Data Analysis
Data Analysis Software is used to sort through data in order to identify patterns and establish relationships.
See Also: Experiments
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Product
PCI-5154, 1 GHz Bandwidth, 2 GS/s, 8-Bit PCI Oscilloscope Device
780320-02
Oscilloscope
1 GHz Bandwidth, 2 GS/s, 8-Bit PCI Oscilloscope Device - The PCI‑5154 high-speed oscilloscope device has two channels that sample up to 2 GS/s with flexible settings for coupling, voltage range, and filtering. Oscilloscope devices also feature a number of triggering modes, deep onboard memory, and an instrument driver that includes data streaming and analysis functions. This device is ideal for applications with fast signals that require up to 1 GHz of analog bandwidth and flexible measurement configurations.
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Product
Fluke DAQ 6.0 Application Software
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Fluke DAQ 6.0 is a powerful, versatile data acquisition application that provides effortless configuration, data logging, and analysis for the 2680A and 2645A NetDAQ Networked Data Acquisition Unit » and 2680 Series Data Acquisition Systems », plus adds support for the Fluke 2638A Hydra Series III Data Acquisition System/Digital Multimeter » and Fluke Calibration 1586A Super-DAQ Precision Temperature Scanner ».
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Product
Analysis Software for FCS and cross-FCS
Burst-Analyzer
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*FCS Fit with User-Defined Model Functions*Identification of Single-Molecule Photon Bursts in Parameter-Tag Data*Analysis of Fluorescence Intensity and Lifetime within Photon Bursts*One- and Two-Dimensional Histograms of Burst Parameters*Filtered Histograms of Burst Parameters*Discrimination of Different Fluorescent Species or FRET States*Determination of FRET Efficiencies*Exclusion of Artifacts in Intensity Traces
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Product
PCI-5124 , 150 MHz Bandwidth, 200 MS/s, 12-Bit PCI Oscilloscope Device
779171-03
Oscilloscope
150 MHz Bandwidth, 200 MS/s, 12-Bit PCI Oscilloscope Device—The PCI-5124 high-resolution oscilloscope device has two channels that sample up to 200 MS/s with flexible settings for coupling, impedance, voltage range, and filtering. Oscilloscope devices also feature a number of triggering modes, deep onboard memory, and an instrument driver that includes data streaming and analysis functions. This device is ideal for both time-domain and frequency-domain applications that require high-resolution measurements with up to 150 MHz of analog bandwidth.
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Product
Optical CMM Systems
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Our OmniLux metrology system is highly versatile and provides unparalleled levels of 3D CMM capture for component measurement in seconds. This high precision non contact, metrology system is extremely versatile because it measures components of any geometry and of any material. Geometries possible include: spheres, asphere, cylinder, internal bore, cone/taper, step height or freeform in any material such as polished or rough metals or ceramics and polymers. The Omnilux is fast and accurate because, unlike direct contact sensors, the use of optical sensors means that the whole surface can be analysed while the object is suspended in space, ensuring that no damage comes to delicate surfaces. Our easy-to-use software interface, developed from years of experience enables the operator to effortlessly control the system. Rich data analysis, automation and export of results for the immediate generation of reports as well as a compact footprint means OmniLux is the leading solution for production or R&D environments where reducing cycle times is critical to sustainable success.
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Substrate Manufacturing
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KLA’s substrate manufacturing portfolio includes defect inspection and review, metrology and data management systems that help substrate manufacturers manage quality throughout the wafer fabrication process. Specialized wafer inspection and review tools assess wafer surface quality and detect, count and bin defects during production and as a critical part of outgoing wafer qualification. Wafer geometry systems ensure the wafer shape is extremely flat and uniform in thickness, with precisely controlled wafer shape topography. Data analysis and management systems proactively identify substrate fabrication process excursions that can lead to yield loss. KLA’s substrate manufacturing systems support process development, production monitoring and final quality check of a broad range of substrate types and sizes including silicon, prime silicon, SOI, sapphire, glass, GaAs, SiC, GaN, InP, GaSb, Ge, LiTaO3, LiNBO3, and epitaxial wafers.
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Product
In Situ Process Management
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KLA’s comprehensive portfolio of SensArray® products enables in situ monitoring of process tools’ environments. With wired and wireless sensor wafers and reticles, an automation package and data analysis systems, SensArray products provide comprehensive information for a wide range of wafer and reticle processes. Wafer process equipment manufacturers, IC manufacturers and reticle manufacturers use SensArray data to visualize, diagnose and control process conditions.
