Functional Test Systems
See Also: Functional Test, Functional ATE
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Product
PXI 5W Programmable Resistor Module, 4-Channel, 1Ω to 31.5Ω
40-252-010
Programmable Resistor Module
The 40-252-010 is a programmable resistor module with 4 channels which can be set between 1Ω and 31.5Ω with 0.125Ω resolution The 40-252 range provides a simple solution for applications requiring up to 5W of power handling per channel. The 40-252 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. Each channel is able to simulate short or open circuit conditions that can be experienced in a system caused by faulty wiring or sensors.
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Product
Double Function Tester with Shielded HF Test Chambers
End-of-line Tester UTP 9010 RF
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The UTP Series 9010 is a scalable test series available in a variety of feature-rich variants and many designs. The UTP 9010 RF function tester shown here as an example is suitable for tests with a medium number of channels and complexity. It is designed for parallel testing of two or more test items. The measuring instruments used are used alternately for several test items. Due to its compact design and construction as a modular system, this powerful tester can easily be expanded to larger numbers of channels.The integrated HF test chamber UTP 5070 developed by NOFFZ allows an independent shielded test. It can be operated manually or fully automatically by a robot .The basic version of the UTP 9010 series is an ideal system for functional and end-of-line tests and is already preconfigured for this purpose. The RF tester presented in the example is used in particular to test infotainment and eCall modules in the vehicle as well as IoT products with wireless technologies.
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Product
VFTLP+ Test System
4012
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The Model 4012 VFTLP+™ test system was developed in early 2000 to add high speed measurements to the usual I-V plot, to measure and record the real TDDB waveform which causes oxide failure.*Accurate measurements of this waveform have finally been identified by Barth Electronics Inc. and CDM protection can now be based on known dimensional design parameters. We identify the response of your CDM protection circuits with 100ps risetime pulses which simulate the real CDM test. This is the only way with which to provide the total gate oxide threat voltage data.*Convenient, precise, repeatable operation*Computer controlled for automated testing
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Product
Multisite Testing – Rail System
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Mechanical system allowing the flexibility of multi-site testing with adjustable site to site spacing The Celadon Rail System allows multi-site testing capability with flexible die to die spacing using existing Celadon VersaTiles™ to minimize cost of test with new DUT structures. The modular design allows for additional site assemblies and rail assemblies to be added after the original system purchase. With the Celadon Light-Tight Enclosure and Rail System Tool, high accuracy alignment and testing can be performed at extreme temperatures without effecting the thermal equilibrium of the system.
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Product
DDS Function Generator
FG-2000
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Based on the latest advances in DDS (Direct Digital Synthesis) technology, the FG-2000 series is a portable high precision sine, square, and triangle waveform function generator. The FG-2000 series utilize microprocessor control that delivers clean and accurate waveforms up to 20MHz with 5V peak-to-peak amplitude in a portable hand-held unit.
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Product
Vibration Test Systems
G-9 Series
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The G-9 Series Vibration Test Systems, featured by high eccentric moment and a large loading table supported by the unique rigid lateral suspension structure, are suited to transportation tests for relatively large specimens; packaged goods and electric apparatus. In addition, the unique structure enables horizontal tests of relatively heavy specimens without conventional horizontal slip tables.
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Product
Test Automation Systems
iTest
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Our iTest family of test automation systems provide a full range of capabilities, allowing you to purchase just the right solution for your application without having to overbuy.
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Product
Automatic System Function Tester
3240
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Chroma 3240 is an innovative handler for high-volume multi-site IC testing at the system level.
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Product
Universal Test System
LEON System
Test System
A universal ICT, FCT, ISP and Boundary Scan platform.Based on the ABex platform, which directly integrates Konrad analog bus technology and PXI/PXIe in one chassis, the LEON platform can be configured to solve various test challenges. Due to this architecture only one system provides the complete test flow combining ICT, ISP, Boundary Scan and FCT.Various form factors and configurations allow a perfect combination between cost, speed and test coverage. The modular architecture provides the possibility to reconfigure or upgrade the systems based on your test needs.The LEON System software provides a powerful development and test execution environment which directly supports NI TestStand. All systems and components could be integrated into third party software using supplied APIs.
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Product
Modular Breakout System 160-Pin Plugin Module
95-190B-003
Modular Breakout System
The 95-190B-003 Plugin Breakout Module is designed to be fitted to a PXI 40-190B Fault Insertion Switch as part of the Pickering MBoS. The Modular Breakout System is designed to Simplify HILS (Hardware In the Loop Simulation) Applications.
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Product
Vibration Testing System
F Series
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Suited to durability tests for all industrial products such as aeronautical, automobile, electronic and precision equipment.
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Product
Modular Breakout System 8-Pin Power D-type Plugin Module
95-191-002
Modular Breakout System
The 95-191-002 Plugin Breakout Module is designed to be fitted to a PXI 40-191 Fault Insertion Switch as part of the Pickering MBoS. The Modular Breakout System is designed to Simplify HILS (Hardware In the Loop Simulation) Applications.
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Product
Vehicle Test Systems
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What counts in development processes is the speed at which new vehicles and new technologies are made ready to go into production. For vehicle testing, this means that complex test problems must be solved. HORIBA develops vehicle test stands that simulate the realities of driving in the most varied situations both precisely and economically.
