Test Heads
1) interchangeable assembly connecting test signals between DUT and ATE. 2) representation of a human head. 3) provide network test access.
See Also: Heads, Test Probes
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Product
Galvo-Resonant Scan Head and Controller
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Our LSK-GR08(/M) Galvo-Resonant Scanner contains one resonant scan mirror and one galvo scan mirror that deflect an incident laser beam in X and Y, respectively. Identical to the galvo-resonant scanner used in our Bergamo® II multiphoton microscopes and complete Cerna®-based confocal systems, the 8 kHz resonant frequency of the resonant scan mirror enables much higher-speed scans than a galvo-galvo system. In our Bergamo system, the scanner can achieve 30 fps at 512 x 512 pixels image resolution.
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Product
Kelvin Test Contactor/Probe HEad
cPython
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cPython™ Kelvin contactors and probe heads provide superior electrical and thermal performance with significant cost savings. This makes cPython Kelvin ideal for lab and high-volume production test of analog and mixed signal integrated circuits – for applications such as power control, A-D and D-A converters, audio, video, power amplifiers, photonics, optical MEMS and sensors.cPython Kelvin probes are electrically isolated and mechanically independent force and sense paths for true Kelvin contact for taking accurate measurements, even under high current conditions. These robust probes provide hundreds of thousands of insertions or touchdowns, and a bandwidth up to 26 GHz.
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Product
Fiber Optic Sensor Head Variations
FU Series
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11 Fiber Optic Sensor Head Variations. Flexible Stainless Steel Jacket. Wide Area Detection. Hex-shaped Heads for Trouble-free Mounting. Heat resistant. Small Beam Spot. Thin-sleeve Thrubeams
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Product
Image Sensor Test System
IP750
Test System
Teradyne's IP750 series dominates the image sensor tester market with its superior performance and low cost of test. The IP750 delivers high throughput and high parallel test efficiency, broad device test coverage from CCD and CIS, analog and digital capture, and concurrent image sensor and logic testing. In addition, Teradyne's IG-XL software environment provides easy, shorter test program development and easy maintenance.
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Product
7-Meter Laser Head Cable
10882B
Calibration Cable
The 10882B 7-meter Laser Head Cable is used to connect the 5519A/B Laser Head to the E1735A USB Axis Module for the 5530 Laser Calibration System.
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Product
Single Optical Head Interface Module
81618A
Optical Module
The single-channel interface module is used to connect optical heads ( Keysight 8162x ) to the mainframes 8163A/B, 8164A/B or 8166A/B.
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Product
Error Detector Remote Head 32 and 17 Gb/s
N4952A
Bit Error Rate Tester (BERT)
The N4952A is an affordable and compact error detector remote head available in 4 to 17 Gb/s and 5 to 32 Gb/s configurations. Compatible with the N4960A Serial BERT controller, it is the perfect solution to test up to 32 Gb/s per channel for 100 Gigabit Ethernet applications and other high-data rate devices. The N4952A error detector supports PRBS or user patterns and operates up to 32 Gb/s in a single band with no gaps or missing data rates. The remote head allows the test equipment to be located very close to the device under test, eliminating the need for long cables that degrade signal quality.
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Product
Motorised and Automated Probe Heads
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Motorised heads enable automated, repeatable re-orientation of probes to allow access to features on all faces of the part, improving the capability of the CMM and maximising productivity.
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Product
WLCSP Probe Heads
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Smiths Interconnect offers Wafer Level Chip Scale Package (WLCSP) Probe Heads utilizing spring probe technology which provide high parallelism in test, superior signal integrity and high speed / RF testing capability.
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Product
FADEC/EEC Test Platform
Test Platform
The FADEC/EEC Test Platform provides a hardware in-the-loop (HIL) closed-loop test environment for dynamic and maintenance testing of full-authority digital engine control (FADEC) and electronic engine control (EEC) units of both rotary- and fixed-wing airframes. The system simulates one or more turbofan engines, including its sensors and actuators for use with the most sophisticated FADECs and EECs on the market. The system delivers repeatable, cost-effective testing in a fraction of the time needed with typical in-house simulation test systems.
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Product
Erase Magnetic Recording Heads
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International Electro-Magnetics, Inc.
*Dual Gap Ferrite Cores*Cassette - 2" Formats*MultiTrack Interlace*Full Track 1" Video
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Product
Laser Head Cable, 7 m
10881B
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Provide reliable power with this five-pin female DIN that connects the laser head to multiple laser boards.
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Product
Test Contactor/Probe HEad
cRacer
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The cRacer™ test contactor and probe head portfolio offer solutions for 5G mmWave FR2 up to 54+ GHz.cRacer utilizes robust spring probe technology for testing singulated packages or probe heads for wafer probe (bumped/pad) applications with fine pitch and WLCSP compatibility – ranging from 100 µm to 650 µm, covering the majority of 5G devices.cRacer features a stainless-steel spring for tri-temp testing and performance in operating temperatures -55°C to +155°C.
