Measuring Microscopes
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Measurement Devices
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In addition to the critical role data loggers play in a data-acquisition system, there are other types of measurement devices. Some measurement devices are used to increase the number of terminals that data loggers can use, which enables them to measure more sensors or control more external devices.
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Scienlab Measurement And Control Module
SL1064B
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The Measurement & Control Module SL1064B is a rack-mount gateway for CAN- and LIN-buses with up to 6 channels. It can be used as a configurable communication interface between Scienlab Battery Test Systems and devices under test (especially their BMS) as well as additional components using CAN communication.
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4-Wire Resistance Measurement | Continuity & HiPot Cable & Wire Harness Testers
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An add-on option for the CableEye HVX high voltage cable tester series that permits expanded testing for contact and wire resistance as low as 1 mΩ. After checking for opens, shorts, miswires, and resistance limits, the 4-wire Kelvin measurement applies a user-selectable test current from 10 mA to 1 A to determine connection resistance within 1 mΩ. The resistance profile of a model cable may be stored and used as a basis of comparison during later testing to reveal cold solder joints, faulty crimps, recessed pins, pin contact contamination, improper wire gauge, and stress-extruded wire.This option may be purchased with any new HVX tester, or added as an upgrade to any of your existing HVX testers.
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Fiber Strain Measurement System
SPL500
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The SPL500 is a fiber strain measurement system that measures fiber elongation and attenuation simultaneously during mechanical stressing of the cable. The SPL500 is designed to produce accurate measurements quickly and with confidence.
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LCR Measurement
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LCR component bridge with built-in test fixture and limits comparator with binning. Micro-ohmmeter with four terminal Kelvin clip leads. High basic accuracy, rechargeable battery operation.
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Real-time S-Parameter And Power Measurement Uncertainty
S96015B
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See real-time measurement uncertainty for S-parameters and power measurements with the measurement traces on one screen. Estimate uncertainty reliably and apply more realistic limit lines for pass/fail tests for better production yield rates
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Scanning Electron Microscope w/ EDX Laboratory
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Trialon has the equipment and experienced staff to operate this highly technical piece of laboratory equipment. Our state-of-the-art materials analysis lab located in Auburn Hills, MI is managed by a Ph.D with over 20 years of hands-on experience in root cause failure analysis of design, material and process for current and future products.
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Products for High-Frequency Measurement
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This product range includes passive high-frequency test probes and accessories as well as touch-protected BNC plug connectors, insulated BNC panel-mount sockets, leads with RG58 or RG59 cable, adapters and converters. Our test probes are suitable for use in CAT III- and CAT IV environments (Measurement Categories), such as the analysis of house and building installations with mains analysis/mains monitoring devices. Our high-frequency accessories are designed with clearance and creepage distances in accordance with IEC/EN 61010-031.
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Color Measurement With Line Scan Cameras
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The Chromasens line scan cameras offer new approaches for the color-accurate capture of objects. The chromaPIXA has an internal FPGA-based color calculator which converts the color information of the CCD sensor on-the-fly into standard output color spaces. Algorithms are used which allow a more precise transformation than the usual 3x3 matrix transformation.
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Electrode Measurement Meter
Ion 700
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Ion-selective electrode measurement has never been this easy – or economical! The Ion 700 measures and records up to 100 data points with 0.01 resolution.
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Fast LID Measurements for EOL
KMP
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TechnoTeam Bildverarbeitung GmbH
The KMP is the solution to cost-effectively bring indirect light measurement technology to places with too little space for a BV room. Its lightweight and compact design allow it to be integrated into production lines, positioned next to production or in a small lighting lab.
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Loop Resistance Measuring Device According to DIN EN 61557-3 (VDE 0413-3)
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PeakTech Prüf- und Messtechnik GmbH
A loop tester which is used to test the safety of electrical systems. These device measures the impedance of the short-circuit loop between the outer conductors of a circuit, whereby the probable short-circuit current is calculated. The protection of the circuit (miniature circuit breaker) must therefore trigger at a lower current than the expected short-circuit current, in order to avoid excessive heating of the lines and thus a fire risk. The PeakTech 2715 is due to its function and its robust design almost indispensable when performing new installations, but also for general checking of electrical systems, this device is the ideal companion.
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Game And Profile Measurement Systems
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MFF markets Gap and Profile measurement systems. From the innovative GapGun Edge Break that uses a portable laser measurement system to bring precision to the shop floor, to the Gap Gun Pro that represents the simplest yet most technologically advanced and reliable thing that can arise from a development matured through years of daily use in the process control phases.