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Product
Test Systems
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In-Circuit Test (ICT) tests populated circuit boards by means of electronic measurements through thin needles on test fixtures. We offer in-circuit testers for various testing strategies – from the flexible 19“ rack to the ergonomic high-performance tester. And all of our in-circuit testers are also available in the Lambda edition for true parallel testing. The flying probe test checks your printed circuit boards using four movable test heads. This requires no fixtures and allows for flexible test program generation. That makes our flying probe test systems ideal for a high mix of printed circuit boards and small to medium test volumes, such as for prototype testing.
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Product
Quadruple Function Tester with Shielded HF Test Chambers
UTP 9011 RF
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Circuit boards are the heart of all electronic devices. To ensure the reliable function of these boards, detailed tests are essential.Our board-level tester UTP 9011 RF works safely, quickly and cost-optimized at circuit board level. Our interchangeable adapters are particularly efficient in this system, with which you can even test different test items at the same time. The shielded NOFFZ HF test chamber always ensures consistently good results.
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Product
Automatic System Function Tester
3260
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Chroma 3620 is an innovative system handler for high-volume multi-site IC testing at the system level.
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Product
Electronic Equipment Testing System
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The task set forth the need to create a special universal software core, the main tasks of which are the provision of measurement and control processes, as well as the interaction of software components intended for collection, visualization, mathematical processing and documenting of data. For each stand, specific program modules were additionally developed according to test methods specific products. The overall modular architecture of the system makes it easy to supplement and correct test algorithms.
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Product
Optics Test Systems
Contract Measurements And Services
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Optik Elektronik Gerätetechnik GmbH
Thanks to our very good laboratory equipment, we offer contract measurements for numerous measuring tasks. In the field of optics, measurement and testing technology, these are, for example, the parameters MTF, focal length, radius, contact dimension, focal length, geometric and optical parameters of cylindrical lenses. Others on request.
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Product
Fixture Self-Test Controller and Calibration Check
AQ818
Test Fixture
The module AQ818 includes all the electronic blocks required to perform an effective test platform self-test. Thanks to this module, a chain of tests can be performed, which will end up not only with a report of the defective instruments or switch modules, but also with the relay contacts live expectancy report.
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Product
Phase Noise Test System
N5511A
Phase Noise Analyzer
The Keysight N5511A phase noise test system (PNTS) lets you measure at the limits of physics with readings down to kT (-177 dBm/Hz). The N5511A PNTS is a replacement for the gold-standard Keysight E5500 phase noise measurement system and is designed to meet the needs of phase noise power users.
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Product
Electro-Stimulation Equipment Testing System
STIMU-600
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Test device for functional testing of electrical stimulation devices.
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Product
Application Software for Electronic Test & Instrumentation
test
Application software provides configuration-based workflows for electronic test and instrumentation applications. Application software is part of the NI software portfolio.
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Product
Transformer Test System
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Transformer testing instrument, can be used as a stand-alone device and has the highest efficiency. Can be used in power transformers, network communication transformers, etc.
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Product
LTE RRM Test System
T4010S
Test System
The T4020S LTE RRM tester is the Keysight platform for LTE RRM conformance testing of LTE UEs. T4020S belongs to the Keysight LTE product family and, as the other LTE T4000S test platforms, is based on the T2010A LTE Wireless Communications Test Set.
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Product
Nanomechanical Test Systems
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Bruker’s nanomechanical test systems deliver the highest degree of performance, accuracy, reliability, and versatility for quantitative mechanical and tribological characterization at the nanoscale and microscale. Utilizing multiple patented and proprietary technologies, the Hysitron product line of standalone nanomechanical test systems enable quantitative characterization at length scales unreachable by others. Combined with the most comprehensive suite of hybrid characterization techniques, the TI 990 TriboIndenter, TI 980 TriboIndenter, TI Premier Series, and TS 77 Select nanoindenters will keep your materials development at the forefront of technology.
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Product
Integrated I-V Test Systems
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The OAI Integrated I-V Test System is perfect for R&D as well as production, the OAI Integrated I-V Test System delivers extremely accurate solar cell performance measurement. OAI’s advanced fully Integrated I-V Test System is designed to overcome the limitations of flash testing by providing a highly optimized pulse width and voltage sweep rate to match any type of solar cell’s high capacitance and slow dielectric response speed. As a result, the system produces extremely accurate measurements of solar cell I-V parameters and efficiency while leading to the most accurate test results.
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Product
Test System
MFTS500
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Computer Gesteuerte Systeme GmbH
The MFTS500-System is specially designed for the testing of electronic control units (ECUs). It can be configured to be used as a development or as a production tester. Every effort has been made during development and design to ensure that the system is flexible and cost effective.
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Product
Battery and DC System Testing
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HAOMAI Electric Test Equipment Co., Ltd.
Testing for battery and DC power systems.
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Product
Test System
ITC57300
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The ITC57300 Dynamic Parametric Test System mainframe accepts Test Heads that perform nondestructive transient measurements on semiconductor devices such as Insulated Gate Bipolar Transistors (IGBT), power MOSFETs, diodes, and other bipolar devices(requires additional optional bias power supplies and custom personality boards). Included in the mainframe are all test equipment and software necessary to analyze and perform resistive and inductive switching time, switching losses, gate charge, Trr/Qrr, and other transient tests.
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Product
Automated Test System
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Automated Test System is a production-ready solution that combines test software and various hardware for validation test in both manufacturing and R&D. The solution provides a high performance and cost-effective system based on National Instruments technology.
