Discrete Device
semiconductor typically having one circuit.
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Product
Flexible Test And Scan Solution For FFC Devices
Ismeca NY32W
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32-position turret test and scan platform for semiconductors on film-frame wafer media, providing the highest inspection yield for WLCSP and Bare Dies. Integrating innovative hardware and software technologies such as intelligent features that enable extended autonomous operation and productivity.
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Product
Hi-Speed Discrete Test System
QT-6000
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QT-6000 Test System, with built-in capacitance test (DC+CAP) and Scanbox etc, is applicable to devices like medium & small power transistors, MOS-FET, diodes and Wafer.
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Product
Power Discrete Tester
Mostrak-2
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M2 test system has multiple test generators which cover static and dynamic test procedures. It is our first truly modular tester which allows for the system to be upgraded and expanded when needed. M2 are designed to get the tester as close as possible to the handler interface and operator at the highest possible speeds. M2 is capable of HV (3 kV) and LV (600A) testing and has dynamic switching capabilities up to 1200V. MOSTRAK systems can test the following device types: MOSFET, IGBT, Bipolar transistor, Diode - rectifiers, Thyristor (SCR) - Triac, Linear voltage regulator (VReg), Transient voltage suppressor (TVS).
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Product
PCIe-5763, 16-Bit, 500 MS/s, 4-Channel PCI FlexRIO Digitizer Device
786166-01
FlexRio Digitizer
The PCIe-5763 is a PCI FlexRIO Digitizer Device that simultaneously samples four channels at 500 MS/s with 16 bits of resolution and features 225 MHz of analog input bandwidth. With over 73 dB of SNR, the PCIe-5763 is ideal for applications that require a wide dynamic range with a wideband digitizer. The FlexRIO driver includes support for finite and continuous streaming modes, and you can implement custom algorithms and real-time signal processing on the LabVIEW-programmable Xilinx Kintex UltraScale FPGA. Available in AC and DC coupled variants, the PCIe-5763 is ideal for both time and frequency domain applications, including radar prototyping, LIDAR, communications, microscopy, OCT, event detection, and particle physics.
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Product
Complete Solution for Developing & Testing Discrete Voltage-Level Interfaces
M8KDiscrete
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The M8KDiscrete module provides a complete solution for developing and testing discrete voltage-level interfaces. The M8KDiscrete contains control I/O registers that are memory-mapped and may be accessed in real time. The module supports ten programmable I/O discretes that can record or control the external discretes that are connected to it. In addition, the module can record changes in the input discrete with an associated time tag via a built-in FIFO. Output discretes are open collector, capable of handling up to 32V with a maximum sink current of 100 mA each.
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Product
PCIe-6341, PCI Express, 16 AI (16-Bit, 500 kS/s), 2 AO (900 kS/s), 24 DIO Multifunction I/O Device
781046-01
Multifunction I/O
PCI Express, 16 AI (16-Bit, 500 kS/s), 2 AO (900 kS/s), 24 DIO Multifunction I/O Device - The PCIe‑6341 offers analog I/O, digital I/O, and four 32-bit counters/timers for PWM, encoder, frequency, event counting, and more. The device delivers high-performance functionality leveraging the high-throughput PCI Express bus and multicore-optimized driver and application software. Onboard NI‑STC3 timing and synchronization technology delivers advanced timing functionality, including independent analog and digital timing engines and retriggerable measurement tasks. The PCIe‑6341 is well suited for a broad range of applications, from basic data logging to control and test automation. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
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Product
Small Device Test Chambers
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Small Device Test Chambers are used for basic sound level measurement of small products and equipment, pre-compliance testing of small products and equipment and end of line manufacturing test on small products and equipment.
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Product
Resistance Measuring Device According to DIN EN 61557-4 (VDE 0413-4)
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PeakTech Prüf- und Messtechnik GmbH
An extremely robust milliohm measuring device in a splash-proof hard case for professional field service use, e.g. for resistance measurement on motor coils, generators and transformers or for continuity testing on ring bus systems in industrial plants.
