Stimulus
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Product
True-Mode Stimulus
S96460B
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S96460B provides mismatch-corrected true-mode stimulus and enables accurate balanced measurements on 4-port E5080B vector network analyzers.
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Product
True-Mode Stimulus
S95460B
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S95460B provides mismatch-corrected true-mode stimulus and enables accurate balanced measurements on M980xA PXI vector network analyzers.
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Product
DC Bias and RF Stimulus Control Module
Quantum SMART Fixture
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Accel-RF Corporation, the world leader in turnkey RF automated reliability test instruments, has "unplugged" the industry-leading RF SMART Fixture from their automated test platform and made it available for benchtop test. The NEW Quantum SMART Fixture is a programmable self-contained DC bias and RF stimulus control module capable of synchronizing sequenced independent pulsed-bias and pulsed-RF signals to a DUT or remote fixture. The signals are controlled from a user interface compatible with Accel-RF's LIFETEST software. The Quantum SMART fixture is capable of "active" temperature control and monitoring of a remote DUT through embedded firmware in the microprocessor
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Product
64-Channel 1MSa/s USB Modular Multifunction Data Acquisition
U2331A
Data Acquisition Module
The U2331A offers multifunction capabilities in a module. It can be used like a digital multimeter in polling mode. It can be transformed to be a simple scope using the continuous mode with simple triggering capabilities. No matter if it is used as a standalone module or when plugged into a U2781A USB modular instrument chassis, the synchronization and triggering capabilities allow great flexibility in making the desired measurements. With the analog output being able to send out predefined or arbitrary waveforms make this a good tool when closed loop feedback or stimulus is required. The digital IO channels allows for closed loop control through connections to switches, relays and solenoids. The burst mode enables the U2331A to simulate simultaneous analog input acquisition.
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Product
True-Mode Stimulus
S93460B
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The S93460B provides mismatch-corrected true-mode stimulus and enables accurate balanced measurements on 4-port PNA or PNA-X network analyzers.
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Product
Detector Test Bench
RTB 3000
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The RTB 3000 Detector Test Bench from Santa Barbara Infrared (SBIR) is a flexible integrated IR detector test station for evaluation of single element detectors, linear arrays, and focal plane arrays. The RTB 3000 provides the radiometric stimulus necessary to perform accurate IR detector testing in both laboratory and production environments.
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Product
Multi-Wafer Test & Burn-in System
FOX-XP
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The key features of the new FOX-XP test cell that contribute to the cost-effectiveness of the solution include the ability to provide up to 2,048 "Universal Channels" per wafer, which allows the system to test all the devices on the wafer in parallel. The new "Universal Channel" architecture allows any channel to be any function (I/O, Device Power Supply (DPS) or Per-pin Precision Measurement Unit (PPMU)). This enhanced architecture now allows customers to perform per pin parametric testing, more extensive digital pattern test with deeper data stimulus / capture memory (32M per pin), and deeper scan (768M) optimized for BIST/DFT testing.
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Product
ARINC HSI / ADI Test Fixture
TA-2000
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The TA-2000 test fixture is a combination panel that incorporates all the standard capabilities of the legacy CTS-11(ADI) and CTS-12(HSI) panels and much more. This panel is married to our model TA-1001 dual synchro transmitter/API panel thus allowing for local stimulus and alignment of the instruments synchros and resolvers. The panel provides for testing of both superflag(28v) and low level meters through a matrix of switching that will allow testing of all meters simultaneously or just individually. The low level meter drive circuit also incorporates an automatic mode that will continuously oscillate the L/R and Up/Dn pointers.
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Product
Modulation Distortion Up To 70 GHz
S930707B
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S930707B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 70 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930707B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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Product
6U CPCI D/S, S/D, I/O & Comm Board
78CS2
Multifunction I/O
NAI’s 78CS2 is a 6U cPCI Multifunction I/O and Communication Board designed for applications requiring Digital-to-Synchro/Resolver (D/S) stimulus output, as well as I/O and communication functions. This board contains five independent function module slots. The board can be configured for 10 D/S channels, or for D/S in combination with I/O and communication modules. Additional enhancements include FIFO data buffering for select modules. Using multiple DSPs, the enhanced motherboard enables higher processing power and dedicated pre-processing control for each module.
