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Modulation Distortion Up To 125 GHz
S930712B
S930712B enables fast and accurate active device modulation distortion characterization under modulated stimulus conditions up to 125 GHz. The wide dynamic range and vector error correction of the PNA-X results in an extremely low residual EVM of the test setup, delivering you a complete picture of your device’s performance without test system interference. S93072B measures EVM, NPR, ACPR, and decomposes nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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PXIe-5668, Up to 26.5 GHz PXI Vector Signal Analyzer
783124-01
Up to 26.5 GHz PXI Vector Signal Analyzer - The PXIe‑5668 offers wide bandwidth with high-performance measurement performance and speed. It meets the challenging requirements of applications such as wireless communications, radio frequency integrated circuit characterization, RADAR test, and spectrum monitoring and signal intelligence. With its implementation as a PXI instrument, the PXIe‑5668 also features the fast measurement speed required for high-volume manufacturing test, and multi-instrument synchronization capabilities for phase-coherent MIMO test. You can use the optionally included PXIe-5698 preamplifier to improve dynamic range and sensitivity near the instrument noise floor.
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USB Data Communications Multiplexers
These USB multiplexers are ideal for the testing of multiple devices that use USB interfaces, allowing the test system to select one target device from many. The design is bi-directional to permit use as a multiplexer or de-multiplexer with no impact on performance and uses long lifetime electro-mechanical relays characterized for use in data communications systems.
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Intelligent Sensors
Silicon Labs is a leading supplier of intelligent sensor solutions that are characterized by superb reliability, compact size, high levels of integration and unmatched ease of use for a variety of applications. Our diverse sensor product portfolio includes optical sensors, digital relative I2C humidity and temperature sensor ICs, biometric sensors and capacitive touch sense microcontroller devices.
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Compound Semi | MEMS | HDD Manufacturing
KLA has a comprehensive portfolio of inspection, metrology, and data analytics systems to support power devices, RF communications, LED, photonics, MEMS, CPV solar and display manufacturing. High brightness LEDs are becoming commonly used in solid-state lighting and automotive applications, and LED device makers are targeting aggressive cost and performance improvements, requiring more emphasis on improved process control and yield. Similarly, leading power device manufacturers are targeting faster development and ramp times, high product yields and lower device costs, and are implementing solutions for characterizing yield-limiting defects and processes. KLA's inspection, metrology and data analytics systems help these manufacturers control their processes and increase yield.
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CG-MALS
Calypso II
Label-free, immobilization-free characterization of protein-protein and other macromolecular interactions with composition-gradient multi-angle light scattering.
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PNA-X Microwave Network Analyzer
N5245B
Simplify your test stations by replacing racks and stacks of equipment Increase productivity with the most integrated and flexible single-connection microwave test engine Reduce test time with the world's widest range of single-connection measurement applications Accurately test linear and nonlinear device characterization using advanced error correction Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
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X-Series Measurement Applications for EXT
A broad set of X-Series measurement applications for EXT enabling you to characterize, troubleshoot and rapidly create test code for the manufacture of your design.These applications are based on the library of over 25 X-Series measurement applications for benchtop signal analyzers.
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Teradyne Software Solutions
From design through production, whether developing and debugging code or performing characterization, Teradyne offers an array of seamless solutions that extend beyond our core software to reduce your engineering efforts and speed development.
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Parametric Curve Tracer Configurations
Keithley PCT
Developing and using MOSFETS, IGBTs, diodes and other high power devices requires comprehensive device-level characterization such as breakdown voltage, on-state current and capacitance measurements. Keithley's line of high power Parametric Curve Tracer configurations supports the full spectrum of device types and test parameters. Keithley's Parametric Curve Tracer configurations include everything necessary for the characterization engineer to develop a complete test system quickly.
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High-Resolution Precision SMU (10 FA, 210 V)
PZ2110A
The Keysight PZ2110A is a precision source / measure unit (SMU) that expands precise measurements from conventional static measurements and pulsed measurements, to fast dynamic measurements. It is ideal for a wide variety of current versus voltage (IV) measurement tasks that require both high resolution and accuracy. The PZ2110A can accurately perform characterization, parametric tests, and reliability tests of semiconductors, active / passive components, and general electronic devices.
