Surface Contamination
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Surface Contamination Monitors
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Small-sized devices for measuring the ambient dose equivalent rate and the ambient dose equivalent of X-ray and gamma radiation, as well as measuring the flux density of beta particles (AT6130).
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Surface Contamination Monitor
IMI Inspector Alert™ V2
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The IMI Inspector Alert™ V2 measures alpha, beta, gamma and x-radiation using a 2-inch “pancake” GM detector with high sensitivity to common beta and alpha sources. The easy-to-read digital display shows readings in your choice of µSv/hr, mR/hr, CPM, or CPS. The Total/Timer feature allows timed readings from one minute to 40 hours for precise measurement of low level contamination. An audible alert sounds when the radiation reaches a user-adjustable level.
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Geiger Counter
ONYX®
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ONYX features a modern, streamlined look and the use of advanced technologies, making it a one-of-a-kind Geiger Counter. It weighs only 7 oz. (200g.) and measures a mere 5.1 X 2.6 X 0.9 in. (72 X 37 X 13 mm.) making it easy to transport. Despite its compact size ONYX is capable of detecting alpha, beta and gamma radiation with the same sensitivity as the IMI Inspector Alert™, and like the IMI Inspector Alert™ V2, ONYX is optimized for surface contamination measurements through use of its 2 in. pancake Geiger Mueller tube.
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Omicron Fiber Optic Connector
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Teledyne Impulse-PDM’s Omicron 5030/5070 optical connectors utilize proven small form factor ferrule technology and are available for multi-mode or single-mode operation.The connectors are offered, as standard, in stainless steel to BSEN10088-3 Grade 1.4404 (316L), which is electro-polished to remove surface contamination, thus improving resistance to corrosion. Connector bodies can also be manufactured in other materials, either to address specific anti-corrosion requirements, or to increase depth rating. Engaging nuts are normally manufactured in naval brass to UNS C46400.
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Spatial Heterodyne Surface Chemical Agent Detector
SHSCAD
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Wide area, high areal coverage rate surface contaminant detection via LWIR reflectance spectroscopy employing eye safe broadband quantum cascade lasers (QCLs) and a high-speed spatial heterodyne spectrometer (SHS) in a handheld sensor package (~ 10,000 cm3, 10 lb).
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Spectrometers
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Search and detection of gamma radiation sources with automatic identification of the radionuclide composition; Measurement of the dose rate of gamma radiation; Detection of neutron radiation and measurement of the neutron count rate (AT6102); Measurement of the dose rate of neutron radiation (external detection unit BDKN-03); Measurement of the flux density of alpha and beta particles from contaminated surfaces (external detection units BDPA-01 / BDPB-01)
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Analytical Techniques
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Anderson Materials Evaluation, Inc.
Our numerous analytical techniques, we tackle a wide range of materials challenges and commonly combines several analytical techniques to fully address complex and multi-dimensional materials issues. Our materials analysis laboratory provides XPS surface analysis, thermal analysis (TGA, DSC, TMA), FTIR infrared spectroscopy, UV-Vis spectrophotometry and reflectivity measurements, gas chromatography – mass spectroscopy (GC-MS), SEM/EDX, optical microscopy, mechanical testing, electrochemistry and corrosion analyses, residual gas mass spectroscopy, contact angle measurements, surface contamination measurements, adhesive bonding failure analysis, facility testing for silicone contamination, mechanical testing, metallography and fractography, density and porosity measurements, volatile organic component testing, friction, and other analytical capabilities. We continue to upgrade and expand our arsenal of analytical techniques and custom analytical methods to support our customers’ needs.
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Total Reflection X-ray Fluorescence (TXRF) Services
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A highly surface-sensitive technique, TXRF is optimized for analyzing surface metal contamination on semiconductor wafers.
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Surface Quality Monitors
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PET manufactures and markets non-destructive, non-contact surface contamination and thin film detection models and automated systems (surface quality monitoring system) capable of detecting thin layer contamination, thin films and coating down to the Angstrom level. These systems represent a major breakthrough by providing, for the first time, a quantitative measure of surface cleanliness. As surface cleanliness verification instruments, in a part cleaning environment, these products are capable of validating the cleaning quality of all the part cleaning equipment available in the market. Any of SQM model series is capable of verifying metal contamination; monitoring absence/presence of organic and/or inorganic on virtually on surfaces of all metals. They are, price/performance, the most sufficient product available for testing surface of metals for surface cleanliness. These systems operate in an ambient environment, require no sample preparation or deposit of any agents on the surface. In any parts cleaning environment where the quality and efficiency of part cleaning equipment for removal of surface contamination is highly desired, these systems provide a scientific solution by quantitatively measuring the surface cleanliness. The SQM series has the sensitivity and operational simplicity required to provide fast and cost effective surface evaluation for all metals.
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Product
Optical 12,000 Meter Connector
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Teledyne Impulse-PDM’s 5135/5175 optical connectors utilize proven standard ferrule technology and are available for multi-mode or single-mode operation.The connectors are manufactured in Titanium Ti 6Al-4V, which is electro-polished to remove surface contamination, thus improving resistance to corrosion. The engaging nuts are also manufactured in the same grade of Titanium and the threads are coated with a Nickel/PTFE composite coating to prevent galling. The connectors have been qualifi ed to 12,000 meter operating depth.
