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Ultrasonic Thickness Gauge
QTG Series
Ultrasonic Thickness Gauge - QTG Series are economical, user-friendly, menu driven, and multi-functional units offering extensive features from basic measurements (model: QTG I) to extended memory (5000 reading storage) and USB output capabilities (model QTG II). The instrument can measure with very high resolution (0.01 mm or 0.001 inches) the thickness of metallic and non-metallic materials such as steel, aluminum, titanium, plastics, ceramics, glass and any other good ultrasonic wave conductor. The Ultrasonic Thickness Gauge - QTG Series accurately displays readings in either inches or millimeters and is equipped with special features like Automatic recognition of probes with different frequencies and Automatic zeroing of the unit.
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Epi Thickness & Composition
FTIR (Fourier Transform Infrared) is the most important technology for measuring epitaxial film (Epi) thickness, measuring impurities in Silicon and monitoring dielectrcis, like Borophosphosilicate glass (BPSG), FSG, PSG, etc in semiconductor industry. FTIR is evolving from a primarily quality control (wafer supply chain) technology to a tool/process/chamber (test wafers) monitoring technology and more importantly, a device (product wafers) monitoring tool.
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Compact Coating Thickness Gauges
MP0R-FP Series
Compact pocket coating thickness gauges with connected cable probe and PC-interface for a convenient, fast and nondestructive coating thickness measurement on virtually all metals
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Inline Thickness Measuring Instrument
TGD
Dr. Brockhaus Messtechnik GmbH & Co. KG
Thickness and profile measuring system for use in production lines.For cold and hot rolled strips and sheets. Measuring procedure free of contact.
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Thin Film Metrology Systems
Gemini Series
The n&k Gemini-TF, Gemini-TF-M and Gemini-FPD are specifically designed for measurements of patterned and unpatterned films on transparent or opaque substrates. These tools are used extensively for solar cell, flat panel and photomask applications. The tools belonging to the Gemini-TF Series are based on unpolarized Reflectance (R) and unpolarized Transmittance (T) measurements, with a 50μm spot size for both R and T. R and T are simultaneously measured to determine film thickness and n and k spectra from 190nm – 1000nm
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Copper PCB
The Amitron process is capable of producing 20 plus ounces of finished copper and reliably spray coat a protective and consistent solder mask with imaged nomenclature. Amitron utilizes a unique process referred to as "Laminated Deposition". This combination of processes allows extreme copper thickness requirements to become very practical and cost effective. The process utilizes heavy base copper that when placed in our plating and etching systems will deliver consistent and reliable high power circuits.
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Semiconductor Metrology Systems
MTI Instruments'' semiconductor wafer metrology tools consist of a complete line of wafer measurement systems for virtually any material including Silicon wafer (Si), Gallium Arsenide wafer (GaAs), Germanium wafer (Ge) and Indium Phosphide wafer (InP). From manual to semi-automated wafer inspection systems, the Proforma line of wafer metrology inspection tools is ideal for wafer thickness, wafer bow, wafer warp, resistivity, site and global flatness measurement. Our proprietary push/pull capacitance probes provide outstanding accuracy throughout their large measurement range, allowing measurement of highly warped wafers and stacked wafers. MTII''s solar metrology tools include off line manual systems for wafer thickness and Total Thickness Variation (TTV), as well as, in-process measurement systems capable of measuring wafer thickness, TTV and wafer bow at the speed of 5 wafers/second.
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Thickness Gauges
Our digital thickness gauges offer a range of features for advanced performance. Explore different options to suit your application needs, from simple handheld gauges to advanced models. All Olympus ultrasonic thickness gauges can measure thickness from one side of a part.
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Wall Thickness Measurement Gauges
ElektroPhysik Dr. Steingroever GmbH & Co. KG
Portable wall thickness measuring device for non-destructive measurement of up to 24 mm. Thickness measurement of all non-magnetic materials such as glass, synthetic materials, stainless steel and composites; can also be used for objects with complex geometries.
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Ultrasonic Wall Thickness Measurement Meters
The LaserLinc UltraGauge+™ series of ultrasonic meters and gauges measure wall thickness, layer thickness, and concentricity of plastic, rubber, glass, and metal products. Typical applications include tubing, hose, pipe, insulated wire, cable, and certain multi-layer products.
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Terahertz Systems
Non-destructive and non-contact coating thickness measurement of organic single and multilayer systems as well as material analysis.
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Geotextile Thickness Tester (Wet Sieving)
TG040
TESTEX Testing Equipment Systems Ltd.
Geotextile Thinkness Tester, to determine the thickness of geotextile synthetic materials and related products under pressure and in specified time.
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PANELMAP
PANELMAP is a software package used to collect, edit, analyze and visualize measured physical parameters on rectangular semiconductor panels. PANELMAP can import data files from various metrology tools such as ellipsometers, thickness gauges and four point probes. The imported data can then be visualized or printed as line scans, contour plots, 2D or 3D plots or as a histogram.
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Micro-spot DUV Reflection and Transmission Spectrophotometry
FilmTek 3000 PAR
Scientific Computing International
Metrology system with a 50µm spot that delivers high-performance transmission and reflection measurement of patterned films deposited on transparent substrates. Ideally suited for measuring the thickness and optical constants of very thin absorbing films.
