X-ray Diffraction
crystalline interference pattern of X-rays to determine atomic and molecular structure of a crystal.
-
Product
X-ray Diffraction (XRD) Instruments
-
X-ray diffraction (XRD) is one of the most important non-destructive tools to analyze all kinds of matter—ranging from fluids, to powders and crystals. From research to production and engineering, XRD is an indispensable method for materials characterization and quality control. Rigaku has developed a range of diffractometers, in co-operation with academic and industrial users, which provide the most technically advanced, versatile and cost-effective diffraction solutions available today.
-
Product
X-ray Diffraction and Elemental Analysis
D2 PHASER
-
The D2 PHASER is the most compact and fastest, all-in-one crystalline phase analysis tool available on the market. It is mobile and easy to install with only the need for standard electrical power. The D2 PHASER is therefore ideal for laboratory or on-location operation, in other words, it is a true Plug'n Analyze system.
-
Product
X-ray Diffraction and Elemental Analysis
D8 ADVANCE
-
The intelligent beam path components of the D8 ADVANCE with DAVINCI design provide true plug'n play functionality requiring minimum or even no user intervention. Featuring automatic and tool-free switching of the diffraction geometry without the need for complex adjustments, the D8 ADVANCE with DAVINCI design broadens the analytical capabilities for a wide community of X-ray diffraction users.
-
Product
X-ray Diffraction and Elemental Analysis
N8 HORIZON
-
The N8 HORIZON is a powerful tool for both high-end research and for multi-user facilities investigating a variety of nano-materials from solid bulks, to fibers, surfaces or biological samples.
-
Product
X-Ray Seamless Pixel Array Detector
XSPA-400 ER
-
In general, X-ray diffraction measurements using a Cu X-ray source are known to have difficulty detecting trace crystalline phases because of increased background when measuring samples containing transition metals. The high energy resolution of the XSPA-400 ER supresses the fluorescent X-rays originating from the sample, thereby reducing background, enabling highly sensitive measurements of samples containing transition metals, such as iron and steel compounds and battery materials.Therefore, it achieves higher sensitivity measurements than conventional detectors.
-
Product
Diffractometers & Scattering Systems
-
Bruker develops and manufactures analytical solutions for X-ray diffraction and scattering. Our innovative instruments and software support research, development and quality control in academia, governmental institutions and industry.
-
Product
Nuclear Magnetic Resonance Spectrometer
NMR
-
NMR is an abbreviation for Nuclear Magnetic Resonance. An NMR instrument allows the molecular structure of a material to be analyzed by observing and measuring the interaction of nuclear spins when placed in a powerful magnetic field.For the analysis of molecular structure at the atomic level, electron microscopes and X-ray diffraction instruments can also be used, but the advantages of NMR are that sample measurements are non-destructive and there is less sample preparation required.Fields of application include bio, foods, and chemistry, as well as new fields such as battery films and organic EL, which are improving and developing at remarkable speed. NMR has become an indispensable analysis tool in cutting-edge science and technology fields.
-
Product
Benchtop X-ray diffraction (XRD) instrument
MiniFlex
-
New sixth generation MiniFlex X-ray diffractometer (XRD) is a multipurpose analytical instrument that can determine: phase identification and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure. It is widely used in research, especially in material science and chemistry, as well as in industry for research and quality control. It is the newest addition to MiniFlex series of benchtop X-ray diffraction analyzers from Rigaku, which began with the introduction of the original MiniFlex system decades ago.
-
Product
Software
DIFFRAC.SUITE
-
DIFFRAC.SUITE represents a new software platform offering a wide range of software modules for easy X-ray powder diffraction data acquisition and evaluation. Based on Microsoft's .NET technology, DIFFRAC.SUITE offers all the advantages of most modern software technology for maximum ease of use and networking.
-
Product
Research XRD Diffractometers
X'Pert³
-
The successful X'Pert platform is continued by the Malvern Panalytical’s X'Pert³ range of X-ray diffraction systems. With new on-board control electronics, compliance with the latest and most stringent X-ray and motion safety norms, advances in eco-friendliness and reliability the X'Pert³ platform is ready for the future.
-
-
Product
TEL-X-Ometer X-ray System
-
X-ray experiments can include radiography, x-ray fluorescence, and x-ray diffraction. All can be performed with the TEL-X-Ometer, a compact x-ray source designed for student use. Take a look at the TEL-X-Ometer and accessories today.
-
-
-
Product
Electron Backscatter Diffraction (EBSD) Camera
Velocity™
-
high-speed EBSD mapping with the highest indexing performance on real-world materials. Velocity™ EBSD camera combines indexing speeds greater than 3,000 indexed points per second with indexing success rates of 99% or better. At these speeds, the Velocity™ uses 120 x 120 pixel EBSD patterns for improved band detection. This image resolution, combined with proven EDAX triplet indexing routines, provides orientation precision values of less than 0.1°.
