Device Under Test
a specific purpose component or module check; ex. substantial component of a PCB.
See Also: DUT, Unit Under Test, EUT
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Test & Burn-In Socket for Devices up to 13mm Square
CSP/MicroBGA
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Test & Burn-In Socket. Socket is easily mounted and removed to & from the BIB due to solderless pressure mount compression spring probes which, are accurately located by two molded plastic alignment pins and mounted with four stainless steel screws. Standard molded socket format can accommodate any device package of 13mm or smaller, by using machined (for small quantities) or custom molded (for large quantities) pressure pads and interposers.
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Product
Power Device Test Systems
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Power semiconductors are devices that control electric power, and are used in automobiles and a wide range of electrical products. Our power semiconductor test systems, developed and provided by CREA, an Advantest Group company, specialize in testing power semiconductors that handle high voltages and large currents, and have special safety features for this purpose.
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Product
Oscilloscope Device
Oscilloscope
Oscilloscope Devices are flexible, software‐defined instruments that are versatile enough for both time‐ and frequency‐domain measurements and are offered in industry-standard form factors like PCI and USB. They feature up to eight channels that can sample at speeds up to 2 GS/s. The devices also feature numerous triggering modes, deep onboard memory, and driver software API that includes data streaming and analysis functions.
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Product
Smart Network Emulation for All Mobile Device Tests
CMWcards
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Use R&S®CMWcards to prepare the tests you always wanted, but never found the time to set up. Create wireless signaling and application tests on the R&S®CMW500 wideband radio communication tester just by setting up a hand of cards – no programming required. Revolutionary card wizards and unique game rules guide you through setting up test sequences that fully comply with test specifications. Thanks to the R&S®CMW500 tester’s unrivaled multi-technology capability, R&S®CMWcards can be used to rapidly reproduce signaling scenarios for various wireless communications standards.
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Product
HighFfrequency Test Devices
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VI Systems now releases engineering prototype samples of high performance transmitter and receiver optical subassemblies (TOSAs and ROSAs) for 25 Gbit/s and 40 Gbit/s applications and product development.
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Product
Crypto Devices
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Confidential communications are essential to armed forces and government authorities. The Rohde & Schwarz crypto devices provide secure end-to-end encryption for the secure transmission of sensitive information over public communications networks or radio transmissions. Rohde & Schwarz crypto devices are interoperable with HF/VHF/UHF radios, satellite communications and line transmission equipment. They can encrypt and decrypt voice and data communications at the highest security levels. The crypto devices are ideal for stationary and mobile platforms in rugged terrain and in naval and airborne environments.
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Product
High-Voltage Test Device
PGK 150 HB
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Cable testing and diagnostics with the BAUR PGK HB. There are hardly any other longer-lasting, more robust and cost-effective testing devices than the two-piece high-voltage test devices from the PGK HB series. They generate continuous adjustable test voltages with mains frequency or optionally DC with positive or negative polarity. The display instruments for current and voltage, the safety control unit and the regulating transformer for the voltage are integrated in the operating unit.* Operation as DC or AC testing device* Polarity of the DC voltage can easily be reversed* Robust and durable
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Product
IEC61588 Mandrel Test Device
CX-KD13
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Shenzhen Chuangxin Instruments Co., Ltd.
This Mandrel Test Device conforms to IEC60588-1 Fig6 and IEC60065 Fig14--16.The test shall be performed by fixing the specimens of thin sheets on a mandrel made of nickel plated steel or brass with smooth surface finish.
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Product
Device Characterization
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Probe systems for device characterization must be particularly flexible because many different measurements often must be performed; DC, IV/CV, Capacitance, HF, 1/f, temperature and more. The modular architecture of the PS4L product line is ideal for these broad requirements.
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Product
Electricity Metering Device
Mk7B
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Designed for residential and commercial use, the Mk7B can operate in credit or prepayment mode. It has a 100 Amp relay for remote connect/disconnect of electrical services.
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Product
NFC Conformance Test System
T3111S
Test System
The T3111S RIDER NFC Conformance Test System is the Keysight solution for RF Analog and Digital Protocol testing of NFC, EMV and ISO devices. The Test System is based on the Keysight T1141A NFC Test Set and it is complemented by the Keysight's or FIME's robots for accurate and repeatability RF testing. Selected 3rd party positioning robots can also be supported.
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Product
Device Specific Kits
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Kits contain specific type of the measuring device and is packed with typical accessories
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Product
Wireless Device Test Sets & Wireless Solutions
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Keysight products provide mobile phone designers and manufacturers with increased measurement speeds, improved accuracy, and exceptional flexibility for testing mobile devices. Our one box test sets cover all the major technology formats: LTE-Advanced, LTE (FDD and TDD), GSM/GPRS/EGPRS/E-EDGE, W-CDMA/HSPA/HSPA+/DC-HSDPA, cdma2000®/1xEV-DO/eHRPD, TD-SCDMA/TD-HSDPA/TD-HSUPA, IS-95, TIA/EIA-136, AMPS, Bluetooth®, Bluetooth Enhanced Data Rate (EDR), Bluetooth Low Energy, ZigBee™, Wireless LAN (WLAN), 802.11a/b/g, 802.11n, NFC/EMV, MIMO, and WiMAX™.
