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Measuring Microscopes
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Measuring Microscopes, Image Processing
Measuring Microscopes
Optik Elektronik Gerätetechnik GmbH
Image processing software for dimensional measurements, motorized measuring microscopes and fully automatic measuring machines.
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Measuring Microscopes, Image Processing
Milling & Drilling
Optik Elektronik Gerätetechnik GmbH
OEG manaufactures all mechanical parts in house and offers these services to other companies.
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Measuring Microscopes, Image Processing + Drawing Die And Wire Measurement
Easy Low Cost Wire Drawing Die Measuring Microscope
Optik Elektronik Gerätetechnik GmbH
Simple optical measuring system for diameter and ovality of wire drawing dies with image processing software.
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Magneto-optical Effect Measurement And Observation
Diode Laser based Kerr Loop Measurement System. Microscopic local measurement in the scale of few μm is available.
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Measuring Microscopes, Image Processing + Optics Test Equipment
Development And Production Services
Optik Elektronik Gerätetechnik GmbH
Development and assembly of opto-mechanical building groups, including software development.
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Microscopic Melting Point Meter
DRK8029
Shandong Drick Instruments Co., Ltd.
Determination of the melting point of the substance. Mainly used for the determination of drugs, chemicals, textiles, dyes, perfumes and other organic crystal, the microscope. Measured either by capillary method, and the slides are available - coverslip (hot stage method).
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Non Contact Measurement
There is no one-size-fits-all solution for accurate measurement, and different applications require different measurement systems. At Vision Engineering, we design and manufacture a broad range of non-contact measurement systems from toolmakers’ measuring microscopes to fully automated CNC video measuring systems with optional contact measurement available. Combined with the latest metrology software solutions available, we offer the right tool for the job.
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Measuring Microscopes, Image Processing + Semiconductor Technology, Micro Scriber
Line Width Measurement
Optik Elektronik Gerätetechnik GmbH
COMEF is an image processing software with special functions for the highly accurate measurement of line width and line distance. Using grey value algorithms, the width and distance of conductor lines or structures on silicon wafers can be measured with subpixel accuracy.
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Portable Measuring Microscope
Opto's portable microscope is designed to handle even the most demanding on-site inspections. With its ergonomic design, robust construction and perfectly matched optics configuration, it is a precise and reliable tool.
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FOV Micro Measuring Microscope 4.0
The new ultra-compact digital micro measuring microscope from Opto is the perfect tool for on-site measurements in production.
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Measuring Microscopes, Image Processing
COMEF
Optik Elektronik Gerätetechnik GmbH
Image processing system.
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PXIe Measurement Accelerator
M9451A
The M9451A PXIe Measurement Accelerator combined with Option DPD Digital Pre-Distortion & Envelope Tracking Gateware shows what is possible when you combine state of the art FPGA's with Keysight's trusted measurement expertise and PXIe's high speed data handling. As part of Keysight's RF PA/FEM Characterization & Test, Reference Solution, this combination provides unprecedented performance for demanding envelope tracking and digital pre-distortion measurements required for testing modern power amplifiers (PAs) and front-end modules (FEMs). Hardware acceleration provides better than 20x speed improvement over Keysight's previous host-based Reference Solution, with closed/open loop digital pre-distortion (DPD) and envelope tracking (ET) measurements taking just tens of milliseconds and overall measurement times less than 70 ms.
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PXIe-4143, 4-Channel, ±24 V, 150 mA Precision PXI Source Measure Unit
782431-01
PXIe, 4-Channel, ±24 V, 150 mA Precision PXI Source Measure Unit - The PXIe-4143 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation and each channel has integrated remote (4-wire) sensing for accurate measurements. The fast sample rate of the PXIe-4143 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules. Additionally, you can tune the PXIe-4143 response to any load to achieve optimum responses with maximum stability and minimum transients using SourceAdapt technology.
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PXIe-4141, 4-Channel, ±10 V, 100 mA, Precision PXI Source Measure Unit
781743-01
PXIe, 4-Channel, ±10 V, 100 mA, Precision PXI Source Measure Unit - The PXIe-4141 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote (4 wire) sensing for accurate measurements. The fast sample rate of the PXIe-4141 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules. Additionally, you can tune the PXIe-4141 response to any load to achieve optimum responses with maximum stability and minimum transients using SourceAdapt technology.
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PXIe 5-channel Precision Source/Measure Unit, 500 kSa/s, 10 pA, 30 V, 500 mA
M9615A
The Keysight M9615A is a PXIe five-channel precision source / measure unit (SMU). It supports accurate measurement up to 30 V / 500 mA with resolution down to 6 uV / 10 pA.
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PXI FPGA & Measurement Accelerator
Keysight PXI FPGA & measurement accelerator provide digital-pre-distortion (DPD) and envelope tracking (ET) measurements that are embedded in high performance FPGA processing cards.
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PXIe Short SMU
52403P
Chroma's 52403P is a PXI Express Short Pulse SMU (Source/Measure Unit) designed for fast, precise and reliable sourcing and measurement of thermo-sensitive devices such as high-power laser diodes (LD). Integrating a high-speed pulser, a high precision SMU and a DAQ module into a single PXIe SMU, the 52403P can measure both the LIV and the low-level leakage current of a high-power LDs.
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Source Measure Units (SMUs)
B1511B
The SMUs of B1500A integrate 4-quadrant voltage/current source and measurement capabilities for accurate IV measurement with the range of 0.1 fA - 1 A / 0.5 µV - 200 V. It supports spot, sweep, pulse sampling and QS-CV measurements.
