Mapping
See Also: Wafer Mapping, Survey
-
Product
Micro-spot DUV Spectroscopic Reflectometry
FilmTek 2000 PAR
-
Scientific Computing International
A low-cost solution for high-throughput, fully-automated mapping of patterned wafers for development and production environments. Utilizes patented parabolic mirror technology to measure wavelengths from DUV to NIR with a spot size as small as 13µm. Fully user-customizable wafer mapping capabilities rapidly generate 2D and 3D data maps of any measured parameter.
-
Product
Easy3DMatch
-
Align a scanned 3D object with another scan or with a reference meshCompute the local distances between 3D scans and a golden sample or reference meshDetect anomalies such as misplaced features, geometric distortions, gaps, bumps,...Compatible with all 3D sensors that produce point clouds, depth maps or height maps
-
Product
Saluki S5700 Series Field Comm Analyzer (SA/CA/OPTICAL)
-
S5700 Series Field Comm Analyzer combines the highest performance operating specifications and multi-functional measurements such as cable and antenna system analysis, fiber inspection, spectrum analysis, cellular signal demodulation, interference analysis, signal coverage mapping and RF/optical power measurements in a single instrument.
-
Product
Automotive Test Lead Kit
143
-
Test Lead Kit includes our basic set of interchangeable specialty test probes designed for automotive use. The flexible back probing pins are great for sliding into automotive connectors like those on fuel injectors and MAP sensors. The large Crocodile Clips are good for clipping to grounds and battery terminals. Roll up storage pouch keeps your leads organized.
-
Product
Photoluminescence Mapping System
VS6845A
-
Industrial Vision Technology Pte Ltd.
With its unique optical design technology, the System detects and classifies defects that affect yield and uses advanced photoluminescence (PL) technology to enable real-time monitoring of MOCVD production processes.
-
Product
Real-time Chemical Imaging System
AZtecLive & Ultim Max
-
AZtecLive is a revolutionary new approach to EDS analysis that enables a radical change in the way users perform sample investigation in the SEM. It combines a live electron image with live X-ray chemical imaging to give an intuitive new way of interacting with your samples. 100 mm2 and 170 mm2 sensor areas. Quantitative analysis at 400,000 cps. EDS mapping at >1,000,000 cps.
-
Product
MAPS Core
-
An all-in-one core package includes the ADLINK products’ driver, device management utility-ACE and, PXI configuration setting utility
