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Transmission Electron Microscopy
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Sputter Coater & Freeze Fracture Solutions
To obtain high-quality images of samples with scanning (SEM) or transmission electron microscopy (TEM), your samples need to be conductive to avoid charging. If a sample does not have a high enough conductivity, then you can quickly cover it with a conductive layer using the method of sputter coating. Also, a carbon or e-beam evaporator coating can be used. Such coatings protect the sample, allow enhancing of the EM image contrast, or can act as a TEM-grid support film for small scale samples.
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Autonomous Driving AI Decision Making ECU
ADM-AL30
ADM-AL30 is dedicated to Autonomous Driving Applications. Powered by Intel® 12th Gen Core i9/i7 CPU and the NVIDIA RTX 4000 SFF Ada GPU, this AI computing platform can process huge amounts of data and make crucial decisions for autonomous vehicles. Equipped with 2 x 10G Base-T and 8 x 1G Base-T1 automotive ethernet ports, as well as 8 x CAN FD and 4 x CAN 2.0 interfaces, it seamlessly integrates into any automotive ecosystem. Plus, its ISO 16750-2 and ISO 7637-2 ensure reliability and safety under the most demanding conditions.
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NVIDIA GPU And Intel® Xeon® AI Computing Platform For Autonomous Drive Applications
AVA-3510
The AVA-3510 Series is powered by an Intel® Xeon® E processor coupled with workstation-grade Intel®C246 chipset to support up to 64 GB ECC DDR4 memory. The system incorporates one 2.5" SSD 256G for easy installation as optional accessories for fast read/write performance.
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High-end Transmission Electron Microscope
CryoARM
JEOL announces the latest member in its family of high-end transmission electron microscopes, the CryoARM. This highly automated TEM is designed for unattended operation and high throughput imaging of cryo-EM specimens. The CryoARM was initially introduced to a select audience at the 2016 Gordon Research Conference in Hong Kong, M&M 2016 in Columbus, OH and EMC 2016 in Lyon, France. The CryoARM is a dedicated cryo-TEM, based on the highly successful JEOL ARM (Atomic Resolution Microscope) series, an ultrahigh performance, highly stable platform considered to be the "best-in-class" TEMs. The development of the CryoARM was accomplished in collaboration with leading Life Science researchers.
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Transmission Protection
Schweitzer Engineering Laboratories, Inc.
SEL transmission protection solutions provide complete primary and backup protection from all types of faults. Using these devices helps you avoid expensive equipment damage and failure while maintaining system performance and increasing availability.
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Optical microscopy (OM)
Materials Analysis Technology Inc.
Optical microscopy is used to display the surface morphology of samples by 2D intensity contrast due to deflection and reflection of visible light shined on areas of interest. Its resolution is about half of the incident wavelength, which is ~0.2 μm for visible light (wavelength of 400-700 nm). Such resolution limits the maximum magnification to X1000, and thus optical microscopy provides preliminary inspection of sample surface structure.
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Transmission Dynamometers
Our equipment tests automatic and automated-manual transmissions. On and off-highway transmission test stands, transmission and hydraulic component test stands and valve body test stands.
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X-ray Microscopy
Xradia Family
✔ Characterize the properties and behaviors of your materials non-destructively.✔ Reveal details of microstructures in three dimensions (3D).✔ Develop and confirm models or visualize structural details.✔ Achieve high contrast and submicron resolution imaging even for relatively large samples.
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Telecom Transmission Tests
Networked Communication Solutions, LLC
Is designed to test across the full bands of T1-Lite® or E1-Lite® or test individual timeslots.
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Scanning Probe Microscopy
SPECS Surface Nano Analysis GmbH
As Scanning Probe Microscopy (SPM) is a key tool for nanotechnology, SPECS offers dedicated solutions for highly demanding requirements.In UHV, strong emphasis lies on spectroscopic methods such as scanning tunneling spectroscopy and inelastic tunneling spectroscopy as well as single atom and molecule manipulation. With the invention of a Joule-Thomson cryostat by Prof. Wulf Wulfhekel, SPECS now offers the JT-STM , operating sample and sensors in thermal equilibrium below 1K with optional high magnetic field.
