Stimulus
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Product
True-Mode Stimulus
S93460B
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The S93460B provides mismatch-corrected true-mode stimulus and enables accurate balanced measurements on 4-port PNA or PNA-X network analyzers.
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Product
True-Mode Stimulus
S96460B
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S96460B provides mismatch-corrected true-mode stimulus and enables accurate balanced measurements on 4-port E5080B vector network analyzers.
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Product
Modulation Distortion Up To 26.5 GHz
S930702B
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S930702B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 26.5 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930702B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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Product
Fault Diagnostics in Power-Off State
QT55
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Qmax Test Technologies Pvt. Ltd.
Signature Method of Testing is also known as VI Trace Characteristics, is a proven fault diagnostics technique in Power-Off state while testing a board. By applying known wave from signal with desired Voltage, Source impedance and Frequency of the stimulus signals, depending upon the test node and its characteristics, a Voltage (V) vs Current (I) graph is plotted and studied.
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Product
VXI Precision Waveform Synthesizer
3151B
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The Racal Instruments™ 3151B Waveform Synthesizer combines 250 MS/s waveform generation performance, versatility, and compact size into a singleslot VXIbus format. The 3151B is a greatly improved version of a field-proveninstrument ideal for VXI test stimulus generation. It replaces the 3151A+ and other similar units which were standard on many military and commercial test platforms.
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Product
Power-Switching Test System
High Voltage Switching Test System
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The Accel-RF Power-Switching Test System is capable of measuring reliability under a variety of conditions for switching power applications up to 1kV (off) and 25A (on) at rates up to 1MHz switching frequency, dependent on voltage. By leveraging technology developed for the RF burn-in tray platform with new fast switching measurement techniques, this system can support testing of multiple devices under elevated temperature stimulus in a small physical area, and offers the flexibility to test both soft- and hard-switching applications. The Accel-RF Power-Switching System is the most flexible and accurate power switching platform available.
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Product
Modulation Distortion Up To 53 GHz
S95070B
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S95070B software enables fast and accurate active device modulation distortion characterization under modulated stimulus conditions up to 53 GHz. The wide dynamic range and vector error correction of the PXI VNA results in an extremely low residual EVM from the test setup, giving you a complete picture of your device’s performance without test system interference. S95070B software measures EVM, NPR, ACPR, and decomposes nonlinear signals and linear signals through spectral correlation between the input and output spectrum, without doing demodulation. Integration with the PXI VNA’s measurement flexibility enables you to do quick modulation distortion measurements along with traditional VNA tests.
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Product
Wafer Level Test Handler
Kronos
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Wafer level test handler for 6/9DOF sensors with real stimulus. Very high UPH capacity and the lowest cost of test (COT). KRONOS is one of the only wafer level test solutions for motion sensors with real stimulus.
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Product
Arbitrary Waveform Generator
AWG70000B
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The AWG70000B Series Arbitrary Waveform Generator represents the cutting edge in sample rate, signal fidelity and waveform memory, making it ideal for design, testing and operations of complex components, systems and experiments. With up to sample rate of 50 GS/s and 10-bit vertical resolution, it delivers the industry's best signal stimulus solution for easy generation of ideal, distorted and “real-life” signals.
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Product
Signal Generator
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Tektronix signal generators cover a wide range of applications, from replicating sensor signals to creating RF and the fastest high speed serial data signals. Each versatile signal generator can create a virtually unlimited number of signals - analog or digital, ideal or distorted, standard or custom. From the world's only direct synthesis of high-speed serial data waveforms for simplified receiver testing, to the world's most versatile arbitrary function generator for common stimulus signals, Tektronix has a signal generator to meet your debug challenge.
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Product
RF Automated Accelerated Reliability Test Station (AARTS)
RF-HTOL
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The RF Automated Accelerated Reliability Test Station (AARTS) systems are designed to stress devices with RF, DC, and thermal stimulus. The systems were designed from their inception to include RF stimulus - it was not added as an after-thought. Hence, the software and hardware are fully integrated and provide full-featured support.
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Product
PCI D/S, S/D, I/O & Comm Board
76CS3
Multifunction I/O
NAI’s 76CS3 is a PCI/PCIe multifunction I/O and communication board designed for applications requiring Digital-to-Synchro/Resolver (D/S) and Digital-to-LVDT/RVDT (DLV) stimulus output, as well as I/O and communication functions. This full-slot board contains five independent, function module slots. The board can be configured for 6 separate D/S channels, or for D/S in combination with I/O and communication modules. Using multiple DSPs, the enhanced motherboard enables higher processing power and dedicated pre-processing control for each module.
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Product
RF Sources
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Textron Systems’ commercial RF Sources (RFS 340, SSI) provide an unmatched combination of frequency coverage, power range, signal fidelity and switching speed in either a two-slot VXI, 1U LXI®, or VME Synthetic Stimulus Instruments (SSI) format.
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Product
Modulation Distortion Up To 13.5 GHz
S930701B
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S930701B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 13.5 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930701B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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Product
PCI and PCI-X Bus Analyzer / Exerciser
PCI850
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The PCI850 analyzer provides a multitude of functions to help analyze your system.- Capturing bus activity using sequential triggers and filters- Exerciser to perform memory, I\O and configuration cycles- Stimulus generation for hardware simulation- Target memory with addressable windows- Anomaly detection of protocol and timing violations- Performance analysis of utilization, transfer rates, latency, statistics- Compliance testing
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Product
Digital Wideband Transceiver Analysis
S94610B
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Digital Wideband Transceiver Analysis is an add-on software to Device Measurement eXpert (DMX) that adds cross-domain stimulus response measurements for digital/RF mixed-signal device characterization. Included Waveform Creator helps define digital IQ test stimulus waveforms that are used in the RF signal generators for receiver tests or downloaded to the digital-to-analog converters for transmitter tests. The DUT control is customizable to accommodate various data converters and transceiver types by defining device operation settings, transmit/receive switching, reading and writing digital IQ waveform from and to DUTs. Acquired RF or digital data is processed in the VNA’s applications for faster, accurate measurements and analysis.
