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Product
Test System
USB Explorer 280
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The Ellisys USB Explorer 280 is a sophisticated protocol test and analysis system for USB SuperSpeed traffic monitoring, driver and software stack debugging, and performance analysis.
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Product
IC Product Testing & Analysis Services
Integrated Service Technology
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Integrated Service Technology Inc.
iST (Integrated Service Technology Inc.) is a leading lab-service company, specializing in the development of IC product testing & analysis, failure analysis, debugging, reliability test, material analysis. Apart from developing testing technologies for the upstream IC design and semiconductor industries, iST also expanded to provide a full-spectrum of services for the mid and downstream companies in the electronics industry.
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Product
PCIe 4.0 Test Platform
PXP-400A
Test Platform
The Teledyne LeCroy PXP-400A Test Platform provides a convenient means for testing PCIe 4.0 cards with a self-contained portable and powered passive backplane. The PXP-400A provides power required for both cards under test, and an interposer can be used for connection to a protocol analyzer.
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Product
Test System
2000/DATS
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WesTest Engineering Corporation
The WesTest-2000/DATS features Teradyne's high performance Digital Test Instrument and state-of-the-art intrsuments from Agilent, Elgar and North Atlantic.
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Product
Analogue IC Tester
SYSTEM 8 (AICT)
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The SYSTEM 8 Analogue IC Tester is the answer to testing analogue devices. The key feature of the AICT is its ability to functionally test all common analogue ICs and discrete devices in circuit. It is also capable of testing all types of analogue and digital components by means of the well-known, power off V-I test technique. For users requiring only the latter function, please select the Analogue Test Station section.
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Product
Batterie Inspektor
Battery Test Platform
By combining the most diverse hardware and software modules, Batterie Inspektor™ delivers innovative, automated, and digitalized battery testing at every stage of manufacturing. With this flexible test platform, all modules can be adapted to their respective quality requirements. Manufacturing is simplified through a scalable and standardized framework for both new projects and upgrades.
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Product
Die Test Handler
3112
Test Handler
Chroma 3112 is a productive pick & place handler for high volume single- or multi-site bare die testing.
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Product
Counterfeit IC Detector
Sentry
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The ABI SENTRY is a unique solution for the quick and easy detection of Counterfeit ICs and components. ABI Electronics has over 27 years of experience in the field of Test & Measurement equipment as well as Contract Electronics Manufacturing. Knowledge of both industries has allowed ABI to design this product around two main concepts:
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Product
High-Speed Signal Recording Systems
System
GaGe has a long history of providing high-speed, real-time signal acquisition, processing, and recording systems on PC-based platforms. This expertise saves customers time and eliminates uncertainties and risks with self-integrated systems.
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Product
IC Tester
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The Peritec adopted the NI products, to build in 1/10 the cost of the commercial product functions of the IC tester. It offers original brand as "ECOIC".IC tester on the market, yet very expensive that several tens of million, part of its function could only really used. Therefore, it possible to continue to build the only really necessary function in Peritec, we have created a mechanism to be completed at a lower cost and development, high-performance, short-term.
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Product
NI's Electrical Functional Test Solution
Functional Test
PXI instrumentation ensures complete and accurate test coverage with a modular architecture mounted in ultra-reliable PXI chassis.TestStand and LabVIEW software provide rapid development of complex test steps and sequences. PXI systems conserve floorspace because of their small, light form factor. Order them preassembled and installed using NI ATE Core Configurations.SystemLink™ software deploys updates and democratizes data insights to optimize operational efficiency.
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Product
CDMA2k Analysis Using NI PXI RF Test Instruments
NI-RFmx CDMA2k
Test Instrument
NI-RFmx CDMA2k is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development effort.
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Product
Display ICs For Automotive
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Renesas has invested in key technologies to address the latest trends within the automotive market. Offering both standard and AEC-Q100 qualified products for automotive applications, Renesas' automotive display IC product line is defined by feature rich, highly integrated semiconductor solutions that incorporate many key function blocks for front console, rear seat entertainment, and rear camera display applications.
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Product
Test Systems
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In-Circuit Test (ICT) tests populated circuit boards by means of electronic measurements through thin needles on test fixtures. We offer in-circuit testers for various testing strategies – from the flexible 19“ rack to the ergonomic high-performance tester. And all of our in-circuit testers are also available in the Lambda edition for true parallel testing. The flying probe test checks your printed circuit boards using four movable test heads. This requires no fixtures and allows for flexible test program generation. That makes our flying probe test systems ideal for a high mix of printed circuit boards and small to medium test volumes, such as for prototype testing.
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Product
Mezzanine System
5174
System
The 5174 provides two major functions, serving as a precision Voltage Controlled oscillator board and a variable frequency source board. These features can be use together or independently. As a variable frequency source, the 5174 provides a high-resolution variable clock source that is based upon a reference clock supplied by the ECM carrier.
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Product
Stator Test Systems
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Automation Technology's STS-3800 has become the "gold standard" in Stator Testing Equipment. The STS-3800 is packed with standard features and like all of ATI's 3800 Series Test Systems, it is backed by the industry leading two-year limited warranty. The STS-3800 offers the most comprehensive testing of stators and fields available.
