Scattering
a propagating wave or moving particle's linear trajectory, interrupted by non-uniformity in the medium they move through.
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Dynamic Light Scattering (DLS)
NANOTRAC
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Dynamic Light Scattering (DLS) is an established and precise measurement technique for the characterization of particle sizes in suspensions and emulsions. Microtrac is a pioneer of particle analysis technology and has been developing optical systems based on Dynamic Light Scattering for over 30 years.
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Diffractometers & Scattering Systems
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Bruker develops and manufactures analytical solutions for X-ray diffraction and scattering. Our innovative instruments and software support research, development and quality control in academia, governmental institutions and industry.
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Neutron Scattering and Beamline Systems
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For optical, neutron and particle beam experiments, Cryogenic offers a range of split pair magnets. These allow strong magnetic fields to be produced in a small volume with maximum access to the working space. Split pair coils can be mounted to provide either a vertical field with horizontal access or a horizontal field offering horizontal or vertical access.
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Scattering Sensors
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Scattering sensor data offers links to particulate bigeochemistry and ocean color. Sea-Bird Scientific offers a wide variety of scattering sensor configurations and measurement capabilities. Our sensors are available in single, dual, and three-measurement combinations.
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Benchtop Small Angle X-ray Scattering (SAXS) Instrument
NANOPIX mini
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Non-destructive measurement of particle size and size distribution.Rigaku NANOPIX mini is the world’s first benchtop small angle X-ray scattering (SAXS) system that is engineered to deliver automatic nanoparticle size distribution analysis for both quality control (QC) and research and development (R&D) applications. Nanoparticle size, size distribution, and particle shape are the key pieces of information obtained from SAXS. Samples may range from solutions, suspensions or slurries to solid plastics, rubbers or polymers.
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Small-Angle X-Ray Scattering (SAXS) Products
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Small-Angle X-Ray Scattering (SAXS) Products from Rigaku
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SERS (Surface Enhanced Raman Scattering) Substrate & SERS Reader – Mini Chemistry Analytic Pack
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The porous carbon SERS substrate provides not only high signal enhancement due to its strong broadband charge-transfer resonance for large chemical enhancement (as opposed to electromagnetic enhancement in traditional metal-based SERS substrates), but also extraordinarily high reproducibility or substrate-to-substrate, spot-to-spot, sample-to-sample, and time-to-time consistency in SERS spectrum (which is not possible with traditional metal-based SERS) due to the absence of "electromagnetic hot spots" by making the entire surface of the substrate "chemically hot", high durability due to no oxidization, and high compatibility to biomolecules due to its fluorescence quenching capability.
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Evaporative Light Scattering Detector for HPLC
ELSD-LT III
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The evaporative light scattering detector (ELSD) is a general-purpose universal detector that can even detect components with no UV absorption, such as carbohydrates, lipids, surfactants, and synthetic polymers. With exceptional sensitivity, a wide dynamic range through Analytical Intelligence features, and easy operability using LabSolutions™ software, the ELSD-LT III contributes to more effective analysis in a wide variety of fields.
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Present Weather Sensors
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Bristol Industrial & Research Associates Ltd
Biral forward scatter Present Weather Sensors measure visibility and report precipitation type and intensity. These compact sensors can identify a wide range of precipitation types including drizzle, rain, snow, hail, freezing rain and other forms of frozen precipitation. Precipitation type is reported using a combination of WMO Table 4680 and METAR codes. The range of precipitation types identified varies with sensor model.
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Surface Analysis
Innova-IRIS
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This provides researchers a perfect combination of chemical or crystallographic information at high spatial and spectral resolution with the most advanced atomic force microscopy characterization. The Innova-IRIS can be integrated with your choice of a leading Raman system to provide the best opaque sample TERS investigations available today. However you tailor your system, your application will benefit from Bruker exclusive, high-contrast IRIS TERS probes and the best tip preservation and lowest drift, guaranteeing that alignment is preserved even over the optical integration times necessary to interrogate weak Raman scatterers.
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Network Analyzers
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A network analyzer is an instrument used to analyze the properties of electrical networks, especially those properties associated with the reflection and transmission of electrical signals known as scattering parameters (S-parameters). Network analyzers are used mostly at high frequencies; operating frequencies can range from 9 kHz to 110 GHz
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Spectroscopy
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*Femtosecond multi-pulse transient absorption and reflection measurements *Femtosecond fluorescence upconversion *Time-resolved femtosecond stimulated Raman scattering (FSRS) *Hundred picoseconds-to-microsecond time-correlated single-photon counting (TCSPC)
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OEM Solutions
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Headwall-manufactured gratings, spectrographs, and spectrometers maximize the quality of UV-VIS-NIR analysis. Each grating is an original piece, unmarred by replication processes. These master-quality gratings feature superior spectral and spatial resolution and extremely low scatter, meeting the demands of your high-performance instrument. We have more than 40 years of experience producing gratings and spectral engines for ourselves and for our OEM customers.