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Product
Bipolar/FET/Diode Dual Head Production Test System
36XX
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Two test stations on the 3600E and 3601E systems. Performs DC, AC, and pulsed tests. Excels at evaluating difficult to measure parameters on zeners, current limiters, varactor tuning diodes and darlingtons. 24 bin opto-isolated handler/prober interface. Parallel first-in first out computer to tester interface for maximum throughput. Parallel testing with a 3602E or 3603E allows shared test execution for extremely high throughput applications when interfaced to high speed handlers with multiple test sites.
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Product
Doppler Sensor Heads
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Designed for long range motion/speed/directional detection where the sensitivity is essential.
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Product
Impulse Hammers/Impedance Heads
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Impulse hammer excite from the smallest of structures to various civil engineering structures. The Dytran model 5800SL is an ultra miniature IEPE impulse hammer used to excite structures or machinery with a definable impulse force in modal and structural analysis of very light structures and impulse testing of very low mass, high resonant frequency components.
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Product
Laser Diode Reliability Burn-In / Life-Test System
58602
Test System
Chroma 58602 is a high density, precision multi source measurement Unit (SMU) module with temperature control and exchangeable interface developed for burn-in, reliability and life test of optoelectronic components including laser diodes, VCSELs, VCSEL Arrays, silicon Photonics, photo-diodes and other similar components.
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Product
6TL36 Inline Handler
AM304
Test Handler
Test handler 6TL36 able to test DUTs inside Faraday ChamberDual line (bypass)
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Product
Audio Mastering Magnetic Recording Heads
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International Electro-Magnetics, Inc.
*Tape and Film*Standard Replacement*Instrumentation Quality*Custom Formats
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Product
Parametric Test Fixture
U2941A
Test Fixture
The Keysight U2941A is a parametric test fixture that is designed to complement the usage of U2722A USB source measure unit in the testing of semiconductor components, including SMT and DIP ICs.
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Product
TrainLink™ Head Of Train Device
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Wabtec Trainlink telemetry systems provide a critical link to last-car information, such as brake pipe pressure, motion status, battery condition, and high visibility marker status.
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Product
Automotive Test Platform
ETS-800
Test Platform
Next-Gen Automotive Test Platform With the Industry’s Highest Throughput and Fastest Time to Market
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Product
Test Contactor/Probe Head
cBoa
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cBoa™ test contactors and probe heads are the solutions for contacting high-frequency devices for package test or final test at wafer. The robust design and materials of the cBoa probe withstand the rigors of high-volume test by providing longer life and higher yield. The homogeneous DUT side plunger provides longer run times between cleaning and increased probe life.The cBoa features a stainless-steel spring for tri-temp testing and performs in operating temperatures of -55°C to +155°C and bandwidth of up to 35 GHz @ -1 dB.
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Product
HTOL Test Systems
Test System
Our IOL & Power-Cycling systems increase measurement quality & throughput while simultaneously reducing the Total Cost of Test (TCoT) of an open platform. We focus on complete monitoring and precise temperature control for each device under test.
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Product
Compression Head
G201A31
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To simulate the subjecting of a child-related product to mechanical damage through compressing or other action likely to be performed by a child. After testing, the product may be tested for sharp edges, sharp points & small parts.
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Product
Test System Optimized for High-Performance Digital and SoC
ULTRAWAVEMX44 and ULTRAWAVEMX20-D16
Test System
Teradyne is the leader in RF/wireless device testing and has a large installed base of UltraFLEX test systems with the UltraWave24 RF instrument. As new devices for handset and base station applications are introduced using mmWave technology, Teradyne’s mmWave instrumentation has expanded in anticipation of new testing demands.
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Product
Ranging Sensor Heads
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A ranging sensor head that is designed and manufactured for short range measurements of a moving or stationary target's range, speed and direction.
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Product
High-Power InGaAs Optical Head
81626C
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The new 81626C high-power optical head provides a 5 mm detector area and allows flexible placement of the remote optical power meter, which is then connected to the N7749C. The 81626C accepts parallel beams with up to 4 mm diameter, standard SM fiber and MM fiber with max. 100 μm core diameter, NA ≤ 0.3. A wide choice of adapters allows input from popular fiber connector types, bare fibers or open beams. The magnetic D-shaped adapters allow rapid removal and replacement without twisting attached fibers.
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Product
Scienlab Battery Test System — Cell Level
SL1002A
Test System
Test System with up to 36 Channels.The Keysight SL1002A provides sink and source with 0 to 6 V, 100 to 600 A, 0.6 to 3.6 kW and 36 channels for battery cells.
