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Power Test Systems
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Automatic Test System
Automatic Test system is the ultimate solution for power electronic testing. The system includes a wide range of hardware choice such as AC/DC Sources, Electronic Loads, DMM, Oscillate Scope, Noise Analyzer and Short /OVP Tester. This flexibility combined with its open architecture software platform-PowerPro III, gives users a flexible, powerful and cost effective test system for almost all types of power supply testing.
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Real Time Audion Spectrum Analyzer
TrueRTA's audio spectrum analyzer software shows you a detailed picture of what you're hearing in real-time, that is, as it happens. You can create your own professional measurement system starting with TrueRTA software on your PC. Then add the measurement microphone, preamp and USB interface of your choice. TrueRTA accurately tests audio systems using a Windows PC with basic sound capability. TrueRTA turns your PC into a powerful audio test system normally seen only in better audio research and design laboratories. TrueRTA runs under Windows Vista, 7, 8 and 10.
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Protection Relay Testing
ARTES
Compact, powerful relay test systems for carrying out highly complex tests with ease and precision. The test systems of the ARTES product line are used to carry out functional tests on all types of protection devices, including DT/IDMT relays, distance protection relays and differential protection relays, to ensure that they function correctly. More than 20 years of experience in developing and manufacturing automatic relay test systems have gone into creating the fourth generation of ARTES test instruments.
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Integrated Transformer Test Van
XD90
Hangzhou Xihu Electronic Institute
The XD90 integrated modular power system testing vehicle provides an integrated yet flexible solution of preforming a wide selection of normal and specialty tests on power equipment. Designed with the effectiveness and efficiency of power testing in mind, this platform achieves the goal of “integration of functions” instead of just a “combination of instruments”. Not only it provides an abundant means of power testing, but with optimized device placement, operational convenience, and safety factor.
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Switching Power Supply ATS (SMPS ATS)
8200
Chroma Power Supply Auto Test System model 8200 provides complete solution for PC ATX power supply, adapter and battery charger testing. The application oriented system structure makes it the most cost effective test equipment for initial test in power supply production line. To meet the power supply test requirements, Chroma Power Supply Auto Test System model 8200 has built in 20 ready-made test items. Users can simply enter the test conditions and test the power supply features while proceeding. With the report and management functions, Chroma Power Supply Auto Test System model 8200 is able to provide versatile tools to establish test documents and perform system administration.
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Saluki S8723X Series USB CW Power Sensor (9kHz - 40GHz)
S8723X series is a diode detector USB power sensor based on a USB 2.0 full-speed/high-speed adaptive interface. It has a wide frequency range and large power dynamic range. It can be connected to a computer or other electronic measuring instruments, easy to set up a power test system, particularly useful for field and other low-cost production line testing and power testing.
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Power Device Test Systems
Power semiconductors are devices that control electric power, and are used in automobiles and a wide range of electrical products. Our power semiconductor test systems, developed and provided by CREA, an Advantest Group company, specialize in testing power semiconductors that handle high voltages and large currents, and have special safety features for this purpose.
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IOL & Power Cycling Test Systems
Our IOL & power cycling systems increase measurement quality and throughput and reduce testing costs on an open platform. The focus is on seamless monitoring and precise determination of all parameters of each DUT. In addition, the systems are equipped for the special requirements of wide-bandgap technology.
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IEC61850 Digital Substation Testing
With the development of power system, more and more digital substation based on IEC61850 has been built in the world. IEC61850 is the new communication protocol which is adopted by power system so as to change the analog complicated wiring connection and protocol conversion. Based on IEC61850, all Messages, such as GOOSE, SV, MMS, PTP, etc, could be communicated on the Ethernet via fiber optical cable connection. In China, the digital substation have started since 2003, until now there are already more than 6000 digital substation put on operation, China Power Grid is planning to build 5000 more new digital substations. PONOVO, as the leading power system testing solution provider, have launched plenty of IEC61850 digital testing tools, not only digital relay test set, but also MU test set, multi-functional analyzer, 24 hours online monitoring and analyzing system, etc so that users could have suitable testing equipment for the digital substation commissioning and testings.
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EMC Compliance Test Systems
ECTS2
Now in its second generation, the ADAPTIVE POWER EMC Compliance Test Systems use a greatly enhanced harmonics and flicker measurement system and newly designed flicker impedance options to support single and three phase AC harmonics, flicker and AC and DC immunity compliance testing up to the maximum required current of 75A per phase.
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Grid-Connection Testing System
This system is a power supply test system that performs grid-connection testing of distributed power sources (solar cells, fuel cells, gasoline engines, etc.)Enable inverter device testing that complies with the Agency for Natural Resources and Energy’s “Guidelines for System Interconnect Technical Requirements” and the Japan electrical Safety & Environment Technology Laboratories (JET) publication “Testing Methods for Small Solar Cell Power Generation System and System Interconnection Safety Devices”.
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Power Supply Test Systems
FineSoft on LabWindows CVI platform 2 testers connected with Ethernet hub to dedicated server GPIB Test.
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Switchgear Testing Solutions
IES Systems is a world leader in the design and manufacturing of power switchgear test systems.*GFCI/AFCI Circuit Breaker Test Solutions*Medium Voltage Breaker Test Solutions*Residential Circuit Breaker Test Solutions*Molded Case Circuit Breaker Test Solutions*AIR Circuit Breaker Test Solutions*Vacuum Bottle Test Solutions
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Power Distributions
LXinstruments Power Distribution Units (PDU) provide all of the functionality required to power a test system in a compact 19-inch rack. This means that devices can be supplied with both mains voltage and DC voltage. With the soft-on-off function, the PDU can be controlled remotely via remote buttons and other potential-free contacts. We carry single-phase devices for the 16 A connection to three-phase devices for the 3x63 A or for the 125 A connection.