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High Precision Source Measure Unit (SMU) - Hybrid Compatible PXI, 100ks/S Programming/Measurement Speed
52400 series
Hybrid Compatible PXIFour quadrant operationHigh source/measurement resolution (multiple ranges)Low output noiseHigh programming/measurement speed (100k s/S) & slew rateOptional measurement logDIO bitsOutput profiling by hardware sequencerProgrammable output resistanceFloating & Guarding output16 Control Bandwidth SelectionMaster / Slave operationDriver with LabView/LabWindows & C/C# APISoftpanel GUI
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PXIe Precision Source/Measure Unit, 1.25 MSa/s, 10 fA, 210 V, 315 mA
M9601A
M9601A PXIe precision SMU is the industry-first precision PXIe SMU enabling faster precise measurement from DC to 20 μs pulse up to 210 V/315 mA with the best-in-class 10 fA resolution and low noise.
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PXIe-4137, ±200 V, ±1 A DC, ±3 A Pulsed, Up to 40 W DC, 100 fA Precision System PXI Source Measure Unit
783761-02
PXIe, ±200 V, ±1 A DC, ±3 A Pulsed, Up to 40 W DC, 100 fA Precision System PXI Source Measure Unit - The PXIe-4137 is a high-precision, system source measure unit (SMU). It features 4-quadrant operation and sources up to 40 W of DC power and can pulse up to 500 W. Analog-to-digital converter technology helps you perform high-precision measurements with a current resolution of 100 fA or high-speed acquisitions up to 1.8 MS/s. The module also can maximize stability and measurement accuracy with SourceAdapt technology, which you can use to tune the transient response to match the characteristics of any load. The PXIe-4137 is ideal for a broad range of applications including manufacturing test, board-level test, and lab characterization with devices such as ICs, power management ICs (PMICs), and RFICs and discrete devices including LEDs and optical transceivers
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PXIe-4139 , ±60 V, ±3 A DC, ±10 A Pulsed, 40 W DC, 100 fA Precision System PXI Source Measure Unit
782856-03
PXIe, ±60 V, ±3 A DC, ±10 A Pulsed, 40 W DC, 100 fA Precision System PXI Source Measure Unit - The PXIe-4139 is a high-precision, system source measure unit (SMU) that features 4-quadrant operation and sources up to 40 W of DC power. This module features analog-to-digital converters that help you perform high-precision measurements with a current resolution of 100 fA or high-speed acquisitions up to 1.8 MS/s. The module can maximize stability and measurement accuracy with SourceAdapt technology, which you can use to tune the transient response to match the characteristics of any load. You can use the PXIe-4139 for applications including manufacturing test, board-level test, and lab characterization with devices such as ICs, power management ICs (PMICs), and RFICs and discrete devices including LEDs and optical transceivers.
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DFB Laser Source Module
LaserPXIe 1200 Series
The LaserPXIe 1200 Series is a highly customizable DFB laser source available in a wide range of wavelengths and powers.
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50 µs Pulse Medium Current Source/Measure Unit (MCSMU)
B1514A
The 50 s Pulse Medium Current SMU is an SMU designed for faster pulsed IV measurement. It enables a pulsed measurement down to 50 s pulse width, a 10 times or more narrow pulsed measurement than provided by a comparable conventional SMU. In addition, the instrument offers a wider range and versatility, up to 30 V / 1A, with voltage/current programmability. It is useful to characterize high to medium power devices on the new materials such as SiC and GaN, and organic devices, and the MCSMU expands your choices of pulsed IV measurement.
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PXIe-4135, ±200 V, ±1 A DC, ±3 A Pulsed, Up to 40 W DC, 10 fA Precision System PXI Source Measure Unit
783762-01
PXIe, ±200 V, ±1 A DC, ±3 A Pulsed, Up to 40 W DC, 10 fA Precision System PXI Source Measure Unit - The PXIe-4135 is a high-precision, system source measure unit (SMU). It features 4-quadrant operation and sources up to 40 W of DC power and can pulse up to 500 W. Analog-to-digital converter technology and native triaxial connectors help you perform high-precision measurements with a current resolution of 10 fA or high-speed acquisitions up to 1.8 MS/s. The module also can maximize stability and measurement accuracy with SourceAdapt technology, which you can use to tune the transient response to match the characteristics of any load. The PXIe-4135 is ideal for a broad range of applications including manufacturing test, board-level test, and lab characterization with devices such as ICs, power management ICs (PMICs), and RFICs and discrete devices including LEDs and optical transceivers.
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PXI Source And Measurement Unit Family
PXS840x
The PXS(e)840x is a high precision, high speed source and measurement unit, which is designed for automated high throughput testing.
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PXIe-4144, 4-Channel, ±6 V, 500 mA PXI Source Measure Unit
782432-01
PXIe, 4-Channel, ±6 V, 500 mA PXI Source Measure Unit - The PXIe-4144 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote (4-wire) sensing for accurate measurements. The fast sample rate of the PXIe-4144 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules.
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Source Measurement Unit
SMU8
The SMU8 offers high voltage SMU in a compact, 3U PXI / USB form factor. The SMU8 supports 0V to +4V 0.5A or 0V to +12V 25.6mA with FVMI, FVMV, FIMV, FIMI modes. 8 channel can be ganged to support high current driving.
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PXIe-4142, 4-Channel, ±24 V, 150 mA PXI Source Measure Unit
782430-01
PXIe, 4-Channel, ±24 V, 150 mA PXI Source Measure Unit - The PXIe-4142 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote (4-wire) sensing for accurate measurements. The fast sample rate of the PXIe-4142 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules.
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PXIe-4140, 4-Channel Source Measure Unit
781742-01
The PXIe-4140 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote (4-wire) sensing for accurate measurements. The fast sample rate of the PXIe-4140 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules.
