Test Switches
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Switch PXI Solid-State Switch Module, 6xSPST, 25 A, 100 V
40-184A-001
The 40-184A-001 has 6-off high current SPST switches in two PXI slots and is part of our range of high power solid state switching solutions. Each SPST switch uses a fully isolated solid-state relay which has been designed to offer fast operation under hot switching conditions and high inrush current with no operational life degradation.
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SSP Switch Probes
Current Rating (Amps): 5Average Probe Resistance (mOhm): 50Spring Force Remark: Force at switch point: 2.36 (66)Test Center (mil): 187Test Center (mm): 4.75Full Travel (mil): 150Full Travel (mm): 3.81Recommended Travel (mil): 100Recommended Travel (mm): 2.54Mechanical Life (no of cyles): 100,000Overall Length (mil): 1,210Overall Length (mm): 30.73Switch Point (mil): 25Switch Point (mm): 0.64
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General Purpose PXI Relay Switch Modules
PXI relay switch modules offer reliable switching in a variety of configurations. They consist of multiple independent single-pole single-throw (SPST), single-pole double throw (SPDT), double-pole single-throw (DPST) and double-pole double-throw (DPDT) relays. Our PXI relay switch modules come in a variety of relay types including reed relays, electromechanical relays (EMR) and solid state relays—offering you the optimum switching performance for your application.
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Switching System Test Tools
eBIRST
The eBIRST toolset consists of three different tools that support 200-pin LFH, 78-pin and 50-pin connectors and a set of adaptors that allow connection to other connector types. A supplied application program controls the eBIRST tools via a USB2 port that also provides the tool power and controls the switching system using a Test Definition File to define the test sequence. These tools work by measuring the path resistance at the switching system external connectors using four-wire measurements, quickly establishing whether the path is good, has increased resistance or has failed. Below are links to various eBIRST tool information:
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In-Circuit Tester
Sparrow MTS 30
The Sparrow MTS 30 is a 19“ test system that can be integrated into any standard rack. The In-Circuit tester can also be used as benchtop test system. With this compact and flexible tester you can perform both analog and digital In-Circuit and functional tests.
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Switch Testing Machines
Educated Design & Development, Inc.
1 or 3 actuating device(s) for rocker switches and push- button switches with 2 single-acting pneumatic cylinders each, with air throttle valves to adjust the actuating speed, height-adjustable mounted to holders, with multiple adjustable specimen holders, with safety sockets to connect the specimens to external test voltages and loads1 housing, made of steel, with protective hood1 plug-in unit with front panel for operating the devices.1 Control device for the entire unit:main switch with EMERGENCY OFF function, safety switch for the protective hood, mains cord and fuses1 control device for each actuating device:programmable control unit with exchangeable program modules (containing the "test rhythm") and for adjusting and indicating the test parameters "number of strokes" and "stroke time", start and stop push-buttons, push-buttons for moving manually the cylinder pistons and as actuation indicator for the cylinder
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HV Test System for Patient Monitors
HV test enclosure for testing medical products (patient monitors). Insulated test booth with large space for DUT.3 different test nests for adapting different devices.Displays from patient monitors are checked. For this, insulation tests and leakage current measurements must be carried out. Ensuring the standard-compliant test. For the safety of the operating personnel, the test cell is electrically locked while the high voltage measurement is active.
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Flight Control System Test Platform
The Flight Control System Test Platform provides a hardware in-the-loop (HIL) closed-loop test environment for dynamic and maintenance testing of Flight Control Systems (FCS) of both commercial and military aircraft. The system simulates control surface activities from multiple combinations of rudder, flaps, elevator, aileron, and engine controls to the FCS. The system delivers repeatable, cost-effective testing in a fraction of the time needed with typical in-house simulation test systems.
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PXIe Flexible Microwave Module, Dual SP6T Terminated 40 GHz, Single SPDT 40 GHz, 50 Ω, SMA
42-890-006
The 40-890 (PXI) and 42-890 (PXIe) range of PXI microwave modules allows users to specify the mix of relay types, frequencies and quantities based on the application requirements within the capabilities of the module driver card. Choose from the extensive relay selection already available in the Pickering microwave range to create a flexible solution.
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In-Line Test System
With an Averna in-line test system, clients boost production/yields, catch defects invisible to the human eye, reduce equipment downtime, and ensure repeatable results.
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PXI/PXIe Microwave Transfer Switch, Single, 50 GHz, 50 Ω, SMA-2.4, Failsafe, Remote Mount
42-782B-551-E
The 40-782B-551-E (PXI) and 42-782B-551-E (PXIe) single failsafe transfer switches with remotely mounted relays are part of our range of PXI microwave switching modules. They have a characteristic impedance of 50 Ω and a maximum operating frequency of 50 GHz. Connections are made via front panel mounted high quality SMA-2.4 coaxial connectors.
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Test System Optimized for High-Performance Digital and SoC
ULTRAWAVEMX44 and ULTRAWAVEMX20-D16
Teradyne is the leader in RF/wireless device testing and has a large installed base of UltraFLEX test systems with the UltraWave24 RF instrument. As new devices for handset and base station applications are introduced using mmWave technology, Teradyne’s mmWave instrumentation has expanded in anticipation of new testing demands.