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AC Resonant Test System
Yangzhou Power Electric Co., Ltd
Testing of certain apparatus requires much high voltage or current that a straight AC test system is not sufficient. Thus resonant test reactor with a variable core is needed. The main advantage of such test systems is lower input power and larger output power. The resonant test system is designed to compensate capacitance in the testing circuit precisely by tuning inductance of the test system. AC resonant test system is used for factory testing of middle, high and ultra-high voltage cables, capacitors, generators, motors, power transformers and gas-insulated switchgears.
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Test & Test Development for Circuit Card Assembly
Teledyne Advanced Electronic Solutions performs comprehensive testing at the CCA and system level assembly. Teledyne AES can perform testing developed by the customer or develop a complete test strategy for the customer’s products.- Bed of Nails FixtureIn-Circuit Test (Bed of Nails) or Flying Probe Testing for rapid feedback on CCAs- Functional testing of CCAs or complete systems- Environmental testing to include vibration, thermal cycling, HASS, etc.- CCA and system level test development- High frequency testing – currently to 40 GHz- High power system testing – currently to 4kW
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VLSI Test Systems
50/100 MHz clock rate50/100 Mbps data rate1024 I/O pins (Max :1280 I/O pins)Up to 1024 sites Parallel testing32/64 M pattern memoryVarious VI sourceFlexible HW-architecture (Interchangeable I/O, VI, ADDA,)Real parallel trim/match functionTime & frequency measurement unit (TFMU)High-speed time measurement unit (HSTMU)AD/DA test optionSCAN test option (max 1G M/chain)ALPG test option for embedded memorySTDF tools supportTest program/pattern converter(J750, D10, V50, E320, SC312, V7, TRI-6020, ITS9K)User friendly windows 7 environmentCRAFT C/C++ programming languageSW (Software) same as 3380P & 3360P
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Photonics Module Test System
58625
Chroma 58625 provides characterization testing for 3D sensing illumination devices. various test modules are combined for validation testing under precise temperature control.
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Communications Test System for Frontline Diagnostics
ATS3000P
The ATS3000P is designed using Astronics Test Systems’ proven Synthetic Instrumentation architecture. Featuring 23instruments, and both Automated and Standalone modes to test, record, and diagnose faults, the unit provides complete RF, Analog and Digital capabilities. The ATS3000P also includes the sophisticated IF and baseband I/Q DigitalSignal Processing required for modern radios. The fieldupgradeable, software-defined architecture features easyto-use graphical user interfaces and enables testing with minimal operator intervention. Test Program Sets are available for a full range of tactical radios, or you can create new TPSs easily using the included TestEZ® software suite.
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NI Semiconductor Test Systems
The STS delivers the openness and flexibility of the NI PXI platform to the semiconductor production environment. For easy integration into the production test cell, the STS comes with features such as handler/prober integration, spring probe device under test interfacing, STDF data reporting, and system calibration.
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VLSI Test System
3380P
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (512 I/O pins to test 512 ICs in parallel) that can meet the upcoming higher IC testing demands.
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BMS Manufacturing Test System
The Battery Management System (BMS) Manufacturing Test System performs functional testing of product during end-of-line manufacturing. The system hardware includes all instrumentation to test a BMS, including multiple cell simulators, a mass interconnect for quick product transition and bed-of-nail fixtures to ensure less down time, higher throughput, and easy maintenance. The system application easily integrates into manufacturing processes, provides a method to test multiple product types, and optimizes tests to ensure only good product is released from manufacturing.
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Test System
BMS HIL
The BMS Hardware-in-the-Loop (HIL) Test System is a high performance platform providing all necessary input signals used for battery pack simulation. A real-time operating system executes complex cell and pack models commonly used for BMS algorithm development and firmware regression testing.
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Advanced SoC/Analog Test System
3650
Chroma 3650 is an SoC tester with high throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses.
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Configurable Functional Test System
ATS-5000
Maximize the uptime of your most critical electronics with the ATS-5000 Functional Test System from Astronics Test Systems. Deployed globally for more than 20 years, the newest version of this tester provides a configurable, affordable solution that delivers just enough test.
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SoC Test Systems
Specifically designed for high-throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses. With the full functions of test capability, high accuracy, powerful software tools and excellent reliability, 3650-EX is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.
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Advanced SoC/Analog Test System
3650-EX
Chroma 3650-EX is specifically designed for high-throughput and high parallel test capabilities to provide the most cost effective solution for fabless, IDM and testing houses.
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Regenerative Battery Pack Test System
17020E
Charge/discharge modes (CC, CV, CP)Power Range: 10kW / 20kW per channelVoltage Range: 60V/ 100VCurrent Range: 100A/200A/300A/400A/ 500A/600A/700A/800A per channelRegenerative battery energy discharge, efficiency 85%Channels paralleled for higher currentsDriving cycle simulationFast current conversion without current interruptHigh precision measurementSmooth current without over shootTest data analysis functionData recovery protection (after power failure)Independent protection of multi-channel
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VXI Digital Multiplier
4152A
The 4152A’s advanced features like limit testing, averaging, speed/resolution trade-offs, and fast function changes provide the high “test system” throughput required in today’s production test environments.
