Surface Contamination
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Product
Surface Profilers
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Taylor Hobson offers a world leading range surface form, surface finish and metrology solutions for 3D contour,ideal for the most demanding applications.
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Product
19" Drawer With Writing Surface, Unshielded, 8.75"H X 24"D
DR-081924-S
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Unshielded drawers with writing surface are constructed of 20 ga. CRS and are furnished with ball bearing chassis slides to provide smooth operation. Available for 19" and 24" rackmount in 20", 24" and 30" depths, with or without a keylock.
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Product
Sapphire/SIC Wafer Flatness and Surface Appearance System
FM200
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Sapphire/SIC wafer flatness and surface appearance system provide a previous surface flatness testing solution, though non-contract lighting testing to record the whole information of the surface, rapid and fast measurement for various of surfaces, line and all kinds of surface information.
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Surface Charge and Zeta Potential
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Surface analysis is a vital method for qualifying new materials in technical and biological applications. Surface charge analysis empowers users to closely monitor the surface chemistry from small particles in the nanometer range up to large wafers. Gain insights into modifications resulting from surface treatment and surface interactions with natural environments under near-ambient conditions. Get a competitive edge in optimizing existing products and developing new ones using the Anton Paar instruments which offer zeta potential measurement for a wide range of applications.
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Ionic Contamination (Cleanliness) Tester
Zero-Ion
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Current IPC standards now require ROSE testing for process monitoring. The Zero Ion ionic contamination tester fully complies with current IPC standards.
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Product
K Thermocouple Surface Probe
TP655
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Surface thermocouple Type “K” probe. Tolerance according to IEC 60584-2 standard.
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Surface Resistance Meter Kit - Test Anti-Static, Static Dissipative and Conductive Surfaces
PRS-812RM
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- Surface Resistance Tester from 0.10 Ω to 1 Teraohm- Constant Voltages 10 volts and 100 volts- Automatic Electrification Period- Determines if a surface is Dissipative, Conductive, or Insulative- Measures resistance point-to-point(Rtt) and resistance to ground (Rtg)- Measures resistance of ESD Flooring, ESD Worksurfaces and Packaging- Conforms to all ESD Association Standards for Resistive Characterization- Includes 2 each Surface Resistance Probes- Packaged in a hard shell Carrying Case- Certificate of Calibration Traceable to NIST included- 2-year Limited Warranty on Main Instrument
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Surface Roughness Gage
1000
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The Adcole Model 1000 represents the state of the art in surface roughness measurement for crankshafts, camshafts and other cylindrical components. The machine is pre-programmed for optimized workflows. Operators simply need to load and unload the parts. In addition to its unprecedented accuracy, this product is also the fastest system for taking critical surface measurements.The base gage is a rugged, self-standing horizontal granite surface plate with affixed headstock, tailstock and carriage. Scanned data is immediately available for review on the touchscreen monitor or printing.
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Product
Surface Resistance System Kit
PRS-801RM
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- Perform Point-to-Point and Resistance to Ground Measurements from 0.01 Ω to 200 Teraohms- Accuracy of ±2% from 1.00 Ω to 9.99x1010Ω- Measures in accordance with ESD TR53, ANSI/ESD S4.1, ANSI/ESD S7.1, ANSI/ESD STM97.1 and others- Constant Test voltages 10V and 100V meeting ANSI/ESD S20.20- Operates using a Rechargeable Li-ion Battery Pack- Takes Approximately 8,000 Measurements on a Single Charge (480 hours typical)- Stores up to 999 Test Values Into Memory- Compatible with Prostat Connect 2.0 for Downloading into Excel®- Charging and Download via Standard Micro USB Cable- Includes 5lb Conductive Probes and Carrying Case- Certificate of Calibration Traceable to NIST included- 2-year Limited Warranty on Main Instrument
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Product
Meters For Contact Angle And Surface Tension + Semiconductor Technology, Micro Scriber
SURFTENS HL Automatic
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Optik Elektronik Gerätetechnik GmbH
Fully automatic contact angle meter for silicon wafers up to 12 inch The contact angle measuring system SURFTENS HL automatic is designed for use in semiconductor industry and research, in particular for process control of wafer coating and in the photolithographic process.
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Product
19" Drawer with Writing Surface, Unshielded, 5.25"H x 20"D
DR-051920-S
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Unshielded drawers with writing surface are constructed of 20 ga. CRS and are furnished with ball bearing chassis slides to provide smooth operation. Available for 19" and 24" rackmount in 20", 24" and 30" depths, with or without a keylock
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Product
19" Drawer with Writing Surface, Unshielded, 7"H x 20"D
DR-071920-S
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Unshielded drawers with writing surface are constructed of 20 ga. CRS and are furnished with ball bearing chassis slides to provide smooth operation. Available for 19" and 24" rackmount in 20", 24" and 30" depths, with or without a keylock
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Contamination & Clearance
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Provides the ultimate user-friendly operation, with thorough and reliable detection of external contamination on personnel working in nuclear environments.