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Product
Rugged Aircraft Interface Devices
AB2-AID
Interface
The AB2-AID is ready to go with high-performance avionics I/O combined with valuable built-in features such as a 9-port Ethernet switch, Ethernet to serial bridge, and 8GB flash memory. All in a compact, rugged package for easier integration and longer life.
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Product
16-CH Discrete Input 16-CH Discrete Output Module
HSL-DI16DO16-M-NN
Input/Output Module
- Input voltage: ±40 V (Max)- Output switching capacity: Single channel 500 mA; all channels 60 mA at 24 VDC- Photo couple isolation voltage: 2500 Vrms- Input impedance: 4.7 KΩ- Input current: ±10 mA (Max) , ±12.5 mA (Peak)- 16-CH digital input and 16-CH digital output. "NN" type for NPN sinking type sensor input or dry contact and NPN sinking type output- Slave ID consumption: 1
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Product
USB-4432, 102.4 kS/s, 100 dB, 0.8 Hz AC/DC Coupled, 5-Input Sound and Vibration Device
780421-01
Sound and Vibration
The USB-4432 is designed for sound and vibration measurements. Four of the input channels incorporate integrated electronic piezoelectric (IEPE) signal conditioning for accelerometers and microphones and built-in antialiasing filters that automatically adjust to your sampling rate. The fifth input channel does not include IEPE support.
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Product
Measuring Devices for Magnetically Hard Materials
MAG-ST100
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The computerized measuring system is designed for measure the static magnetic properties of the hard magnetic materials e.g. Alnico, ferrite, magnets based on cobalt alloy with rare-earth elements or Nd-Fe-B alloy. The system provides the opportunity of a tabular and graphic presentation of the obtained data, which can be presented by means of monitor, printer or plotter. MAG-ST100 system fulfill the requirements of IEC404-5 Standard.
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Product
GPIB-RS485/RS422 GPIB Instrument Control Device - Taiwan 110VAC
779733-11
GPIB Controller
The GPIB‑RS485 is an IEEE 488 controller device for PCs with RS485 or RS422 ports. You can use this device to integrate an instrument into your system using GPIB. This device transforms a computer with an RS485 or RS422 serial port into a talker, listener, or controller on the GPIB bus. It can also interface RS485 and RS422 instruments and peripherals to the GPIB bus. It can implement the physical and electrical specifications of the IEEE 488, RS485, and RS422 standards, as well as interpret and execute high-level commands from the serial port, including serial‑to‑GPIB, and GPIB‑to‑serial protocol conversions. This device is IEEE 488.2 compatible. The device includes a license for the NI‑488.2 driver software, providing maximum reliability for connecting to third-party instruments with GPIB.
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Product
Measuring Devices For Nanoindentation
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With our measuring devices, you can determine the mechanical properties of thin coatings reliably and accurately. From protective paint coatings to hardness of PVD coatings: We have the right solution for you. We offer you powerful and easy-to-use measuring instruments for the laboratory and production. You can choose from a wide range of accessories to adapt your device to your individual requirements.
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Product
Analog Output Device
Analog Output Module
The Analog Output Device helps you create applications such as stimulus-response, power supply control, deterministic control, and sensor/signal simulation. The Analog Output Device supports various output resolutions, channel counts, and other onboard features, so you can replace several kinds of instruments in your system, including stand-alone proportional integral derivative (PID) controllers, low-speed arbitrary waveform generators, and function generators.The Analog Output Device includes the NI-DAQmx driver and configuration utility that simplify configuration and measurements. NI-DAQmx supports NI programming environments as well as Python, ANSI C, C#.NET, and MathWorks MATLAB® software.
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Product
Security Devices
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Schweitzer Engineering Laboratories, Inc.
Security devices protect perimeters and secure communications within LANs.