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VLSI Test System
3380P
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (512 I/O pins to test 512 ICs in parallel) that can meet the upcoming higher IC testing demands.
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Medalist i1000D
U9401B
The Keysight Medalist i1000D is now even better. Improving from its previous state of an analog-only ICT, the new digital release of the system now features per pin programmable digital cards and a whole new set of intuitive software graphical user interfaces (GUIs) that makes programming and development effortless.
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TD-SCDMA Analysis Using NI PXI RF Test Instruments
NI-RFmx TD-SCDMA
The NI-RFmx TD-SCDMA personality is a highly optimized API for performing physical layer measurements on TD-SCDMA cellular standard signals. NI-RFmx TD-SCDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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LXI High Voltage Switching - 10xSPST Plugin Module
65-233-904-HI
The 65-233-904-HI plug-in module is part of a scalable high voltage switch platform that provides a high voltage switching solution with capability up to 9 kV.
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PXI/PXIe RF Switch, Hex SPDT, 3GHz, 50Ω, SMB
40-870A-006
The 40-870A-006 (PXI) and 42-870A-006 (PXIe) are 50Ω RF switches with 6 separate SPDT relays in a single slot. They have low insertion loss and VSWR through the use of modern RF relay technology at an affordable cost. The switch banks been carefully designed to ensure excellent and repeatable RF characteristics to frequencies of 3GHz. The injection of noise and unwanted signals into the signal paths of the 40/42-870A has been minimized by careful attention to the mechanical and electrical design.
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PXI Semiconductor/IC Test System
A high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO card consists of a Sequencer Pattern Generator (SQPG) and 32 channels of full ATE-like features. The 33010 IO card is expandable up to 256 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/ PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.
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Switch Box for Fully Automatic Testing
CP SB1
The switchbox CP SB1 reduces wiring work at power transformers. Thereby, the time needed for testing can be reduced and, at the same time, safety can be significantly increased.
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PXI/PXIe RF Switch, Hex SPDT, Terminated, 8GHz, 50Ω, SMA
40-880B-003
The 40-880B-003 (PXI) and 42-880B-003 (PXIe) are hex SPDT 50Ω RF switches with 8GHz bandwidth. The 40/42-880B range have automatic termination of unused signals and are available as a dual switch in 1 slot, a quad switch in slots or hex and octal switches in three slots.
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LTE/LTE-Advanced Analysis Using NI PXI RF Test Instruments
NI-RFmx LTE/LTE-Advanced
Highly optimized RF measurement experiencePerform physical layer analysis on LTE cellular signals including MODACC, ACPR, CHP, OBW, and SEMIncludes support for TDD, FDD, and LTE-Advanced signals specified in 3GPP standards release 12Simple access to advanced measurement parallelism
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High 2.90 (82.20) - 12.60 (357.00) Switch Probe
TSP100-H180-3
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 20Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 197Full Travel (mm): 5.00Recommended Travel (mil): 157Recommended Travel (mm): 4.00Overall Length (mil): 1,990Overall Length (mm): 50.60Switch Point (mil): 59Switch Point (mm): 1.50
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Switch Stick Test Equipment
Hanco units provide a full high voltage electrical test as required by OSHA. Front-loading, top-loading and portable units are available.- Sticks can be tested wet or dry.- Test units are available to test sticks up to 14 or 21 feet maximum length or up to 8 feet for the portable unit.
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Standard 1.10 (31.18) - 4.80 (136.00) Switch Probe
TSP100-F180-1
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 20Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 197Full Travel (mm): 5.00Recommended Travel (mil): 157Recommended Travel (mm): 4.00Overall Length (mil): 1,990Overall Length (mm): 50.60Switch Point (mil): 59Switch Point (mm): 1.50
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6TL23 Off-Line seat operation Base Test Platform w/o Table
H71002301
- 18U height 19inch rack space (580mm depth)- VPC G12 or G12X interface- Man Machine interface H73000301 (not included)- stand-up operation
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High Density DPDT Plug-In Switch Card
1260-112
The Astronics 1260-112 is a 96-channel, high-density, double-pole, double-throw (DPDT), switch for the Adapt-a-SwitchTM platform.
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PXI Test System Dev, Debug & Monitor Software
InstrumentStudio
InstrumentStudio is free application software that provides an integrated approach to interactive PXI measurements. InstrumentStudio helps you to unify your display, export instrument configurations to code, and monitor and debug your automated test system. You can view data on unified displays with large, high-resolution monitors, and then capture multi-instrument screenshots and measurement results.
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PXI Single 2 x 2 Fibre Optic (M Mode)SCM62.5
40-860-212-M62.5
Pickering PXI Fiber Optic MEMS Switching cards are available in many high density formats with a choice of 5 different connector styles to suit most applications: FC/APC (for optimal performance), FC/PC and SC/PC for general applications and LC and MU for high density applications. Fiber optic multiplexers create a signal path by redirecting the optical signal into a selected output fiber.
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Switching
When a defined level in a container is reached, the limit switch triggers a switching signal.
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Component Test Systems
These products include test peripherals used with test systems, such as interfaces that connect semiconductor devices with test systems, and handlers that transport semiconductors to the test system. System-level test equipment and software are also included in this category.