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Elcometer Bresle Patches
135B
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Elcometer 135B Original Bresle Patches are used to determine surface chloride contamination and are self-adhesive rubber film patches with a sealed compartment for sampling soluble impurities from steel surfaces with a suitable solvent.
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Surface Contamination Kit
138/2
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The Elcometer 138/2 Surface Contamination Kit provides the user with a means for testing invisible surface contaminants including:pHchloride ionsironsalts
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Surface
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Electronic Development Labs, Inc.
EDL has been handcrafting quality sensors that are robust in design and feature high accuracy with remarkable reliability. Our technicians meticulously consider every specification, meeeting the individual needs of every customer. And quality doesn’t have to mean exorbitant cost. Our sensors are always priced competitively to deliver exceptional value.
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Microbial Contamination Monitors
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Is an active sampling method that is superior to the usage of settle plates, that additionally creates validated and actionable data.
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Surface Analysis
Innova-IRIS
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This provides researchers a perfect combination of chemical or crystallographic information at high spatial and spectral resolution with the most advanced atomic force microscopy characterization. The Innova-IRIS can be integrated with your choice of a leading Raman system to provide the best opaque sample TERS investigations available today. However you tailor your system, your application will benefit from Bruker exclusive, high-contrast IRIS TERS probes and the best tip preservation and lowest drift, guaranteeing that alignment is preserved even over the optical integration times necessary to interrogate weak Raman scatterers.
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Surface Cleanliness
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Surface cleanliness: Soluble salts & ion specific contamination (sulphates, chlorides, nitrates etc.) which are often invisible to the eye, together with amine blush (for amine cured epoxy coatings) can result in premature coating failure, resulting in high re-coating and maintenance costs. Elcometer has a range of test equipment for assessing surface cleanliness prior to applying a coating.
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Surface Thermometers
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Tel-Tru® Manufacturing Company
Tel-Tru Surface Thermometers are designed to measure surface temperatures on a wide variety of surfaces and are available in several configurations.
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Fluid Contamination Test
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Fluid contamination testing determines the abilities of materials to withstand the contaminating fluids, to which they are exposed in service.
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Surface Calibrators
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Electronic Development Labs, Inc.
A software-driven process for gaming mice that optimizes the sensor to a specific surface's texture, reflectivity, and weave.
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Contamination Detection and Analysis
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Contamination testing, detection, analysis, troubleshooting and resolution expertise to minimise downtime, maintain customer confidence, for quality & safety
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Sample Holder/Stocker For Contaminant Measurement
EDXIR-Holder
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Measure the Samples Kept in the Holder with EDX and FTIR The Holder Can Be Used as the Sample Stocker after the Measurement
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Surface Analysis
Dimension AFP
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The Dimension AFP is the world's only fab-based metrology tool specifically designed for both CMP profiling and etch depth metrology for current and advanced technology nodes. The system combines the superb resolution of an AFM with the long-scan capability of an atomic force profiler tomonitor etch depth and dishing and erosion on submicron features with unsurpassed repeatability.
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SURFACE PROFILE GAGES
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Steel is often abrasive blast cleaned or otherwise roughened prior to painting. The peak-to-valley height of the resultant surface profile is an important factor in the performance of applied protective coatings. Low profile may reduce coating bond strength (adhesion). Too high and the peaks may receive insufficient coverage and possibly rust prematurely. The costly application of more coating may be required if the profile is too high. For these reasons, surface profile should be measured prior to coating application to ensure that it meets contract specifications.
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Surface Mount Switches
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Dow-Key® Microwave offers PCB mounted, miniature electro-mechanical microwave switches. These switches are designed with an overall size of 0.75” x 0.75” x 0.58” and weight of 0.5 ounces for test and aerospace applications where small size, reduced weight, and less power consumption are critical.
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SURFACE MOUNTING
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Direct ceiling or wall installation for spaces without recessed options or when easy installation is required.
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Surface Carbon Analyzer
SurfaceC‑800
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Determination of surface carbon is a special requirement for quality control in the metal producing and metal working industry. ELTRA’s SurfaceC-800 analyzer is designed for the precise determination of surface carbon in numerous kinds of solid samples from trace level up to 1000 µg/cm2. The SurfaceC-800 is equipped with a resistance furnace with quartz tube for sample oxidation and can provide temperatures up to 1000 °C. The temperature of the SurfaceC-800 can be set up in steps of 1 °C. As common carrier gas in the SurfaceC-800 oxygen is used.
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Photoemission And Surface Photovoltage Spectroscopy
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KP Technology have developed a range of modules that feature surface photovoltage and photoemission spectroscopy capabilities.
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Contamination Monitors
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Control of X-ray and gamma radiation personal dose equivalent.The dosimeter together with the PC reader and the software forms an efficient automatic system for staff radiation exposure control.
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Surface Cleanliness Analyzer
Surface Analyst
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The Surface Analyst is a fast, easy, accurate, and non-destructive instrument that quantifies your level of surface preparation from the lab to the manufacturing floor. In 2 seconds, the Surface Analyst determines the surface cleanliness level by providing the contact angle measurement and a pass/fail result.
