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Your High-performance Slide Scanner For Fluorescence, Brightfield And Polarization
ZEISS Axioscan 7
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Digitize your specimens with Axioscan 7 – the reliable, reproducible way to create high-quality virtual microscope slides. Axioscan 7 combines qualities that you would not expect to get in a slide scanner: high speed digitization and outstanding image quality plus an unrivaled variety of imaging modes are all available in a fully automated and easy to operate system.
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Energy Dispersive X-ray Fluorescence Spectroscopy Consumables
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Energy Dispersive X-ray Fluorescence Spectroscopy Consumables
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LED Goniophotometer for Lamps
880
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Shenzhen Chuangxin Instruments Co., Ltd.
Be used to measure the luminous intensity distribution curve intensity data spread angle and equivalent luminous flux of luminaries. Computer controls the whole test process automatically with low cost and simple operations.
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X-ray Fluorescence Measuring System
FISCHERSCOPE X-RAY/XDV-SDD
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Premium model for universal use for the inspection of very thin or complex layers up to RoHS screening at very low detection limits.
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Spectroscopy Lamps and Light Sources
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The StellarNet portable Light Sources facilitate measurements in the UV, VIS, and NIR for various samples and application types using standard SMA-905 optical connectors. These low cost modular components are robust, reliable, and designed to last in portable and industrial environments.
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Multi-Channel X-Ray Fluorescence Spectrometer
FACTORY LAB MXF-2400
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Wavelength Dispersive X-Ray Fluorescence Spectrometer The Shimadzu MXF-2400 is an improved version of the Shimadzu Multi-Channel X-ray fluorescence spectrometer, which has been rated highly in the overseas market as well as in the Japanese market. The latest hardware designed to fully utilize the principle of X-ray fluorescence spectrometry and the data processing unit that uses various software programs to permit automatic management of analysis data combine to provide high analytical productivity both in R&D and production control. Up to 36 elements can be simultaneously determined by the fixed monochrometer and up to 48 elements can be determined sequentially by the optional scanning monochrometer. High analytical precision is provided even in high sensitivity analysis of a few ppm quantity level.
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X-ray Fluorescence Measuring Instrument
FISCHERSCOPE® X-RAY XDLM®
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Universal instrument for inspection of small parts and small structures, measuring of light metals, hard coatings and thin electroplated parts.
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Total Reflection X-ray Fluorescence (TXRF) Services
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A highly surface-sensitive technique, TXRF is optimized for analyzing surface metal contamination on semiconductor wafers.
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X-ray Fluorescence Measuring Instrument
FISCHERSCOPE® X-RAY XDL®
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Your entry into automated measuring. Robust XRF measuring device for quality control of electroplated bulk parts and for bath analysis.
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Energy Dispersive X-ray Fluorescence Spectroscopy Systems
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Energy Dispersive X-ray Fluorescence Spectroscopy Systems
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Compact Goniophotometer For Lamp Spread Angle Tester
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Shenzhen Chuangxin Instruments Co., Ltd.
LCG-1600 Goniophotometrc System carries out measuring methods of fixed location and rotating luminaires. The measured luminaire is installed on the two-dimension rotating table, using “+” laser to make the luminaire lighting center superposed with the rotating center of rotating table. The mechanical equipment allows turning the tested luminaires around a vertical axis and a horizontal axis. When tested luminaires turn around horizontal axis, the detector which is at the same level with rotating table will measure the intensity of each direction at this surface. When rotating with vertical axis, the detector will measure the intensity at the vertical surface. The vertical and horizontal axis can be rotated continuously at ±180° or 0~360°. According to the measurement requirements, the system can be operated in C-γ coordinates. When getting intensity distribution data, computer will calculate other photometric parameters automatically.
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Lamp Cap Digital Torque Meter 0-10N Lamp Base Torque Tester
CX-338
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Shenzhen Chuangxin Instruments Co., Ltd.
Torque Meter is a newly developed intelligent product with microproccesor built-in.
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X-ray Fluorescence, XRF Analysis Services
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Two XRF systems are available, a wavelength dispersive system (WDXRF) and an energy dispersive system (EDXRF). The difference is the manner in which the x-rays are detected. WDXRF instruments have very good energy resolution which leads to fewer spectral overlaps and improved background intensities. EDXRF instruments have higher signal throughput which can shorten analysis times. The higher signal throughput also makes EDXRF systems suitable for small spot or mapping analysis.
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Lamp Holder Torsion Test Instrument
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Shenzhen Chuangxin Instruments Co., Ltd.
This lamp holder Torsion Test is strictly designed according to UL496 etc. It's mainly used to the screw lampholder torsion test of protecting accidental force.
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X-ray Fluorescence
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XRF analysis – one of the best analytical techniques to perform elemental analysis in all kinds of samples, no matter if liquids, solids or loose powders must be analyzed.
