analysis, Please do not hesitate to contact us anything related to semiconductor analysis, such as observation by polishing / parallel polishing (ball and bump observation etc.), peeling observation of defective part, analysis of foreign matter by EDX · FT - IR etc.
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Product
DC Power Supply
PW-7033
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*Portable type, small size design*Overload protection*3 sets output: 0~32V/0~3A x 2 + 5V/3A*Parallel: 0~64V/0~3A or + 32V ~ -32V/0~3A*Series: 0~32V/0~6A*3 digits, 4 sets LED display, Green is display for voltage, Red is display for current, easy to read, no mistakes.
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Product
RZ Family of 64-Bit & 32-Bit Arm-Based High-End MPUs
RZ/A
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The high-performance RZ/A Series MPUs retain the ease-of-use of Renesas microcontrollers (MCUs), while combining Renesas' proprietary technologies and the Arm® ecosystem. RZ/A devices offer up to 10 MB of on-chip SRAM, which can buffer up-to WXGA resolution graphics without the need for external SDRAM. This capability is married with the device’s ability to execute code in-place (XIP) from QSPI flash, which greatly simplifies board design. Coupled with its high-bandwidth 128-bit wide parallel data bus, the RZ/A supports faster graphics, digital audio signal processing, device control, and more.
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Product
96-CH High-Driving DIO Card
PCIe-7396
Analog Input Module
The PCIe-7396 is a 96-bit parallel digital input/output (DIO) card esigned for industrial applications. The plug and play feature of PCI Express Bus architecture makes it easy for users to install the PCIe-7396 on their systems quickly.
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Product
I-8000 Parallel Data Acquisition Modules
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ICP DAS I-8000 Parallel Series I/O are high speed cartridge based and come in a multitude of digital and analog configurations. They are communicable via an RS-485 backplane in all of ICP DAS USA's I-8000 & I-87K series rack mount controllers. There are two types of I/O communication bus, parallel bus and serial bus. The parallel bus type I/O modules (high profile I-8K series) are high speed, used only in the PACs including XPAC, WinPAC, iPAC, ViewPAC, etc. And the serial bus type I/O modules (high profile I-87K series) are low speed, used in both PACs including XPAC, WinPAC, iPAC, ViewPAC, etc.
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Product
Holographic Concave Gratings - Type I
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HORIBA Scientific produces a wide range of holographic master gratings from which high precision replicas are manufactured.Type I holographic concave gratings are recorded on spherical substrates, with equidistant and parallel grooves.Their geometric optical properties are the same as classically ruled gratings and are interchangeable with them.When used in a spectrograph, Type I holographic concave gratings are traditionally arranged on the Rowland circle (i.e., the circle defined by the grating center and the tangential radius of curvature of the grating).