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Product
Rad-Hard Analog ICs
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ST's wide range of rad-hard QML-V qualified analog ICs covers analog-to-digital converters (ADC) and digital-to-analog converters (DAC) for telemetry, instrumentation and imaging applications. Our portfolio also includes rad-hard op amps, high-speed differential amplifiers up to 1 GHz, shunt voltage references and comparators to ensure a complete solution for signal conditioning, referencing and data conversion.
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Product
AirTech Test Systems
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Ingenieurbüro Dr. Hillger Ultrasonic-Techniques
Hillger NDT has developed AirTech testing technology for the requirements of air-coupled testing. Our USPC 4000 AirTech ultrasonic testing system and our robust AirTech sensors consisting of optimized transmit and receive probes deliver optimal results under demanding conditions.
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Product
ICE 3000 Series
ICE3001
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This subsystem is an agile filter for the SATCOM frequency band, capable of acting as either a receive or a transmit filter. It enables simultaneous operation of multiple transceivers in extreme cosite environments. The ICE3001 provides multiple poles of RF selectivity to reduce broadband noise, harmonics, and spurious signals for either receive or transmit applications. This filter is a highly integrated design incorporating complete Built-in-Test capability. The design has been qualified for military applications. A dual-mount tray is also available as an option for easy incorporation on your platform. Cost-effective modifications are available on the ICE3001.
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Product
Drop Test System
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HIACC Engineering & Services Pvt. Ltd.
HIACC's Drop Test System is a specialized, automated testing apparatus designed to simulate real-world handling and transportation hazards, determining the "drop bearing capacity" (durability) of products and their packaging.
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Product
EMC Test Systems
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The sum of EMC is not necessarily equal to its parts; any modular electronic device from a complete aircraft down to a mobile phone needs to meet EMC requirements for the device itself, even if all the individual modules are compliant. For the enormous range of types of modular device requiring EMC test, R&S offers extremely flexible and scalable EMC test systems; practically as modular as the devices under test.
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Product
C-Mic Testing System
BK3010
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The BaKo BK3010 is our main C-Mic tester. It's small enough to carry under your arm and with a test time of under 0.5 seconds, it tests as fast as you can connect a microphone. Setting up the specifications is so easy and intuitive, we based the BK3012 D-Mic Tester on it. It is also the model for our BK9010B Fully Automatic C-mic Tester.
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Product
Noise Figure Analysis Using NI PXI RF Test Instruments
NI-RFmx Noise Figure
Test Instrument
Measure noise figure, gain, Y-factor, effective temperatures, hot and cold power, and moreOptimized calibration and measurement routines for multi-DUT test using Y-factor and cold sourceSupports the PXIe-5668R 26.5 GHz VSA, the PXIe-5698 26.5 GHz preamplifier, and VSTsDesigned for use with industry-standard noise sources such as the Noisecom NC346 Series
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Product
Magnetic-Field Test System
MTS-800
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The MTS-800 is a compact test system for broadband generation and measurement of magnetic fields. Its internal components allow automatic EMC tests according to automotivestandards where high field strength need to be generatedor measured.
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Product
Electroluminescence Test Systems
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The products of the SolarModule EL-inline family are integrated into a module production line, before lamination, after lamination or at the end directly after the performance measurement. High-resolution cameras provide excellent image quality and allow the automatic detection of relevant defects. A manual evaluation of images is no longer necessary, which means that considerable costs can be saved. Communication to upstream and downstream processes is flexible and can be adapted to all common interfaces.
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Product
SAS Protocol Test System
M124A
Test System
The SAS Sierra M124A Protocol Test System is Teledyne LeCroy's 7th generation protocol analyzer system that provides 100% accurate protocol capture of both SAS (SAS 3.0) and SATA (SATA 3.0). The industry's most widely used test platform for SAS and SATA features unmatched analysis and debug capabilities to help pinpoint problems at every layer of the protocol.
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Product
VME Data Acquistion System
ADM-31
System
The VME-based ADM31 data acquistion system supports up to 48 differential or up to 96 single-ended analog inputs. The ADM31 control card is an intelligent A/D subsystem master or slave device that controls the analog A/D cards. Up to two A/D cards can be configured with the control card to complete the A/D system.
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Product
microLED Testing System
OmniPix-ML1000
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The OmniPix-ML1000 is the first all-encompassing microLED testing system, offering both full wafer and localized individual pixel inspection. Measure localized and total EQE. Use automated PL and EL to test and characterize your microLEDs. Analyze defective pixels with nano-PL and nano-EL.
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Product
VFTLP+ Test System
4012
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The Model 4012 VFTLP+™ test system was developed in early 2000 to add high speed measurements to the usual I-V plot, to measure and record the real TDDB waveform which causes oxide failure.*Accurate measurements of this waveform have finally been identified by Barth Electronics Inc. and CDM protection can now be based on known dimensional design parameters. We identify the response of your CDM protection circuits with 100ps risetime pulses which simulate the real CDM test. This is the only way with which to provide the total gate oxide threat voltage data.*Convenient, precise, repeatable operation*Computer controlled for automated testing
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Product
VLSI Test System
3380
Test System
The 3380 VSLI test system equipped with a maximum of 1280 I/O channels, 256 VI sources, flexable architecture and comprehensive optional function boards (ADDA/Hi-voltage DPS) can meet the high parallel multi-test tendency.
