Diode Test
See Also: Diode, Laser Diode, Zener Diode, Photodiode, Diode Testers
-
Product
Diode Power probe
-
The COMM-connect 3026 Diode based temperature compensated probe is designed for use with the COMM-connect range of Power Monitors. The probe will handle from 50µW to 100mW . Used with external couplers and the our measurement system application from 1W to 1MW, a high dynamic range can be configured. The 3026 Diode based probe gives excellent stable results along with the COMM-connect Power Monitor variants. This gives our customers a number of applications to monitor and control the last part of your RF network installation from transmitters to the antenna.
-
Product
Pump Laser Diode Driver
S-110
-
•LD Driver, EDFA, ASE Broadband Source, 1X4 Optical Switch•Variable Optical Attenuator, Wavelength Meter•SOA Driver, SLED Driver, Pump LD Driver•Pattern Generator & BERT, SFP Transceiver Driver•4Channel Optical Return Loss Meter (Light Source & Power Meter)
-
Product
80 DIOs, 8AIs, 8AOs JTAG Boundary Scan Resources Unit Expansion
YAV9JTAH
Test Fixture
80 DIOs8 Ais8 AOsCompatible with all JTAG vendors
-
Product
EOL/Functional Testing
Functional Test
Whether you are testing RF LRU modules as a defense contractor, or implementing the next power supply tester for EV charge stations, ARC can create a custom, flexible automated end of line test solution for a variety of needs, with your budget in mind.Leverage our expertise with PXI mixed signal modular instruments, RF test capabilities and switching to complete your next solutions. Shorten your test development times, improve hardware and software standardization, and control your future test development costs by partnering with ARC on your next project.
-
Product
Laser Diode Source Product Family
LDS-7200
-
5 nanometers tuning range• 10 picometer setpoint accuracy• 0.1 picometer resolution• 20mW output power• 0.005 dB power stability• Built-in coherence control• Integrated function generator• USB remote interface• Application program with source code
-
Product
THz Diodes
-
Macom Technology Solutions Holdings Inc.
The intrinsic cutoff frequencies of these Schottky junction devices exceed 1 THz, making them well-suited for use in mixers and detectors operating in the frequency bands from 60 GHz into the hundreds of GHz bands.
-
Product
2.5G DFB Laser Diode Chips
-
Guilin GLsun Science and Tech Group Co., LTD
2.5G DFB Laser Diode Chips by GLSN
-
Product
SCR, Diodes & Assemblies
-
SCR and Diodes are available as assemblies or discrete parts. Most assemblies are encapsulated. CEHCO stocks a variety of rectification products such as Diodes, SCR’s (silicon-controlled rectifiers), and Encapsulated Assemblies. We SCR and diodes replacement specialist. We specialize in obsolete and hard-to-find SCR and diode assemblies. We can offer an equivalent replacement for most obsolete rectification devices.
-
-
Product
TVS Diodes
-
Power TVS diodes provide outstanding protection for both alternating current and direct current power line applications by a Power TVS diode in a surface mount package. When compared to other devices, such as MOVs, power TVS diodes provide much better protection. Bourns provides a broad voltage range of devices with surge current ratings ranging from 3, 6, 10, and 15 kA to suit a variety of applications.
-
Product
Tunable Diode Laser Absorption Spectroscopy
5100 TDLAS
-
The feature-rich 5100 TDLAS offers high-sensitivity, analyte-specific, fast-response measurements for critical industrial applications. It features a single absorption cell and integrated sample system in a compact, cost-effective package.
-
Product
Laser Diode Drivers
-
Berkeley Nucleonics Corporation
Provides a laser diode with a stable, low-noise current source.
-
Product
NFC Conformance Test System
T3111S
Test System
The T3111S RIDER NFC Conformance Test System is the Keysight solution for RF Analog and Digital Protocol testing of NFC, EMV and ISO devices. The Test System is based on the Keysight T1141A NFC Test Set and it is complemented by the Keysight's or FIME's robots for accurate and repeatability RF testing. Selected 3rd party positioning robots can also be supported.
-
Product
Modules - Modules, Diode
-
Diode modules from Vishay feature a range of technologies including FRED Pt®, HEXFRED®, and high performance Schottky, with reverse voltage ratings up to 2500 V and forward current ratings up to 600 A.
