Transmission Electron Microscopes
image a beam electrons through a thin specimen.
See Also: Electron Microscopes
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Fluorescence Microscopes
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Bruker’s suite of fluorescence microscopy systems provides a full range of solutions for life science researchers. Our multiphoton imaging systems provide the imaging depth, speed and resolution required for intravital imaging applications in neuroscience, oncology and immunology. Our confocal systems enable cell biologists to study function and structure using live-cell imaging in cell cultures and invertebrate model organisms at speeds and durations previously not possible. Bruker’s super-resolution microscopes are setting new standards with quantitative single molecule localization which allows for the direct investigation of the molecular positions and distribution of proteins within the cellular environment. Our latest addition, Luxendo light-sheet microscopes, are revolutionizing long-term studies in developmental biology and investigation of dynamic processes in cell culture and small animal models.
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Electron Microscope Analyzer
QUANTAX FlatQUAD
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QUANTAX FlatQUAD is the EDS microanalysis system based on the revolutionary XFlash® FlatQUAD. This annular four-channel silicon drift detector is inserted between SEM pole piece and sample, achieving maximum solid angle in EDS.
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Product
Microscopic Four-Point Probes
M4PP
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CAPRES M4PP Microscopic Four-Point Probes have an electrode pitch three orders of magnitude smaller than conventional four-point probes, and are fabricated using silicon micro-fabrication technology.
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Transmission Control
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Schweitzer Engineering Laboratories, Inc.
Transmission control systems provide flexible local control and SCADA integration for substation and line protection assets, improving your system’s reliability and efficiency.
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Atomic Force Microscope
DriveAFM
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The DriveAFM is Nanosurf’s novel flagship AFM platform: a tip-scanning atomic force microscope (AFM) that combines, for the first time, several capabilities in one instrument to enable novel measurements in materials and life sciences.
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Electronic Units
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Electronic units for field installation and mounting rack installation control the actuators. They are fed with 115 or 230 V AC. A local control panel allows for easy basic settings.
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Electronic Dendrometer
CRITERION RD 1000
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F. W. Breithaupt & Sohn GmbH & Co.KG
*BAF: Visually estimates if trees fall in or out of a given plot as related to the specified Basal Area Factor.*In/Out: Internally computes the limiting distance for questionable, borderline trees and determines if they are in or out of the plot.*Diameter: Determines the diameter of a tree at any given height.*Height/Diameter: Provides the ability to determine the height at which a specific diameter occurs.*Raw Inclination: Measures inclination in percent slope.
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Inverted Microscope Platform
Axio Observer
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In life sciences research you come up against new challenges every day. That’s why you want a flexible microscope system that can be tailored to your needs. ZEISS Axio Observer is your inverse platform for demanding multimodal imaging of living and fixed specimens. Combine Axio Observer with a wealth of technologies and refine it to support your experiments precisely.
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Electronic Printers
EP-100/EP-110
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Easy-to-Use Printers, Supporting Good Laboratory Practice The EP-100 and EP-110 electronic printers for Shimadzu balances are easy-to-use, provide time and signature information, and support Good Laboratory Practice (GLP). Supported balance models include: AP; AW-D, AUW, AUX and AUY; ATX and ATY; AT-R; UP; UW and UX; TX; TXB; BL; ELB; BW-K and BX-K; and the MOC63u moisture balance.
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Acoustic Microscope
AMI P300
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The FastLine P300 Acoustic Microscope is specifically designed for accelerated throughput, semiautomated screening of microelectronic devices on the manufacturing floor.
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Inverted Metallurgical Microscope
GX53
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Designed for use in the steel, automotive, electronics, and other manufacturing industries, the GX53 microscope delivers crisp images that can be difficult to capture using conventional microscopy observation methods. When combined with OLYMPUS Stream image analysis software, the microscope streamlines the inspection process from observation to image analysis and reporting.
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Product
Electronic Loads/Sinks
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An electronic load offers the possibility of testing the specimen under different loads. Various load changes are simulated, as they can occur in normal operation. For this purpose, the relevant load current is set in a defined range and electronically controlled. For the test, different operating states are either programmed or entered into the system via an interface (USB, RS-232, GPIB...). For easy handling and quick use, there are four operating modes.
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Scanning Magnetic Microscope
Circuit ScanTM 1000
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Operating circuits within a semiconductor generate external magnetic fields near the surface of the device. These magnetic fields, while weak in strength, contain information about the spatial variation of current density flowing within the circuit. Micro Magnetics has developed the CS1000 to make practical use of this information and provide engineers with valuable information about what is going on inside circuitry non-destructively.
