Impulse Test
Check using a short surge of energy.
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Compact & Flexible Test Systems for FCT,ICT, ISP and Boundary Scan Designed for Easy Integration
LEON Rack
The LEONRack test system is a flexible test system that could be installed in automation or handling solutions. It is highly flexible and available in three different chassis sizes from low pin count to high pin count test systems. As part of the LEON Family, LEONRack is based on the ABex platform which directly incorporates Konrad analog bus technology and PXI/PXIe in one chassis.
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EOL RF Functional Test
AS652
With this RF test platform, integrable according to the specific needs of the product, we cover a very wide range of test needs with manual feeding.Ergonomics have been fully observed in the design, including the option of servo adjustment of the working height according to the operator.
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Bottom Electrode SMD Test Fixture
16198A
Designed for impedance evaluations of bottom electrode SMDs and supports 201 (mm) and 402 (mm) sizes
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Manual Test System for ICT & ISP with Integrated ABex and up to 426 Test Points
LEON Fixture
The LEONFixture is the ideal ICT and ISP solution for small and cost sensitive applications. This manually operated test system combines optimal ergonomics with high performance, durability and precision, ensuring your investment over the long term. The LEONFixture features a test system integrated in a manual base fixture. The system is designed to be used with an Ingun ATS MA13 insert which could be customized by a lot of fixture houses all over the world.As part of the LEON Family, LEONFixture is based on the ABex platform which directly incorporates Konrad analog bus technology and PXI/PXIe in one chassis.
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In-Circuit Tester
Sparrow MTS 30
The Sparrow MTS 30 is a 19“ test system that can be integrated into any standard rack. The In-Circuit tester can also be used as benchtop test system. With this compact and flexible tester you can perform both analog and digital In-Circuit and functional tests.
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HV Test System for Patient Monitors
HV test enclosure for testing medical products (patient monitors). Insulated test booth with large space for DUT.3 different test nests for adapting different devices.Displays from patient monitors are checked. For this, insulation tests and leakage current measurements must be carried out. Ensuring the standard-compliant test. For the safety of the operating personnel, the test cell is electrically locked while the high voltage measurement is active.
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Flight Control System Test Platform
The Flight Control System Test Platform provides a hardware in-the-loop (HIL) closed-loop test environment for dynamic and maintenance testing of Flight Control Systems (FCS) of both commercial and military aircraft. The system simulates control surface activities from multiple combinations of rudder, flaps, elevator, aileron, and engine controls to the FCS. The system delivers repeatable, cost-effective testing in a fraction of the time needed with typical in-house simulation test systems.
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Digital Impulse Voltage Measuring System
TR-AS
The well-established Impulse Voltage Measuring Systems TR-AS, including the digital recorders from our own development and manufacturing, where further developed consequently and now feature improved sampling rates up to 200 MS/s in real-time with 14 Bit resolution simultaneouly in up to 16 measuring channels.
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Impulse Winding Tester
TH2883-10
Changzhou Tonghui Electronic Co., Ltd.
TH2883 series products are newly developed impulse winding testers by Tonghui. This product line makes Tonghui as the first provider of impulse winding tester from low voltage of 30V to high voltage of 10kV, single channel to multichannel (Max.:8 channels) in this industry. The instrument adopts popular 32 bit CPU and high density SMD technology, 65k color 7-inch TFT wide display screen, bringing ease for your eyes and convenience to your operation. The minimum impulse voltage of 30V, maximum impulse voltage output of 10kV, winding test of 1uH inductance value, sampling rate of 200Msps, memory depth of 6k bytes makes your test accurately. The usage of standard sample average, application of demagnetized impulse, high bandwidth analog acquisition circuit, technology of high-fidelity corona extraction as well as the opening of non-destructive test reflect the design philosophy “customer-oriented, share the future technology with you” of Tonghui.
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In-Line Test System
With an Averna in-line test system, clients boost production/yields, catch defects invisible to the human eye, reduce equipment downtime, and ensure repeatable results.
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Test System Optimized for High-Performance Digital and SoC
ULTRAWAVEMX44 and ULTRAWAVEMX20-D16
Teradyne is the leader in RF/wireless device testing and has a large installed base of UltraFLEX test systems with the UltraWave24 RF instrument. As new devices for handset and base station applications are introduced using mmWave technology, Teradyne’s mmWave instrumentation has expanded in anticipation of new testing demands.
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Multiple Impulse Generator
MIG0624LP1
MIG0624LP1 is a multiple impulse generator with four independent outputs each of 6kA and 1 Ohm source impedance. These are combined to deliver impulses up to 24kA. The impulses generated by this equipment are the 8/20µs and 10/1000µs current impulses. Typical applications would be testing of varistors, gas arresters and other surge protection devices.
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Borehole Impulsive Source Of Choice
G-SOURCE
Over the years the Sercel G-SOURCE range of products has become the system of choice for advanced VSP surveys, in both offshore and onshore environments. The G-SOURCE and delta cluster combine the advantages of a powerful source and a clean acoustic performance to maximize borehole data quality.
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VLSI Test System
3380P
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (512 I/O pins to test 512 ICs in parallel) that can meet the upcoming higher IC testing demands.
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Medalist i1000D
U9401B
The Keysight Medalist i1000D is now even better. Improving from its previous state of an analog-only ICT, the new digital release of the system now features per pin programmable digital cards and a whole new set of intuitive software graphical user interfaces (GUIs) that makes programming and development effortless.
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Impulse Winding Tester
TH2883-5
Changzhou Tonghui Electronic Co., Ltd.