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Product
Ignition Safety Devices
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Excelitas Technologies specializes in the design, manufacture, and testing of MIL-STD-1901A compliant rocket motor Ignition Safety Devices (ISD) for safe initiation of both launch and flight motor initiators. Our ISD designs are compatible with through bulkhead initiators that work in-line with the detonator to provide highly reliable transfer of pyrotechnic energy, while isolating the ISD from the rocket motor heat and combustion effects. Our ISDs are designed for either single- or multiple-pulse initiation applications.
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Product
Ferrite Devices
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Ducommun's products include very broad ferrite device selections to cover 100 MHz to 110 GHz operation frequency range. These devices include narrow band drop-in (FID and FCD), connectorized (FIC and FCC), junction (FIW and FCW) isolators and circulators and iso-adapters (FII and FCI). The broad bandwidth versions are offered as full band junction isolators and circulators (FIF and FCF) and Faraday isolators (FFF). These devices feature low insertion loss, high isolation and wide operating temperature range. Low cost and volume production versions of these ferrite devices are available per customers’ request.
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Product
PCIe-5763, 16-Bit, 500 MS/s, 4-Channel PCI FlexRIO Digitizer Device
786165-01
FlexRio Digitizer
The PCIe-5763 is a PCI FlexRIO Digitizer Device that simultaneously samples four channels at 500 MS/s with 16 bits of resolution and features 225 MHz of analog input bandwidth. With over 73 dB of SNR, the PCIe-5763 is ideal for applications that require a wide dynamic range with a wideband digitizer. The FlexRIO driver includes support for finite and continuous streaming modes, and you can implement custom algorithms and real-time signal processing on the LabVIEW-programmable Xilinx Kintex UltraScale FPGA. Available in AC and DC coupled variants, the PCIe-5763 is ideal for both time and frequency domain applications, including radar prototyping, LIDAR, communications, microscopy, OCT, event detection, and particle physics.
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Product
SSD - Solid State Storage Devices
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LinkedHope Intelligent Technologies Co.,Ltd.
LinkedHope Intelligent Technologies SSD Products
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Product
GPIB-ENET/1000, Ethernet GPIB Instrument Control Device - Swiss 220VAC
781630-02
GPIB Controller
The GPIB‑ENET/1000 is an IEEE 488 controller device for computers with an Ethernet port. You can use this device to share a single GPIB system among many networked users or to control several test systems from a single networked host. The GPIB‑ENET/1000 features a password-protected web interface for easy configuration. It can also control IEEE 488 devices from anywhere on an Ethernet‑based (LAN) TCP/IP network (Gigabit, 100BASE‑TX, 10BASE‑T). Each device interfaces to and shares up to 14 GPIB devices from several network hosts, and you can control up to 100 GPIB‑ENET/1000 interfaces with a single computer. The device includes a license for the NI‑488.2 driver software, providing maximum reliability for connecting to third-party instruments with GPIB.
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Product
Semiconductor Device Parameter Analyzer/Semiconductor Characterization System Mainframe
B1500A
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Current-voltage (IV) measurement capabilities of spot, sweep, sampling and pulse measurement in the range of 0.1 fA - 1 A / 0.5 V - 200 VAC capacitance measurement in multi frequency from 1 kHz to 5 MHz and Quasi-Static Capacitance-Voltage (QS-CV) measurement capabilitiesAdvanced pulsed IV and ultra-fast IV measurement capability from minimum 5 ns sampling interval (200 MSa/s)Up to 40 V high voltage pulse forcing for non-volatile memory evaluation
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Product
Discrete Detectors
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TRAL test station is a quasi-universal test station designed to measure parameters of discrete (or small linear array) infrared detectors sensitive in a wide spectral range from about 700nm to about 16 000 nm (NIR/SWIR/MWIR/ LWIR detectors or broadband non selective detectors). All main types of infrared detectors can be tested: photonic detectors: photovoltaic/photoreconductive, cooled/non-coooled, thermal detectors, pyroelectric detectors etc.