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Sapphire Defect Laser Probe and Glasses
LP-100
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Easy to use and portable■ low price with long lifetime■ can be used to detect many defects, like micro crack, bubbles, impurity, crystal subgrain■ When the laser go though the crystal, if it is monocrystal the light should be scattering, in macro it should be white.
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Water Treatment Plant Analyzer
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Aqualog® is the only instrument to simultaneously measure both absorbance spectra and fluorescence Excitation-Emission Matrices. EEMs are acquired up to a 100 times faster than with other instruments. Dedicated software automates traceable Quinine Sulfate Unit calibration and correction of inner-filter effects and Rayleigh and Raman scattering lines, enabling rapid export to modeling algorithms like PARAFAC.
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Laboratory And Analysis Systems
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High performance UV-VIS-IR spectrophotometer with superb optical performance for the determination of spectral absorption coefficient and spectral effective scattering coefficients
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X-Ray Photoelectron Spectrometer
AXIS Supra
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AXIS SupraTM is an X-ray photoelectron spectrometer (XPS) with unrivalled automation and ease of use for materials surface characterisation. The patented AXIS technology ensures high electron collection efficiency in spectroscopy mode and low aberrations at high magnifications in parallel imaging mode. XPS spectroscopy and imaging results can be complemented by additional surface analysis techniques such as: ultraviolet photoemission spectroscopy (UPS); Schottky field emission scanning Auger microscopy (SAM) and secondary electron microscopy (SEM) and ion scattering spectroscopy (ISS). The AXIS Supra replaces the AXIS Ultra DLD as Kratos' flagship x-ray photoelectron spectrometer.
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Deep Submersible Particle Size Analyzer
LISST-Deep
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The LISST-DEEP instrument obtains in-situ measurements of particle size distribution, optical transmission, and the optical volume scattering function (VSF). Using a red 670nm diode laser and a custom silicon detector, small-angle scattering from suspended particles is sensed at 32 specific log-spaced angle ranges. This measurement is post-processed to obtain sediment size distribution, volume concentration, optical transmission, and VSF. The electronics and optical configuration in the LISST-DEEP are very similar to Sequoia’s workhorse, the LISST- 100X. However, because of the extreme difficulty associated with keepingalignment under high pressure, the LISSTDEEP hardware design is radically different from the LISST-100X. This allows the LISST-DEEP to be deployed down to 3000 m and obtain reliable measurements of the in situ particle size distribution and volume concentration in waters with optical transmission up to 98.5%.
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Vector Network Analyzer
SNA5000A
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The SIGLENT SNA5000A series of Vector Network Analyzers have a frequency range of 9 kHz to 8.5 GHz, with 2 and 4 port models available. Designed to give you instant insight into scattering, differential, and time-domain measurements. They are effective instrumentation for determining the Q-factor, bandwidth, and insertion loss filters and feature impedance conversion, movement of measurement plane, limit testing, ripple test, fixture simulation, and adapter removal/insertion adjustments. There are five sweep types: Linear-Frequency, Log-Frequency, Power-Sweep, CW-Time, and Segment-Sweep mode. The SNA5000A series VNAs also support scattering-parameter correction of SOLT, SOLR, TRL, Response, and Enhanced Response for increased flexibility in R&D and manufacturing applications.
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Field-installation Type Turbidity Meter (Four-Wire Transmission, For Wide Range)
HU-200TB-W
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HU-200TB-W is a turbidity meter developed to continuously measure turbidity in processes with large turbidity changes, such as water intake and sedimentation tanks in water supply plants. It employs transmission 90-degree scattered light method and is ideal for monitoring changes in processes with large turbidity changes from low range (10 degrees) to high range (2000 degrees). An electric wiper cleaning can be installed as an option, and long-term stable measurement is possible by periodic cleaning.
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UltraScan VIS Spectrophotometer
Spectrometer
Hunter Associates Laboratory, Inc.
The UltraScan VIS easily measures both reflected and transmitted color as well as transmission haze and meets CIE, ASTM and USP guidelines for accurate color measurement. UltraScan VIS uses diffuse/8° geometry with automated specular component inclusion/exclusion. For transmission measurement, the use of a robust CIE-conforming sphere instrument (TTRAN Total Transmission mode) effectively negates the effects of minor scattering typically found in transparent samples.