-
-
Product
Laser Diode Burn-in Reliability Test System
58604
Test System
The Chroma 58604 is a high density, multi-function, and temperature controlled module for laser diode burn-in and lifetime tests. Each module has up to 256 SMU channels which can source current and measure voltage in various control modes as described below.
-
Product
Diode Laser Spectroscopy
-
Diode Laser Spectroscopy by Mesa Photonics: Herriott Cell and OEM laser diode controller boards.
-
Product
Scienlab Battery Test System – Pack Level, 110 KW Compact Version
SL1710A
Test System
Compact solution for testing Battery Packs with output power up to 110 kW and voltage range up to 1500 V
-
Product
10G DFB Laser Diode Chips
-
Guilin GLsun Science and Tech Group Co., LTD
10G DFB Laser Diode Chips by GLSN
-
Product
Diodes
-
Development target specification*PD=5W class*Capability for load dump surge：ISO7637-2, JASO A-1*Reliability standard：AEC-Q101*Package size：[W×L×H] 12.0×9.6×4.3(mm)
-
Product
In-line High-Density ICT System Series 7i
E9988GL
In-Circuit Test System
The E9988GL Keysight i3070 Series 7i Inline High-Density In-Circuit Test (ICT) system brings industry-leading ICT technologies into your automated manufacturing line, saving resources and optimizing your automated test strategy.
-
Product
Laser Diode Drivers (LDD)
-
LDD technology has evolved from driving DVD/CD/Blue-ray optical drives to include laser projection in smartphones, automotive head-up displays (HUDs) and pico projectors. Renesas has developed new LDDs for RGB scanning laser projection systems and laser-based pico projectors. Automotive HUDs are benefiting from big innovations in MEMS projection systems and are now central to advanced driver assistance systems (ADAS) and safety. The latest laser scanned-MEMS projection systems can provide higher resolution images and at a lower cost.
-
Product
25G DFB Laser Diode Chips
-
Guilin GLsun Science and Tech Group Co., LTD
25G DFB Laser Diode Chips by GLSN
-
Product
VITA 62, 3U Test Fixture
TF-3U-7B041-1
Test Fixture
This Power Supply test fixture is being proposed as a tool for checking Injector / Ejector operation, proper alignment of the VITA 62 connector and proper alignment of both keys on a Single slot, 3U, VITA 62/SOSA power supply.
-
Product
PXI Semiconductor/IC Test System
Test System
A high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO card consists of a Sequencer Pattern Generator (SQPG) and 32 channels of full ATE-like features. The 33010 IO card is expandable up to 256 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/ PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.
-
Product
Semiconductor Test System
TS-960e
Test System
The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
-
Product
Laser Diode Characterization Testing
-
The Yelo Laser Diode Characterization system performs automated characterization of a laser device. The system will allow the operator to load a single packaged Laser device into a TEC controlled fixture mount. Each test station (LIV, Spectrum, Far Field/Beam Divergence) will then automatically align with the Laser Device in a sequential order and perform the automated tests required of each station.
-
Product
Diode Tester
FEC VF40CM
-
Frothingham Electronics Corporation
The VF40CM is intended for testing VF, HALF CYCLE SURGE, and THERMAL RESPONSE/RESISTANCE on small- and medium-power diodes and rectifiers. It can also measure THERMAL RESPONSE/RESISTANCE on NPN and PNP bipolar transistors using an external user-supplied VCB supply.The VF40CM also is sometimes used to measure VZ of low-voltage zener diodes up to the compliance voltage limit of the tester. 20V at 20A is possible.
-
Product
Schottky Mixer and Detector Diodes
-
Macom Technology Solutions Holdings Inc.
Schottky diodes are majority carrier diodes formed by plating a layer of metal on a layer of doped semiconductor, which forms a rectifying junction. The type of metal and the type of dopant in the semiconductor determines the diode’s barrier height, which is a measure of the amount of energy required to force the diode into forward conduction. MACOM produces Si Schottky diodes as well as GaAs Schottky diodes for use as signal detectors or in frequency mixers.
-
Product
KATANA & PILAS Pulsed Diode Lasers
-
With external trigger functionality, nano- to picosecond pulse duration, and a wide range of wavelengths, the KATANA & PILAS series are our most versatile offering.