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Science-Grade MWIR InSb Camera
FLIR A6700 MWIR
Designed for electronics inspections, manufacturing monitoring, scientific research, and non-destructive testing, the FLIR A6700 MWIR camera is ideal for high-speed thermal events and fast-moving targets. Short exposure times allow users to freeze motion and achieve accurate temperature measurements. In fact, the camera’s image output can be windowed to increase frame rates to 480 frames per second to accurately characterize even higher speed thermal events, helping ensure critical data doesn’t get missed during testing.
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PNA-L Microwave Network Analyzer
N5231B
Perform basic analysis of passive components and simple active devices Measure S-parameters with good accuracy up to 13.5 GHz in cost-sensitive applications Get the world's best price-to-performance ratio for microwave manufacturing Configure an economical solution for signal-integrity measurements and materials characterization Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
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Power Operational Amplifiers
ST offers a portfolio of power op-amps characterized for high output current, low drop and high gain. This makes them suitable for a wide range of applications and, in particular, for driving inductive loads such as motors and lamps, as well as in automotive applications offering superior performances. Our op-amps are available in insertion and surface-mount packages to meet different environmental requirements.
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PXIe-5652, 6.6 GHz RF Analog Signal Generator
781217-01
PXIe, 6.6 GHz, PXI RF Analog Signal Generator—The PXIe‑5652 features continuous-wave generation capabilities with FM, 2‑FSK, or OOK modulation. It uses direct digital synthesis (DDS) for high-resolution frequency hopping or phase-continuous sweeping for fixture and device characterization applications. The PXIe‑5652 is ideal for clocking nonstandard sample rates, such as WCDMA signals at baseband or intermediate frequency (IF). With these versatile signal generators, you can perform analog and digital modulation through the onboard DDS circuit, which gives you frequency modulation and frequency-shift keying for applications such as bit error rate test, antenna testing, or even keyless entry. You can also perform amplitude modulation using on-off keying.
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PXIe-5668, Up to 26.5 GHz PXI Vector Signal Analyzer
783156-03
Up to 26.5 GHz PXI Vector Signal Analyzer - The PXIe‑5668 offers wide bandwidth with high-performance measurement performance and speed. It meets the challenging requirements of applications such as wireless communications, radio frequency integrated circuit characterization, RADAR test, and spectrum monitoring and signal intelligence. With its implementation as a PXI instrument, the PXIe‑5668 also features the fast measurement speed required for high-volume manufacturing test, and multi-instrument synchronization capabilities for phase-coherent MIMO test. You can use the optionally included PXIe-5698 preamplifier to improve dynamic range and sensitivity near the instrument noise floor.
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Ensure Accurate Screening, Diagnosis and Monitoring
CT QA Solutions
Over 40 years of experience helping our customers with CT compliance and patient safety. From CT Perfusion verification, to Dual Energy Characterization, to daily, monthly and annual CT QC, Gammex is your trusted CT QA and compliance partner.
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LXI Microwave Matrix, 10GHz, Dual 3x3
60-750-233-B
The 60-750-233-B is a dual 3x3 10GHz microwave matrix with internal termination. It is part of the 60-750/751 range of LXI Microwave Switches controlled through an LXI compliant Ethernet connection. It is available in a variety of configurations and frequencies up to 18GHz (60-751). The matrix is characterized for 50 ohm applications, for 75 ohm versions please consult your local sales representative.
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Secondary Ion Mass Spectrometry (SIMS Analysis)
Rocky Mountain Laboratories, Inc.
Secondary ion mass spectroscopy is operated either in the dynamic mode (DSIMS) or the static mode (SSIMS). DSIMS is useful for profiling impurity and trace elements through films and interfaces. SSIMS is useful for characterizing polymeric materials and only measures the outermost molecular layer of a specimen.
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Display Measurement Systems
DTS Series
Instrument Systems Optische Messtechnik GmbH
Characterization of emissive, transmissive, reflective, and transflective displaysViewing-angle-dependent analysis of illuminance, contrast, color, and derived parametersDetermination of the electro-optical transfer function: analysis of luminance, contrast, and color depending on electrical driving conditionsMeasurement of transient properties, such as switching times, flicker, and modulation
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Test Solutions for Networked Vehicle Components/Connected Cars
Infotainment & Telematics
Developing automatic test systems for the automotive industry is one of our core areas. This industry in particular is characterized by rapid technological progress and ever faster time-to-market requirements.In the vehicle, multimedia devices are used for pure entertainment, but also as vehicle information, which are intended to cover security and navigation services.Infotainment and telematics devices such as eCall modules, connected gateways, instrument clusters or the HMI (Human Machine Interface) are networked with each other and with the most important vehicle functions. All of this is made possible - in addition to GNSS (Global Navigation Satellite System) - by wireless and new communication standards such as A 2 B, BLE, C-V2X, Wi-Fi 6 and 5G.The complex networking is a very attractive factor for drivers and passengers, but this complex communication can become a major challenge for developers.High-speed interfaces and high-frequency modules used in combination must send and receive signals between the different devices absolutely error-free.With our individual and sensitive test and inspection systems, we also simulate vehicle components or emulate the vehicle environment and thus ensure the functionality of your devices. We take your pioneering developments to the next level.
