Electron
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Product
Scanning Electron Microscopes
SEM
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Scanning Electron Microscopes (SEM) scan a sample with a focused electron beam and obtain images with information about the samples’ topography and composition.
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Product
Scanning Electron Microscopy
SEM
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Materials Evaluation and Engineering
JEOL JSM-6610 LV LaboratoryScanning electron microscopy (SEM) uses electrons for imaging to obtain higher magnifications and greater depth of field than light microscopes. The instruments at MEE are capable of variable-pressure, or low vacuum, SEM (VPSEM), as well as traditional high-vacuum conditions for sample observation. VPSEM is a specialized method using a variable-pressure sample chamber that allows direct evaluation of samples that are not readily examined with a traditional high-vacuum SEM. Nonconductive or vacuum sensitive samples that would typically require additional sample preparation can be directly analyzed in VPSEM without the need for additional sample preparation, such as carbon or metallic conductive coatings. This reduces both sample preparation time and distractions in microanalysis. Our laboratory also has a field emission SEM (FESEM) for critical high-magnification work and low-voltage (LVSEM) applications. Each instrument has a spacious sample chamber that can accommodate large and irregularly-shaped specimens and accessories for feature dimensional analysis and chemical microanalysis.
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Product
Electron Probe Microanalyzer
EPMA-1720
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Both hardware and software incorporate the latest technologies to create the next generation of EPMA. New functions that offer simple and easy-to-understand operation have been added to the superb basic EPMA performance that Shimadzu has fostered over many years – high sensitivity, high accuracy, and high resolution – to allow the EPMA's capabilities to be exploited to the fullest. While easy enough for even novices to use, it also supports sophisticated analysis by experienced users.
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Scanning Electron Microscope (SEM)
Prisma E
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Prisma E scanning electron microscope (SEM) combines a wide array of imaging and analytical modalities with new advanced automation to offer the most complete solution of any instrument in its class. It is ideal for industrial R&D, quality control, and failure analysis applications that require high resolution, sample flexibility and an easy-to-use operator interface. Prisma E succeeds the highly successful Quanta SEM.
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Electron Microscope Analyzer
QUANTAX EBSD
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QUANTAX EBSD system, with its popular OPTIMUS 2 detector head, is the best available solution for analyzing nanomaterials in the SEM
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Product
Scanning Electron Microscope
E5620
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The E5620 is a MASK DR-SEM(∗) product for reviewing and classifying ultra-small defects in photomasks and mask blanks. It implements Advantest’s highly stable image capture technology to easily import defect location data from mask inspection systems and automatically image the locations. Compared to the E5610, our predecessor DR-SEM system, the E5620 features a number of improvements designed specifically to target mask requirements for extreme ultraviolet (EUV) lithography.
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Electron Microscope Analyzer
QUANTAX WDS
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The QUANTAX WDS (WDX) for SEM consists of the XSense wavelength dispersive spectrometer yielding the best resolution among all parallel-beam WDS systems.
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Product
Electron Microscope Analyzer
QUANTAX Micro-XRF
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Micro-X-ray Fluorescence (Micro- XRF) spectroscopy analysis is a complementary non-destructive analytical technique to traditional Energy Dispersive Spectroscopy (EDS) analysis using a Scanning Electron Microscope (SEM).
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Product
Electron Spectrometers
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SPECS Surface Nano Analysis GmbH
Nanotechnology is focused on the engineering and the physical properties of small structures. Therefore techniques that have sensitivities at a scale of 0.1 nm to 100 nm are required to study these structures. Different methods of electron spectroscopy (XPS, UPS and AES) have a sensitivity in this range and are therefore key techniques in nanoscience.Thanks to our high level of expertise in electron optics and electronics we can offer electron spectrometers with the highest resolution and transmission possible.
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Atomic Resolution Analytical Electron Microscope
NeoARM JEM-ARM200F
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"NEOARM" comes with JEOL’s unique cold field emission gun (Cold-FEG) and a new Cs corrector (ASCOR) that compensates for higher order aberrations. The combination of a Cold-FEG and ASCOR enables atomic-resolution imaging at not only 200 kV accelerating voltage, but also a low voltage of 30 kV."NEOARM" is also equipped with an automated aberration correction system that incorporates JEOL’s new aberration correction algorithm for automatic fast and precise aberration correction. This system enables higher-throughput atomic-resolution imaging even at low accelerating voltages. Furthermore, a new STEM detector that provides enhanced contrast of light elements is incorporated as a standard unit.