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Laser Doppler Surface Velocity Meter
LV-7000 series
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The LV-7000 series detects speed, uneven speed, distance, length of moving object or rotating object without contact. By contacting with 2 sensors, it enables to calculate difference in velocity/length between the two points in real time and output with 3,000 ppm of accuracy. The frequency response can be expanded up to 20 kHz, which achieves to understand phenomena and evaluate mechanical systems at high speed, efficiently, and accurately. It is useful for evaluation of motor control and behavior measurement, improving parts quality, and reducing loss of material.
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Product
Digital Surface Profile Gauge
NOVOTEST SP-1M
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Digital Surface Profile Gauge NOVOTEST SP-1M is designed for profile measuring on either flat or curved surfaces. Also it can be used for measurements of surface roughness (Rz), after abrasive blasting pre-painting work.
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19" Drawer with Writing Surface, Unshielded, 10.5"H x 20"D
DR-101920-S
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Unshielded drawers with writing surface are constructed of 20 ga. CRS and are furnished with ball bearing chassis slides to provide smooth operation. Available for 19" and 24" rackmount in 20", 24" and 30" depths, with or without a keylock
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Product
Surface Mount Reed Relays
Series 200
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Surface Mount Reed Relays. Wide range featuring dry or mercury wetted switches. Coaxial version for high speed digital or RF up to 6 GHz. 5, 12 or 24 volt coils with optional diode
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Product
K Thermocouple Surface Probe
TP647
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Surface thermocouple Type “K” probe. Fiberglass cable. Tolerance according to IEC 60584-2 standard.
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Product
Ionic Contamination Test System
Omegameter SMD 650
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The SCS Omegameter SMD 650, the long-time industry standard for ionic testing utilizing “static test” methodology, is designed to perform cleanliness testing on printed circuits and assemblies. Identifies the presence of ionic contamination on bare and assembled printed circuit boards and other electronic components. Provides an accurate and repeatable method for determining cleanliness on site. Provides immediate process control results, eliminating the need for outside laboratory testing.
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Product
19" Drawer with Writing Surface, Unshielded, 3.5"H x 20"D
DR-031920-S
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Unshielded drawers with writing surface are constructed of 20 ga. CRS and are furnished with ball bearing chassis slides to provide smooth operation. Available for 19" and 24" rackmount in 20", 24" and 30" depths, with or without a keylock
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Surface Analysis
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Bruker Nano Surfaces provides industry-leading surface analysis instruments for the research and production environment. Our broad range of 2D and 3D surface profiler solutions supply the specific information needed to answer R&D, QA/QC, and surface measurement questions with speed, accuracy, and ease. Bruker’s AFMs are enabling scientists around the world to make discoveries and advance their understanding of materials and biological systems. Our tribometers and mechanical testers deliver practical data used to help improve development of materials and tribological systems.
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Product
Surface Mount-to-DIP JEDEC SOT-25, SOT-23A-6 Adaptor
1110748
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Surface Mount to DIP Adapter for SOT-25, SOT-23A-6. Allows for breadboarding or substitution of microgate SOT-23A-6 and SOT-25 IC and transistor packages into .100 [2.54] pitch proto boards or PC boards. Solder masked top-side pads allow user to hand solder devices directly to topside of adapter with fewer problems of solder bridging. Longer male bottom pins are available at special request for easy use of probe clips. Large topside pads allow for soldering test pins, jumpers, etc. to top of adapter.
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Product
Digital Automated Interferometer and Microscope for Surface Inspection
DAISI-V3
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The ultimate production interferometer for measuring end-face geometry on single-fiber connectors, equipped with a revolutionary «no-exterior-moving-parts» mechanical design.
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Non-contact Optical Surface Profiler
VS-OSP
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The VersaSCAN OSP integrates the Base with a high-accuracy, high-speed laser displacement sensor. The OSP technique uses diffuse reflection mechanism to measure topography of a sample. OSP can be used to measure topography, as a very sensitive leveling mechanism, or charting topography to be implemented with other scanning probe techniques for constant-distance mode operation.
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Surface Analysis and Materials Characterization Services
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The Materials Characterization division of Evans Analytical Group is the leading global provider of surface analysis and materials characterization services. Our international network delivers world-class analytical services directly to you. EAG''s expertise in surface analysis, composition and contamination measurement, trace elemental analysis and microscopy can help you and your company meet your goals, no matter what high technology industry you work in.
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Surface Profile Test & Measurement Products
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PCWI Surface Profile Test & Measurement Products
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Automatic Online Flatness and Surface Appearance System
UltraSort200
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The UltraSort continues our 25 year tradition of providing metrology solutions to semiconductor wafer manufacturers. Designed for volume wafer production, this automated system offers superior performance in rapid, repeatable, accurate, noncontact qualification of silicon and alternative substrate wafers.
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Product
Surface Roughness Meter
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Shenzhen Graigar Technology Co.,Ltd.
Surface Roughness Tester is powerful, accurate and easy to use. It is ideal for checking large components, structures, auditing batch prior to shipment and production line process control.
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Surface Imaging & Metrology Software
Mountains®
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Analyze multiple types of surface data. Turn your surface data into accurate, visual surface analysis reports. See every feature with high quality real-time 3D imaging of surface topography. Characterize surfaces in accordance with the latest metrology standards.