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Electronic Loads
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Electronic loads are indispensable tools in several fields of electrochemistry, for example in the research of batteries and fuel cells. Using an additional external power supply you easily can extend an EL to a two-quadrant potentiostat you need e.g. in the field of electrolysis.
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Transmission / Reflection Measurement
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Measure spectral transmittance and reflectance of optical elements such as lens, plate glass, filter, reflector, prism and so on.The wavelength range is 350 to 1100 nm as standard and 220 to 2000 nm as an option.Reflection measurement of a general spectrophotometer can only measure several types of fixed angles, but in this device the incident angle of the sample at the time of reflectance measurement is variable at an arbitrary angle and the minimum incident angle at reflectance measurement is 15 ° ( Optical axis angle 30 °) can be set up.
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Confocal Microscopes
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Our confocal microscopes for top-class biomedical research provide imaging precision for subcellular structures and dynamic processes.
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Scanning Electron Microscopes
SEM
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Scanning Electron Microscopes (SEM) scan a sample with a focused electron beam and obtain images with information about the samples’ topography and composition.
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Microscope Photomultiplier Photometers
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HORIBA's microscope photometers are ideal for any lab wishing to quantitate light intensity from a sample on a microscope stage. Initially designed for the most demanding low light level fluorescence kinetics of labeled mammalian cells, these photometers are also just as well suited for mineral analysis or transmission studies.
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Transmission Operations
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Schweitzer Engineering Laboratories, Inc.
The safe and efficient operation of transmission facilities requires that critical information be sent to SCADA and system operators. With this knowledge, they can respond quickly and appropriately to power system events.
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3D Video Microscope
BVM-20104
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The microscope is configured with 1.3M HD industrial camera. VGA image output interface, can be connected to the computer and monitor directly. clear and vivid image, taking photos, SD card storage, auto exposure. Camera is equipped with remote control panel, which makes the operation much easier. Optical lens keep parfocal under zoom, there is no deviation for center; 3D rotary observation
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Electronic Components
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We supply a wide range of components and materials to the electronics industry, such as: integrated circuits for personal computers, semiconductor materials for system LSI, optical communication materials for telecommunications, components for display devices seen in smartphones and projectors, and materials used in solar cells and lithium batteries.
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FIBER OPTIC MICROSCOPES
SpecVision
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SpecVision is a video probe that engages directly with Krell polishing machines. This permits the viewing of polished optical surfaces while connectors or bare fibers are still loaded in the polisher. This in-line video inspection technique minimizes material handling and potential damage/contamination that may occur when transferring components from the polisher to a traditional microscope. SpecVision can interface with Scepter, SpecPro and Rev Polishers.
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Transmission FT-NIR Spectrometer
QuasIR™ 1000
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The QuasIR™ 1000 is an NIR analysis solution that brings together portability with unmatched spectroscopic performance. The QuasIR™ 1000 ensures direct calibration transfer without the frustration of standardizing instruments or adjusting models to accommodate excessive instrument variability.
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Light Microscopes
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Compound light microscopes from Leica Microsystems meet the highest demands whatever the application – from routine laboratory work to the research of multi-dimensional dynamic processes in living cells.
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Optical Signal Transmission
Analog
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Used for oscillographing analog signals under EFT/EDS/RF interference.
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Metallurgical Microscope
BXJ900 Series
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Nanjing Kozo Optical and Electronical Instrument Co., Ltd.
LCD Metallurgical microscope is one new microscope, it is suitable to observe the sample while with the sharp image.
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Product
Transmissive Rotary Disk
DISK-2
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US Digital offers a wide variety of standard rotary encoder disks. They may be ordered as a stand alone disk (see below) or as a codewheel (see the Disks page). These rotary encoder disks are made from mylar polyester film. This material allows for a wide temperature range and is virtually unbreakable. There is no minimum order.
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Atomic Force Microscope
LensAFM
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The Nanosurf LensAFM is an atomic force microscope that continues where optical microscopes and profilometers reach their resolution limits. It is mounted like a normal objective lens, thus extending the resolution and measuring capabilities of these instruments.
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Atomic Force Microscope
3DM Serirs
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Park Systems has introduced the revolutionary Park 3DM Series, the completely automated AFM system designed for overhang profiles, high-resolution sidewall imaging, and critical angle measurements. With the patented decoupled XY and Z scanning system with tilted Z-scanner, it overcomes the challenges of the normal and flare tip methods in accurate sidewall analysis. In utilizing our True Non-Contact Mode™, the Park 3DM Series enables non-destructive measurement of soft photoresist surfaces with high aspect ratio tips.





