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Product
Electron Backscatter Diffraction (EBSD) Camera
Velocity™
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high-speed EBSD mapping with the highest indexing performance on real-world materials. Velocity™ EBSD camera combines indexing speeds greater than 3,000 indexed points per second with indexing success rates of 99% or better. At these speeds, the Velocity™ uses 120 x 120 pixel EBSD patterns for improved band detection. This image resolution, combined with proven EDAX triplet indexing routines, provides orientation precision values of less than 0.1°.
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Electron Multiplication (EM) Standard Image Sensors
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EM (Electron Multiplication) is a technology that uses on-chip gain in the charge domain to effectively eliminate read noise from an image sensor. This enables advanced ultra-low light applications that require extreme sensitivity at fast frame rates. Examples include life science applications such as single molecule detection, super resolution microscopy and spinning disk confocal microscopy along with physical science applications such as nanotechnology imaging, Bose Einstein condensates and soft X-ray spectroscopy, and astronomy applications such as adaptive optics and lucky imaging. The inclusion of an additional conventional output allows further flexibility for applications such as true 24 hour surveillance.
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Electron Probe Microanalyzer
EPMA-8050G
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This instrument is equipped with a cutting-edge FE electron optical system, which provides unprecedented spatial resolution under all beam current conditions, from SEM observation conditions up to 1 μA order. Integration with high performance X-ray spectrometers that Shimadzu has fostered through the company's traditions achieves the ultimate advance in analysis performance.
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Electron Microscope Analyzers
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Bruker’s electron microscope analyzers EDS, WDS, EBSD and Micro-XRF on SEM offer the most comprehensive compositional and structural analysis of materials available today. The full integration of all these techniques into the ESPRIT software allows you to easily combine data obtained by these complementary methods for best results.
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Scanning Electron Microscope
JSM-IT510
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Scanning electron microscopes (SEMs) are indispensable tools not only for research but also for quality assurance and manufacturing sites.At those scenes, the same observation processes need to be performed repeatedly and there has been a need to improve the efficiency of the process.
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Product
Auger Electron Spectroscopy (AES)
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Rocky Mountain Laboratories, Inc.
Auger Analysis, Auger Electron Spectroscopy (AES or Auger) is a chemical surface analysis method. AES measures the chemical composition of the outermost 100 Å of a sample. Measurements can be made at greater depths by ion sputter etching to remove surface layers.
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Ion & Electron Detection
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Photonis is the global leader in the development and manufacturing of detectors and optical components to detect ions and electrons. These detectors and components have been designed for a wide range of scientific instruments used in space and research projects but also in cells and material analysis in lifescience or non destructive testing.
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Electron Spin Resonance Spectrometer
ESR
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Electron Spin Resonance (ESR) is a powerful analytical method to detect, analyze and determine thecharacteristics of unpaired electrons in a substance. It is clear that the state of electrons in a substance have a strong influence on its characteristics and functionality, so evaluation by ESR is becoming more and more important. Many types of substances, from electronic materials to catalysts, biological samples, can be studied regardless of whether they are solid, liquid, or gas. A wide range of ESR techniques are possible using suitable attachments together with the basic instrument.
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Product
Electronics Design Software
Altium Designer
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Professional unified design system, high productivity stress-free environment and native 3D PCB editor. Easily design the most complex and innovative board layouts with advanced and accessible routing tools. Stay at the frontline of innovative technology development with the world's first-and-only support for rigid-flex PCB design.
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Optical Test
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Optical components such as micro-lenses, diffractive optical elements (DOE), meta optical elements (MOE) and micro lens arrays (MLA) are now largely used on consumer electronics and even more optical elements need to be integrated into smaller and smaller packages. Nowadays mass-production industries key to success lies in increasing the yield by means of strongly automatized testing machines, with statistical analysis.