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UV Man Spectrometer
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UV Raman (with laser wavelengths below 400nm) can be used to probe specific sample properties, and benefit from experiment properties different from typical visible Raman measurements – for example, greatly increased Raman scattering efficiency, modified laser penetration within the sample, and resonance coupling to different chemical moeities. However, UV analyses come with a number of technical challenges, that require considered instrument design to allow UV Raman to be a truly useful tool for the researcher.
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Profiling Current Meter and Wave
SeaGuardII DCP Wave
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The SeaGuardII DCP Wave is a 600kHz Doppler Current Profiler able to measure directional wave parameters and currents from a bottom mounted installation.The Acoustic Wave software 5759 used by the DCPS implements unique features to improve the wave measurement accuracy by optimizing the signal to noise ratio.Maximum deployment depth is 40m in normal scatter conditions. The Profiling Current Meter and Waveis available as a self-recording instrument. It can be easily integrated into a real-time system offering reliable two-way communication.
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FT-NIR for Process Analytics
QuasIR™ 2000E
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Galaxy Scientific’s QuasIR™ 2000E is designed for continuous measurement of the chemical composition of material transported on a conveyor belt, through a pipe, or in a chute. Our unique external projection optics use high powered tungsten lamps to illuminate the sample from as far as 24 inches away and collect the scattered reflection off the sample through a fiber optic cable. The analysis spot size can be set as small as 0.5″ or as large as 8″ in diameter and can be custom tailored to applications needs.
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PCI Card with 8 output channels
PCI_LVDS_8T
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The PCI-LVDS-8T PCI card has 8 channels of LVDS output (8T), digital filtering and storage. The PCI-LVDS-8T is compatible with TIA/EIA-644 LVDS standards. The card features "Scatter gather" DMA data transfer into the transmit memories.
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Metrology
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Rosenberger Hochfrequenztechnik GmbH & Co. KG
Network analyzers are used to measure so-called scatter parameters (S-parameters). These describe the behaviour of electrical components with the help of wave magnitudes. Whether simple cables, filters, amplifiers or complex subsystems, the following applies to all these components: Different loads can have unseen effects on the measured values over time.
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Gloss & Reflectance
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Visual appearance can determine a person’s perception of a product. Colour and Gloss are two key parameters that are used to define a product’s overall quality. Perception is subjective, but Elcometer’s range of gloss meters, DOI meters and colour assessment equipment can quantify appearance measurement. The ability of a surface to reflect light without scattering is known as gloss. Using a gloss meter, gloss is measured by directing a constant intensity light beam at a fixed angle to the test surface and then by monitoring the amount of reflected light at the same angle. Different surfaces require different reflective angles.
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Omnisens Optical Fiber And Cable Measurement And Quality Control
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To provide quality control or help with the design and testing of fibers, Omnisens Vision offers fast, accurate strain and temperature measurements.Omnisens Vision is based on Brillouin scattering. In single mode fibers it produces precision readings with high spatial resolution over long distances and/or large loss test conditions. It is capable of high speed testing in dynamic situations such as flex fatigue.Its configuration flexibility makes the Omnisens Vision well adapted to a wide variety of test & measurement needs.
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High-efficiency Fiber Stretcher
PZ2
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The PZ2 provides the most extensive stretch of our stretcher product family. It is a fiber wound piezoelectric element for use in a wide range of optical interferometric measurement and sensing system applications. Typical uses include open loop demodulation, sensor simulation, white-light scanning interferometry and large angle modulation of interferometric phase. The PZ2 is ideal for use in OCT [Optical Coherence Tomography] and OCDR [Optical Coherence Domain Reflectometry] applications requiring scattering or boundary definition measurements.
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C & L-Band Separate Raman Fiber Amplifier
RFA7000
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Hangzhou Huatai Optic Tech. Co., Ltd.
1. Erbium-doped Fiber Amplifier, due to the multiple cascades and the accumulation of noise caused by spontaneous emission, will reduce the system CNR greatly and thus it will limit the transmission capacity and distance of the system. Raman Fiber Amplifier (RFA) is a newly designed fiber amplifier based on Stimulated Raman Scattering (SRS) effect. It is considered as the core technology of new generation DWDM fiber over-long communication. Compared with Erbium-Doped Fiber Amplifier, Raman amplifier has the advantage of low Noise Figure (NF), wider gain bandwidth, flexible gain spectral region and stable temperature. It is the only device that can operate in 1300~1600 nm.