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Product
PXI-5122, 100 MHz, 100 MS/s, 14-Bit PXI Oscilloscope
778756-04
Oscilloscope
100 MHz, 100 MS/s, 14-Bit PXI Oscilloscope—The PXI‑5122 high-resolution PXI oscilloscope has two channels with flexible settings for coupling, impedance, voltage range, and filtering. PXI Oscilloscopes also feature a number of triggering modes, deep onboard memory, and an instrument driver that includes data streaming and analysis functions. This device is ideal for both time-domain and frequency-domain applications that require high-resolution, low-noise measurements with up to 100 MS/s and 100 MHz of analog bandwidth. The PXI‑5122 also features PXI synchronization and data streaming capabilities.
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Product
PXIe-5162, 1.5 GHz, 5 GS/s, 10-Bit PXI Oscilloscope
782622-11
Oscilloscope
PXIe, 1.5 GHz, 5 GS/s, 10-Bit PXI Oscilloscope—The PXIe-5162 high-speed oscilloscope device has two or four channels that sample at up to 5 GS/s with flexible settings for coupling, voltage range, and filtering. PXI Oscilloscopes also feature a number of triggering modes, deep onboard memory, and an instrument driver that includes data streaming and analysis functions. This device is ideal for applications with fast signals that require up to 1.5 GHz of analog bandwidth and flexible measurement configurations.
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Product
Fluorescence Imaging
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A next-generation fluorescence lifetime imaging microscopy (FLIM) camera that simplifies FLIM for researchers and imaging centers by combining excellent light sensitivity with easy image acquisition and data analysis.
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Product
LC Software
LabSolutions CS
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LCs and GCs are used extensively in quality control and research and development departments in a wide range of industries, including pharmaceutical, chemical, and food. Recently, an increasing demand for food safety and environmental analysis and measurement has led to a dramatic increase in the number of samples being analyzed which, in turn, has resulted in demands for faster, easier-to-use instruments and software. In the pharmaceutical industry, compliance to regulations and guidelines, such as CSV and PIC/S GMP, U.S. FDA 21 CFR Part 11, Data Integrity and so on, and the proper, efficient management of instruments and analytical data are required. With this background, faster, more efficient management of instruments and data is essential. LabSolutions is a network-compatible analysis data system capable of meeting these needs.
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Product
3D Software
Geomagic Control X
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Combined with the powerful and highly precise Artec 3D scanners, Geomagic Control X is a fantastic solution for anyone looking for speed, accuracy and a large variety of tools to choose from. Easily get the data required for extensive quality control in no time at all with Artec’s advanced 3D scanning solutions. Acquire precise measurements and carry out inspection and data analysis on the spot, using Geomagic Control X and an Artec 3D handheld scanner. Compare 3D scans to the reference CAD model to minimise assembly flaws and increase productivity.
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Product
EDXIR-Analysis Contaminant Finder/Material Inspector
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EDXIR-Analysis software is specially designed to perform qualitative analysis using data acquired by an energy dispersive X-ray (EDX) fluorescence spectrometer and a Fourier transform infrared spectrophotometer (FTIR). This software is used to perform an integrated analysis of data from FTIR, which is excellent at the identification and qualification of organic compounds, and from EDX, which is excellent at the elementary analysis of metals, inorganic compounds and other content. It then pursues identification results and the degree of matching. it can also be used to perform EDX or FTIR data analysis on its own. The library used for data analysis (containing 485 data as standard) is original to Shimadzu, and was created through cooperation with water supply agencies and food manufacturers. Additional data can be registered to the library, as can image files and document files in PDF format. It is also effective for the linked storage of various types of data as electronic files.
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Product
EDX-FTIR Contaminant Finder/Material Inspector
EDXIR-Analysis Contaminant Finder/Material Inspector
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EDXIR-Analysis software is specially designed to perform qualitative analysis using data acquired by an energy dispersive X-ray (EDX) fluorescence spectrometer and a Fourier transform infrared spectrophotometer (FTIR). This software is used to perform an integrated analysis of data from FTIR, which is excellent at the identification and qualification of organic compounds, and from EDX, which is excellent at the elementary analysis of metals, inorganic compounds and other content. It then pursues identification results and the degree of matching. it can also be used to perform EDX or FTIR data analysis on its own. The library used for data analysis (containing 485 data as standard) is original to Shimadzu, and was created through cooperation with water supply agencies and food manufacturers. Additional data can be registered to the library, as can image files and document files in PDF format. It is also effective for the linked storage of various types of data as electronic files.