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Current Measurement Probes
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Comprehensive line of clamp-on current probes covers the entire spectrum of applications, from electrical panels to substations. AEMC Current Probes measure current without interrupting the circuit under test and extend the measuring capabilities of DMMs, recorders, power meters, and loggers. The numerous jaw sizes are designed to accommodate a wide variety of conductor diameters and ranges. Available for AC or DC measurements.
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Field thermal needle system for thermal resistivity / conductivity measurement
FTN01
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Hukseflux Thermal Sensors B.V.
The FTN01 Field Thermal Needle System allows performing fast, on-site measurements of the thermal resistivity or conductivity of soils, in particular around the typical depth of burial of high voltage cables. FTN01 is designed with a focus on robustness and saving time, while still offering sufficient accuracy for typical field measurements. The sensor is a Non-Steady-State Probe (NSSP), TP09, which is mounted at the tip of the Lance LN01. The system is operated using a hand-held Control and Readout Unit CRU01.
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Signal Conditioners & Measuring Transducers
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Signal conditioners and measuring transducers ensure interference-free signal transmission in measurement and control technology. From highly compact 6 mm signal conditioners and measuring transducers through signal conditioners with functional safety to signal isolators for intrinsically safe circuits in the Ex area: our signal conditioners and measuring transducers ensure interference-free signal transmission in MCR technology.
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Multi-Test Resistivity Measurement System
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Sheet resistance mapping of thin films with a collinear 4-point probe, Temperature co-efficient of resistance (TCR) of thin films with collinear 4-point probe, Precision temperature co-efficient of resistance (TCR) with 2-point Kelvin probes and precision surface temperature probe, resistor testing with 2-point Kelvin probes,Precision resistor testing with a Kelvin probe card, temperature co-efficient of resistance resistor test (TCR), and Standard TCR test of multiple resistors with Kelvin probes or a probe card.
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EMC Emission Measurements
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AFJ manufactures a complete range of RF emission test equipment for EMC applications.Our FFT EMI Receivers cover the frequency range from 9kHz to 3GHz.
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Reflex Reflector Measurement Systems
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Photometric Solutions International Pty Ltd
The measurement setup involves using a projector to illuminate the test item, and then measuring the luminous intensity of the light reflected from the test item. The ratio of the luminous intensity emitted by the reflector (in candelas) to the illuminance on the reflector (in lux) is the coefficient of luminous intensity or CIL (cd/lx).
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Free Measurement System
CFMS
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The Cryogen Free Measurement System (CFMS) from Cryogenic Ltd is a modular research system designed to enable the user to perform a wide range of material characterisation experiments in variable field and variable temperature environments.
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Non Contact Thickness Measurement Systems
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Non contact thickness measurement is becoming more complicated with each passing year.From medical devices to food packaging, we understand the needs from an array of industries to successfully design non contact thickness measurement systems to meet your needs:
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Advanced KIT: LED LUX Measurement Kits
LLM-Basic KIT and LLM
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Special photoradiometer kits with PHOT probe for the measurement of ILLUMINANCE. Thanks to the high precision sensor, the kits can be used in a wide range of applications and situations where the measurement of illuminance (LUX) is necessary.
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LED Light Measurement System
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RayClouds Photoelectric Technology Co.,Ltd.
The LED optical measurement system includes Blue Light Analyzer, Glare Analyzer, LED Light Intensity Measurement, LED Goniophotometer, Lighting Electrical Measurement System, LED LightBar Measurement System, LED Photochromic Tester.
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Surface Profiler Measurement System
SP series
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SP series, high accuracy 3D surface profiler measurement system with white light interferometry.
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Benchtop Unit for Universal Coating Thickness Measurement
FISCHERSCOPE MMS PC2
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Multifaceted for coating thickness measurement and material testing. Universal multi-measuring system for parallel coating thickness measurement and material testing with up to eight measuring modules.
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LAP's Laser Gauge For Straightness Measurement Of Bars And Tubes
Check X-Line
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This process is unique on the market and was developed with our partner sema Systemtechnik. You receive a verifiable quality assurance of your rods or pipes in the current production. The modular design allows individual configurability and can be easily integrated into the existing system. Benefit from the competence and experience of two strong partners.
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Insulation Resistance Measurement
MI15KVe
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The MI-15KVe High-Voltage insulation tester is a truly portable device that allows the measurement of insulation resistances using test voltages up to 15kV.
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Smart Inductive Digital Measurement Sensors (DMS)
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Contrinex Smart Inductive Digital Measurement Sensors (DMS)
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Wafer Cathodoluminescence Microscope
Säntis 300
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Attolight’s Quantitative CL-SEM offers “No Compromise” large field fast scanning simultaneous acquisition of SEM images, hyperspectral CL maps, and optical spectra. Smaller diameter wafers, or miscellaneously shaped substrates are manually loaded on intermediary 300mm susceptors subsequently handled automatically by the tool.