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Product
Protective Cover, 9050, VXI and Discrete Wiring, ITA
410112582
Protective Cover
When storing the ITA, the cover snaps on to protect the modules and contacts. The body of the cover is clear chromated aluminum and the mounting blocks are made of Delrin.
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Product
Optimize Throughput And Cost For MmWave 5G Device Functional Test
Functional Test
Test engineers always have faced tough new test-coverage challenges. Those introduced by 5G measurements at mmWave are no exception, as they require over-the-air (OTA) radiated test solutions. But never have these pressures seen today’s intense time-to-market, manufacturing volume, and operational expectations! A solution that meets these demands must:
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Product
Device Power Supply (DPS) & Parametric Measurement Units (PMU) ATE
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Analog Devices’ parametric measurement units (PMUs) and device power supply (DPS) products offer a flexible range of voltage and current source/measurement capability to meet the needs of a wide range of cost-sensitive test applications. With a proven track record, Analog Devices’ PMU and DPS products serve a wide variety of precision test application requirements, such as measurement and control for voltage and current. Analog Devices’ DPS and PMU products are equipped with unique precision measurement and control capability for today's demanding ATE solutions.
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Product
PCI-5105, 8‐Channel, 12-Bit, 60 MHz Bandwidth PCI Oscilloscope Device
779686-01
Oscilloscope
8‐Channel, 12-Bit, 60 MHz Bandwidth PCI Oscilloscope Device—The PCI‑5105 high-density oscilloscope device has eight simultaneously-sampled channels with flexible settings for coupling, impedance, voltage range, and filtering. Oscilloscope devices also feature a number of triggering modes, deep onboard memory, and an instrument driver that includes data streaming and analysis functions. This device is ideal for applications with many channels that require up to 60 MS/s or 60 MHz of analog bandwidth.
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Product
PCIe-6346 , 8 AI (16-Bit, 500 kS/s), 2 AO, 24 DIO, Multifunction I/O Device
785813-01
Multifunction I/O
PCIe, 8 AI (16-Bit, 500 kS/s), 2 AO, 24 DIO, Multifunction I/O Device - The PCIe-6346 offers analog I/O, digital I/O, and four 32-bit counters/timers for PWM, encoder, frequency, event counting, and more. The device delivers high-performance functionality, leveraging the high-throughput PCI Express (PCIe) bus and multicore-optimized driver and application software. Because of its multi-ADC architecture, the device offers simultaneous sampling. Onboard NI-STC3 timing and synchronization technology deliver advanced timing functionality, including independent analog and digital timing engines and retriggerable measurement tasks. The PCIe-6346 is well suited for a broad range of applications, from basic data logging to control and test automation. The included NI-DAQmx driver and configuration utility simplify configuration and measurements.
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Product
FAult Detector and OScilloscope 7 Functions in 1 Device
FADOS7F1
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Prot-Ar-Ge Industrial Project Design R&D Ltd. Co.
Usage of FADOS7F1: Determining faults of all types of electronic cards such as electronic cards of medical devices, textile and any other machines; automobile electronics; computer, monitor, TV, etc. Electronic Components Test: IC, transistor, FET, IGBT, resistor, capacitor, indicator, ect. This device is used to determine the faults at all these electronic components.
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Product
Thermal Conductivity Measuring Device
TCM1001
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In recent years, there has been a demand for small and thin electronic products such as mobile devices, and printed circuit boards are shifting to thin, multi-layered, and even modularized printed circuit boards. effect of bonding materials, that is, the ability to easily conduct heat, is emphasized, and testing equipment that evaluates thermal conductivity is required .As a business of our company, we have mainly manufactured and sold test equipment for solder wettability tests and solder bonding strength, but there was a need to urgently develop next-generation bonding material test equipment to replace these. Under these circumstances, we received a request from an academic research facility to manufacture a device that can measure the thermal conductivity of conductive adhesives under research and development, and we were able to obtain an opportunity to develop the device. We proceeded with the development based on these requirements .