TH2883 series products are newly developed impulse winding testers by Tonghui. This product line makes Tonghui as the first provider of impulse winding tester from low voltage of 30V to high voltage of 10kV, single channel to multichannel (Max.:8 channels) in this industry. The instrument adopts popular 32 bit CPU and high density SMD technology, 65k color 7-inch TFT wide display screen, bringing ease for your eyes and convenience to your operation. The minimum impulse voltage of 30V, maximum impulse voltage output of 10kV, winding test of 1uH inductance value, sampling rate of 200Msps, memory depth of 6k bytes makes your test accurately. The usage of standard sample average, application of demagnetized impulse, high bandwidth analog acquisition circuit, technology of high-fidelity corona extraction as well as the opening of non-destructive test reflect the design philosophy “customer-oriented, share the future technology with you” of Tonghui.
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Impulse Winding Tester
TH2882A-3
Changzhou Tonghui Electronic Co., Ltd.
Due to the influence of coil wire material, magnetic material, framework and manufacture technics etc., coil products (such as transformers, motors, etc.) may have defects of low insulation between coil layers, circles and leads. TH2882A series impulse winding tester, adopting high-speed sampling technique, is a new generation analysis test instrument for insulation performance of coil products.
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Impulse Generators
HYPERLABS triggerable impulse generators create precise high-speed pulses with 50 to 100 ps rise time. They can be triggered by input from antennas and other signal generator systems.
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TD-SCDMA Analysis Using NI PXI RF Test Instruments
NI-RFmx TD-SCDMA
The NI-RFmx TD-SCDMA personality is a highly optimized API for performing physical layer measurements on TD-SCDMA cellular standard signals. NI-RFmx TD-SCDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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Impulse Response Measurements
Dirac
Dirac is a sophisticated tool to calculate a very wide range of acoustical parameters from impulse response measurements of an enclosure. Through many years of development and customer feedback, Dirac has grown to support many different applications. Due to its user friendly interface it is suitable for field measurements, but it also contains many advanced features that make it useful in a laboratory or research setting.
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Impulse Semiconductor High Current Integrated
Transmission Line Pulse Test System
The Impulse Semiconductor High Current Transmission Line Pulse (TLP) test system is the tool of choice for extracting ESD parameters for transient protection devices in a package, or at wafer level. With accuracy better than 100 milliohms at 40 amps peak current, the Impulse high current TLP is specially tailored to the needs of today's ESD device designers who must accurately measure low values dynamic resistance irrespective of breakdown voltage.
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PXI Semiconductor/IC Test System
A high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO card consists of a Sequencer Pattern Generator (SQPG) and 32 channels of full ATE-like features. The 33010 IO card is expandable up to 256 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/ PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.
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Impulse Winding Tester
TH2883S4-5
Changzhou Tonghui Electronic Co., Ltd.
TH2883 series products are newly developed impulse winding testers by Tonghui. This product line makes Tonghui as the first provider of impulse winding tester from low voltage of 30V to high voltage of 10kV, single channel to multichannel (Max.:8 channels) in this industry. The instrument adopts popular 32 bit CPU and high density SMD technology, 65k color 7-inch TFT wide display screen, bringing ease for your eyes and convenience to your operation. The impulse voltage of100V~5000V, maximum 8 channel sweep test, maximum 20 test procedures, sampling rate of 200Msps, memory depth of 6k bytes makes your test accurately.The usage of standard sample average, application of demagnetized impulse, high bandwidth analog acquisition circuit, technology of high-fidelity corona extraction as well as the opening of non-destructive test reflect the design philosophy “customer-oriented, share the future technology with you” of Tonghui.
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Impulse Winding Tester
TH2882A-5
Changzhou Tonghui Electronic Co., Ltd.
Due to the influence of coil wire material, magnetic material, framework and manufacture technics etc., coil products (such as transformers, motors, etc.) may have defects of low insulation between coil layers, circles and leads. TH2882A series impulse winding tester, adopting high-speed sampling technique, is a new generation analysis test instrument for insulation performance of coil products.
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LTE/LTE-Advanced Analysis Using NI PXI RF Test Instruments
NI-RFmx LTE/LTE-Advanced
Highly optimized RF measurement experiencePerform physical layer analysis on LTE cellular signals including MODACC, ACPR, CHP, OBW, and SEMIncludes support for TDD, FDD, and LTE-Advanced signals specified in 3GPP standards release 12Simple access to advanced measurement parallelism
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6TL23 Off-Line seat operation Base Test Platform w/o Table
H71002301
- 18U height 19inch rack space (580mm depth)- VPC G12 or G12X interface- Man Machine interface H73000301 (not included)- stand-up operation
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Impulse Sledge Hammer
Impact hammers are designed to measure the frequency of mechanical structures, such as mechanical movement, mechanical damping and impedance.
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PXI Test System Dev, Debug & Monitor Software
InstrumentStudio
InstrumentStudio is free application software that provides an integrated approach to interactive PXI measurements. InstrumentStudio helps you to unify your display, export instrument configurations to code, and monitor and debug your automated test system. You can view data on unified displays with large, high-resolution monitors, and then capture multi-instrument screenshots and measurement results.
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Component Test Systems
These products include test peripherals used with test systems, such as interfaces that connect semiconductor devices with test systems, and handlers that transport semiconductors to the test system. System-level test equipment and software are also included in this category.
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Conformance Test System
TS8980
The R&S®TS8980 is the most compact full range conformance testing solution on the market for testing in line with requirements from GCF, PTCRB and regulatory bodies. It supports the entire device certification process for RF and RRM, covering the widest range of technologies including 5G NR based on 3GPP and carrier acceptance specifications. The test system is available in various configurations to cover the required scope of testing.