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IR/Visible Ranging Projectors
SBIR offers various ranging test bench systems that can be configured for non-infinity focus testing. Each system can be specifically designed for various tasks including characterizing the performance of IR and visible sensors and performing multi-sensor boresighting (IR to Visible to Laser).
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Thermal Test Chip
Thermal Engineering Associates, Inc.
Thermal Test Chips (TTC) are used in many different Applications: Package Thermal Characterization, Heat Source Simulator, Temperature Reference Platform, Transient Analysis, System Thermal Management Design, Thermal Interface Material (TIM) Measurement & Characterization, Heat Sink Measurement & Characterization.
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Handheld Fiber Optic Light Source
Anfkom International Co.,Limited
3109 optical light source can provide 1 to 4 output wavelengths to meet specific requirements,including the 650nm red source and the 1310/1550nm wavelengths for single mode fiber or the 850/1300nm wavelengths for multimode fiber,as well as other wavelengths according to customer needs.Together with the 3208 optical power meter, it is a perfect solution for the fiber optic network characterization.
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VNAs for Automated Test Equipment (ATE)
With our USB VNAs your automated test equipment works as one software system running on a single computer. We can customize the analyzer module to fit in your system, provide extra frequency range coverage as compared to our standard VNA models should you need it in your specific application or characterize the expected performance outside the frequency limits of our standard VNAs.
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Electrical Signal Test
High-density, multi-channel pulse pattern generators and bit error detectors for the design, characterization and production test of optical transceivers and opto-electrical components.
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Magnet Testing
Helmholtz Coils
A coil arrangement consisting of two coils with the same radius or edge length is called a Helmholtz coil. At the correct distance, these coils are arranged in parallel on the same axis and current flows through them in the same direction. Their magnetic field is then characterized by a large homogeneous area in the center of the coil, which is freely accessible for experiments and measurement tasks. Helmholtz coils can have a circular or square geometric shape.
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Squeak & Rattle Sub-System And Component Testing
At MB Dynamics, we’re proud to provide clients in a wide range of industries with quiet, custom turnkey component testing systems for combined squeak & rattle testing as well as durability testing of different components and subsystems (in 1 to 6 DOF). Test items can be excited in one or more axes to understand and characterize the physics and root causes of BSRs. Real-world, on-road vibration conditions are multi-axis simultaneous – vertical, fore-aft or longitudinal, lateral, roll, pitch, and yaw – 6 degrees of freedom or 6 DOF. Affordability drives decisions to find BSRs by exciting in one or two – fewer than 6 DOF. That has been a driving force for MB – be effective at finding BSRs with a lesser number of shakers (DOFs) and thus reduce the test equipment cost of finding BSRs. Vertical-only can be effective; sequential vertical then fore-aft then lateral is one step closer to real-world; creating vibration in four or five axes of response simultaneously is even closer; and full 6 DOF systems that are quiet come closest to duplicating in the lab the on-road conditions. MB offers all these possibilities to meet trade-offs of budget, test time, road replication, and BSR detection effectiveness.
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Glow Discharge Optical Emission Spectrometer
GD-Profiler 2™
The GD-Profiler 2™ provides fast, simultaneous analysis of all elements of interest including the gases nitrogen, oxygen, hydrogen and chlorine. It is an ideal tool for thin and thick films characterization and process studies.
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Stylus Profilometry
Dektak®
Bruker's Dektak stylus profilers are the product of over four decades of proprietary technology advances. They provide repeatable, accurate measurements on varied surfaces, from traditional 2D roughness surface characterization and step height measurements to advanced 3D mapping and film stress analyses. Dektak surface profilers have been widely accepted as a superior solution for measuring thin film thickness, stress, and surface roughness and form in applications ranging from educational research verification to semiconductor process control.