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Portable Thickness Gauge
Magna-Mike 8600
The Magna-Mike® 8600 is a portable thickness gauge that uses a simple magnetic method to make reliable and repeatable measurements on nonferrous materials. Operation of the Magna-Mike is very simple. Measurements are made when its magnetic probe is held or scanned on one side of the test material and a small target ball (or disk or wire) is placed on the opposite side or dropped inside a container.
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1 KN Capstan Grips For Yarn And Wire
These capstan grips are applicable for tensile testing yarn and metal wire with thickness less than 3 mm (0.12 in). Flat grip faces are used to hold the specimen. The grip faces are opened and closed by a cam with an operating lever. Ease-of-use and simple design are advantages of these 1 kN capstan grips for yarn.
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PRECISION GAUGE
PX-7
The PX-7 is our basic precision gauge model. The PX series are packaged in an aluminum extruded body, with nickel plated aluminum end caps. The PX series gauges are typically used for thin material applications. This gauge has the ability to calibrate to a variety of different materials using a one point calibration option. Some of the features include: Scan feature (allowing the user to scan an area for the minimum thickness), alarm mode (audible & visual), differential mode (+/- from nominal thickness value), and RS232 port out.
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Compact Coating Thickness Gauges
MP0 Series
Ultra compact pocket coating thickness gauges for simple, fast and nondestructive coating thickness measurement on virtually all metals or only on steel/iron
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FPP Software
Four Point Probe
Materials Development Corporation
For use with a manual four point prober, the MDC FPP Software operates in a convenient, single screen that displays both measurement parameters and testresults. The FPP software can measure Resistivity, Conductivity, Resistance, Doping, Thickness, and SheetResistance when used with a compatible current source and voltmeter or SMU.
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EMAT Thickness Gauges
The EMAT thickness gauge uses advanced electromagnetic-acoustic technology to measure metal thickness, even in cases where traditional methods like piezo-ultrasonic or laser-optical are not applicable.
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Thickness Meter for Phosphor Coating
PM200T
PM200T is applicable for the manufacturers of fluorescent lamp. During the procedure of powdering tube, PM200T solves the problem efficiently how to control the phosphor thickness and uniformly of the tube. It becomes the important tool to reach best lumen output and save the phosphor.
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Ultrasonic Thickness Gauge
72DL PLUS
The Olympus 72DL PLUS™ ultrasonic thickness gauge delivers precision thickness measurements at high speed in a portable, easy-to-use device. With fast scanning, advanced algorithms, and our lowest-ever minimum thickness capability, you can confidently measure the thickness of very thin layers in the most challenging applications.
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Digital Thickness Gauge
K094
For carpets, with weight set 20-2000 GM/cm², presser foot 412mm², range 0-25mm x 0.01mm.
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IEC60335-2-9 Clause 3 Figure 103 Vessel For Testing Hotplates
CX-GZ
Shenzhen Chuangxin Instruments Co., Ltd.
IEC60335-2-9 clause 3 figure 103 Vessel for testing hotplatesParameter:1.Pot and lid material industrial aluminum2. Pot material thickness 2 mm;3. The bottom of the pot body can not be outward convex, can not exceed 0.05mm;4. Pot body and lid surface should be smooth;5, size: 110, 145, 180, 220, 300mm each one
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Coating Thickness Gauges
Non-destructive coating thickness measurement of non-magnetic coatings, e.g. paint, enamel, chrome on steel, and insulating coatings, e.g. paint and anodizing coatings on non-ferrous metals.
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Flatness, Bow, Warp, Curvature, Glass Thickness
FLATSCAN 650 3D
Optik Elektronik Gerätetechnik GmbH
High accurate flatness & thickness measuring system for large substrates.
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Metal Thickness Measurement
Micro-Epsilon offers innovative measurement and inspection systems for the metals industry. Latest technologies are used for thickness, profile and surface measurements. Performance and quality, as well as reliability of products and services have made Micro-Epsilon one of the leading suppliers of inspection systems for optical thickness measurement used in the metals industry. Numerous, successful installations in 13 countries around the world in milling lines and processing lines speak for themselves.
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COATING THICKNESS GAGES
Coating thickness or dry film thickness (DFT) is an important variable that plays a role in product quality, process control, and cost control. Measurement of film thickness can be accomplished by selecting the best mil gage for the particular application.
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FR-4 PCBs
Monthy Capability: 1200 Sq M/MonthLayer: 4 LayersMaterial: FR4 TG140Dimension: 335.14mm*245.65mmFinished board thickness: 1.6mm+/-0.13mmFinished copper thickness: 2ozMin Trace Width/Space: 8/8milMin hole size: 0.3mmMin hole wall copper: ≥25UMSoldermask Color: YellowSurface finishing: HALApplication field: Consumer electronics
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Film Thickness Probe
FTPadv
The SE 500adv combines ellipsometry and reflectometry to eliminate the ambiguity of measuring layer thickness of transparent films. It extends the measureable thickness to 25 µm. Therefore the SE 500adv extends the capability of the standard laser ellipsometer SE 400adv especially for analyzing thicker films of dielectrics, organic materials, photoresists, silicon, and polysilicon.