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Product
Ground Fault Locator
GFL-1000
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The GFL-1000 ground fault locator is used to pinpoint faulty grounding where electrical cables have breakage and lost to the ground. The GFL-1000 is recommended by NERC PRC-005-2 to inspect for unintentional grounds for VLA, VRLA and NiCad batteries every four calendar months. Included software allows for data management analysis.
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In-Line Metrology
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For industrial applications, k-Space is known for its ability to provide robust data and analysis for in-line solutions in production environments. k-Space works side by side with the customer to understand their specific measurement and inspection needs, and then develops a custom solution to meet the identified requirements. Our solution includes custom measurement technology, software, database generation and integration, go/no go determination, pick and place, alarm status, and PLC communication.
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Product
Software & Informatics
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Agilent laboratory software offers the control that businesses demand, as well as the flexibility and technical functionality that cutting-edge labs require. Our portfolio features a range of high-quality solutions to ensure your laboratory can make the most of every analytical system.We offer analytical data systems for instrument control and data analysis, laboratory informatics and automation software, data and workflow management, and additional lab software packages to enhance data visualization and mining.
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Product
PXI-5105, 60 MHz, 8-Channel, 12-Bit PXI Oscilloscope
779685-03
Oscilloscope
60 MHz, 8-Channel, 12-Bit PXI Oscilloscope—The PXI‑5105 high-density PXI oscilloscope device has eight simultaneously-sampled channels with flexible settings for coupling, impedance, voltage range, and filtering. PXI oscilloscopes also feature a number of triggering modes, deep onboard memory, and an instrument driver that includes data streaming and analysis functions. This device is ideal for applications with many channels that require up to 60 MS/s or 60 MHz of analog bandwidth. The PXI‑5105 also features PXI synchronization and data streaming capabilities.
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Product
Bottle Cap Torque Meter
HN-B
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Shenzhen Chuangxin Instruments Co., Ltd.
HN-B Series Cap Torque Meter is an intelligent metrologic instrument and is designed for detecting and calibrating the torsion of various caps. Installation of clamps is easy, rapid and its max diameter can reach 200mm.You can connect it to PC by USD output and transmit data for analysis and printing.
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Product
USB-5132 , 50 MHz Bandwidth, 2-Channel, 8-Bit USB Oscilloscope Device
780468-01
Oscilloscope
50 MHz Bandwidth, 2-Channel, 8-Bit USB Oscilloscope Device - The USB‑5132 low-cost oscilloscope device has two channels that sample up to 50 MS/s with flexible settings for coupling, impedance, voltage range, and filtering. Oscilloscope devices also feature a number of triggering modes and an instrument driver that includes data streaming and analysis functions. This device is ideal for portable and benchtop applications with fast signals that require flexible measurement configurations and up to 50 MHz of analog bandwidth.
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Product
Light Tach Kit
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When taking vibration measurements on rotating machinery, it is crucial that you record tachometer pulses along with vibration data. A photoelectric sensor along with reflective tape that is attached to the rotating element will provide these speed pulses for data analysis.
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Product
PAM analysis upgrade for Signal Integrity Studio, WavePulser 40iX High-Speed Interconnect Analyzer
WAVEPULSER-SI-STUDIO-UPG-PAM
Analyzer
Signal Integrity (SI) Studio uses SDA Expert (SDAX) serial data analysis software options to simplify NRZ or PAM serial data jitter, eye diagram, noise and crosstalk measurement and analysis setup.
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Product
2 Channel IV Analyzer / Source Monitor Unit
E5263A
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Keysight E5262A and E5263A 2ch IV Analyzers are the low cost solution for current-voltage characterization. The E5262A and E5263A support two channels of SMUs (Source/Monitor Units) for voltage/current sourcing and voltage/current measurement with the best in the class current measurement performance as low as 5 pA. The Easy EXPERT group+ GUI based characterization software is furnished and available on your PC to support all the tasks required in the characterization from the measurement setup to the data analysis. Powerful integration of SMU's versatile measurement capabilities and GUI based characterization software makes the E5262A and E5263A the best solutions for characterization and evaluation of two or three terminal devices such as materials and active/passive components with uncompromised measurement reliability and efficiency.