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Product
Data Logging Device
E84 DLD
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Finally the solution every field technician and equipment owner needs to quickly locate and resolve signal anomalies, dropouts and glitches that cause E84 handoffs to fail. This next generation recording device is a small self-contained unit that inserts between the passive equipment and PI/O transceiver to capture and write E84 handshakes to its non-volatile memory.
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Product
Laser Diode Burn-in Reliability Test System
58604
Test System
The Chroma 58604 is a high density, multi-function, and temperature controlled module for laser diode burn-in and lifetime tests. Each module has up to 256 SMU channels which can source current and measure voltage in various control modes as described below.
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Product
Electricity Metering Device
Mk7A
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Built on the advanced Atlas metering platform, the Mk7A is a single phase 2-element meter which integrates both a 100A UC3 compliant relay and 40A UC2 compliant load control relay which allows disconnection and reconnection of electrical services remotely.
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Product
Scienlab Battery Test System – Pack Level, 110 KW Compact Version
SL1710A
Test System
Compact solution for testing Battery Packs with output power up to 110 kW and voltage range up to 1500 V
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Product
High-Voltage Test Device
PGK 70 HB
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Cable testing and diagnostics with the BAUR PGK HB. There are hardly any other longer-lasting, more robust and cost-effective testing devices than the two-piece high-voltage test devices from the PGK HB series. They generate continuous adjustable test voltages with mains frequency or optionally DC with positive or negative polarity. The display instruments for current and voltage, the safety control unit and the regulating transformer for the voltage are integrated in the operating unit.* Testing of medium- and high-voltage cables* DC voltage testing of up to 70 kV output voltage with positive or negative polarity* AC voltage testing - up to 55 kV for switchgear, busbars and insulating elements* Easy-to-maintain 2-piece design
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Product
In-line High-Density ICT System Series 7i
E9988GL
In-Circuit Test System
The E9988GL Keysight i3070 Series 7i Inline High-Density In-Circuit Test (ICT) system brings industry-leading ICT technologies into your automated manufacturing line, saving resources and optimizing your automated test strategy.
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Product
Imaging Devices
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High quality imaging devices with double or simple telecentric objectives offering exceptional spatial resolution with high FOV. Dedicated to high quality measurements whatever your display size.
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Product
Integrated Passive Devices
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Macom Technology Solutions Holdings Inc.
MACOM’s new Integrated Passive Devices (IPD) products can be used in a wide range of aerospace and defense, wireless, and test and measurement applications. These IPD devices implement various functions such as baluns, couplers and power dividers, and are available in PQFN or bare die. Operating over the 2 GHz to 20 GHz frequency range our IPD products offer excellent performance over wide bandwidths.
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Product
Large Current Battery Short Circuit Test Device
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Guangdong Bell Experiment Equipment Co.,Ltd
DGBELL Large Current Battery Short Circuit Test DeviceApplication: Battery Module, Battery Pack, Battery System short circuit.Short Circuit Mode: Pneumatic drive contact + Vacuum Interrupter
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Product
Socket Outlet Torque Test Device
CX-LJ
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Shenzhen Chuangxin Instruments Co., Ltd.
For measuring and testing the torque strain exerted by appliances with plug pins on socket-outlets, in accordance with IEC 60065 clause 15.4.1 and figure 11, IEC 60335-1 clause 22.3, IEC 60884-1 clause 14.23.2.
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Product
Ultra-high Performance Solution for Memory Device Test
Magnum EPIC
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Teradyne’s Magnum EPIC is a high-performance test solution for latest generation DRAM devices. These devices are key enablers for technologies like 5G, AI, cloud computing, autonomous vehicles, AR/VR and applications with high definition graphics.
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Product
Device Thermal Test Systems
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Thermal Engineering Associates, Inc.
Thermal test system combines the test and measurement capability of dedicated instruments with the ease of operation and data collecting capability offered by graphical-user-interface-driven software operating on an integrated computer.Diodes (PN, Schottky, LED, varactor, PIN), Stacked Diodes (Hi-V Rectifiers & LEDs), Laser Diodes, Transistors (Bipolar, MOSFET, IGBT) & Diodes, Integrated Circuits (Application & Thermal Test Die).
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Product
Discrete Devices High-speed Testing System
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QT-6000 discrete device high-speed testing machine is suitable for testing small and medium-power diodes, transistors, field effect transistors and other products and wafers. It can expand built-in capacitance testing (DC+CAP), EAS, VC, pA modules, as well as external LCR (ultra high precision capacitance testing), Scanbox, etc. The machine can be used for FT mass production testing or laboratory testing.
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Product
VITA 62, 3U Test Fixture
TF-3U-7B041-1
Test Fixture
This Power Supply test fixture is being proposed as a tool for checking Injector / Ejector operation, proper alignment of the VITA 62 connector and proper alignment of both keys on a Single slot, 3U, VITA 62/SOSA power supply.
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Product
PXI Semiconductor/IC Test System
Test System
A high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO card consists of a Sequencer Pattern Generator (SQPG) and 32 channels of full ATE-like features. The 33010 IO card is expandable up to 256 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/ PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.