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Product
RF-Ready DC Fixture
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The RF-Ready DC fixture provides space for mounting RF input and output matching circuits. Hence, it is possible to tune up the assembly at a remote test station, such as a network analyzer, to peak performance and then run the life test with DC stimulus. The matching structures also allow incorporation of more complex stabilization structures.
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Product
Carbon Monoxide Detector Tester
Solo C3
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Many multi-sensor fire detectors detect carbon monoxide (CO) as well as smoke and / or heat. Under international codes and standards the CO cell needs to be functionally tested with a CO stimulus from the protected area through the detector vents to the sensor.
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Product
Chroma LCR Meters
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Chroma Systems Solutions, Inc.
Some of the key features to look for in an LCR meter (also known as an impedance meter) are: accuracy, test frequency, measured parameters, test voltage and test current. Additionally, an easy to understand display of test results and the ability to access and use these results has become increasingly important. Component testing often requires much more than simply a resistance, capacitance or inductance value at a given test frequency and stimulus voltage. An LCR meter or impedance meter must have the flexibility to provide multi-parameters over wide frequency and voltage ranges.
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Product
PXI 8/16-Channel Isolated D/A Converter
M9185A
Digital / Analog Converter
The M9185A is a fully independent, isolated D/A converter that is capable of supplying high voltage levels in parallel of up to eight or sixteen channels. Each channel is able to output up to 16V as stimulus signals to Device Under Tests (DUTs).
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Product
LASAR Post Processor, Run Time And Diagnostic Test Solution
DtifEasy Series
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DtifEasy is a full-featured tool set for importing, converting, and executing IEEE-1445 compliant digital test vectors generated by a LASAR simulation. All four IEEE-1445 file types - UUT model group, Stimulus and Response group, Fault Dictionary group, and Probe group are supported by DtifEasy; providing the user with the ability to execute go/no-go, fault dictionary, and guided probe sequences. DtifEasy supports MTS' 3U PXI GX529x series of dynamic digital instrumentation to 200 MHZ as well as the 6U PXI GX5960, 50 MHz digital instrumentation. All of these instrument families are compatible with the digital logic probe.
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Product
Protocol Analyzer and Exerciser
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Keysight's protocol test solutions for each technology typically consists of both protocol analyzer application as well as a stimulus solution, such as an exerciser or traffic generator. Keysight's protocol test solutions combine multi-protocol analysis, traffic generation, performance and conformance verification to debug, validate and optimize your designs using high speed protocol standards.
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Product
CXA-m PXIe Signal Analyzer
M9290A
Signal Analyzer
Deploy a smaller microwave footprint, no trade-off in precision: Rely on fully specified performance up to 26.5 GHz in 4 slots Optimize your balance between speed, sensitivity and accuracy with the choice to operate in swept or FFT modes Perform fast calibrated stimulus response measurement with full-band tracking generator Smooth the transition between R&D, manufacturing, and maintenance: CXA-m is code compatible with benchtop X-Series signal analyzers and ESA spectrum analyzers
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Product
Arbitrary Waveform Generator
AWG70000B
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The AWG70000B Series Arbitrary Waveform Generator represents the cutting edge in sample rate, signal fidelity and waveform memory, making it ideal for design, testing and operations of complex components, systems and experiments. With up to sample rate of 50 GS/s and 10-bit vertical resolution, it delivers the industry's best signal stimulus solution for easy generation of ideal, distorted and “real-life” signals.
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Product
Tri-Temp Strip Level Test Instrument
Apollon
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APOLLON is a tri-temperature strip-level test system for motion sensors. It is especially designed for high-end Automotive and Industrial applications. APOLLON offers extremely good testing conditions: high stimulus and temperature accuracy and low noise level.
