Test Cards
See Also: Cards, Extender Cards, Probe Cards, POST Cards
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Product
Testing Services Test
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Aero Nav Laboratories is uniquely positioned to provide testing services that promote safe and reliable products, which are in compliance with the government and industry standards.
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Product
Probe Card
VersaTile™
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Celadon has reduced the size of a probe card to 28mm with the VersaTile™ with Advanced Cantilever™ technology. The VersaTile™ with Advanced Cantilever™ technology can fit on a conventional 3-hole mount probe positioner for single site probing. The same VersaTile™ with Advanced Cantilever™ technology can be used in a 300mm VersaPlate™ for multi-site probing.
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Product
Reflective Memory Node Card
PMC-5565PIORC
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The PMC-5565PIORC Reflective Memory node card provides a high-speed, low latency, deterministic interface that allows data to be shared between up to 256 independent systems (nodes) at rates up to 170 Mbyte/s. Each Reflective Memory board may be configured with 128 MB or 256 MB of onboard SDRAM.The local SDRAM provides fast Read access times to stored data.
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Device Test Kits
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Instrument test kits are based on either the multi-parameter DR 900 handheld colorimeter or the Hach DR 1900 handheld spectrometer. Select kits also include the Hach digital titrator, POCKET PRO pH tester and/or HQ40D meter (dissolved oxygen, conductivity, ORP, etc.). Instrument sets are useful for a wide range of applications including potable water, waste water and industrial applications such as boilers and chillers.
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Product
Antenna Test Chamber
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Comtest provides Antenna test ranges fully covered with microwave absorbers for both near-field and far-field measurements. Because we always strive for new solutions, our R&D department developed our ‘Javelin Tip’ polystyrene absorbers. The enhanced material composition and altered shape, lead to improved performance and cleaner working space, enabling you to make high precision antenna testing fast, reliable, and worry-free.
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Transformer Resistance Testing
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Weshine Electric Manufacturing Co., Ltd
Transformer insulation resistance deterioration is one of the most common causes of transformer failure: a failing transformer is a costly replacement in an electrical system with the potential for a long downtime. If you fail to maintain your transformer with regular insulation resistance testing (as can be carried out by the WESHINE Transformer Ohmmeter (VS-3110 series) of transformer test equipment) then it’s likely to fail before reaching its maximum operating life.
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Product
PCI Precision Resistor Card 6-Channel, 3Ω To 11.4MΩ
50-297-053
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The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Complete Testing Solutions
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System includes a lamp and monochromator for a tunable light source, which is coupled to a high sensitivity source meter with measurement software. This user-friendly system is the most powerful Spectral Response system currently on the market, but its true power is the ease of upgrading from the base PTS-1 to the more powerful PTS-2-QE (Quantum Efficiency) or PTS-3-CPM (Constant Photocurrent Method). Designed for researchers who have limited budgets but want to start work immediately, this allows the ability to do baseline studies until additional funding for the full QE or CPM system becomes available.
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SAP Testing
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ZenQ SAP Testing Services are on-demand, providing the best testing solution for identifying application errors before they make their way into production. Enterprises normally face challenges in analyzing SAP test requirements, handling compatibility issues while configuring, customizing and integrating different modules. We help our clients ease these testing challenges by having test accelerators to bring down cost overheads.
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Product
Simulator / Analyzer / Tester PCI BUS Interface Card
CIC301 - MIL-STD-1553
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The CIC301 is a full-featured, high performance, Dual Redundant MIL-STD-1553 A/B serial bus Simulator Analyzer Tester designed as a plug in card for PCI backplane. The CIC301 includes full error injection and can operate in independent or simultaneous mode as a Bus Controller, multiple simulated Remote Terminals and full/selective Monitor. Its data structure can be changed on the fly without interrupting the processor for real time operation. The active monitor stores, time tag and annotates bus traffic with the message type and any detected errors. Stored words are annotated with a break down of the word error.
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Test Engineering Projects
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Precision Development Consulting Inc
Fiber Optics Test System, Data Collection, Trident Missle Components, PC Board Functional Test and Bearing Tester
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Product
Surge Arrester Testing
SCAR 10
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This MOV- Metal Oxide Varistor test system is the perfect device to perform analysis and diagnostics on metal oxide arrestors. It is supplied with a special current clip-on transformer designed for the measurement of current leakage.