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Atomic Force Microscopy
Bruker’s industry-leading AFM microscopes provide the highest levels of performance, flexibility and productivity, and incorporate the very latest advances in atomic force microscopy techniques. Applications range from materials science to biology, from semiconductors to data storage devices, from polymers to optics with measurement of nanoscale topography, nano-mechanical, nano-electrical and nanoscale chemical mapping.
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Microscopy Image Analysis Software
analySIS FIVE
The image analysis software "analySIS FIVE" is designed for users of industrial microscopes compatible with digital cameras for microscopes. Users can select from 5 types depending on their required functions, such as "measurement," "database," "report creation," and "particle analysis."
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Microscopy Software/Hardware
ZEISS Atlas 5
Atlas 5 is your powerful hardware and software package that extends the capacity of your ZEISS scanning electron microscopes (SEM) and ZEISS focused ion beam SEMs (FIB-SEM). Use its efficient navigation and correlation of images from any source, e.g. light- and X-ray microscopes. Take full advantage of high throughput and automated large area imaging. Unique workflows help you to gain a deeper understanding of your sample.
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Transmission Line Probes
Transmission line probes are a special type of passive probe designed for use at very high frequencies. They replace the high impedance probe cable found in a traditional passive probe with a precision transmission line, with a characteristic impedance that matches the oscilloscope input (50 Ohm). This greatly reduces the input capacitance to a fraction of a picofarad, minimizing the loading of high frequency signals. A matching network at the tip increases the DC input resistance. While they have lower DC input resistance than a traditional passive probe (usually 500 Ohm) to 1kOhm), the input impedance of these probes remains nearly constant over their entire frequency range. A traditional /10 passive probe will have a 10 MOhm) input impedance at DC, however this impedance drops rapidly with frequency, passing below the input impedance of a transmission line probe at less than 100 MHz.
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Electronic
Our electronic switches offer single or dual setpoints, adjustable time delays, external setpoint adjustments and more.
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Transmission Meters
Shenzhen Linshang Technology Co., Ltd.
As a leading window film transmission meter (window tint meter) manufacturer, Linshang Technology provides a variety of window film meters to measure transmission rate, rejection rate, SHGC for materials such as automotive film, thermal insulation film, architectural film, thermal insulation glass, etc. There are mainly portable solar film transmission meters LS160 series, LS162 series, LS163 series, desktop demonstration window tint meters LS101, LS180, LS181, L182, split transmission meters LS110A, LS110H. Whether you want to measure UV or IR rejection (940nm, 1400nm) or visible light transmittance, you can find a suitable window film meter here.
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Transmission Line Pulse Testing
Transmission Line Pulse testing, or TLP testing, is a method for semiconductor characterization of Electrostatic Discharge (ESD) protection structures. In the Transmission Line Pulse test, high current pulses are applied to the pin under test (PUT) at successively higher levels through a coaxial cable of specified length. The applied pulses are of a current amplitude and duration representative of the Human Body Model (HBM) event (or a Charged Device Model – CDM – event in the case of Very Fast TLP, or VF-TLP).
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Network Transmission Tester
SIGNALTEK NT
If you install, maintain or troubleshoot data cabling and Ethernet networks, SignalTEK NT allows you to prove the performance up to Gigabit Ethernet transmission rates.
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Enterprise/ Carrier Transmission Tester
UniPRO MGIG1 Series
Designed for comprehensive turn-up testing, monitoring and troubleshooting of fixed line, mobile, microwave and wireless carrier Ethernet links. UniPRO MGig1 is suitable for use on any backhaul link at speeds of up to 1 Gb/s.
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Scanning Electron Microscopy
SEM
Materials Evaluation and Engineering
JEOL JSM-6610 LV LaboratoryScanning electron microscopy (SEM) uses electrons for imaging to obtain higher magnifications and greater depth of field than light microscopes. The instruments at MEE are capable of variable-pressure, or low vacuum, SEM (VPSEM), as well as traditional high-vacuum conditions for sample observation. VPSEM is a specialized method using a variable-pressure sample chamber that allows direct evaluation of samples that are not readily examined with a traditional high-vacuum SEM. Nonconductive or vacuum sensitive samples that would typically require additional sample preparation can be directly analyzed in VPSEM without the need for additional sample preparation, such as carbon or metallic conductive coatings. This reduces both sample preparation time and distractions in microanalysis. Our laboratory also has a field emission SEM (FESEM) for critical high-magnification work and low-voltage (LVSEM) applications. Each instrument has a spacious sample chamber that can accommodate large and irregularly-shaped specimens and accessories for feature dimensional analysis and chemical microanalysis.