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Product
MagScope Software
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MagScope is Magcam's advanced data analysis software formeasuring and analyzing magnetic field distributions.MagScope is designed to extract as much informationas possible from the measurement data. MagScope is integrated in and optimized for all our magnetic field cameras and scanners.
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Product
PCI-5124, 150 MHz Bandwidth, 200 MS/s, 12-Bit PCI Oscilloscope Device
779171-01
Oscilloscope
150 MHz Bandwidth, 200 MS/s, 12-Bit PCI Oscilloscope Device—The PCI-5124 high-resolution oscilloscope device has two channels that sample up to 200 MS/s with flexible settings for coupling, impedance, voltage range, and filtering. Oscilloscope devices also feature a number of triggering modes, deep onboard memory, and an instrument driver that includes data streaming and analysis functions. This device is ideal for both time-domain and frequency-domain applications that require high-resolution measurements with up to 150 MHz of analog bandwidth.
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Product
Automatic Vision Measuring Machine
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Sinowon Innovation Metrology Manufacture Ltd.
Moving bridge structure, measured workpiece is fixed;◆ Four-axis CNC fully auto close loop control, auto measurement;◆ “00” grade “JINANQING”marble base and pillar, stable and reliable;◆ Imported open type linear scale, resolution is 0.1um, high accuracy, great stability;◆ Imported P grade linear guide, precision grinding ball screw and AC servo motor, ensure accuracy stability of system position;◆ Imported high definition color industry camera, ensure clear observation and stable measurement requirement;◆ 6.5X continue auto zoom lens, precision auto zoom, only need to make pixel calibration once time;◆ Programmable 5-ring 8-division LED surface illumination, contour parallel LED illumination, can realize 256 grade brightness adjustment intelligently;◆ Equipped with imported touch probe, realize 3D measurement;◆ With proprietary fully auto measuring software iMeasuring 4.2, powerful function, simple operation;◆ Optional laser probe, it can also be customized according to customer request;◆ Optional FexQMS Measuring Data Analysis and Real-time monitoring software which enhance program control and reduce material
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Product
350 MHz RF Frequency Counter, 10 digits/s
53210A
Frequency Counter
Single-channel, RF frequency counter One 350 MHz input channel, plus optional second channel (6 GHz or 15 GHz)10 digits/second resolution Built-in math analysis and color, graphical display (trend and histogram)LXI-C/LAN, USB, GPIB Optional: Lithium Ion Battery BenchVue software enabled: Do more with your PC and instrument together, no programming required. Easily control your counters, quickly build automated tests and log data for faster analysis and save precious time.
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Product
PXIe-5186, 5 GHz, 12.5 GS/s, 8-Bit PXI Oscilloscope
782058-02
Oscilloscope
PXIe, 5 GHz, 12.5 GS/s, 8-Bit PXI Oscilloscope—The PXIe‑5186 high-speed PXI oscilloscope has two channels with flexible settings for coupling, voltage range, and filtering. PXI oscilloscopes also feature a number of triggering modes, deep onboard memory, and an instrument driver that includes data streaming and analysis functions. This device is ideal for applications with fast signals that require up to 5 GHz of analog bandwidth and flexible measurement configurations. The PXIe‑5186 also features PXI synchronization and data streaming capabilities.
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Product
WaveMaster Oscilloscope, 4 GHz Bandwidth, 4 Input Channels, 40 GS/s Max Sample Rate
WaveMaster 804Zi-B
Oscilloscope
Up to 20 GHz bandwidth and 80 GS/s sample rate.The most advanced oscilloscope user interface.The industry’s only true hardware 14.1 Gb/s serial trigger.Low Jitter Measurement Floor and exceptional timebase stability.Comprehensive set of serial data analysis, debug, validation and compliance tools.Integrated 50 Ω and 1 MΩ inputs for true connection and probing flexibility.Integrated standard and custom measurements and math functions for unrivaled analysis capability.Multi-lane serial data eye, jitter and crosstalk analysis.Real-time de-embedding, emulation, and equalization.
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Advanced NDT Data Acquisition & Analysis
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WeldSight™ software’s comprehensive acquisition and analysis tools enable you to engineer compliant and repeatable advanced phased array (PA), ultrasonic testing (UT), and time-of-flight diffraction (TOFD) weld inspections.