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Product
Detector Test Bench
RTB 3000
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The RTB 3000 Detector Test Bench from Santa Barbara Infrared (SBIR) is a flexible integrated IR detector test station for evaluation of single element detectors, linear arrays, and focal plane arrays. The RTB 3000 provides the radiometric stimulus necessary to perform accurate IR detector testing in both laboratory and production environments.
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Product
Serial Analyzers
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This product enables passive monitoring, debugging, and target system analysis of all speeds of Serial RapidIO Gen2 and Gen1 from the physical coding-sublayer (PCS), through serial protocol, to full-duplex link protocol exchanges. Stimulus transmitters allow for injection of SRIO packets, control symbols, and 8b/10b characters.
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Product
MEMS Handler
4664-IH
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The ULTRA P is a high performance production handler that provides thermal conditioning, full 6 DOF mechanical stimulus and an electrical ATE signal path for testing Micro-Electro-Mechanical Systems (MEMS) Accelerometers and Gyroscopes.
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Product
VXI Video Processor System
65VP1
Processing Module
NAI’s 65VP1 is a Video Processor System (VPS) on a VXI board. Capable of highly accurate video stimulus and measurements, this state-of-the-art instrument is the culmination of over three generations of Automatic Test Equipment (ATE) development programs. It provides increased functional density, and it reduces power consumption, size, and cost of the overall system. The 65VP1 is ideally suited for defense and commercial ATE programs, including television applications.
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Product
VXI 12-Channel, 3-Wire LVDT/RVDT Simulation
65DL2
Simulator
NAI’s 65DL2 is a 12-channel, 3-wire, LVDT/RVDT Simulation Instrument on a VXI board. This single-slot, message-based board features up to 12 stimulus channels of 3-wire LVDT/RVDT, wraparound self-test, and onboard programmable excitation supply. The board is uniquely versatile, as each excitation input and output voltage is programmable. In addition, each channel can be programmed to be controlled by an external DC voltage. A replacement for the 5410C-83, the 65DL2 is ideally suited for defense, commercial aerospace, and industrial applications.
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Product
Sensors Test Cells
Integrated MEMS
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The best technical performance, cost optimization, one-shot factory integration.A single unit integrates the modules for the handling, contacting and complete testing of MEMS devices, including the physical stimulus for functional test, and the tri-temp thermal conditioning.
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Product
Modulation Distortion Up To 8.5 GHz
S930700B
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S930700B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 8.5 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930700B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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Product
Stimulus Test Cell
HA7200
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The HA7200 enables these improvements by providing high-speed, high-accuracy temperature and pressure test for automotive sensor R&D and production. Advantest’s proprietary temperature control technology delivers an optimized test solution for high-spec pressure sensors across a broad range of temperatures, in the automotive industry and beyond.
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Product
JTAG Boundary-Scan I/O Modules
SCANIO Family
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The Corelis family of SCANIO™ modules turn any IEEE standard 1149.1 boundary-scan controller into a powerful digital boundary-scan tester. The SCANIO family of products use boundary-scan gate arrays to add control and visibility to connectors, traces, and logic that can not be tested using traditional boundary-scan techniques.The SCANIO products, when combined with a boundary-scan controller, operate as a traditional “bed-of-nails” tester except access to the stimulus and response I/O’s is achieved via boundary-scan.
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Product
Modulation Distortion Up To 50 GHz
S930705B
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S930705B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 50 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930704B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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Product
RF-Ready DC Fixture
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The RF-Ready DC fixture provides space for mounting RF input and output matching circuits. Hence, it is possible to tune up the assembly at a remote test station, such as a network analyzer, to peak performance and then run the life test with DC stimulus. The matching structures also allow incorporation of more complex stabilization structures.
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Product
Stimulus Induced Fault Testing
SIFT
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SIFT allows for the analysis of numerous stimuli to identify speed, fault, and parametric differences in silicon. The heart of the SIFT technique revolves around intentionally disturbing devices with external stimuli and comparing the test criteria to reference parts or timing/voltage sensitivities. Synchronous interfacing is possible to any tester without any wiring or program changes. The system can be based on either a motorized probe station or portable microscope stand for test head applications.
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Product
HV AC Hipot
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The HV AC Hipot package is a hardware and software upgrade available for select Eclypse Analyzers. This package adds a High Voltage AC stimulus source CCA to the analyzer chassis and the HV AC Stimulus utility provides the software drives for ELITE to integrate AC Hipot into test programs.
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Product
16-Channel 500kSa/s USB Modular Multifunction Data Acquisition
U2353A
Data Acquisition Module
The U2353A offers multifunction capabilities in a module. It can be used like a digital multimeter in polling mode. It can be transformed to be a simple scope using the continuous mode with simple triggering capabilities. No matter if it is used as a standalone module or when plugged into a U2781A USB modular instrument chassis, the synchronization and triggering capabilities allow great flexibility in making the desired measurements. With the analog output being able to send out predefined or arbitrary waveforms make this a good tool when closed loop feedback or stimulus is required. The digital IO channels allows for closed loop control through connections to switches, relays and solenoids. The burst mode enables the U2353A to simulate simultaneous analog input acquisition.