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Energy Dispersive X-ray Fluorescence Spectrometer
Pharmaceutical Elemental Impurities Analysis System
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Control of Elemental Impurities in Pharmaceuticals In the pharmaceutical industry, the analysis of elemental impurities is necessary to ensure the safety of pharmaceuticals. In December 2014, the "Guideline for Elemental Impurities" (Q3D) was issued by the International Council for Harmonisation of Technical Requirements for Pharmaceuticals for Human Use (ICH), consisting of representatives from Europe, the U.S. and Japan. In Japan, the "Guideline for Elemental Impurities in Drug Products" (PFSB/ELD Notification 0930 #4 from the Ministry of Health, Labour and Welfare) was issued, and will be applied to new drug products submitted for approval after April 1 2017. For 24 elements categorized in Class 1 to Class 3, residual quantities in pharmaceutical drug products must be controlled within permissible limits. Although ICP-AES and ICP-MS are used for precise analysis of elemental impurities, X-ray fluorescence spectrometers can be used as an alternative analysis method. This is because they can quantitatively and qualitatively analyze a variety of elements nondestructively, and without chemical pretreatment, unlike ICP-AES and ICP-MS systems. The X-ray fluorescence spectrometry has been adopted as a general method of analysis in the U.S Pharmacopeia and the European Pharmacopoeia. (USP<735>, Ph.Eur.2.2.37)
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Product
Goniophotometer Test System For Led Lamp
LCG-1680B
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Shenzhen Chuangxin Instruments Co., Ltd.
Design according to IEC61341the test method of central luminous intensity and beam angle for reflecting light, this instrument can be used to test the cross section luminous intensity distribution curve, central luminous intensity and effective beam angle of LED assembled luminaries and LED lens system with diameter less than 180mm.
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X-ray fluorescence spectrometers
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SPECTRO Analytical Instruments GmbH
SPECTRO is a world leader in the manufacture of energy dispersive X-ray fluorescence spectrometers. In recent years, SPECTRO has set standards by further developing X-ray fluorescence technology to create many new fields of operation for ED-XRF spectrometers.
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Walk-In Xenon Lamp Weathering Test Chamber
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Xenon is one of the noble gases and is a major component of arc lamps and flash lamp and it also has its importance in general anesthetics. One of the major applications of xenon lamp is that it can be used in research applications to simulate the sunlight.
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X-ray Fluorescence Measuring System
FISCHERSCOPE X-RAY 5000
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Inline measuring with highest precision for thin films. Robust XRF instrument for measuring and analyzing thin films and layer systems in the running process with connection to the production control system.
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Fluorescence Multiphoton Microscopy
Ultima Investigator™
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As the most streamlined model of Bruker''s Ultima family of multiphoton microscopes, Ultima Investigator™ features a base system specifically optimized for in vivo studies and is designed for add-on flexibility with a host of specialized options. Ultima Investigator''s high-resolution, high-speed, high-sensitivity deep imaging provides the ultimate value for smaller labs and additional imaging bandwidth in larger labs.
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CVAF – Cold Vapor Atomic Fluorescence
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Cold Vapor Atomic Fluorescence (CVAF) is a powerful technique based on detecting fluorescence light emitted by the sample. Below the principle of the technique is explained in a nutshell.
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Wavelength Dispersive X-ray Fluorescence Spectroscopy
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Wavelength Dispersive X-ray Fluorescence Spectroscopy
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UV Fluorescence Total Reduced Sulfur Analyzer
Model T102
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The Model T102 TRS analyzer uses the proven UV fluorescence principle to measure Total Reduced Sulfur at levels commonly required for ambient air monitoring.The Model T102 uses a high temperature external converter set at 850°C to allow conversion of H2S, methyl mercaptan, dimethyldisulfide, and methyl-disulfide to SO2 at this temperature with efficiency greater than 98%. A switching option alternately measures TRS and SO2 while showing both readings concurrently on the front display.All T Series instruments offer an advanced color display, capacitive touch screen, intuitive user interface, flexible I/O, and built-in data acquisition capability. All instrument set up, control and access to stored data and diagnostic information is available through the front panel, or via RS232, Ethernet, or USB com ports, either locally or by remote connection.The Model T102 comes with NumaView ™ Software. NumaView™ Remote PC Software allows for a remote connection with virtual interface and data downloading capability to analyzers operating NumaView ™ Software.
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Lamp gauge
E27
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Shenzhen Chuangxin Instruments Co., Ltd.
To check the maximum dimensions of the screw thread and dimension T1 minimum of caps on finished lamps shown on sheet 7004-2.
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Portable X-RAY Fluorescence Measuring System
FISCHERSCOPE® X-RAY XAN® 500
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Mobile and universal handheld device for precise coating thickness measurement and material analysis - even with difficult material combinations.
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Total Reflection X-Ray Fluorescence (TXRF) Products
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Total Reflection X-Ray Fluorescence (TXRF) Products by Rigaku
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Led Lamps
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The range of professional lamps signed HT, to facilitate your work and shed light on your results.
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X-ray Fluorescence Spectrometer
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X-ray fluorescence spectrometer that provides quick, easy elemental analysis using touch screen operation. It is equipped with functions for conventional qualitative and quantitative analysis (FP method, calibration curve method), as well as screening for RoHS elements. With a variety of both hardware and software options available, it is customizable to cover a wide range of analysis needs.
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Product
Energy Dispersive X-ray Fluorescence (ED-XRF) Spectrometer
XEPOS
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SPECTRO Analytical Instruments GmbH
The new SPECTRO XEPOS spectrometer represents a quantum leap in energy dispersive X-ray fluorescence technology. It provides breakthrough advances in multi-elemental analysis of major, minor, and trace element concentrations. New developments in excitation and detection deliver outstanding sensitivity and detection limits yielding remarkable gains in precision and accuracy. The amazing SPECTRO XEPOS excels at critical tasks from rapid screening analysis to precise product quality control. Apply it for at-line processing in a variety of industries, for geology and mining, for environmental and waste monitoring, and for research and academia.