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PCB Systems Vibration and Acceleration Simulation Solution
Xpedition
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As the industry’s market share leader in PCB design software, the Mentor Graphics® Xpedition product augments mechanical analysis and physical testing by introducing virtual accelerated lifecycle testing much earlier in the design process. This is the industry’s first PCB-design-specific vibration and acceleration simulation solution targeting products where harsh environments can compromise product performance and reliability, including the military, aerospace, automotive and industrial markets. Traditional, physical HALT (highly accelerated lifecycle testing) is conducted just before volume manufacturing, and requires expert technicians, which can result in costly schedule delays. Bridging mechanical and electronic design disciplines, the Xpedition product provides vibration simulation significantly faster than any existing method. This results in increased test coverage and shortened design cycles to ensure product reliability and faster time to market. The Xpedition component modeling library is the most extensive in the industry, comprised of over 4,000 unique 3D solid models which are used to create highly defined parts for simulation. The 3D library allows users to easily match geometries to their 2D cell database. Designers can assemble the parts models on board and automatically mesh them for performance analysis, including stiffeners and mechanical parts. The system modeling tool is ultra-fast since it can model over 1,000 components per minute.
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PXIe-1486, 8 Input, 8 Output, or 4 Input/4 Output PXI FlexRIO FPD-Link™ Interface Module
787453-01
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The PXIe-1486 combines the Texas Instruments Flat Panel Display Link™ (FPD-Link™) interface with the Xilinx FPGA for high-throughput vision and imaging applications. This module provides a … high-speed digital interface for using and testing modern advanced driver assistance systems (ADAS) and autonomous drive (AD) camera sensors and electronic control units (ECUs). Additionally, the PXIe-1486 makes use of a combination of FPD-Link™ serializers and deserializers with a Xilinx FPGA to provide a high-throughput and customizable FPD-Link™ interface on PXI. The included FlexRIO driver, with LabVIEW FPGA examples, provides access and control for power-over-coax, I²C back-channel communication, and general-purpose input/output (GPIO) communication on the FPD-Link™ channels. The PXIe-1486 is ideal for applications such as in-vehicle data logging, lab-based playback, or hardware-in-the-loop (HIL). FPD-Link is a trademark of Texas Instruments.
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Product
Flexible Vertical Gage
911
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The world standard for camshaft measuring, the Adcole Model 911 is ideal for measuring pistons, pump rotors/housings, transmission shafts and any other cylindrical component. Measurement results are displayed on a touchscreen monitor and can be printed/plotted or simply uploaded electronically for historical tracking. Vertical part orientation does away with the need for sag correction, while also minimizing the gage’s footprint on the shop floor. The adjustable tailstock accommodates multiple part lengths. Parts are rotated for a full 360-degree analysis of each feature.
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Product
Logger
S7021
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Data logger is designed for record of pulses and two-state events. Values are stored to a non volatile electronic memory. Data transfer to the personal computer for further analysis is performed via USB, RS232, GSM or Ethernet interface by means of a proper communication adapter.
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Product
VIP Cabin Management Systems
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Where elegance meets powerful functions, add a new level of electronic sophistication to your cabin.
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Product
Capacitor Charging Power Supplies
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Lumina Power CCPF and CCHP capacitor chargers utilize the latest innovations in power electronics to deliver clean and efficient energy for pulsed power applications. Learn more about the CCPF and CCHP below.
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Product
USB-8452, 3.3 MHz I2C, 50 MHz SPI I2C/SPI Interface Device
781964-02
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The NI USB‑8452 is a master interface for connecting to and communicating with inter-integrated circuit (I2C) and serial peripheral interface (SPI) devices. With plug‑and‑play USB connectivity, the USB‑8452 is a bus-powered, portable solution to communicate with consumer electronics and integrated circuits. It also includes eight general-purpose digital I/O lines for a variety of applications, such as configuring the address of I2C devices, toggling LEDs, or strobing convert and data ready lines common to analog converter chips. You can physically place the USB‑8452 more closely than PCI interfaces to I2C/SPI devices, which reduces I2C bus length and minimizes noise problems. Additionally, the interface provides +5 V and GND to power circuits with no external power supply.
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Product
3U Centrifugal Blower for Pressurizing Consoles
CB-300A
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3U centrifugal 300 cfm blower for pressurizing consoles, computers and electronic systems with cool, filtered air. Includes easy-to-remove, washable dust filter, 3-conductor AC cord and removable, brushed aluminum grille. Installs on 19” panel mounting rails.