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Product
Measurement and Analytics Solutions
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Based on our OTP² system platform, we were able to implement a family of scalable test systems which is based on a common systems architecture, e. g. for products in the area of chemical analytics measurement. We not only implemented a universal, extremely comprehensive test system, but also a series of compact systems for benchtop placement which are fully compatible with the larger, universal system. Our specialized self-test adapters and test software enable fast verification of the test systems as well as partly automated calibration by the customer.Our systems are also used in electrical measurement applications, e. g. for calibrating analog input assemblies for PLC technology. For this purpose, specialized calibrators are integrated into the system; they provide traceable calibration of the relevant stimulus signals.
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Product
Frequency Response Analyzers
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Frequency Response Analysis (also referred to as Transfer Function Analysis) measures the output spectrum of a system relative to a stimulus, and is used to characterize the dynamics of the system under test. The technique measures the magnitude and phase relationship between output and input waveforms as a function of frequency. The input signals may be from a wide range of sensors including acoustic (microphones/sonar), mechanical (accelerometers/displacement transducers), optical (photodetectors), and electrical (amplifiers).
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Product
VXI Precision Waveform Synthesizer
3151B
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The Racal Instruments™ 3151B Waveform Synthesizer combines 250 MS/s waveform generation performance, versatility, and compact size into a singleslot VXIbus format. The 3151B is a greatly improved version of a field-proveninstrument ideal for VXI test stimulus generation. It replaces the 3151A+ and other similar units which were standard on many military and commercial test platforms.
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Product
200 MS/s Waveform Generator & Dual 50 MHz Pulse/ Timing Generator
3172
Pulse Generator
The Racal Instruments™ 3172, a 200 MS/s Waveform Generator and Dual 50 MHz Pulse and Timing Generator, combines multi-instrument density and highfrequency performance in a single-slot, C-sized VXIbus format.Waveform output in the range of 100 μHz to 30 MHz with 16-bit vertical resolution (12-bit vertical for 3171 emulation) and pulse output to 50 MHz make the 3172 a powerful solution to a variety of test stimulus requirements.
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Product
VXI Precision PLL Waveform Synthesizer
3152B
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The Racal Instruments™ 3152B Waveform Synthesizer combines 250 MS/s waveform generation performance, versatility, and compact size into a single-slot VXIbus format.The 3152B is a greatly improved version of a fi eld-proven instrument ideal for VXI test stimulus generation. It replaces the 3152A which is standard on many military and commercial test platforms
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Product
Modulation Distortion Up To 26.5 GHz
S930702B
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S930702B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 26.5 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930702B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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Product
16-Channel 500kSa/s USB Modular Multifunction Data Acquisition
U2353A
Data Acquisition Module
The U2353A offers multifunction capabilities in a module. It can be used like a digital multimeter in polling mode. It can be transformed to be a simple scope using the continuous mode with simple triggering capabilities. No matter if it is used as a standalone module or when plugged into a U2781A USB modular instrument chassis, the synchronization and triggering capabilities allow great flexibility in making the desired measurements. With the analog output being able to send out predefined or arbitrary waveforms make this a good tool when closed loop feedback or stimulus is required. The digital IO channels allows for closed loop control through connections to switches, relays and solenoids. The burst mode enables the U2353A to simulate simultaneous analog input acquisition.
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Product
Platforms
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The use of switching systems to route instrumentation and stimulus signals to appropriate test points on a unit under test has a very crucial role to play in most electronics test systems. The sharing of test resources, connection of calibration references, load management, and many other functions are all managed by the switching system, the switching system acts as the interface between the unit under test (UUT) and the test equipment.
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Product
Accessories: Mobile Vibration System
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The Mobile Vibration System from Copernicus Technology is a new and affordable system for applying vibration stimulus during testing work, with a range of features that make it highly adaptable and fully configurable by the user.
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Product
Characterization Platform
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This standalone integral software and hardware platform is capable of functioning as an independent single-channel or virtual multi-channel characterization test subsystem. The platform is USB controlled to provide temperature, RF-signal and bias-control to a device-under-test (DUT) for semiconductor performance measurement. When used in conjunction with Accel-RF's embedded Pulser-Card Assembly, the test device is capable of pulsed DC and RF stimulus.
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Product
Modulation Distortion Up To 43.5 GHz
S930704B
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S930704B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 43.5 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930704B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