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IOT Devices Testing
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IoT devices refer to Internet of Things Devices. They are hardware devices programmed for specific applications and can transmit data over the internet and other networks. IoT devices include sensors, gadgets, actuators, gaming consoles, smartwatches, voice control devices, machines, vehicles, buildings, etc. collection and exchange of data.
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Magnetic Effects Test
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This test determines if an object can operate normally in strong externally generated magnetic environments. The magnetic effect test helps to assist in determining the proper location of the equipment in the installation.
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Brake Test Systems
Giant 8000 Series
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Customer perception of vehicle quality is closely related to the NVH behaviour of the vehicle. With the HORIBA ATS Brake testing system, NVH relevant design features are analyzed and various metrics stored in the database of the automation system. For friction borne vehicle NVH problems coming from the brake and its components the GIANT 8000 Series is the ideal tool to resolve it. The GIANT 8000 Series is superior NVH test system providing you with the best testing conditions for all types of vehicles. Test brake fixtures could be tested with a complete wheel suspension system. In a semi acoustic chamber NVH tests could be realized and drum brakes and disc brakes including the vehicle axle could be tested.
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Primary Test Equipment
LET-2000-RD
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It allows to perform with sufficient power, all the primary current injections to test the proper function and wiring of all the elements that compose the protection and measuring section in a substation.
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Automated API Testing
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TestingWhiz is an API test automation tool that helps you test whether your application communicates and responds correctly to perform a workflow by verifying web services connected to them.
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Vehicle Test Systems
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What counts in development processes is the speed at which new vehicles and new technologies are made ready to go into production. For vehicle testing, this means that complex test problems must be solved. HORIBA develops vehicle test stands that simulate the realities of driving in the most varied situations both precisely and economically.
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Product
Scienlab Battery Test System – Module Level
SL1001A Series
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The SL1001A and SL1006A Battery Test Systems – Module Level Series help you emulate sink and source for battery modules for automotive and industrial applications.
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Product
Exchangeable Test Fixture
MA 2112/D/H/S-7
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 11,30 kg
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Product
PRODUCTS TESTING
ESD
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MicroStat Laboratories -R.E.T.S.
Our ESD test capabilities include resistance, resistivity, electrostatic shielding, charge generation, and charge dissipation. We routinely test flooring materials, packaging, footwear, garments, ionizers and many other ESD control products and materials. We utilize the relevant test methods and standards of the ESD Association, ANSI, ASTM, NFPA, IEST, IEC, AATCC, or our clients’ in-house specifications.
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Product
Test Clips
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Angled Nose allows tight hold on 66 blockUse on 110 block with jumper and bed of nailsUse on larger cables with single piercing nail
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Product
32-CH 80 MB/s High-Speed Digital I/O Card
PCIe-7300A
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ADLINK PCIe-7300A is an ultra-high-speed digital I/O card. It consists of 32 digital input/output channels. High performance designs and state-of-the-art technology make this card ideal for a wide range of applications, such as high-speed data transfer, digital pattern generation and digital pattern capture applications, and logic analyzer applications. Trigger signals are available to start the data acquisition of pattern generation.
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Product
ISO Test Charts
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ISO has been the governing body for Image Quality Testing all over the world. To that end, APPLIED IMAGE is proud to be a participant in assuring that the industry has products that meet or exceed the requirements of ISO. Since ISO covers many levels, we provide test patterns of various types that can be used for Image Capture and Evaluation of Optical and Imaging systems of all types.
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Stationary Test Equipment
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Single- and three-phase, standardized and individual test systems are covering all legal metrological test requirements for simple meters, high precision multifunction meters, smart meters and reference standards. Flexible and modular system components for the optimal customer orientated solution.
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Special Test Kits
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Application specific kits are available for many parameters including Arsenic, Water in Oil, Sulfate, Glycol and others. These kits use different methods, such as test strips, turbidity, and visual color changes.
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Test Handlers
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Cohu has 50+ years of semiconductor test expertise designing and manufacturing pick-and-place, gravity feed, test-in-strip handlers, MEMS test cells, and turret-based test handling and back-end finishing equipment for ICs, LEDs and discrete components.Our test handlers support a variety of package sizes and device types, including automotive, mobile, power, micro-electromechanical systems (MEMS) and microcontrollers, among others.
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