-
Product
Laser Diffraction Particle Size Analyzer
SALD-2300
-
The new standard in the SALD series. While maintaining continuity and compatibility with respect to the data of the SALD2000/2100/2200, which were popular, widely distributed models, this instrument is equipped with many new functions useful for evaluating changes (dispersion, aggregation, dissolution) in particle size distribution relative to the concentration or time. It supports a particle concentration range from 0.1 ppm to 20% and can perform a series of measurements of 200 data points at 1 second minimum intervals.
-
Product
X-Ray Fluorescence Analyzer
MESA-50K
-
In order to meet RoHS/ELV and to analyze hazardous elements, HORIBA has offered the X-ray Fluorescence Analyzer XGT-1000WR series. Since 2002, 1000 units have been used all over the world for these applications to meet the critical needs from our customers to analyze the sample without cutting it. In 2012, an intuitive MESA-50 X-ray Fluorescence Analyser was released. It became every popular in a very short amount of time, and in 2013 a new type of MESA-50 with a big sample chamber has been added to the MESA-50 series. It is equipped with the sophisticated LN2-free detector. As/Sb analysis function and Multilayer Film FPM are available as options.
-
Product
X-Ray Cameras
-
A range of scientific camera solutions optimized for high energy / X-Ray detection.
-
Product
X-ray Fluorescence Spectrometer
-
X-ray fluorescence spectrometer that provides quick, easy elemental analysis using touch screen operation. It is equipped with functions for conventional qualitative and quantitative analysis (FP method, calibration curve method), as well as screening for RoHS elements. With a variety of both hardware and software options available, it is customizable to cover a wide range of analysis needs.
-
Product
X-ray Fluorescence Measuring System
FISCHERSCOPE X-RAY 5000
-
Inline measuring with highest precision for thin films. Robust XRF instrument for measuring and analyzing thin films and layer systems in the running process with connection to the production control system.
-
Product
Real-time X-ray Inspection System
JewelBox 70T™
-
The JewelBox-70T delivers superior image quality with excellent resolution and sensitivity for laboratory and failure analysis applications. The system’s 10-micron MicroTech™ x-ray source provides magnification from 7X to 2000X, with resolution of 100 line pairs/mm.
-
Product
Imaging X-Ray Photoelectron Spectrometer
Kratos AXIS Nova
-
X-ray photoelectron spectroscopy (XPS), also known as electron spectroscopy for chemical analysis (ESCA), is a mature and widely used surface analysis technique for materials characterisation. XPS provides quantitative elemental and chemical state information from the upper most 10 nm of material. The The AXIS Nova photoelectron spectrometer can collect X-ray photoelectron spectra and images from any material that is stable under the ultra-high vacuum conditions required for the technique.
-
Product
X-ray Fluorescence Measuring system
FISCHERSCOPE® X-RAY 4000 Series
-
Inline measuring with maximum endurance. Robust inline device for measuring on solid strips, punched grids with measuring structures from a few millimeters up to coated membranes or solid strips up to one meter wide.
-
Product
X-ray fluorescence spectrometers
-
SPECTRO Analytical Instruments GmbH
SPECTRO is a world leader in the manufacture of energy dispersive X-ray fluorescence spectrometers. In recent years, SPECTRO has set standards by further developing X-ray fluorescence technology to create many new fields of operation for ED-XRF spectrometers.
-
Product
Conveyor X-ray Scanners
-
Innovative baggage X-ray screening units for quick and easy identification of the material composition of scanned objects.
-
Product
X-ray Inspection System
RTX-113HV
-
Precision X-ray Inspection for BGAs, QFNs, LEDs, sensors, medical devices, and other packaged devices.
-
Product
X-ray Inspection System
Cougar ECO / Cheetah ECO
-
Cheetah and Cougar ECO X-ray inspection systems for use in the electronics industry. These microfocus systems, which have been developed by Yxlon in Germany, are characterized by an excellent price-performance ratio. Being entry-level systems in two sizes, each of them provides best inspection results in quality control in the SMT and semiconductor industries.
-
Product
Software For SALD-2300 Laser Diffraction Particle Size Analyzer
LabSolutions SALD
-
Providing Secure, Confident Data Management on a Network System! The SALD-2300 laser diffraction particle size analyzer is now compatible with data integrity requirements. Connecting LabSolutions SALD to the LabSolutions system, with its proven compatibility with ER/ES regulations, enables confident, reliable data management. In addition to SALD data, consolidated management is available for LC, GC, and UV data.
-
-
Product
Xray Food Inspection
-
FlexXray has developed leading, certified technology and processes to use advanced x-ray technology to inspect products specifically for food companies. Although they look like a TSA line at the airport, our systems are highly customized machines and processes built specifically to find contaminants like metal, glass, wood, stone, plastic, and rubber in food products of all types. What we do is find needles in haystacks – but the needles we find are even smaller than needles in a haystack. In fact, FlexXray can find contaminants down to 0.8mm or smaller.