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Fiber-Optic Transmission
Fiber optic transmission systems all use data links that work similar to the diagram shown above. Each fiber link consists of a transmitter on one end of a fiber and a receiver on the other end. Most systems operate by transmitting in one direction on one fiber and in the reverse direction on another fiber for full duplex operation. It's possible to transmit both directions on one fiber but it requires couplers to do so and fiber is less expensive than couplers. A FTTH passive optical network (PON) is one of the only systems using bidirectional transmission over a single fiber because its network architecture is based around couplers already.
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Electron Multipliers
Electron multipliers are mainly used as positive/negative ion detectors. They are also useful for detecting and measuring vacuum UV rays and soft X-rays. Hamamatsu electron multipliers have a high gain (multiplication factor) yet low dark current, allowingoperation in photon counting mode to detect and measure extremely small incoming particles and their energy. This means our Hamamatsu electron multipliers are ideal for electron spectroscopy and vacuum UV spectroscopy such as ESCA (electron spectroscopy for chemical analysis) and Auger electron spectroscopy as well as mass spectroscopy and field-ion microscopy.
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Electronic Components
We supply a wide range of components and materials to the electronics industry, such as: integrated circuits for personal computers, semiconductor materials for system LSI, optical communication materials for telecommunications, components for display devices seen in smartphones and projectors, and materials used in solar cells and lithium batteries.
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Data Transmission
HighReach Measuring & Controlling System Co.,Ltd
Is sending and receiving digital or analog data between devices.
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Coherent Transmission Test Instruments
Optical modulation analyzers provide detailed insights into the complex modulated optical signals at the physical layer to determine signal quality or evaluate components that are designed for IQ modulation and demodulation.
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Electronic Loads
Flexible electronic DC loads for general purpose applications. Voltage up to 80V, current up to 80A and power up to 600 watts. CI, CR, CG, CV and CP modes, built-in transient generators. Models with USB, RS232, GPIB and LXI compliant LAN interfaces.
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Electronics
Electromagnetic, Signal Integrity, Thermal and Electro-Mechanical Simulation Solutions. The use of Ansys Electronics solution suite minimizes the testing costs, ensures regulatory compliance, improves reliability and drastically reduces your product development time. All this while helping you build the best-in-class and cutting-edge products. Leverage the simulation capability from Ansys to solve the most critical aspects of your designs
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Electronic Counters
GR2-C Series
The GR2-C Series is a self-powered LCD Totalizer in small form. With a panel size of DIN 48 x 24mm, it is perfect for limited space installations. It is powered by a replaceable lithium battery that lasts approximately 7 years, no external power required. The GR2-C series is available in 7 digits with 8mm height figures with Front Reset or Remote reset options. Input signal includes dry contact, open collector, voltage, wide range voltage at maximum count speed upto 30Hz. The front panel protection is IP54 and wiring connection is easily done via the terminal block connector, making it secure and reliable. CE, UL and RoHS compliant.
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Analytical Software for Microscopy
SPIP
SPIP™ or Scanning Probe Image Processor - is an advanced software package for processing and analyzing microscopic images at nano- and microscale. It has been developed as a proprietary software by Image Metrology and is unique in the microscopy and microscale research market. With the high level of usable features, SPIP provides industrial and academic researchers with an advanced toolkit for working with microscope images, incl. extracting data from most microscopy file types, cleaning and enhancing data, analyzing measurements, visualizing and reporting analysis results. The software is used for research and innovation in a variety of industries such as pharmaceutical, cosmetics, semiconductors, hard disk manufacturing, polymer and aluminum manufacturing. Furthermore, SPIP is widely recognized as the standard microscope image analysis software for research and education at leading universities, and has been cited in more than 1200 scientific publications.
